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7618465 |
Near-field antenna
The invention relates to a near-field antenna comprising a dielectric shaped body having a tip. The shaped body is characterized in that at least the surface of the tip is metallized, thereby...
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7617720 |
Surface position measuring method and surface position measuring device
A surface position measuring method capable of measuring a position on a soft surface accurately and rapidly (real time), with low invasiveness. The method comprises the steps of measuring the...
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7617719 |
Method and apparatus for obtaining material property information of a heterogeneous sample using harmonic resonance imaging
A method and apparatus for its practice are provided of differentiating at least one component of a heterogeneous sample from other component(s) using harmonic resonance imaging and of obtaining...
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7615739 |
Spin microscope based on optically detected magnetic resonance
The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or...
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7615738 |
Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements
A scanning probe microscope assembly that has an atomic force measurement (AFM) mode, a scanning tunneling measurement (STM) mode, a near-field spectrophotometry mode, a near-field optical mode,...
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7614288 |
Scanning probe microscope fine-movement mechanism and scanning probe microscope using same
An inching mechanism for a scanning probe microscope capable of performing measurement with high precision while enhancing the scanning speed by a probe furthermore, and a scanning probe microscope...
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7614287 |
Scanning probe microscope displacement detecting mechanism and scanning probe microscope using same
A displacement detection mechanism for a scanning probe microscope capable of performing measurement quickly with high precision even if an objective lens or an illumination system is arranged...
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7610797 |
Carbon nanotube detection system
A carbon nanotube detection system is disclosed. The detection system is suitable to detect carbon nanotube vibrations. Types of detection systems include but are not limited to: magnetic coupling...
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7608820 |
Spin microscope based on optically detected magnetic resonance
The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or...
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7607344 |
Factory-alignable compact cantilever probe
A scanner which includes a gradient index lens for passing and focusing beams from a radiation emitter to a cantilevered member reflective surface of a probe and from the reflective surface to a...
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7607343 |
System for nano position sensing in scanning probe microscopes using an estimator
In accordance with the invention, an estimator is used in the controller portion of a scanning probe microscope to provide precise position estimates of the probe tip which is controlled in the...
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7607342 |
Method and apparatus for reducing lateral interactive forces during operation of a probe-based instrument
A cantilever probe-based instrument is controlled to reduce the lateral loads imposed on the probe as a result of probe/sample interaction. In a preferred embodiment, the probe tip and/or sample...
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7605368 |
Vibration-type cantilever holder and scanning probe microscope
A vibration-type cantilever holder holds a cantilever opposed to a sample. The holder supports a main body part of the cantilever at only its base end so that a probe at the free end of the...
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7603891 |
Multiple frequency atomic force microscopy
An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
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7596990 |
Method and apparatus for obtaining quantitative measurements using a probe based instrument
A cantilever probe-based instrument is controlled to counteract the lateral loads imposed on the probe as a result of probe sample interaction. The probe preferably includes an active cantilever,...
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7596989 |
Probe for an atomic force microscope
A probe for an atomic force microscope is adapted such that, as a sample is scanned, it experiences a biasing force urging the probe towards the sample. This improves probe tracking of the sample...
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7594443 |
Mechanically tunable optical-encoded force sensor
An optical-encoded force sensor is disclosed. The optical-encoded force sensor includes a cantilever probe having a probe tip, a set of reflective phase gratings and multiple nano-photonic...
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7591171 |
Atomic force microscope
A surface shape of a member to be measured is measured by reflecting measuring light at a reflection surface of a probe and utilizing an atomic force exerting between the probe and utilizing an...
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7591170 |
Rough road detection system
A rough road detection system includes an engine speed module, a feature space module, a normalization module, and a rough road module. The engine speed module generates an engine speed signal...
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7584653 |
System for wide frequency dynamic nanomechanical analysis
Dynamic nanomechanical analysis of a sample is performed by using a cantilever probe that interacts with the sample using a force applied across a wide range of frequencies that includes...
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7581438 |
Surface texture measuring probe and microscope utilizing the same
A surface texture measuring probe ( 60 ) includes a probe head ( 65 ), a first supporting body ( 61 ), a second supporting body ( 62 ), a piezoelectric element ( 63 ) and a balancer ( 64 ). The...
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7578853 |
Scanning probe microscope system
A scanning probe microscope system comprising a hollow probe 3, a tube 4 connected to a rear end 32 of the hollow probe 3, a support table 1 provided under the hollow probe 3, and a...
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7578176 |
Systems and methods for utilizing scanning probe shape characterization
A scanning probe microscope's probe tip dimensions as they exist or existed for a certain data or measurement are inferred based on probe activity taking place since a probe characterization...
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7574932 |
Sample holding mechanism and sample working/observing apparatus
A sample working/observing apparatus possesses a sample holding mechanism. The sample holding mechanism possesses a sample holder holding a sample, and a base detachably supporting the sample...
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7574903 |
Method and apparatus of driving torsional resonance mode of a probe-based instrument
A method of operating a scanning probe microscope includes using a probe having a cantilever, and oscillating the probe at a torsional resonance frequency thereof. In addition, the method includes...
