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5939623 |
Scanning type near field interatomic force microscope
A scanning type near field interatomic force microscope of the type having a hook-shaped probe formed of a light transmitting material and having a sharpened tip portion with a transmitting hole...
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5936237 |
Combined topography and electromagnetic field scanning probe microscope
A combined near-zone electromagnetic field and topography probe based on a scanning-probe microscope (SPM). One or a plurality of sub-wavelength electromagnetic antennas and waveguides are...
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5929326 |
Glide sensor integrated suspension
A glide sensor suspension assembly for supporting a glide sensor having a slider and a sensor element. The suspension assembly comprises a load beam support member having a load dome projection at...
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5925818 |
Method and apparatus for magnetic force control of a scanning probe
A method and apparatus of magnetic force control for a scanning probe, wherein a first magnetic source having a magnetic moment is provided on the scanning probe and a second magnetic source is...
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5923033 |
Integrated SPM sensor having a photodetector mounted on a probe on a free end of a supported cantilever
An integrated SPM sensor including a cantilever having a probe on its free end, a supporting base for supporting the cantilever on its fixed end, and signal lines for conducting a signal picked up...
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5915271 |
Head/disc force transducer
An apparatus, and method of forming the same, for measuring a head-to-disc contact force in a magnetic disc storage system are disclosed. A slider body of the head has a trailing edge and an air...
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5908981 |
Interdigital deflection sensor for microcantilevers
A deflection sensor for a microcantilever includes two sets of interdigitated fingers, one (reference) set being attached to the substrate from which the microcantilever extends and the other...
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5907096 |
Detecting fields with a two-pass, dual-amplitude-mode scanning force microscope
A scanning probe microscope is used as an atomic force microscope during a first pass of a vibrating probe tip along a line extending along a sample surface, with data representing topographical...
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5905260 |
Triboluminescent damage sensors
A damage sensor for detecting damage within a structure such as aircraft wings or fuselage, or a bridge. The sensor comprises a small piece of a triboluminescent material connected via light...
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5902928 |
Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator
A scanning probe microscope includes a segmented piezoelectric actuator having a course segment and a fine segment, the outputs of which are combined to determine the movement of a distal end of...
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5898106 |
Method and apparatus for obtaining improved vertical metrology measurements
A probe-based surface characterization or metrology instrument such as a scanning probe microscope (SPM) or a profilometer is controlled to account for errors in the vertical positioning of its...
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5892223 |
Multilayer microtip probe and method
A multilayer microtip probe, and method of manufacture, having a microtip prepared for adhesion of a first overlayer for determining probe operating properties and a hardened protective overlayer...
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5883387 |
SPM cantilever and a method for manufacturing the same
An SPM cantilever comprises a cantilever portion shaped as a thin plate and extending between a proximal end and a free end, a supporting portion attached to one surface of the cantilever portion...
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5883705 |
Atomic force microscope for high speed imaging including integral actuator and sensor
A cantilever for a scanning probe microscope (SPM) includes a piezoelectric element in a thicker, less flexible section near the fixed base of the cantilever and a piezoresistor in a thinner, more...
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5880360 |
Method for imaging liquid and dielectric materials with scanning polarization force microscopy
The invention images dielectric polarization forces on surfaces induced by a charged scanning force microscope (SFM) probe tip. On insulators, the major contribution to the surface polarizability...
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5877412 |
Probe for atomic force microscope and atomic force microscope
A probe for an atomic force microscope comprises a body having a cantilever portion and a probe portion made from a single-crystal material. The probe portion has a tip formed as a vertex of three...
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5874669 |
Scanning force microscope with removable probe illuminator assembly
A scanning force microscope employs a laser (76) which creates a laser beam (26). The laser and a probe assembly (24) are mounted in a removable probe illuminator assembly (22). The removable probe...
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5874668 |
Atomic force microscope for biological specimens
An atomic force microscope for quantitative imaging and identification, at the molecular or submolecular level, biomolecules or subunits of biomolecules in a physiologic environment, through use of...
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5872311 |
Integrated piezoelectric and thermal asperity transducers for testing disc media in high performance disc drives
A device for testing smoothness of a rotatable disc is disclosed. A slider body has a trailing edge surface and an air-bearing surface for gliding over a surface of the disc when the disc is...
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5869751 |
Multi-dimensional capacitive transducer
High precision force imparting and/or a force (including weight) and displacement measuring/indicating device which includes a multi-dimensional capacitor transducer system. The multi-dimensional...
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5866806 |
System for locating a feature of a surface
A probe tip of a scanning probe microscope or a profilometer is scanned across a surface in a contact, non-contact, or intermittent contact mode to sense the presence of a feature to be located....
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5866805 |
Cantilevers for a magnetically driven atomic force microscope
A force sensing cantilever for use in a scanning probe microscope has both a top side and a bottom side. From the bottom side extends a probe tip. The bottom side is coated with a thin film of a...
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5866807 |
Method and apparatus for measuring mechanical properties on a small scale
The mechanical properties of a surface are measured by using a pointed tip on the end of a bendable cantilever such that with force on the other end of the cantilever the tip can be pushed into the...
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5863237 |
Low speed burnishing of asperities in a disc drive
A method of and apparatus for burnishing a surface of a magnetic disc of a disc drive are disclosed. The disc drive has a data head and an actuator supporting the head as the head flies above the...
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5861550 |
Scanning force microscope
A scanning force microscope (10) sometimes referred to as an atomic force microscope employs a laser (32) and a cantilever (28) which move proportionally to a moving reference frame (64). A fixed...
