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7624313 TCAM BIST with redundancy  
In an embodiment of the invention, a method of providing redundancy in a ternary content addressable memory (TCAM) includes: detecting a defective entry in a ternary content addressable memory...
7616541 Method and apparatus for recording write-once type optical recording medium having defective management areas  
A write-once-type recording medium ( 10 ) is provided with: a data area ( 11 ) to record therein record data; and a plurality of management areas in which a plurality of types of management...
7613960 Semiconductor device test apparatus and method  
There is provided a semiconductor test apparatus which uses a test processor to apply a test signal to a DUT having a semiconductor device within it to determine whether the memory is acceptable or...
7607074 Error detecting code addition circuit, error detection circuit and method, and disc apparatus  
An error detector includes a substitute value output section outputting a specific substitute value corresponding to an encoding byte sequence Q of input byte data by referring to a table storing,...
7607069 Computer system including network slices that map to field replaceable units  
In one embodiment, a computer system includes a first client subsystem, a second client subsystem and a network. The network is coupled to convey a packet between the first client subsystem and the...
7607038 Systems and methods for CPU repair  
In one embodiment, a method for repairing a faulty cache element is provided. Once a monitored cache element is determined to be faulty, the system stores the repair information, and cache...
7603593 Method for managing bad memory blocks in a nonvolatile-memory device, and nonvolatile-memory device implementing the management method  
A method for managing bad memory blocks of a nonvolatile-memory device, in which the available memory blocks are divided into a first set, formed by addressable memory blocks that are to be used by...
7603592 Semiconductor device having a sense amplifier array with adjacent ECC  
A semiconductor memory device capable of achieving a sufficient operating margin without increasing an area penalty even in the case of miniaturization is provided. An error correction system...
7603582 Systems and methods for CPU repair  
In one embodiment, a cache element allocation method is provided. Each cache element on a CPU is assigned a quality rank based on the error rate of the cache element. If an allocated cache element...
7596728 Built-in self repair circuit for a multi-port memory and method thereof  
A built-in self repair (BISR) circuit for a multi-port memory and a method thereof are provided. The circuit includes a test-and-analysis module (TAM) and a defect locating module (DLM) coupled to...
7594147 Method and apparatus for recording data on and reproducing data from a recording medium and the recording medium  
In an embodiment of the method of recording data on a recording medium, a next recordable position of a recording range is notified to a host. A replacement for data requested to be recorded is...
7594023 Data carousel receiving and caching  
Data objects are sent using a data carousel and forward error correction. This involves segregating a file into groups, wherein each group represents k data blocks. From the k data blocks of each...
7581146 Semiconductor memory device storing repair information avoiding memory cell of fail bit operating method thereof  
A semiconductor memory device including a memory array having a plurality of memory cells and a data input/output unit. A part of the memory array is assigned as a repair information region. The...
7577885 Semiconductor integrated circuit, design support software system and automatic test pattern generation system  
A semiconductor integrated circuit has a memory circuit having memory cells, a first register, a second register, a register selection circuit having an input to which an output of the first...
7577882 Semiconductor integrated circuit including memory macro  
The present invention provides a semiconductor integrated circuit having area efficiency and repair efficiency improved by sharing a redundant memory macro among a plurality of SRAM macros. Each of...
7571361 Recording method and optical disk recording device  
A recording method and a recording apparatus capable of optimally arranging data on a write-once type optical disc. In a write-once type optical disc recording method with respect to a disc having...
7549098 Redundancy programming for a memory device  
A method for implementing redundancy programming in a memory macro of an integrated circuit chip. It is assumed that all fails are row fails until determined to be bitline fails, test patterns are...
7546495 Method and device for managing defective storage units on a record carrier  
The present invention relates to a method and a corresponding device for managing defective storage units on a record carrier, in particular on a rewritable optical record carrier. To avoid...
7539896 Repairable block redundancy scheme  
A scheme for block substitution within a flash memory device is disclosed which uses a programmable look-up table to store new addresses for block selection when certain input block addresses are...
7536614 Built-in-redundancy analysis using RAM  
A method for testing memory in an integrated circuit device is disclosed. The method includes executing a test routine in a portion of the memory at a speed sufficient to fully test the memory...
7536611 Hard BISR scheme allowing field repair and usage of reliability controller  
A BISR scheme which provides for on-chip assessment of the amount of repair on a given memory and for the flagging of any device as a fail when the device exceeds a pre-determined limit....
7533330 Redundancy for storage data structures  
A storage device comprising has a storage medium, a read-write mechanism, an object-based file system interface, and a controller. The read-write mechanism is adapted to read and to write data from...
7533310 Semiconductor memory test device and method thereof  
A semiconductor memory test device and method thereof are provided. The example semiconductor memory test device may include a fail memory configured to store at least one test result of a memory...
7533308 Semiconductor test system  
The semiconductor test system comprises a test device for testing semiconductor devices including redundant circuits to obtain fail information of defective parts of the semiconductor devices; a...
7533293 Systems and methods for CPU repair  
In one embodiment, a CPU cache management system is provided. The CPU management system includes, for example, a CPU chip and cache management logic. The CPU chip include cache elements that are...
