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8185968 |
Magnetic head inspection method and magnetic head manufacturing method
A magnetic head inspection method is provided with the step that an area smaller than a half of a scanning and measurement area of a magnetic probe in a cantilever unit of the MFM is set as a...
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8161805 |
Method and apparatus for obtaining quantitative measurements using a probe based instrument
A method includes determining the point at which a tip of a probe based instrument contacts a sample and/or the area of that contact by dynamically oscillating a cantilever of the instrument in...
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8161803 |
Micromachined comb drive for quantitative nanoindentation
A microelectromechanical (MEMS) nanoindenter transducer including a body, a probe moveable relative to the body, an indenter tip coupled to an end of the moveable probe, the indenter tip moveable...
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8156795 |
System and method for measuring surface energies
An apparatus (402) and method for measuring a surface energy of a test surface (12), which includes a viscoelastic polymer layer (20), disposed on a moveable component (34), that is compressed...
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8161568 |
Self displacement sensing cantilever and scanning probe microscope
A cantilever has a probe portion and a cantilever portion having a free end portion from which the probe portion extends. A displacement detecting portion detects a displacement of the cantilever...
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8156568 |
Hybrid contact mode scanning cantilever system
This invention addresses a contact mode hybrid scanning system (HSS), which can be used for measuring topography. The system consists of a cantilever or a cantilever array, a scanning stage, a...
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8136389 |
Probe tip assembly for scanning probe microscopes
A probe assembly for a scanning probe microscope (SPM), a cartridge for a probe assembly for an SPM, and a method of attaching a probe tip to an SPM are described.
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8141168 |
Scanning probe microscope and a method to measure relative-position between probes
A main object of the present claimed invention is to provide a scanning probe microscope that can recognize a relative position between multiple probes accurately. The scanning probe microscope...
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8140288 |
On-machine methods for identifying and compensating force-ripple and side-forces produced by actuators on a multiple-axis stage
Methods, apparatus, and systems are disclosed for identifying force-ripple and/or side-forces in actuators used for moving a multiple-axis stage. The identified force-ripple and/or side-forces can...
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8122761 |
Biosensor based on polymer cantilevers
A microcantilever sensor includes a supporting substrate, a cantilever spring element at least partially disposed over the support substrate, a probe layer disposed over the first side of the...
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8113038 |
Systems and methods for detecting a coating on an item such as a magnetic head
Systems and methods for detecting presence of a coating on an item such as a magnetic head. Points on a surface of the item are contacted with an electrically conductive object. A determination may...
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8111079 |
Conductivity measuring apparatus and conductivity measuring method
A conductivity measuring apparatus includes a probe base having a pair of electrodes disposed on respective opposite surfaces of a portion of the probe base. Observing and grasping probes are...
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8109135 |
Cantilever assembly
A cantilever assembly (1) comprises a cantilever (10) having a cantilever tip (11). The cantilever is mounted to a rigid support (12,120,121) and is provided on its back side with an area (110) of...
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8109007 |
Object profile sensing
A method for sensing an object profile shape involves relatively sweeping (whisking or translating) in angular or translational increments an elongated whisker element having a deflectable...
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8104332 |
Probe and cantilever
To provide a probe 1 for use in a cantilever 2 of an scanning probe microscope (SPM) manufacturable in a simple manufacturing process and usable while allowing full use of the properties of...
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8108942 |
Probe microscope
A probe microscope includes a cantilever having a probe, a displacement detecting optical system, an observation optical system, an objective lens, and a parallel glass. The displacement detecting...
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RE43117 |
Method of and apparatus for studying fast dynamical mechanical response of soft materials
The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much...
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8091143 |
Atomic force microscopy probe
A probe for atomic force microscopy (SM) comprising a micromechanical resonator (RMM) and a tip for atomic force microscopy (P1) projecting from said resonator, the probe being characterized in...
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8087289 |
High resolution surface potential microscope
A scanning probe system and method for using the same are disclosed. The system includes a probe that interacts with a specimen. The probe is caused to vibrate at a first frequency of the probe. A...
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8087288 |
Scanning stylus atomic force microscope with cantilever tracking and optical access
A scanned-stylus atomic force microscope (AFM) employing the optical lever technique, and method of operating the same. The AFM of the invention includes a light source and a scanned optical...
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8074291 |
Harmonic correcting controller for a scanning probe microscope
A scanning probe microscope and method for operating the same to correct for errors introduced by a repetitive scanning motion are disclosed. The microscope includes an actuator that moves the...
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8065908 |
Scan type probe microscope
Provided is an atomic force microscope capable of increasing the phase detection speed of a cantilever vibration. The cantilever (5) is excited and the cantilever (5) and a sample are relatively...
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8060943 |
Carbon nanotube oscillator surface profiling device and method of use
The proposed device is based on a carbon nanotube oscillator consisting of a finite length outer stationary nanotube and a finite length inner oscillating nanotube. Its main function is to measure...
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8056402 |
Nanoprobe tip for advanced scanning probe microscopy comprising a layered probe material patterned by lithography and/or FIB techniques
By forming an appropriate material layer, such as a metal-containing material, on a appropriate substrate and patterning the material layer to obtain a cantilever portion and a tip portion, a...