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5859364 |
Scanning probe microscope
A slide glass with a sample rested thereon is placed on an interior total reflection prism with a matching oil between them. A laser beam is applied through a prism to the sample, and evanescent...
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5856617 |
Atomic force microscope system with cantilever having unbiased spin valve magnetoresistive strain gauge
An atomic force microscope (AFM) uses a spin valve magnetoresistive strain gauge formed on the AFM cantilever to detect deflection of the cantilever. The spin valve strain gauge operates in the...
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5852232 |
Acoustic sensor as proximity detector
An acoustic sensor used with a first sensor (such as a profilometer, scanning probe microscope or the like) allows for the positioning of the first sensor with respect to the sample. The acoustic...
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5852233 |
Acoustic microscope with a control and data capturing device
An acoustic microscope allowing both the topography and the elasticity of a sample to be measured at the same time. To this end the displacement of a cantilever with a tip is measured by the...
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5850038 |
Scanning probe microscope incorporating an optical microscope
A scanning probe microscope includes a unit for an SPM measurement on a sample and an optical system for observation of at least the sample. The SPM measurement unit includes a cantilever having a...
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5847383 |
Approaching device of scanning probe microscope
Light is reflected from a cantilever, and the reflected light, except that part which is reflected from the back of the cantilever, is applied to a light-receiving device. A distance between the...
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5847270 |
Stylus attachment for a metrological instrument
An arrangement for mounting a stylus on a stylus support for a metrological instrument includes a camming pin on a mounting disc of the stylus support, which passes through a mounting hole in a...
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5838005 |
Use of focused ion and electron beams for fabricating a sensor on a probe tip used for scanning multiprobe microscopy and the like
Nanometer holes can be reliably and repeatedly defined in the tips of cantilevered probes and used in various types of scanning multiprobe microscopy by defining the hole within a layer disposed on...
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5834644 |
Automatic atomic force microscope with piezotube scanner
An atomic force microscope which can provide an automatic operation of focusing a laser beam onto a cantilever of the atomic force microscope, and which can ensure that a laser beam reflected off...
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5834643 |
Capacitive auto-sensing micro-probe
The present invention discloses a capacitive-type auto-sensing micro-probe used in high-sensitivity sensor elements. The micro-probe is constructed by semiconductor process technology using solid...
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5834645 |
Methods and apparatus for the in-process detection of workpieces with a physical contact probe
An apparatus for detecting the presence of extraneous material on a polishing pad during a chemical mechanical planarization (CMP) process uses a contact probe assembly. The contact probe assembly...
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5831153 |
Investigation and/or manipulation device for a sample in fluid
An investigation and/or manipulation device for a sample which is located in a container fluid includes an investigation and/or manipulation tool which is mounted at a first of a cantilever and...
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5831181 |
Automated tool for precision machining and imaging
A modified Atomic Force Microscope (AFM), which can machine and image the surface of a sample with nanometer precision in all three orthogonal directions by varying the depth-of-cut of the sample....
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5831264 |
Electrostrictive actuator for scanned-probe microscope
The electrostrictive actuator device of the present invention, which controls relative movement in a scanned-probe microscope between the tip of a probe and the surface of a sample, comprises two...
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5825020 |
Atomic force microscope for generating a small incident beam spot
An atomic force microscope utilizing an optical system having a numerical aperture sufficient with the wavelength of light of an incident beam to form a spot on the cantilever having a size of 8...
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5822876 |
Surface displacement measurement gauge
A gauge for measuring an out-of-plane surface displacement profile around a cold-worked fastener hole in relation to the distribution of residual compressive stresses around the hole and related...
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5825670 |
High precison calibration and feature measurement system for a scanning probe microscope
The present invention allows for calibration of a scanning probe microscope under computer control. The present invention comprehends either the removal of nonlinear artifacts in the microscope...
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5821410 |
Scanning tip microwave near field microscope
A microwave near field microscope has a novel microwave probe structure wherein the probing field of evanescent radiation is emitted from a sharpened metal tip instead of an aperture or gap. This...
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5821409 |
Scanning near-field optic/atomic-force microscope with observing function in liquid
A scanning near-field optic/atomic-force microscope comprises a holder for holding a sample immersed in a liquid, and a plate disposed over the holder for covering a surface of the liquid and for...
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5817931 |
Glide detect head with predictable asperity contact region
A glide detect head includes a slider and a transducer. The slider includes a slider body with a leading edge, a trailing edge, and a slider surface therebetween. Substantially parallel rails are...
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5817936 |
Method for detecting an abnormal condition of a road surface by trending a resistance factor
A method for detects a change in the condition of a road traversed by a fleet of at least one mobile machine. The method includes the steps of sensing a plurality of machine parameters as the...
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5814722 |
System for measurement of peaks on surfaces
A method of characterizing the roughness of a surface comprises counting peaks on a surface using a sensor by locating direction changes above a minimum and searches for the next direction change...
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5808184 |
Thermal asperity sensor head with multiple spaced asperity sensors
An asperity sensing head is used for detecting asperities on the surface of a disc while the disc is rotated. The asperity sensing head includes a slider body having a first rail and an air bearing...
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5804708 |
Atomic force microscope and method of analyzing frictions in atomic force microscope
An atomic force microscope comprises a vibrating device for producing transverse vibrations between a sample and a probe and a vertical load-adjusting device for adjusting the vertical load between...
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5804710 |
Atomic force microscope system with multi-directional voice coil actuator for controlling the stylus
An atomic force microscope (AFM) system has a bidirectional actuator to move the AFM tip or stylus in a plane parallel to the surface of the sample to be scanned as well as perpendicularly to the...
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