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5614712 |
Method of engaging the scanning probe of a scanning probe microscope with a sample surface
A method for initially positioning the scanning probe of a scanning probe microscope includes the steps of initially using fine position control to reduce the distance between probe and sample and,...
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5614662 |
Apparatus and method for measuring a paper surface roughness
Subjective paper characteristics such as visual appearance and print quality are often objectively related to certain scales of surface roughness. Three dimensional topographic surface data is...
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5614663 |
Cantilever for use with atomic force microscope and process for the production thereof
The improved cantilever for use with an atomic force microscope comprises a single-crystal silicon base 11 having adequate mechanical strength, a cantilever beam 12 that is made from a silicon...
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5612491 |
Formation of a magnetic film on an atomic force microscope cantilever
A thin film of a magnetic material is applied to one or both surfaces of a force sensing cantilever for use in a scanning force microscope. The cantilevers are then placed between the poles of an...
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5610326 |
Non-destructive process for characterizing the surface condition of a part
A process for checking the surface condition of a part, particularly in areas which are difficult to access, comprises making a rough preliminary imprint of the surface using an elastomeric...
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5606162 |
Microprobe for surface-scanning microscopes
The invention provides, for a surface-scanning microscope, a probe having comparable stiffness in respect of deflections in two different directions, namely the direction towards and away from the...
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5602329 |
Method and apparatus for measuring fracture toughness of a material
A method is provided for determining the fracture toughness of a material based upon observation of crack opening displacement (COD) as a function of distance from the tip of a crack generated in...
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5602330 |
Non-contact force microscope having a coaxial cantilever-tip configuration
The present invention comprises a highly sensitive non-contact force microscope having a coaxial cantilever-tip configuration and a method of forming such configuration. The non-contact microscope...
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5596140 |
Method of monitoring vibrations in vehicles
A method of monitoring for misfire in an internal combustion engine of a vehicle includes sensing vibration of the vehicle by sensing the movement of liquid in a liquid reservoir e.g. by using the...
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5596203 |
System and method for detecting the relative position and motions between a rail vehicle and track
A detecting system for rail vehicles having at least one sprung rigid structure, for instance a bogie frame, and two axles, comprises photosensor position-detecting means applied to the structure...
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5591903 |
Reconstructing the shape of an atomic force microscope probe
A method of reconstructing the shape of an atomic force microscope. The shape of the probe, which is represented by a tip function, is derived from an image taken of a colloidal gold ball by the...
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5583286 |
Integrated sensor for scanning probe microscope
A piezoresistive layer extends in the middle of a cantilever extending from a support section. The cantilever is made of n type silicon and is covered with a silicon oxide film. Electrodes are...
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5581083 |
Method for fabricating a sensor on a probe tip used for atomic force microscopy and the like
Nanometer holes can be reliably and repeatedly defined in the tips of cantilevered probes and used in various types of scanning microscopy by voltaicly defining the hole within a conductive layer...
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5581193 |
Multiple source and detection frequencies in detecting threshold phenomena associated with and/or atomic or molecular spectra
Multiple frequency sources are used to apply a time varying signal to a scanning tunneling microscope and a current or voltage passing between the electrodes of the microscope is measured by a...
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5581082 |
Combined scanning probe and scanning energy microscope
A combined scanning probe and scanning energy microscope, in which the same scanning system is used for both the scanning probe and scanning energy images. A sample is translated substantially...
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5581021 |
Method and apparatus for optimizing piezoelectric surface asperity detection sensor
Disclosed is a method and apparatus for sensing the vibrational response of a slider of predetermined dimensions during contact with one or more surface asperities on a recording surface,...
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5579230 |
Vehicle speed estimation for antilock braking using a chassis accelerometer
Before braking occurs the speed of non-driven wheels is monitored and averaged to determine vehicle speed and an integrator is initialized with that speed. Acceleration is periodically calculated...
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5578745 |
Calibration standards for profilometers and methods of producing them
Adjacent shaped grooves are placed in single crystal structure with great accuracy and known dimensions by a combination of anisotropic and isotropic etching to produce a scanning probe microscope...
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5576956 |
Auxiliary steering angle control system for vehicle
An auxiliary steering angle control system for a vehicle comprises a vehicle condition detecting section for detecting a vehicle condition, a desired motion variable calculating section for...
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5576483 |
Capacitive transducer with electrostatic actuation
High precision force imparting and/or a force (including weight) and displacement measuring/indicating device which includes a multi-plate capacitor transducer system. The transducer may be used...
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5567872 |
Scanning atomic force microscope
A scanning atomic force microscope includes a probe arranged near a sample surface to oppose the sample surface, a support device for supporting the prove, a moving mechanism for moving the probe...
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5565623 |
Method and means for measuring wear in constant velocity joints
A computerized gauge for efficiently measuring surface profiles of tracks of constant velocity joints in order to detect defects in the surfaces when rebuilding CV joints. The race is mounted on a...
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5555632 |
Apparatus for measuring the contours of a wheel
An apparatus for measuring the contours of a railroad wheel which contains a tool slide, a measuring arm pivotally attached to the tool slide, a measuring wheel rotatably attached to the measuring...
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5553487 |
Methods of operating atomic force microscopes to measure friction
A method of operating an atomic force microscope having a probe tip attached to a free end of a lever which is fixed at its other, wherein the probe tip is scanned in forward and reverse directions...
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5551906 |
Caliper assembly for grinder
A caliper assembly for a grinding apparatus includes a pair of spaced apart, moveable, caliper arms for measuring a dimension of a workpiece held in the grinding apparatus. The caliper arms are...
