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9032797 Sensor device and method  
A sensor device including a mechanical oscillator, an excitation unit which is configured to excite the mechanical oscillator to perform a mechanical oscillation within a non-linear range at a...
8997259 Method and apparatus of tuning a scanning probe microscope  
An apparatus and method of automatically determining an operating frequency of a scanning probe microscope such as an atomic force microscope (AFM) is shown. The operating frequency is not...
8997258 Microscope probe and method for use of same  
A microscope probe includes a substrate; an optical resonator disposed on the substrate and including an optical resonance property; a displacement member disposed on the substrate and separated...
8991246 Gear measuring method  
A gear measuring method allows multi-point continuous measurement using a touch probe and is capable of reducing measuring time compared with known methods. For example, a base action for moving a...
8969088 Substrate mimicking intercellular lipids in stratum corneum and method of evaluating skin roughening using the same  
A substrate mimicking intercellular lipids in stratum corneum consisting of a substrate and a lipid membrane formed on the substrate, wherein the lipid membrane is formed from ceramide, palmitic...
8959986 Apparatus having a roughness measurement sensor and corresponding methods  
An apparatus having a roughness sensing system and a roughness measurement sensor, wherein a slide element and a probe tip come to operation, and method of use thereof. The slide element is...
8959661 Atomic force microscope probe, method for preparing same, and uses thereof  
An atomic force microscope probe comprising a piezo-electric resonator provided with two electrodes and coated with an insulating layer and a tip attached on the coated resonator and...
8951652 Substrate for magnetic recording medium, magnetic recording medium, method of manufacturing magnetic recording medium, and method of inspecting surface  
A substrate for a magnetic recording medium having a disc shape with a central hole is provided in which the surface roughness of the principal surface of the substrate is 1 angstrom or less in...
8955161 Peakforce photothermal-based detection of IR nanoabsorption  
An apparatus and method of performing photothermal chemical nanoidentification of a sample includes positioning a tip of a probe at a region of interest of the sample, with the tip-sample...
8925376 Fully digitally controller for cantilever-based instruments  
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The...
8925111 Scanning probe microscope and method of operating the same  
Provided are a scanning probe microscope and a method of operating the same. The scanning probe microscope includes a chuck configured to fix an object. A stacker is configured to load one or more...
8915124 Surface texture measuring apparatus  
A surface texture measuring apparatus includes a stylus displacement detector having a measurement arm which is able to swing, a pair of styli provided at a tip of the measurement arm, and a...
8914911 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy  
Described are methods for magnetically actuating microcantilevers and magnetically actuated and self-heated microcantilevers. Also described are methods for determining viscoelastic properties and...
8891193 Disk drive calibrating threshold and gain of touchdown sensor  
A disk drive is disclosed comprising a head actuated over a disk comprising a plurality of tracks. The head comprises a touchdown element operable to generate a touchdown signal. The touchdown...
8869602 High frequency deflection measurement of IR absorption  
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface by using the AFM probe to detect wavelength dependent IR radiation interaction,...
8869601 Lever-type detector, stylus, and automatic stylus exchanger  
A lever-type detector, a stylus, and an automatic stylus exchanger allow styluses of different types to be exchanged automatically and reduce the burden of exchanging the styluses of different...
8869590 Method and apparatus used for determining friction between slider and rotating data storage medium  
A flexible member is coupled between an actuator arm and a slider. The flexible member facilitates relative motion in a tangential direction of a rotating medium. The relative motion is detected...
8863568 Apparatus and procedure to characterize the surface quality of conductors by measuring the rate of cathode emission as a function of surface electric field strength  
A device and method for characterizing quality of a conducting surface. The device including a gaseous ionizing chamber having centrally located inside the chamber a conducting sample to be tested...
8869311 Displacement detection mechanism and scanning probe microscope using the same  
A displacement detection mechanism for a vibrationally driven cantilever includes a vibration frequency detector comprised of an LC resonator that detects a change of capacitance between the...
8857247 Probe for a scanning probe microscope and method of manufacture  
A probe assembly for an instrument and a method of manufacture includes a substrate and a cantilever having a length that is independent of typical alignment error during fabrication. In one...
8857248 Piezoelectric microcantilevers and uses in atomic force microscopy  
The invention is direct to a piezoelectric microcantilever for static contact and dynamic noncontact atomic force microscopy which may be carried out in solution. The piezoelectric...
8845555 System and method for evaluating tissue  
The present invention provides a sensor system for measuring an elastic modulus and a shear modulus and a method for using the sensor system to evaluate a tissue by determining the presence of...
8841964 Apparatus and method for demodulating an input signal  
An apparatus for demodulating an input signal that includes a frequency detector for tracking a frequency of the input signal, an oscillator and a mixer is disclosed. The input signal and an...
8819860 Device comprising a cantilever and scanning system  
A device including a first part and a second part, the first and second part being connected to each other and being movable relative to each other. The first part is a cantilever that has a...
