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7620861 |
Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels
Embodiments of an apparatus and method for high-speed testing of a device under test are described herein, where the device under test is coupled to a tester via a limited passband communication...
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7620840 |
Transactional flow management interrupt debug architecture
According to some embodiments, a first bus may be monitored, via a first debug gate, the first bus being to exchange data between a first processing system and a second processing system. A second...
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7617425 |
Method for at-speed testing of memory interface using scan
A method and a circuit of testing of a memory interface associated with an embedded memory in a semiconductor circuit involves writing to two memory locations in succession; reading the two memory...
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7617416 |
System, method, and apparatus for firmware code-coverage in complex system on chip
Presented herein is a system, method, and apparatus for firmware code-coverage in complex system on chip. A circuit for analyzing code coverage of firmware by test inputs comprises an input and a...
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7613971 |
Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit
A semiconductor integrated circuit includes an input side flip-flop; a combinational circuit having an input connected with the input side flip-flop; an output side flip-flop connected with an...
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7613965 |
Apparatus and method for high-speed SAS link protocol testing
An apparatus for changing a connection between two serial components on the same circuit board. The apparatus comprises at least one column, and each column includes first, second, third and fourth...
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7613961 |
CPU register diagnostic testing
One embodiment disclosed relates to a method of compiling a program to be executed on a target central processing unit (CPU). The method includes opportunistically scheduling diagnostic testing of...
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7613955 |
Collecting debug data from a wireless device
A data processing apparatus having a memory for storing program code and a processor for processing the program code, the data processing apparatus comprising: a radio module to communicatively...
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7610537 |
Method and apparatus for testing multi-core microprocessors
A computer implemented method, data processing system, and computer usable code are provided for testing multi-core microprocessors. A test process initiates testing on communication bus interfaces...
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7610533 |
Semiconductor integrated circuit and method for testing the same
In a semiconductor integrated circuit, power source wiring for supplying power supply voltage to a plurality of flip flop circuits, and power source wiring for supplying different power supply...
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7610527 |
Test output compaction with improved blocking of unknown values
Implementations of the present principles are directed to test output compaction arrangements and a methods of generating control patterns for unknown blocking. The specified bits in the control...
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7610423 |
Service interface to a memory system
A cascaded interconnect system for providing a service interface to a memory system. The cascaded interconnect system includes a master service interface module, a service interface bus, and one or...
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7607057 |
Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip
An apparatus and method are disclosed for testing a hard macro that is embedded in a system on a chip (SOC) that is included in an integrated circuit chip. The SOC includes the hard macro. A logic...
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7607044 |
Monitoring of a program execution by the processor of an electronic circuit
A method for monitoring the execution of a program by a processor of an electronic circuit comprises operations of collecting monitoring data within the circuit and of transmitting the monitoring...
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7603598 |
Semiconductor device for testing semiconductor process and method thereof
A semiconductor device for testing a semiconductor process applied to manufacturing the semiconductor device is disclosed. The semiconductor device includes at least a testing group. The testing...
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7603596 |
Memory device capable of detecting its failure
A memory device capable of detecting its failure, the memory device includes a data input section for receiving data applied from an external part of the memory device; a latch section for...
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7603585 |
Systems and methods for updating field replaceable units
Systems and methods for updating at least one field replaceable unit (FRU) are disclosed. In an exemplary embodiment the method may comprise generating a virtual image of a FRU ID for each FRU to...
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7596724 |
Quiescence for retry messages on bidirectional communications interface
A mechanism to obtain a quiescence state for a component coupled to a bidirectional communications interface is obtained. A transition to quiescence may be may by activating a first defeature in...
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7596420 |
Device manufacturing method and computer program product
A method is provided wherein a lithographic projection apparatus is used to print a series of test patterns on a test substrate to measure printed critical dimension as function of exposure dose...
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7594150 |
Fault-tolerant architecture of flip-flops for transient pulses and signal delays
A method and apparatus for a structure of a flip-flop that is tolerant to the noise pulses occurring due to the presence of crosstalk faults by sampling the input data multiple times before and...
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7594143 |
Analysis engine for analyzing a computer system condition
A computer-executable method for analyzing a condition of a computer system comprises executing an operating system on a processor according to an operating system image resident in a memory, and...
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7594140 |
Task based debugger (transaction-event-job-trigger)
The embodiments of the invention provide an apparatus, method, etc. for a task based debugger (transaction-event-job-trigger). More specifically, an integrated event monitor for a SOC comprises...
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7590912 |
Using a chip as a simulation engine
The chip is placed in self simulation mode. When the trace logic does not have any more data to output it changes the state of the advance signal. The clock generator detects this state change and...
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7590911 |
Apparatus and method for testing and debugging an integrated circuit
An integrated circuit includes a first deserializer that deserializes serial data containing at least one of test instructions and/or data in a first format. A monitor module communicates with the...
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7590908 |
Semiconductor integrated circuit and method for testing the same
In a semiconductor integrated circuit, power source wiring for supplying power supply voltage to a plurality of flip flop circuits, and power source wiring for supplying different power supply...
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7590891 |
Debugging circuit and a method of controlling the debugging circuit
In a debugging circuit and a controlling method of the debugging circuit, a mode judgment signal is generated which indicates that a central processing unit (CPU) is preparing to debug a...
