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7610570 Method and mechanism for using systematic local search for SAT solving  
An improved method and mechanism for designing and verifying an electrical circuit design is provided using an improved SAT-solver which uses complete assignments and systematic local search to...
7610569 Chip design verification apparatus and data communication method for the same  
A method of verifying a chip design includes: a software side operation step of transmitting output data generated by an operation of a software block to an interface unit, determining whether...
7606694 Framework for cycle accurate simulation  
A system for performing cycle accurate simulation of a circuit design can include a plurality of cycle accurate models, wherein each cycle accurate model is a software object representation of a...
7607057 Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip  
An apparatus and method are disclosed for testing a hard macro that is embedded in a system on a chip (SOC) that is included in an integrated circuit chip. The SOC includes the hard macro. A logic...
7607116 Method and apparatus for verifying system-on-chip model  
A method for performing verification on a Transaction Level (TL) model having at least two abstraction levels in simulation modeling for design of a System-on-Chip (SoC). The TL model verification...
7603636 Assertion generating system, program thereof, circuit verifying system, and assertion generating method  
An assertion generating system is disclosed. In an assertion generating system 207 , a graphical editor 201 generates design data of a semiconductor integrated circuit by graphically editing a...
7603637 Secure, stable on chip silicon identification  
A circuit for providing a bit string, the circuit including a plurality of commonly wired, substantially identical bit cells in a string, where each bit cell is designed to read as only one of a...
7603638 Method and system for modeling statistical leakage-current distribution  
Disclosed is a method and system for modeling statistical leakage current distribution using logarithmic skew-normal distribution by generating statistical data with a statistical analysis method...
7603647 Recognition of a state machine in high-level integrated circuit description language code  
A method and apparatus for recognizing a state machine in circuit design in a high-level IC description language. The present invention analyzes high-level IC description language code, such as...
7600211 Toggle equivalence preserving logic synthesis  
A method of synthesis of a second circuit (N 2 ) that is toggle equivalent to a first circuit (N 1 ), comprising building up N 2 in topological order, starting from the input side of N 2 , by...
7600204 Method for simulation of negative bias and temperature instability  
An apparatus and method to accurately simulate negative bias and temperature instability (NBTI) and its effect. According to a first simulation method, a simulation netlist is automatically scanned...
7600212 Method of compensating photomask data for the effects of etch and lithography processes  
A method for synthesizing a photomask data set from a given target layout, including the following steps: (a) providing a set of target polygons for the target layout; (b) fitting a smooth curve to...
7600209 Generating constraint preserving testcases in the presence of dead-end constraints  
Mechanisms for generating constraint preserving testcases in the presence of dead-end constraints are provided. A balance between precision and computational expense in generating the testcases is...
7600203 Circuit design system and circuit design program  
A circuit design system has: a storage unit in which a netlist is stored; a fault-candidate extracting module configured to extract equivalent fault class G i from the netlist; a judgment module...
7599823 Automated approach to resolving artificial algebraic loops  
A method and apparatus for resolving artificial algebraic loops in model executions include providing a model of an executable process having a plurality of functions. An analysis step identifies...
7600206 Method of estimating the signal delay in a VLSI circuit  
A method estimates the signal delay in a VLSI circuit and accurately estimates the delay and conversion time of a transmission signal in the circuit in order to prevent a designer of the VLSI...
7600207 Stress-managed revision of integrated circuit layouts  
Roughly described, methods and systems for improving integrated circuit layouts and fabrication processes in order to better account for stress effects. Dummy features can be added to a layout...
7599826 System and method for generating various simulation conditions for simulation analysis  
A system for generating various simulation conditions for simulation analysis is disclosed. The system includes: a signal generating module ( 301 ) for generating an N-bit binary sequence...
7600202 Techniques for providing a failures in time (FIT) rate for a product design process  
A technique for providing a product FIT rate is performed within electronic circuitry (e.g., one or more computerized devices). The technique involves receiving a Mean Time To Failure (MTTF) target...
7596423 Method and apparatus for verifying a site-dependent procedure  
The present invention includes a method of verifying a Site-Dependent (S-D) processing procedure, the method including receiving a plurality of wafers by a S-D transfer system, determining S-D...
7596776 Light intensity distribution simulation method and computer program product  
A light intensity distribution simulation method for predicting an intensity distribution of light on a substrate when photomask including a pattern is irradiated with light in which a shape...
7596770 Temporal decomposition for design and verification  
Behavior of a finite state machine is represented by unfolding a transition relation that represents combinational logic behavior of the finite state machine into a sequence of transition relations...
7596774 Hard macro with configurable side input/output terminals, for a subsystem  
A hard macro device (HMD), for a subsystem (TMi) such as a data processor, comprises a processing core (C) provided with at least one time critical input terminal (CIT) adapted to feed it with time...
7594208 Techniques for automated sweeping of parameters in computer-aided design to achieve optimum performance and resource usage  
Techniques for optimizing the placement and synthesis of a circuit design on a programmable integrated circuit are provided. The performance of a circuit design is analyzed after it has been...
7594213 Method and apparatus for computing dummy feature density for chemical-mechanical polishing  
One embodiment of the present invention provides a system that computes dummy feature density for a CMP (Chemical-Mechanical Polishing) process. Note that the dummy feature density is used to add...
