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6566653 |
Investigation device and method
An investigation device includes a time of flight mass spectrometer with an entrance opening, and an electrically conductive tip on a cantilever which is movable from a first position near a sample...
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6559458 |
Measuring instrument and method for measuring features on a substrate
A measuring instrument ( 100 ) and a method for measuring features ( 19 ) on a substrate ( 9 ) are described. The measuring instrument ( 100 ) has a support element ( 15 ) that is provided opposite...
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6557399 |
Advanced glidehead sensor for small slider
A disk surface asperities tester including a glidehead member having a piezoelectric sensor fabricated directly on the glidehead member. The piezoelectric sensors are useful in applications...
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6552339 |
Micro goniometer for scanning probe microscopy
A goniometer for performing scanning probe microscopy on a substrate surface is disclosed. The goniometer has a cantilever, having a cantilevered end and a supported end and a tip disposed at the...
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6552337 |
Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements
Embodiments of the present invention provide methods for measuring a wafer surface. A portion of the wafer surface is measured using a particle counter to provide first measurements corresponding...
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6546788 |
Nanotomography
The invention relates to a device for determining the spatial distribution of properties of a notably heterogeneous sample ( 1 ). The device comprises: a microscope ( 2 ) having a control ( 21 )...
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6545263 |
Scanning probe microscope with probe integrated in an optical system
An illumination device for a light microscope comprises a scanning microscope probe which is integrated in the center thereof. A scanning probe microscope comprising such illumination device is...
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6545273 |
Use of multiple tips on AFM to deconvolve tip effects
The present invention comprises a system for deconvolving tip effects associated with scanning tips in scanning probe microscopes and other scanning systems. The system comprises a scanning system...
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6536265 |
Micro-textured glide sliders for super-smooth media
The present invention includes the realization that air bearing surface (ABS) microtexturing (i.e., the production of well-defined texture patterns on an ABS) affords an effective method to control...
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6532805 |
Micro-material testing apparatus
An atomic force microscope including a cantilever, a transferring device and a displacement detecting device is used for conducting a material test of a test member based on a load amount and a...
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6535464 |
Magneto-optic head with burnishing feature
A magneto-optical head assembly includes waffle-like burnishing features incorporated into the air bearing surfaces of the head assembly. The magneto-optical mesa, or operative feature of the...
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6532806 |
Scanning evanescent electro-magnetic microscope
A novel scanning microscope is described that uses near-field evanescent electromagnetic waves to probe sample properties. The novel microscope is capable of high resolution imaging and...
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6530267 |
Scanning system having a deflectable probe tip
The invention is directed to a scanning system having one or several deflectable probe tips which are excited to oscillation at or near their resonant frequency. A saturation amplifier ( 16 ) is...
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6526815 |
Glide head assembly and test device utilizing the same
A glide head assembly associated with a mounting structure is adapted for use with a test system for testing a presence of asperities on a moving system and comprises an elongated flexure, a slider...
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6528785 |
Fusion-welded nanotube surface signal probe and method of attaching nanotube to probe holder
The fusion-welded nanotube surface signal probe of the present invention is constructed from a nanotube, a holder which holds the nanotube, a fusion-welded part fastening a base end portion of the...
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6515274 |
Near-field scanning optical microscope with a high Q-factor piezoelectric sensing element
A perpendicular-mode near-field scanning optical microscope (NSOM) utilizing a piezoelectric micro tuning fork as its height-sensing element is described. The present invention provides a method...
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6510363 |
Surface texture measuring apparatus
A surface texture measuring apparatus allowing effects of vibration disturbance to be removed and a highly accurate measurement to be achieved. The surface texture measuring apparatus is further...
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6508110 |
Atomic force microscope
A tapping mode atomic force microscope includes a sinusoidal signal generator. The sinusoidal signal generator generates sinusoidal wave signals to a modulating laser diode for outputting a pulsed...
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6504152 |
Probe tip configuration and a method of fabrication thereof
A probe tip configuration, being part of a probe (FIG. 2 ) for use in a scanning proximity microscope, is disclosed, comprising a cantilever beam ( 1 ) and a probe tip. Said tip comprises a first...
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6504151 |
Wear coating applied to an atomic force probe tip
A probe tip manufactured from a conically shaped quartz tip etched to a fine apex. The quartz tip is coated with about 1 μm of a hard material such as silicon nitride. A probe tip having...
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6505141 |
Transducer circuit
A position-to-electrical transducer circuit primarily intended for use in meteorological instruments for measuring a characteristic of a surface of a workpiece. An excitation signal generator...
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6499340 |
Scanning probe microscope and method of measuring geometry of sample surface with scanning probe microscope
A measuring method and apparatus of a scanning probe microscope which is easy to initially set caused by exchanging a cantilever. A cantilever is effected of Z rough movement while forcibly...
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6497141 |
Parametric resonance in microelectromechanical structures
MEM structures which may be driven at parametric frequencies to provide stable operation and to permit precise switching between stable and unstable operations by very small changes in the drive...
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6494085 |
Method and system for detecting thermal asperity on discs used in a disc drive
A method and system for providing adaptive threshold levels for detecting thermal asperities where a unique threshold level is determined for each head. In addition, a unique threshold level is...
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6490912 |
Probe for sensing the characteristics of a surface of a workpiece
The invention pertains to a probe for sensing the characteristics of a surface of a workpiece which contains a probe tip that is movably held and prestressed essentially in the direction of the tip...
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6490913 |
Humidity chamber for scanning stylus atomic force microscope with cantilever tracking
The present invention provides a novel humidity chamber suitable for use with an atomic force microscope (AFM). The humidity chamber of the present invention employs an intricate geometrical design...
