Matches 101 - 120 out of 120 < 1 2 3
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4581738 Test and maintenance method and apparatus for a data processing system  
A test and maintenance system for use with a data processing system comprising a specialized circuit set wherein the circuit set registers can be configured into a serial array, a clock signal...
4551838 Self-testing digital circuits  
In order to test a digital circuit, such as a digital logic circuit (e.g., 100), for faults, during the first three cycles of a test operation of many cycles in duration, a predetermined input word...
4542508 Amenable logic gate and method of testing  
A multiple input logic gate that is amenable to full testability without the "buried logic" problem of conventional VLSI logic devices and a novel dynamic test method for increasing fault-free...
4514806 High speed link controller wraparound test logic  
An interactive terminal system includes a high speed link controller (HSLC) and a number of work stations, all coupled in common to a single conductor coaxial bus. The HSLC includes apparatus...
4498172 System for polynomial division self-testing of digital networks  
A built-in test system employs dual-mode feedback shift registers to supply test vectors and evaluate test responses of functional and interface networks of a logic system. Test responses are...
4493078 Method and apparatus for testing a digital computer  
A system for on-line, concurrent self-testing of a computer is disclosed which is capable of checking the "test kernel" of the computer; that is, the portion of the computer that must be fault-free...
4435806 Device for testing a circuit comprising sequential and combinatorial logic elements  
A device for processing digital signals includes combinatorial and sequential logic elements. For the testing of the device, a shift register can be formed from the sequential elements. A test...
4424581 Logic circuit with a test capability  
A flip-flop circuit receives a portion of a multiple bit output from a combinational logic circuit to be tested, and feeds back a plurality of bits to comprise a portion of the multiple bit input...
4357703 Test system for LSI circuits resident on LSI chips  
A test system performs dynamic testing of complex logic modules at full system clock rates and is resident on each LSI chip under test. The system logic is designed to be included on each LSI chip...
4340857 Device for testing digital circuits using built-in logic block observers (BILBO's)  
A device for testing a digital electronic circuit, having a first BILBO for generating a pseudo-random test pattern, a second BILBO for analyzing a parallel-input signature, a decoder and at least...
4334307 Data processing system with self testing and configuration mapping capability  
A data processing system employing firmware for executing a self test routine each time the system goes through the power-up cycle. The self test firmware provides for compilation of a system...
4320509 LSI Circuit logic structure including data compression circuitry  
A logic structure for an LSI digital circuit includes data compression circuitry for deriving a signature word from the data on a multiplicity of internal nodes which are not directly accessible...
4253183 Method and apparatus for diagnosing faults in a processor having a pipeline architecture  
A processor having a pipeline architecture is comprised of a plurality of replaceable circuit units and includes a snapshot circuit associated with each replaceable circuit unit. Each snapshot...
4236208 Test mode control logic system  
A logic control system is disclosed for verifying the operability of memory and non-memory data and control paths in both local and remote intersystem link (ISL) units electrically interconnecting...
4200225 Diagnostic check system for digital signal circuit  
A diagnostic check system for a digital signal circuit, in which, in a state where a plurality of digital signals are being sent out from a processor such as a microcomputer through an interface...
4184630 Verifying circuit operation  
A polynomial based apparatus, such as an error correcting apparatus, is checked by repeatedly supplying test bits to the apparatus. On even cycles, the modulo two sum of the signal contents should...
4108359 Apparatus for verifying the execution of a sequence of coded instructions  
Apparatus for detecting errors in the execution of a sequence of coded inuctions. The apparatus includes a feed-back shift register to generate a digital sequence which is combined with the...
4099668 Monitoring circuit  
A monitoring circuit for digital circuits is disclosed. The monitor is primarily applicable to digital circuits which operate in a cyclic mode with the digital patterns generated during each cycle...
3787838 FAIL SAFE BUILT-IN TEST EQUIPMENT  
Built-in test equipment (BITE) for an electronic system is implemented in a fail safe manner, with the test equipment itself not having failure modes which might inhibit detection of a system...
3590378 FAULT-DETECTING MONITOR FOR INTEGRATED CIRCUIT UNITS  
A substrate supporting an operational integrated circuit and further supporting a fault-detecting monitor integrated circuit, wherein the monitor circuit samples a plurality of check points in the...
Matches 101 - 120 out of 120 < 1 2 3