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7620868 Method for detecting a malfunction in a state machine  
A method for detecting a malfunction in a state machine is described. The state machine has an operation modeled by a set of states linked to each other by transitions, the state machine...
7620862 Method of and system for testing an integrated circuit  
The methods and circuits of the present invention relate to testing integrated circuits. According to one aspect of the invention, a method of testing an integrated circuit is disclosed. The method...
7620861 Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels  
Embodiments of an apparatus and method for high-speed testing of a device under test are described herein, where the device under test is coupled to a tester via a limited passband communication...
7620848 Method of diagnosing and repairing network devices based on scenarios  
A method and an apparatus are disclosed for diagnosing and repairing network devices based on scenarios. The method and apparatus aggregate responses to a selectable list of queries for a plurality...
7620840 Transactional flow management interrupt debug architecture  
According to some embodiments, a first bus may be monitored, via a first debug gate, the first bus being to exchange data between a first processing system and a second processing system. A second...
7620503 Signal processing fault detection system  
A fault detection system designed to evaluate the structural integrity of a material employs an array of sensors disposed over the material being evaluated. The sensors detect vibrations in the...
7617431 Method and apparatus for analyzing delay defect  
The apparatus for analyzing a delay defect of the present invention obtains the RC of the maximal incidence among region codes (RCs) to which check circuits detecting errors caused with gradual...
7617425 Method for at-speed testing of memory interface using scan  
A method and a circuit of testing of a memory interface associated with an embedded memory in a semiconductor circuit involves writing to two memory locations in succession; reading the two memory...
7617086 Monitoring simulating device, method, and program  
A design data storage unit stores design data of constituent elements constituting a computer system to be monitored. A monitoring condition storage unit stores monitoring conditions of abnormal...
7617064 Self-test circuit for high-definition multimedia interface integrated circuits  
A high-definition multimedia interface circuit uses a high-definition multimedia interface encoder to produce a plurality of channels of data. An output circuit, connected to the high-definition...
7613974 Fault detection method and apparatus  
This invention relates to fault detection in electrical circuits. The invention provides a method and apparatus for testing an input circuit by generating a periodic test signal having a...
7613971 Semiconductor integrated circuit with delay test circuit, and method for testing semiconductor integrated circuit  
A semiconductor integrated circuit includes an input side flip-flop; a combinational circuit having an input connected with the input side flip-flop; an output side flip-flop connected with an...
7613949 Fault isolation system and method  
A mechanism for isolating failures in a digital system is provided. In one embodiment, a fault table is defined for each unit in the system. Related faults are ordered within the table to reflect...
7613210 Measuring time management system, data transmitter-receiver and measuring time management method  
A unified time can be simply set between data measuring instruments, and when the clock function of a specific data measuring instrument was damaged, the data measuring instrument can be...
7610512 System and method for automated and assisted resolution of it incidents  
A computer implemented method for assisted and automated resolving of Information Technology (IT) incidents is provided. The method facilitates one or more users to define repair workflows to...
7610211 Investigating business processes  
Systems and methods of investigating business processes are described. These systems and methods support real-time monitoring, analysis, management, and optimization of business processes. A...
7607056 Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices  
Disclosed herein is a semiconductor test apparatus for simultaneously testing a plurality of semiconductor devices. The semiconductor test apparatus includes a plurality of pattern generation...
7607043 Analysis of mutually exclusive conflicts among redundant devices  
A system for analyzing mutually exclusive conflicts among a plurality of redundant devices in a computer system includes a data management module operable on the computer system. The data...
7607040 Methods and systems for conducting processor health-checks  
Systems and methods for conducting processor health-checks are provided. In one embodiment, a method for evaluating the status of a processor is provided. The method includes, for example,...
7603596 Memory device capable of detecting its failure  
A memory device capable of detecting its failure, the memory device includes a data input section for receiving data applied from an external part of the memory device; a latch section for...
7603595 Memory test circuit and method  
A memory test circuit according to an embodiment of the invention executes a test on a memory in accordance with a pattern mode signal designating a sub-test pattern included in a test pattern and...
7596731 Test time reduction algorithm  
Exemplary embodiments provide a method and system for reducing test time for electronic devices. The method and system aspects include receiving a test data file containing results from a set of...
7596718 Ranged fault signatures for fault diagnosis  
A method and apparatus for diagnosing faults. A fault is detected. One or more process variables that contributed to the fault are determined. A relative contribution of each of the one or more...
7596717 Microcomputer and debugging method  
A microcomputer includes a first memory area that stores a first program, a second memory area that stores a second program, a CPU that operates in accordance with the first program and the second...
7596716 Method and system for managing networks  
The system and method of the present invention apply information filters ( 83 A) hierarchically to information ( 14 ) such as, for example, alerts/events generated by an operational electronic...