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6487897 |
Detector for surface texture measuring instrument
An arm member ( 52 ) detachably provided with a stylus arm ( 53 ) is rotatably held by a casing ( 11 ), where pivots ( 68 ) respectively project from both sides of a rotation center of the arm...
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6487515 |
Method and apparatus for measuring thermal and electrical properties of thermoelectric materials
A method and apparatus for measuring and characterizing microscopic thermoelectric material samples using scanning microscopes. The method relies on concurrent thermal and electrical measurements...
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6484571 |
Surface configuration measuring method
A surface configuration measuring method is provided, the surface configuration measuring method being characterized in having the steps of: moving a touch signal probe by a command velocity vector...
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6470738 |
Rotating probe microscope
In a probe microscope 120 for causing a sample 112 and a tip portion 118 a of a probe 118 on the sample side to approach each other, detecting an interaction between the sample 112 and...
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6455847 |
Carbon nanotube probes in atomic force microscope to detect partially open/closed contacts
The present invention relates to a system for measuring a linewidth or profile of a feature and comprises a scanning probe microscope having a nanotube scanning tip. The nature of the nanotube...
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6453730 |
Surface texture measuring instrument, surface texture measuring method and stylus radius measuring instrument
A Stylus 1 is moved along the surface of a workpiece 20 and the surface texture of the workpiece 20 is measured based on the displacement of the stylus 1 in the Z direction. A spherical...
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6450016 |
Stylus support assembly with flexed ligament hinge
A stylus support assembly for a gauge for a metrological instrument which has a main gauge body and a mounting block for supporting a stylus. The main gauge body and the mounting block each have...
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6452170 |
Scanning force microscope to determine interaction forces with high-frequency cantilever
An apparatus and method for determining a force of interaction between a sample and a tip on a cantilever. The method uses a non-Hookian equation to model the cantilever as it is deflected by the...
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6448553 |
Signal detector to be used with scanning probe and atomic force microscope
A scanning probe having a piezo resistance cantilever section is used with a signal detector comprising a signal detection circuit for detecting a change in the piezo resistance and a circuit for...
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6446496 |
Surface texture measuring instrument
A surface texture measuring instrument has a pre-load leaf spring ( 41, 42 ) for biasing a detector ( 10 ) having a skid ( 14 ) at a distal end thereof, a pre-load force controller ( 47 ) for...
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6441371 |
Scanning probe microscope
The present invention relates to a two-phase scanning method and apparatus for obtaining information necessary to analyze physical properties of materials using a scanning probe microscope. The...
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6435015 |
Scanning probe microscope
A scanning probe microscope having a cantilever probe is provided with a probe supply mechanism for supplying cantilever probes to a probe attaching portion of the microscope. The cantilever probes...
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6437562 |
Magnetic field characteristics evaluation apparatus and magnetic field characteristics measuring method
There is disclosed a magnetic field characteristics evaluation apparatus for turning off a switching signal, measuring the surface of a magnetic field generating member in a magnetized state by...
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6435014 |
Method for determination of surface texture
Method for determination of surface textures by a specified quantification of a maximal height of profile parameter (Rz) and a profile mean wavelength parameter (RSm).
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6435016 |
Head gimbal assembly, test device and slider for use therewith
A slider for use during production of a rigid memory disk comprises a rigid body fabricated from a single phase material having a fracture toughness greater than 4 MPam 0.5 . A head gimbal assembly...
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6425285 |
Drive unit
A slider holding a measuring tool moves along an approximately reverse U-shaped guide rail provided in parallel with a moving direction of the measuring tool without being rotated. Accordingly, a...
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6422069 |
Self-exciting and self-detecting probe and scanning probe apparatus
A scanning probe apparatus and a self-exciting cantilever probe therefor are provided for measuring a characteristic of a sample by scanning a lever of the probe across the sample surface. The...
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6415654 |
Scanning probe microscope system including removable probe sensor assembly
A scanning force microscope system that employs a laser ( 76 ) and a probe assembly ( 24 ) mounted in a removable probe illuminator assembly ( 22 ), that is mounted to the moving portion of a...
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6415653 |
Cantilever for use in a scanning probe microscope
A cantilever for use in a scanning probe microscope includes a lever portion having a probe portion made from a semiconductor substrate. The length and thickness directions of the lever portion are...
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6405583 |
Correlation sample for scanning probe microscope and method of processing the correlation sample
A correlation sample of scanning probe microscope enable to detect correctly each force performing as a standard without influence of irregular data of surface of the sample. Photo-resist film is...
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6405584 |
Probe for scanning probe microscopy and related methods
A scanning probe microscope includes a sensor head adjacent a stage for holding a sample, a scanning actuator for positioning the sensor head relative to the sample, and a probe carried by the...
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6401526 |
Carbon nanotubes and methods of fabrication thereof using a liquid phase catalyst precursor
Single-walled carbon nanotube (SWNT) probe-tips for atomic force microscopy (AFM) are realized by direct synthesis of SWNTs on silicon pyramids integrated onto AFM cantilevers. The growth of SWNT...
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6401020 |
Process and device for controlling headlight range of a motor vehicle
Device for control of headlight range of a motor vehicle including a front axle transmitter ( 1 ) and a rear axle transmitter ( 2 ), which generate signals depending on a position of a vehicle...
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6397667 |
Surface property measuring device
A surface property measuring device includes a detector having a stylus, and a driving mechanism for causing the detector to advance and retreat along a surface to be measured. The measuring device...
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