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7572300 |
Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growth
A scanning probe where the micromachined pyramid tip is extended by the growth of an epitaxial nanowire from the top portion of the tip is disclosed. A metallic particle, such as gold, may...
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7571639 |
Method of correcting opaque defect of photomask using atomic force microscope fine processing device
An opaque defect is processed by scanning with a high load or height fixed mode using a probe harder than a pattern material of a photomask at the time of going scanning, and is observed by...
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7571638 |
Tool tips with scanning probe microscopy and/or atomic force microscopy applications
A micro-object is affixed to a mounting structure at a desired relative orientation. The micro-object may be a tool tip optimized to work with particular microscope objectives permitting the tip to...
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7569817 |
Scanning probe apparatus
In a scanning probe apparatus capable of always effectively canceling an inertial force to suppress vibration even in repetitive use while replacing a sample holding table or a probe, a stage for a...
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7562564 |
Scanning probe microscope and sample observing method using this and semiconductor device production method
A scanning probe microscope capable of measuring accurate 3-D shape information of a sample with high through-put without damaging a sample. In a method for acquiring an accurate 3-D shape of a...
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7562563 |
Apparatus for automatically inspecting road surface pavement condition
Provided is an apparatus for automatically inspecting a road surface pavement condition, includes: a road surface photographing unit; a road surface rutting measuring unit; a flatness measuring...
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7556968 |
Scanning probe microscope and molecular structure change observation method
A scanning probe microscope includes a cantilever, a scanning mechanism which relatively scans the cantilever and a sample which exist in liquid, and an application mechanism which applies...
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7555941 |
Scanner for probe microscopy
A scanner for probe microscopy that avoids low resonance frequencies and accounts better for piezo nonlinearities. The x, y and z axes of a linear stack scanner are partially decoupled from each...
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7555940 |
Cantilever free-decay measurement system with coherent averaging
A system and method for measuring sample material properties by coherently averaging cantilever free-decay signals in a scanning probe microscope is described.
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7552645 |
Detection of resonator motion using piezoresistive signal downmixing
A system containing a micro-mechanical or nano-mechanical device and a method of operating the same is provided. The device includes a resonator and a piezoresistive element connected to the...
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7552625 |
Force sensing integrated readout and active tip based probe microscope systems
In accordance with an embodiment of the invention, there is a force sensor for a probe based instrument. The force sensor can comprise a detection surface and a flexible mechanical structure...
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7550311 |
Near-field optical probe based on SOI substrate and fabrication method thereof
Provided is near-field optical probe including: a cantilever arm support portion that is formed of a lower silicon layer of a silicon-on-insulator (SOI) substrate, the cantilever arm support...
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7549325 |
Glide head with active device
A glide head having a portion thereof that is selectively extendable toward the rotating disk by the application of an electrical signal thereto. The extendable portion may be located on a side...
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7547882 |
Scan data collection for better overall data accurancy
A scan data collection operation includes performing a scanning operation using a scan path that includes a directional component that is additional to a data collection directional component. The...
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7543482 |
Carbon thin line probe
A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line...
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7542872 |
Form measuring instrument, form measuring method and form measuring program
A form measuring instrument measures a form of a surface of an object to be measured using a contact to follow the surface. A pseudo-measurement point acquirer acquires positional coordinates of...
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7539586 |
Correction method and measuring instrument
A measuring instrument comprising a stylus displaced following a work, the instrument further comprises a corrector for correcting a displacement in the translation axis direction value according...
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7536901 |
SPM sensor
An SPM sensor ( 1 ) for a scanning probe microscope with a cantilever ( 3 ), a holding element ( 2 ) at one end of the cantilever ( 3 ) and a sensor tip ( 4 ) at the other end of the cantilever ( 3...
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7534999 |
Quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope
A quantum beam aided atomic force microscopy and quantum beam aided atomic force microscope that can simultaneously perform atomic-level configuration observation and elemental analysis with the...
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7533561 |
Oscillator for atomic force microscope and other applications
A device such as a sensor for use in an atomic force microscope. The device comprises a first oscillator, a second oscillator, a pair of first co-axial members interconnecting the first and second...
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7531795 |
Scanning microscopy using resonant quantum tunneling
In accordance with the invention, resonant quantum tunneling microscopy allows surface imaging while allowing characterization of physical properties associated with the surface.
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7526949 |
High resolution coherent dual-tip scanning probe microscope
A high-resolution scanning probe microscope using a coherent dual-tip probe comprises two single-atom protrusions on a single crystal metal wire. As the dual-tip probe scans across the surface of a...
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7520165 |
Micro structure, cantilever, scanning probe microscope and a method of measuring deformation quantity for the fine structure
Highly efficient and highly sensitive sensors of small size are provided in desired position, desired shape and size for a micro structure that causes elastic deformation at least a part thereof....
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7519502 |
Surface profile measurement processing method
In one general aspect, a method of processing surface profile measurements includes obtaining a calibration image, the calibration image including one or more surface profile measurements at one or...
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7514680 |
Apparatus for modifying and measuring diamond and other workpiece surfaces with nanoscale precision
Apparatus and techniques are provided for modifying and measuring surfaces of diamond workpieces and other workpieces with nanoscale precision. The apparatus and techniques exploit scanning probe...
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