7594206 Fault detecting method and layout method for semiconductor integrated circuit  
The present invention provides a fault detecting method and a layout method for a semiconductor integrated circuit. The fault detecting method performs detection for faults in a semiconductor...
7590911 Apparatus and method for testing and debugging an integrated circuit  
An integrated circuit includes a first deserializer that deserializes serial data containing at least one of test instructions and/or data in a first format. A monitor module communicates with the...
7590737 System and method for customized I/O fencing for preventing data corruption in computer system clusters  
Systems, methods, apparatus and software can implement a flexible I/O fence mechanism framework allowing clustered computer systems to conveniently use one or more I/O fencing techniques. Various...
7587662 Detection of noise within an operating frequency on a network  
Noise is detected within an operating frequency of a communication medium. Messages are monitored on the communication medium for corrupted messages. A noise detected signal is generated when a...
7587638 Method and system for generating and monitoring variable load on an application under test  
A facility executes on a central computer system and applies a time-varying load to an application program under test (AUT). The facility executes in a multiple number of modes or hierarchical...
7587636 Unit test generalization  
A computer system provides a test program and one or more unit tests, such as a traditional unit test and or a parameterized unit test. The system also includes a constraint solver, a theorem...
7587523 Distributed systems for determining card status  
The master/slave arbitration process includes a voting process that allows cards within the system to use voting to determine the health of each of the individual cards. The voting process thereby...
7587296 Adaptive multivariate fault detection  
A method and apparatus for detecting faults. A set of data samples is received, the set of data samples including multiple process variables. One or more multivariate statistical models are...
7587202 Method for conducting digital interface and baseband circuitry tests using digital loopback  
In a mobile device having a primary baseband circuit and a secondary baseband circuit and an interface between the primary baseband circuit and a secondary baseband circuit, a method for testing...
7581138 Method, system and computer program for managing test processes based on customized UML diagrams  
A method for facilitating the management of a test process is proposed. For this purpose, the different test scenarios included in the process and their execution dependencies are represented by...
7577872 Dynamic system diagnosis  
In one embodiment, the invention is a computer-implemented method that (i) launches a diagnostic tool designed for use with a primary software application, (ii) determines whether a diagnostic...
7577550 System and method for detecting performance anomalies in a computing system  
A method comprises receiving, by learning logic, historical metrics of a computing system being monitored. The learning logic determines, from the received historical metrics, forms of...
7577542 Method and apparatus for dynamically adjusting the resolution of telemetry signals  
One embodiment of the present invention provides a system that dynamically adjusts data resolution during proactive-fault-monitoring in a computer system. During operation, the system temporarily...
7577212 Method and system for generating reference voltages for signal receivers  
A method and system for generating a reference voltage for memory device signal receivers operates in either a calibration mode or a normal operating mode. In the calibration mode, the magnitude of...
7574696 Multiprocessor application interface requiring no utilization of a multiprocessor operating system  
A test monitor for a multiprocessor machine including a plurality of processors each configured to execute a test by interpreting a script language for writing tests, in which one of the processors...
7574644 Functional pattern logic diagnostic method  
A method of diagnosing semiconductor device functional testing failures by combining deterministic and functional testing to create a new test pattern based on functional failure by determining the...
7574633 Test apparatus, adjustment method and recording medium  
There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable...
7571363 Parametric measurement of high-speed I/O systems  
A phase comparator is used to test a device under test comprising an input/output (I/O) circuit by applying a signal to the device under test; extracting a phase signal from the phase comparator;...
7571351 Method for controlling a policy  
The method includes confirmation policy processing for acquiring confirmation item information indicating a condition every confirmation item to distinguish a cause at time of fault occurrence,...
7570579 Method and apparatus for fast failure detection in switched LAN networks  
A switch detects port failures and identifies a MAC address associated with the port failure. The switch then sends a failure notification message to other ports on the switch that identifies the...
7570076 Segmented programmable capacitor array for improved density and reduced leakage  
A capacitor circuit and method to reduce layout area, leakage current, and to improve yield is disclosed. The circuit includes an output terminal ( 100 ), a plurality of circuit elements ( 322,...
7565523 Apparatus and method for restoring master boot record infected with virus  
An apparatus for and a method of restoring a master boot record infected with a virus. The apparatus comprises a first storage unit storing a master boot record (MBR), and a virus check unit...
7559001 Method and apparatus for executing commands and generation of automation scripts and test cases  
A command execution terminal includes an interactive graphical-user-interface (GUI) for sending commands to devices under test and to capture and display the command responses and maintaining a...
7558966 Notifying remote administrator of platform integrity determination  
Method and Apparatuses for determining integrity of a platform and notifying a remote system. In one embodiment a verification agent accesses a portion of a memory on the platform at initialization...
7558633 Test system for a user terminal apparatus and test automation method therefor  
In a test automation method and test system for a user end apparatus that can be communicatively connected with a test automation apparatus, at least one data processing unit and a non-volatile...