8813261 Scanning probe microscope  
A scanning probe microscope including: a scanning probe microscope unit section including, a cantilever having a probe, a cantilever holder configured to fix the cantilever, a sample holder on...
8793811 Method and apparatus for infrared scattering scanning near-field optical microscopy  
This invention involves measurement of optical properties of materials with sub-micron spatial resolution through infrared scattering scanning near field optical microscopy (s-SNOM). Specifically,...
8726411 Charged probe and electric fields measurement method thereof  
A charged probe and an electric field measuring method are provided. The probe can be charged with single electricity on single nano particle attached on the top of the probe tip being a charged...
8720256 Off-axis imaging for indentation instruments  
Modifications to the indenter probe tips and transducer, and proper selection of optics in an indentation system allow straight down or slightly angled optical viewing of the sample surface under...
8695398 Intrinsically-calibrated tribometer  
Intrinsically calibrating friction mensuration device has a drive unit with controllable motive member, configured to receive a controllable propulsion force, and to apply tractive force to a test...
8686358 Sub-microsecond-resolution probe microscopy  
Methods and apparatus are provided herein for time-resolved analysis of the effect of a perturbation (e.g., a light or voltage pulse) on a sample. By operating in the time domain, the provided...
8677809 Thermal measurements using multiple frequency atomic force microscopy  
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
8656509 Scanning probe microscope and surface shape measuring method using same  
It has been difficult to highly accurately measure the profiles of samples using scanning probe microscopes at the time when scanning is performed due to scanning mechanism fluctuations in the non...
8650939 Surface texture measuring machine and a surface texture measuring method  
A surface texture measuring machine includes: a stage, a contact-type detector having a stylus, an image probe, a relative movement mechanism and a controller. The controller includes: a center...
8646319 Dynamic power control for nanoscale spectroscopy  
Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a...
8646109 Method and apparatus of operating a scanning probe microscope  
An improved mode of AFM imaging (Peak Force Tapping (PFT) Mode) uses force as the feedback variable to reduce tip-sample interaction forces while maintaining scan speeds achievable by all existing...
8607622 High frequency deflection measurement of IR absorption  
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would...
8606426 Alignment and anti-drift mechanism  
A system includes a displacement sensor, an actuator connected to the displacement sensor, and a feedback unit. The displacement sensor is configured to measure at least one of a relative position...
8606376 Method of actuating a system, apparatus for modifying a control signal for actuation of a system and method of tuning such an apparatus  
A method of actuating a system comprising a movable component and an actuator configured to move the movable component comprises providing a control signal representative of a desired motion of...
8596116 Triangulation of pavement deflections using more than four sensors  
Systems and methods are disclosed that provide improved non-destructive testing of pavements and in particular non-destructive testing of pavements using rolling wheel deflectometer systems having...
8595859 Controlling atomic force microscope using optical imaging  
A method for optically controlling an atomic force microscope (AFM) includes acquiring an optical image of a sample using an optical imaging device, identifying a feature of interest on the sample...
8573036 Surface texture measuring instrument  
A surface texture measuring instrument includes a force sensor (1), an actuator (11) and a detector (12). The surface texture measuring instrument further includes: a scanning controller (54) that...
8562546 System and method for evaluating tissue  
The present invention provides a sensor system for measuring an elastic modulus and a shear modulus and a method for using the sensor system to evaluate a tissue by determining the presence of...
8555711 Material property measurements using multiple frequency atomic fore microscopy  
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
8555698 Engineered surfaces for laboratory tread wear testing of tires  
A method of fabricating a substantially rigid hardened wear surface for a tire tread wear testing apparatus is provided, the method comprising making a cast of a road surface on which tread wear...
8549899 Surface texture measuring instrument  
A surface texture measuring instrument includes a force sensor (1), an actuator (11) and a detector (12). The surface texture measuring instrument further includes: a scanning controller (54) that...
8548668 Control system having tool tracking  
A control system is disclosed for use with a machine having a work tool and operating at a work site. The control system may have a sensor associated with the work tool and configured to generate...
8544324 Quantum tunnelling sensor device and method  
A sensor device, method of fabricating the same, and a method of sensing a physical quantity. The sensor device comprises a substrate; a flexure member, one end of the flexure member being...
8533861 Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy  
Described are methods for magnetically actuating microcantilevers and magnetically actuated and self-heated microcantilevers. Also described are methods for determining viscoelastic properties and...
8499621 Scanning probe microscopy inspection and modification system  
A scanning probe microscopy (SPM) inspection and/or modification system which uses SPM technology and techniques. The system includes various types of microstructured SPM probes for inspection...
8499361 Prototyping station for atomic force microscope-assisted deposition of nanostructures  
A localized nanostructure growth apparatus that has a partitioned chamber is provided, where a first partition includes a scanning probe microscope (SPM) and a second partition includes an atomic...