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5539592 |
System and method for monitoring friction between head and disk to predict head disk interaction failure in direct access storage devices
A system for predicting the failure of a storage unit, such as a disk drive. In a most general sense, the inventive system includes a first mechanism (20, 22, 24) for moving an element (16) over a...
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5537863 |
Scanning probe microscope having a cantilever used therein
A scanning probe microscope according to present invention comprises a cantilever for interaction with a surface, the cantilever having a self vibrator therein for vibrating the cantilever, the...
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5535143 |
Rolling digital surface measurement apparatus
A rolling digital surface measurement apparatus which measures and records the second elevation differences between a plurality of sequentially oriented, regularly spaced, co-linear points which...
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5533387 |
Method of evaluating silicon wafers
The height x i (i=1, 2, . . . , N) of a plurality of measuring points on a silicon wafer from a reference plane is measured by means of an AFM (atomic force microscope), the autocorrelation...
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5531632 |
Apparatus for detecting the surface of a member to be ground, method of manufacturing feelers, and automatic inspection/grinding apparatus
An apparatus for detecting a surface of a member to be ground in which feelers are disposed on, or in close proximity to, the surface of the member to be ground, a sensor detects the displacement...
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5524479 |
Detecting system for scanning microscopes
A scanning probe microscope is provided with a piezo-ceramic tube to carry the sensitive probe at its free end to translationally move the probe in the X and Y directions. Large stationary surfaces...
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5515719 |
Controlled force microscope for operation in liquids
An atomic force microscope in which the deflection of the force sensing probe owing to surface forces is canceled by an opposing magnetic force applied to a small magnetic particle on a force...
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5513518 |
Magnetic modulation of force sensor for AC detection in an atomic force microscope
In a scanning force microscope a thin film of a magnetic material is applied to one or both surfaces of a force sensing cantilever. The cantilevers are then placed between the poles of an...
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5507179 |
Synchronous sampling scanning force microscope
The synchronous sampling scanning force microscope includes a reflective cantilever arm having a free end which is oscillated at a frequency different from the resonance frequency of the cantilever...
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5505075 |
Method for recognizing stretches of rough road with the aid of a tank pressure sensor
A method for recognizing stretches of rough or bad road includes recognizing tank pressure values at successive evaluation instants. A change in tank pressure is ascertained from successive tank...
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5503010 |
Directional atomic force microscope and method of observing a sample with the microscope
An atomic force microscope includes a vibrator which imparts vibration between a probe and a sample such that a relative vertical vibration and a relative lateral vibration are superimposed. A...
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5500535 |
Stress cell for a scanning probe microscope
A novel stress cell for applying stress in-situ to a sample in a scanning probe microscope. It has a loading clamp mounted on a sample stage which is magnetically mounted to a scanning tunneling...
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5497656 |
Method of measuring a surface profile using an atomic force microscope
An atomic force microscope is preferably used to observe a sample surface and measure a surface profile of a sample by making use of interatomic forces existing between a probing tip and the sample...
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5488857 |
Protrusion sensor for sensing protrusion on a disc
A protrusion sensor according to the present invention comprises a protrusion sensing head, a suspension spring having a front end portion fixedly mounting the protrusion sensing head and a rear...
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5489774 |
Combined atomic force and near field scanning optical microscope with photosensitive cantilever
A combined atomic force and near field microscope assembly for atomic level inspection of a target object. The assembly includes a scanning probe with a sharp tip and a photosensitive region on its...
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5483822 |
Cantilever and method of using same to detect features on a surface
A microminiature cantilever structure is provided having a cantilever arm with a piezoresistive resistor embedded in at least the fixed end of the cantilever arm. Deflection of the free end of the...
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5477732 |
Adhesion measuring method
An adhesion measuring apparatus includes a measuring device for measuring a Force-Curve at each of multiple measuring points on a sample surface using a cantilever provided at its distal end with a...
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5476006 |
Crystal evaluation apparatus and crystal evaluation method
Crystal evaluation apparatus is disclosed which includes a cell region having an anode and a cathode, a reservoir tank for supplying of an aqueous solution for forming an anodic oxide film in the...
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5473257 |
Feed rate measuring method and system
A system and method are provided for establishing the feed rate of a workpiece along a feed path with respect to a machine device. First and second sensors each having first and second sensing...
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5469733 |
Cantilever for atomic force microscope and method of manufacturing the cantilever
A cantilever for an atomic force microscope includes a probe and a cantilever body supporting the probe, the probe deflecting in response to an atomic force between said probe and a sample, at...
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5467642 |
Scanning probe microscope and method of control error correction
A scanning probe microscope in which the deflection of a cantilever caused by the proximity between a stylus and a sample is detected, the relative distance between the sample and a probe at which...
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5468959 |
Scanning probe microscope and method for measuring surfaces by using this microscope
A microscope comprises a cantilever having a distal end equipped with an electrically conductive probe allowing current to flow and having a fine tip whose voltage is controllable, a position...
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5465611 |
Sensor head for use in atomic force microscopy and method for its production
A sensor head (1) is described, which has a spacer (5b) between a carrier element (2) and the spring arm (7), which, perhaps carries a sensor tip (9) at the free end; the spacer defines the...
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5466935 |
Programmable, scanned-probe microscope system and method
Scanned-probe microscope systems (20, 140) are disclosed with analog control loops (24, 144) that can be electronically programmed to select from a plurality of transfer functions. The amplitude of...
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5461907 |
Imaging, cutting, and collecting instrument and method
Instrumentation and techniques to image small objects, such as but not limited to individual human chromosomes, with nanometer resolution, to cut-off identified parts of such objects, to move...
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