7594207 Computationally efficient design rule checking for circuit interconnect routing design  
Techniques are described which decrease DRC (design rule check) marking time, e.g., in a circuit interconnect router, by capitalizing on repetitious relationships between interconnect elements...
7594206 Fault detecting method and layout method for semiconductor integrated circuit  
The present invention provides a fault detecting method and a layout method for a semiconductor integrated circuit. The fault detecting method performs detection for faults in a semiconductor...
7594205 Interface configurable for use with target/initiator signals  
Systems and methods for designing integrated circuits and for creating and using androgynous interfaces between electronic components of integrated circuits are disclosed. One preferred method of...
7590955 Method and system for implementing layout, placement, and routing with merged shapes  
Disclosed is an improved method, system, and computer program product for performing layout, placement, and routing for electronic designs. According to some approaches, multiple objects are...
7590959 Layout system, layout program, and layout method for text or other layout elements along a grid  
A system is provided that sets reference points or lines in a layout region and arranges a layout element in the layout region using the positions of the reference points or lines as reference...
7590968 Methods for risk-informed chip layout generation  
A chip layout is generated based on a quantified fabrication process capability. A minimum required value is selected for a fabrication process capability factor associated with a fabrication...
7590912 Using a chip as a simulation engine  
The chip is placed in self simulation mode. When the trace logic does not have any more data to output it changes the state of the advance signal. The clock generator detects this state change and...
7590953 Static timing analysis and dynamic simulation for custom and ASIC designs  
A single verification tool provides both static timing analysis and timing simulation capabilities targeted at both full-custom and ASIC designs in a unified environment. In various embodiments the...
7590958 Method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilities  
A method and apparatus for retrofitting semiconductor chip performance analysis tools with full-chip thermal analysis capabilities is provided. One embodiment of a novel method for performing...
7590954 Test solution development method  
A test solution for one or more circuits implementing a communication standard is based on a design specification received from a development organization and a communication standard. The test...
7590957 Method and apparatus for fixing best case hold time violations in an integrated circuit design  
The disclosure is directed to a method and apparatus for fixing hold violations in an integrated circuit design. The method and apparatus trace upstream along a path in the design corresponding to...
7587689 Method of supporting wiring design, supporting apparatus using the method, and computer-readable recording medium  
A method of supporting an optimum wiring design of a linear structure, includes steps of providing a finite element model of both of the linear structure and a support member which supports the...
7587688 User-directed timing-driven synthesis  
Users or applications provide optimization information that specifies performance-critical portions of the design. Users can identify performance-critical portions of their designs from a priori...
7586299 Power-supply semiconductor integrated circuit, power-supply semiconductor integrated circuit system, development assisting system for power-supply circuit, and program and storage medium therefor  
There is provided a power-supply platform IC for realizing a parameter-deciding power-supply circuit, which, in order to decide a parameter of a power-supply circuit that supplies power to an...
7587692 Method and apparatus for full-chip thermal analysis of semiconductor chip designs  
A method and apparatus for full-chip thermal analysis of semiconductor chip designs is provided. One embodiment of a novel method for performing thermal analysis of a semiconductor chip design...
7587691 Method and apparatus for facilitating variation-aware parasitic extraction  
One embodiment of the present invention provides a system for determining an electrical property for an interconnect layer. During operation, the system receives interconnect technology data which...
7587700 Process monitoring system and method for processing a large number of sub-micron measurement targets  
The invention provides a method that includes the stages of: (i) receiving design information representative of a portion of an object that includes sub micron measurement targets, (ii) processing...
7587690 Method and system for global coverage analysis  
Disclosed are methods and systems for performing coverage analysis. In one approach, the methods and systems perform coverage analysis based upon both implementation-specific design data and...
7586322 Test structure and method for measuring mismatch and well proximity effects  
The present invention is directed to a test structure and method to determine the effects of the well proximity effect on the gate threshold voltage of FETs at different distances from the edge of...
7584450 Method and apparatus for using a database to quickly identify and correct a manufacturing problem area in a layout  
One embodiment provides a system for using a database to quickly identify a manufacturing problem area in a layout. During operation, the system receives a first check-figure which identifies a...
7584077 Physical design characterization system  
A system, method and media for locating and defining process sensitive sites isolated to specific geometries or shape configurations within chip design data. Once a systemic process sensitive site...
7584442 Method and apparatus for generating memory models and timing database  
A method and apparatus are provided for creating and using a memory timing database. A plurality of characterization memories are defined, which can be mapped to a memory resource. Each...
7584438 Method for rapid estimation of layout-dependent threshold voltage variation in a MOSFET array  
An automated method for estimating layout-induced variations in threshold voltage in an integrated circuit layout. The method begins with the steps of selecting a diffusion area within the layout...
7584439 Cell modeling for integrated circuit design with characterization of upstream driver strength  
A cell is modeled for use in an integrated circuit design by characterizing the cell based on an input of the cell being driven by a characterization driver having a specified drive strength. A...
7581200 System and method for analyzing length differences in differential signal paths  
A method for analyzing length differences in differential signal paths includes: loading a design file of the differential signal paths from a storage device ( 9 ); simulating the differential...