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7587202 |
Method for conducting digital interface and baseband circuitry tests using digital loopback
In a mobile device having a primary baseband circuit and a secondary baseband circuit and an interface between the primary baseband circuit and a secondary baseband circuit, a method for testing...
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7584381 |
Semiconductor integrated circuit device, debug system, microcomputer, and electronic apparatus
An integrated circuit device including an internal debug module for on-chip debugging while communicating with a pin-saving debug tool and a CPU, the integrated circuit device comprises; a first...
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7584380 |
Method and system for debugging flow control based designs
Certain embodiments for debugging mechanism for flow control based designs may comprise a debugging interface module between a transmitter and a receiver, all integrated on a chip. At least one...
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7577874 |
Interactive debug system for multiprocessor array
A debug network on a multiprocessor array includes communication channels, a master controller, and one or more individual debug units in communication with one or more of the processors. The...
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7577873 |
Transmission apparatus
A transmission apparatus has a main signal processing device, a monitor control part and an intermediating part to intermediate addresses and data between the monitor control part and the main...
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7577560 |
Microcomputer logic development device
A microcomputer logic development device realizing high speed sampling RAM monitoring by connecting an existing RAM measurement device, provided with a first block providing functions corresponding...
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7574643 |
Test apparatus and method for testing a circuit unit
In a method for testing an electric circuit comprising circuit subunits, the electric circuit is connected to a test system via a tester channel with a connection unit. The tester channel is...
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7574314 |
Spurious signal detection
A circuit for a data processing apparatus and a method for detecting spurious signals is disclosed, the circuit comprising a data input operable to receive digital signal values, spurious signal...
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7571367 |
Built-in self diagnosis device for a random access memory and method of diagnosing a random access
A self diagnosis (BISD) device for a random memory array, preferably integrated with the random access memory, executes a certain number of predefined test algorithms and identifies addresses of...
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7571363 |
Parametric measurement of high-speed I/O systems
A phase comparator is used to test a device under test comprising an input/output (I/O) circuit by applying a signal to the device under test; extracting a phase signal from the phase comparator;...
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7571357 |
Memory wrap test mode using functional read/write buffers
A memory controller for a processing unit provides a memory wrap test mode path which selectively writes data from the write buffer of the controller to the read buffer of the controller, thereby...
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7568141 |
Method and apparatus for testing embedded cores
The inputs to an embedded core, e.g., the core terminals, may not be directly connected to pins on the SoC. The lack of direct access to an embedded core's terminals may complicate testing of the...
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7568135 |
Use of alternative value in cell detection
A system and method, including computer software, allows reading data from a flash memory cell. Voltages from a group of memory cells are detected. The group of memory cells have associated...
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7568061 |
Initializing expansion adapters installed in a computer system having similar expansion adapters
Methods, apparatus, and products are disclosed for initializing expansion adapters installed in a computer system having similar expansion adapters that include detecting an expansion adapter...
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7565578 |
Optical disc apparatus, and method for self-diagnosis control of optical disc apparatus
An optical disc apparatus capable of performing self-diagnosis receives from a host computer a command to enable a self-diagnostic mode. Information indicating that the self-diagnosis mode is...
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7565576 |
Method and apparatus for obtaining trace data of a high speed embedded processor
An integrated circuit device having a plurality of embedded processor/controllers and a parallel emulation trace port coupled thereto to provide trace data for debugging the integrated circuit...
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7562276 |
Apparatus and method for testing and debugging an integrated circuit
An integrated circuit (IC) comprises an embedded processor. An embedded in-circuit emulator (ICE) emulates at least one function of the embedded processor, performs at least one of testing and...
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7562265 |
Method, apparatus and program storage device for providing self-quiesced logic to handle an error recovery instruction
A method, apparatus and program storage device for providing self-quiesced logic for handling an error recovery instruction such as a reset or self-test instruction. For example, during a reset or...
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7559053 |
Program and system performance data correlation
System performance data and program performance data may be collected, converted into the same format and correlated by time. A graph or other display of system performance data over a time period...
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7558722 |
Debug method for mismatches occurring during the simulation of scan patterns
A method and system are disclosed for testing for double shift errors in at least one scan chain of flip-flops during a simulation of the design of a digital integrated circuit chip. At the start...
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7555686 |
Semiconductor device, test board for testing the same, and test system and method for testing the same
Provided are a semiconductor device, a test board, and a test system and method for testing a semiconductor device. The semiconductor device includes an input terminal to which test pattern data is...
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7552360 |
Debug and test system with format select register circuitry
A system and method for sharing a communications link between multiple protocols is described that comprises a system comprising a communications interface configured to exchange information with...
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7548842 |
Scalable system for simulation and emulation of electronic circuits using asymmetrical evaluation and canvassing instruction processors
A scalable system for verifying electronic circuit designs in anticipation of fabrication by compiling a hardware description to instructions for canvassing processors and instructions for circuit...
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7546491 |
Semiconductor memory device with standby current failure judging function and method for judging standby current failure
A semiconductor memory device which a pad for receiving a power voltage, a first power line connected to the pad, and a plurality of second power lines respectively connected to memory cells of a...
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