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8051493 |
Probe microscopy and probe position monitoring apparatus
A method of determining the position of a probe tip. An evanescent electromagnetic field is generated extending beyond an interface boundary between a first medium, having a first refractive index,...
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8042383 |
Digital Q control for enhanced measurement capability in cantilever-based instruments
A digital system for controlling the quality factor in a resonant device. The resonant device can be any mechanically driven resonant device, but more particularly can be a device that includes a...
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8046843 |
Nanometer scale instrument for biochemically, chemically, or catalytically interacting with a sample material
An instrument includes a probe having a porous tip, a tip positioning apparatus to position the tip with respect to a sample material, a probe positioning apparatus to position the probe and sample...
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8034641 |
Method for inspection of defects on a substrate
A method for inspection of defects on a substrate includes positioning a probe of a scanning probe microscopy (SPM) over and spaced apart from a substrate, includes scanning the substrate by...
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8028567 |
AFM tweezers, method for producing AFM tweezers, and scanning probe microscope
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a...
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8024963 |
Material property measurements using multiple frequency atomic force microscopy
Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs...
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8011230 |
Scanning probe microscope
A scanning probe microscope, capable of performing shape measurement not affected by electrostatic charge distribution of a sample, which: monitors an electrostatic charge state by detecting a...
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8011016 |
SPM probe with shortened cantilever
An SPM probe with an elongated support element and a cantilever projecting beyond the front face of the support element and carrying a scanning tip, with the cantilever arranged at a front face...
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8001830 |
High frequency deflection measurement of IR absorption
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would...
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8006316 |
Scanning ion conductance microscopy for the investigation of living cells
A method for interrogating a surface using scanning probe microscopy comprises bringing a scanning probe into proximity with the surface and controlling the position of the probe relative to the...
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8003939 |
Foreign matter or abnormal unsmoothness inspection apparatus and foreign matter or abnormal unsmoothness inspection method
A foreign matter detecting apparatus includes a detecting device for detecting foreign matter by measuring smoothness of a surface of an object undergoing measurement, a marking device for...
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8001831 |
Positioning apparatus and scanning probe microscope employing the same
There is provided a scanning probe microscope employing a positioning apparatus M1 including a unit to be driven in XY direction having a substantially square form in plane geometry at the center...
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7997125 |
Miniaturized spring element and method for producing the spring element
A miniaturized spring element is intended to be particularly suitable for use as a beam probe or cantilever for detecting atomic or molecular forces, in particular in an atomic force microscope,...
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7997124 |
Scanning probe microscope
A scanning probe microscope has a cantilever mounted to undergo oscillation movement over a surface of a sample. The cantilever has a probe on a distal end thereof. A Z-axis controlling amount...
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7997126 |
Texture measuring apparatus and method
A texture measuring apparatus that measures surface information of an object includes: a probe coming into contact with the object while moving on a surface of the object; a first sensor unit,...
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7997123 |
Nanotipped device and method
A dispensing device has a cantilever comprising a plurality of thin films arranged relative to one another to define a microchannel in the cantilever and to define at least portions of a dispensing...
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7992431 |
Piezoelectric microcantilevers and uses in atomic force microscopy
The invention is direct to a piezoelectric microcantilever for static contact and dynamic noncontact atomic force microscopy which may be carried out in solution. The piezoelectric microcantilever,...
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7987703 |
Tweezer-equipped scanning probe microscope and transfer method
A tweezer-equipped scanning probe microscope comprises a first arm with a probing portion, a second arm that moves along an opening direction or a closing direction relative to the first arm, an...
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7975316 |
Atomic force microscope and interaction force measurement method using atomic force microscope
A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a ΔfLR derived from a long-range interaction force and a ΔfSR derived from a short-range interaction fo...
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7966867 |
Scanning probe microscope
The invention provides a scanning probe microscope capable of performing highly accurate three-dimensional profile measurement in a state in which no sliding of the probe or deformation of the...
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7971266 |
Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope
The present invention relates to a method for providing a measuring probe (1, 1a, 2) for a probe microscopic examination of a sample in a probe microscope, in particular a scanning probe...
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7963153 |
Non-destructive ambient dynamic mode AFM amplitude versus distance curve acquisition
A method, a system and a computer readable medium for dynamic mode AFM amplitude versus distance curve acquisition. In an embodiment, a constant force feedback mechanism is enabled prior to the...
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7960695 |
Micromachined electron or ion-beam source and secondary pickup for scanning probe microscopy or object modification
An e-beam or ion beam imaging and exposure system is built into the end of an AFM cantilever which images using the scanning capabilities built into the AFM. In one embodiment, a boron doped...
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7958775 |
Triboacoustic probe
The invention relates to a sensor for the quantitative measurement of the feel of a surface, comprising a prehensile envelope, a hollow contact body for bringing into contact with the surface on a...
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7962966 |
Scanning probe microscope having improved optical access
A scanning probe microscope and method for using the same are disclosed. The Scanning probe microscope includes a probe mount for connecting a cantilever arm and a probe signal generator. The probe...
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7958776 |
Atomic force gradient microscope and method of using this microscope
A scanning probe microscope in which the probe is oscillated at a frequency lower than its resonant frequency, a force sensor that is sensitive to the bending of the cantilever and minimally...
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