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7210330 |
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby
A characterizer for determining the shape of a probe tip for an atomic force microscope and methods of fabricating and using the characterizer. The characterizer includes a micromachined...
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7138627 |
Nanotube probe and method for manufacturing same
A nanotube probe assembled under real-time observation inside an electron microscope, the probe including a nanotube; a holder for holding the nanotube; and a fastening means for fastening the...
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7124625 |
Glide-height disk-tester and method of operation
A glide-height disk-tester operates with the test disk rotating at a predetermined constant rotational speed and uses a glide head with an electrically-resistive heater and a thermally-responsive...
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7121133 |
System, method, and apparatus for glide head calibration with enhanced PZT channel for very low qualification glide heights
A glide head calibration technique uses two fly height calibrations on a disk media certifier. The first calibration point uses a spin down on bump technique at a first height, and the second...
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7096711 |
Methods of fabricating structures for characterizing tip shape of scanning probe microscope probes and structures fabricated thereby
A characterizer for determining the shape of a probe tip for an atomic force microscope and methods of fabricating and using the characterizer. The characterizer includes a micromachined...
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7066005 |
Noncontact sensitivity and compliance calibration method for cantilever-based insturments
A method for determining physical properties of micromachined cantilevers used in cantilever-based instruments, including atomic force microscopes, molecular force probe instruments and chemical or...
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7064341 |
Coated nanotube surface signal probe
The coated nanotube surface signal probe constructed from a nanotube, a holder which holds the nanotube, a coating film fastening a base end portion of the nanotube to a surface of the holder by...
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6957568 |
Small particle impingement comparator and method of determining numerical estimation of a steam path component surface roughness
A small particle impingement comparator for surface finishes in excess of 1000 micro-inches standardizes the evaluation of such surface finishes within a turbine steam path. The small particle...
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6941798 |
Scanning probe microscope and operation method
A scanning probe is microscope has a cantilever having a probe at a disal end thereof and an oscillator for generating a resonance signal near a resonance of the cantilever. A vibrating device...
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6742380 |
Technique for measuring small distances between, and for measuring the flatness of, electrically conductive surfaces
A method and apparatus for measuring the distance between first and second proximately disposed electrically conductive surfaces is provided in which the force exerted between the first and second...
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6679106 |
Road surface roughness measuring device
The object of the present invention is to provide a road surface roughness measuring apparatus for measuring the coefficient of dynamic friction and the roughness of the road surface in each...
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6662623 |
Apparatus and method for glide height calibration of disk surfaces by use of dual-zone laser texture
A disk for calibrating glide heads utilizes a dual-zone configuration of multiple laser melt bumps having selected heights. Averaging the PZT response over many bumps significantly narrows the...
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6591658 |
Carbon nanotubes as linewidth standards for SEM & AFM
The present invention provides systems, methods, and standards for calibrating nano-measuring devices. Calibration standards of the invention include carbon nanotubes and methods of the invention...
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6530258 |
Disk drive laser melt bump disk for accurate glide calibration and certification processing
A bump disk for accurate glide calibration has a new type of glass laser melt bumps that give the same signal amplitudes as conventional AlMg laser melt bumps for the same bump height. The present...
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6505497 |
Orientation-adjusting device
An orientation-adjusting device ( 2 ) having: a body ( 20 ) for holding a surface texture measuring tool ( 1 ), an orientation adjuster ( 30 ) having a leg rested on a workpiece for adjusting an...
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6505141 |
Transducer circuit
A position-to-electrical transducer circuit primarily intended for use in meteorological instruments for measuring a characteristic of a surface of a workpiece. An excitation signal generator...
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6408677 |
Calibration disk having discrete bands of composite roughness
A calibration disk includes calibration areas that allow a glide head to be calibrated as to the glide's head's avalanche height, fly height and the like. The calibration areas may be, for example,...
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6354133 |
Use of carbon nanotubes to calibrate conventional tips used in AFM
The present invention provides systems, methods, and standards for calibrating nano-measuring devices. Calibration standards of the invention include carbon nanotubes and methods of the invention...