7529997 Method for self-correcting cache using line delete, data logging, and fuse repair correction  
An apparatus and method for protecting a computer system from array reliability failures uses Array Built-In Self-Test logic along with code and hardware to delete cache lines or sets that are...
7529986 Semiconductor device and testing method for same  
A test method for a semiconductor device that is provided with an ECC circuit that uses product code that is composed of a first code and a second code for implementing error correction of a...
7526713 Low power cost-effective ECC memory system and method  
A memory controller couples 32-bit data words to and from a DRAM. The DRAM generates error checking and correcting syndromes to check and correct read data. The DRAM generates the syndromes from...
7523380 Methods and structures for providing programmable width and error correction in memory arrays in programmable logic devices  
A random access memory (RAM) in a programmable logic device (PLD) supports error correction as well as a configurable data width. The number of bits in a user data word varies by the selected...
7523364 Double DRAM bit steering for multiple error corrections  
A method and system is presented for correcting a data error in a primary Dynamic Random Access Memory (DRAM) in a Dual In-line Memory Module (DIMM). Each DRAM has a left half (for storing bits ...
7519876 Memory card using flash memory and method of controlling the same  
There is disclosed a memory having a plurality of blocks including management information, and a centralized management block in which the management information of each block is centralized,...
7519875 Method and apparatus for enabling a user to determine whether a defective location in a memory device has been remapped to a redundant memory portion  
The invention provides a method and an apparatus for enabling a user to determine whether a defective location in a memory device of an integrated circuit (IC) has been remapped to a location in a...
7512846 Method and apparatus of defect areas management  
A method and the apparatus of defect areas management includes the steps as following: reading a defect area table in a random access memory; if the area is readable, then read the area. If the...
7509544 Data repair and synchronization method of dual flash read only memory  
A data repair and synchronization method of dual flash ROM is provided, which includes a first flash ROM and a second flash ROM that store the same system data, wherein one of the first flash ROM...
7509543 Circuit and method for error test, recordation, and repair  
In a memory device, an on-die register is provided that is configured to store a row address as well as a column address of a memory cell that fails a test. Storing the row address frees testing...
7509526 Method of correcting NAND memory blocks and to a printing device employing the method  
A printing device comprises memory storing data in blocks and a processing unit communicating with the memory and being responsive to print jobs. In response to a print job, the processing unit...
7506224 Failure recovering method and recording apparatus  
A bad sector is detected by activating a bad sector detecting function of a recording apparatus at a predetermined interval. The bad sector is recovered, when the bad sector is detected at the...
7496822 Apparatus and method for responding to data retention loss in a non-volatile memory unit using error checking and correction techniques  
In a non-volatile memory unit such as a flash memory unit, the degradation of charge can result in an error during a read operation. By using the error checking and correction techniques, a...
7496805 Write once type recording medium, recording device and recording method for write once type recording medium, and reproduction device and reproduction method for write once type recording medium  
A plurality of defect management areas ( 14 A, 14 B, 14 C) are arranged on a write once type recording medium ( 10 ). Spare areas ( 12, 13 ) are divided into a plurality of partial spare areas (...
7496015 Drive device  
A drive apparatus of the present invention includes a recording/reproduction section and a drive control section. The drive control section performs a process including: determining whether or not...
7490274 Method and apparatus for masking known fails during memory tests readouts  
Embodiments of the present invention generally provide methods and apparatus for testing memory devices having normal memory elements and redundant memory elements. During a front-end testing...
7484138 Method and system for improving reliability of memory device  
A system for improving reliability of a memory device includes one or more memory banks, each of which has one or more regular memory cell rows and one or more redundant memory cell rows. At least...
7484065 Selective memory allocation  
Methodology, systems and media associated with selectively allocating memory are described. One exemplary method embodiment comprises receiving a quality data that identifies the quality of one or...
7484039 Method and apparatus for implementing a grid storage system  
Embodiments of the present invention facilitate implementing external storage systems using commodity computer components to achieve high performance and reliability. An exemplary method...
7478291 Memory array repair where repair logic cannot operate at same operating condition as array  
Memory array repair where the repair logic cannot operate at the same operating condition as the memory array is presented. In one embodiment, a test is run with the memory array configured in a...
7478289 System and method for improving the yield of integrated circuits containing memory  
A system and method for increasing the yield of integrated circuits containing memory partitions the memory into regions and then independently tests each region to determine which, if any, of the...
7478288 Method and apparatus for recording data on and reproducing data from a recording medium and the recording medium  
In an embodiment of the method of recording data on a recording medium, a management information entry is recorded in a temporary defect management area of the recording medium. The management...
7472331 Memory systems including defective block management and related methods  
A memory system may include a plurality of non-volatile memory cells and a memory controller coupled to the plurality of non-volatile memory cells. The plurality of non-volatile memory cells may be...
7469368 Method and system for a non-volatile memory with multiple bits error correction and detection for improving production yield  
A method and system for a non-volatile memory (NVM) with multiple bits error correction and detection for improving production yield are provided. Forward error correction (FEC) operations and...
7467337 Semiconductor memory device  
Disclosed is a semiconductor memory device capable of arbitrarily setting an upper limit of the number of error corrections during a test operation. The semiconductor memory device has a counter, a...
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