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6308557 |
Device scanning in a raster mode, with compensation of disturbing effects of mechanical vibrations on the scanning process
A device which scans in a raster mode, in particular to a raster microscope, provides a rapid and inexpensive compensation of the disturbing effects of mechanical vibrations on the scanning...
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6293135 |
Method of calibrating a system for detecting contact of a glide head with a recording media surface
A method and apparatus for calibrating a glide head and detector system performs a pre-screening to ensure the quality of the glide head and the piezoelectric sensor in the detection system. The...
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6275029 |
System and method for monitoring flying height using textured disks
A spacing between a transducer head and disk surface in a disk drive's head-disk interface is monitored. The transducer head includes a magneto resistive element. The surface of the disk includes a...
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6250143 |
Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section
The present invention provides an apparatus and a method of manufacturing that apparatus. More specifically, to a method of manufacturing probes for a stylus nanoprofilometer having a non-circular...
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6194234 |
Method to evaluate hemisperical grain (HSG) polysilicon surface
A new method based on measuring the weight of a wafer (on which the layer of HSG has been deposited) before (W1) and after (W2) the surface of the HSG layer is coated with a layer of either...
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6164118 |
Calibration disk having discrete bands of calibration bumps
A calibration disk for calibrating the fly height of a head, includes spaced circumferencial bands on the disk extending in a concentric fashion from adjacent an outer diameter of the disk to near...
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6142006 |
Method and apparatus for calibrating a glide head and detection system for a magnetic disk drive
A method and apparatus for calibrating a glide head and detector system performs a pre-screening to ensure the quality of the glide head and the piezoelectric sensor in the detection system. The...
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6085581 |
Method for accurately positioning a device at a desired area of interest
A method for positioning a first device utilizing a surface having a viewing translation stage, the surface being movable between a first position where the viewing stage is in operational...
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6016684 |
Certification of an atomic-level step-height standard and instrument calibration with such standards
An atomic-level step-height standard with step heights less than about 100 Å is in the form of a silicon wafer die with a generally smooth reflective surface but with a periodic pattern of...
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5955654 |
Calibration standard for microroughness measuring instruments
A metrology standard that is useful for calibrating instruments for the levels of microroughness encountered in semiconductor, disk drive, and related industries today. In advanced applications,...
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5898106 |
Method and apparatus for obtaining improved vertical metrology measurements
A probe-based surface characterization or metrology instrument such as a scanning probe microscope (SPM) or a profilometer is controlled to account for errors in the vertical positioning of its...
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4611313 |
Method for acoustically surveying the surface contours of the bottom of a body of water
A method for the acoustic surveying of the surface contours of the bottom of a body of water by means of a crossed fan beam echo sounding arrangement wherein, for the purpose of obtaining an...
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4523467 |
Method and apparatus for resonant sensing device
A resonant sensing device for measuring the hardness of a workpiece to be tested includes a diamond tipped rod adapted to be resonant and for determining the hardness of a workpiece to be tested is...
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4331026 |
Indenter-type hardness testing apparatus
A material hardness testing apparatus is provided, for use in quality control of production materials and parts, in which a pneumatically actuated indenter probe, incorporating an LVDT displacement...
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4285745 |
Method of determining optical quality of a laminated article
An interlayer material is scanned prior to laminating same with glass sheets to generate a thickness variation signal, a wedge angle signal and an optical power signal. The signals are then...
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4276766 |
Roughness sensor calibration
A calibrator for calibrating optical sensors that contact a moving web comprising, a rotating disc mounted on an oscillated platform and in a position to be contacted by the contacting part of the...
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4130796 |
Calibrating and measuring circuit for a capacitive probe-type instrument
A calibrating and measuring circuit is disclosed for a capacitive probe-type instrument. The capacitive probe, in contact with a surface to be measured, is connected to an oscillator which...
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3747395 |
MASTER FOR MONITORING FLUID FLOW TYPE SURFACE ROUGHNESS GAGES
A block-type master is described which has formed on the surface thereof a series of straight line grooves, and which in carrying out the monitoring method is placed so that the groove series...
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3505861 |
CAST SURFACE COMPARISON STANDARD
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3190109 |
Calibrating and testing methods
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