|
Match
|
Document |
Document Title |
|
|
7620513 |
Optical time domain reflectometer, and optical fiber measuring method and optical fiber measuring system using the same
In order to easily and efficiently carry out various characteristic evaluations of optical fibers which have been laid down, a table file which is for carrying out association of optical fibers...
|
|
|
7616927 |
Method and apparatus to reduce multipath effects on radio link control measurements
One or more median filter circuits are used to filter radio link control measurements corresponding to one or more radio link parameters of interest, such as received signal quality or round trip...
|
|
|
7599755 |
System and method for dynamically simulating value stream and network maps
A computer readable medium comprising instructions which when executed by a computer system causes the computer to implement a method for creating a dynamic value network map of a process flow is...
|
|
|
7574308 |
System and computer-based method for tracking an implantable medical device characteristic during a coating process
A system, method and computer product track a stent characteristic during a coating process. For example, a method comprises receiving an implantable medical device from a coating apparatus, after...
|
|
|
7571074 |
Method of using a wafer-thickness-dependant profile library
A method for facilitating an ODP (optical digital profile) measurement of a semiconductor wafer. The method includes obtaining real time wafer characteristic data for a measurement site on the...
|
|
|
7565273 |
Determination of the age, identification and sealing of a product containing volatile components
The invention concerns a method and system for determining the age of an object such as a product containing volatile components, comprising: measuring a first strength of a first scent with a...
|
|
|
7558683 |
Method for inspecting defect and system therefor
Based on a plurality of defects' position-coordinates and attribute detected by an inspecting apparatus, defects that are easily detectable by an observing apparatus are selected. With these...
|
|
|
7542880 |
Time weighted moving average filter
A method for estimating a state associated with a process includes receiving a state observation associated with the process. The state observation has an associated process time. A weighting...
|
|
|
7539586 |
Correction method and measuring instrument
A measuring instrument comprising a stylus displaced following a work, the instrument further comprises a corrector for correcting a displacement in the translation axis direction value according...
|
|
|
7532990 |
System and method for press signature tracking and data association
In an exemplary embodiment of the present invention, a method for operation of a printing press includes the steps of generating unique individual signature identification information, tracking...
|
|
|
7526394 |
Quality assessment tool
Non-intrusive speech quality assessment method and apparatus for: storing a sequence of intercepted packets associated with a call, each packet containing speech data, and an indication of a...
|
|
|
7520188 |
Method for controlling quality of a fiberglass mat
A method is provided for controlling the quality of a fiberglass mat. The method includes the steps of dyeing a test specimen of the fiberglass mat, scanning the test specimen with an optical...
|
|
|
7519492 |
Apparatus and method for fully automated closed system quality control of a substance
The present invention provides an apparatus and method for automated quality control of a substance comprising a compartment wherein a substance is located, a monitoring device coupled to the...
|
|
|
7516042 |
Load test load modeling based on rates of user operations
Various technologies and techniques are disclosed for performing load tests based upon user pace. A load test application is provided. Load test settings are received from a user that includes a...
|
|
|
7502658 |
Methods of fabricating optimization involving process sequence analysis
An exemplary method for performing fabrication sequence analysis, the method comprising, defining a process group, wherein a process group includes fabrication processes in a fabrication sequence,...
|
|
|
7484357 |
Apparatus, system, and method for determining and implementing estimate reliability
An apparatus, system, and method are disclosed for determining the reliability of an estimate such as particulate accumulation on a diesel particulate filter, weighing the estimate according to a...
|
|
|
7469170 |
Device and method for assessing the safety of systems and for obtaining safety in system, and corresponding computer program
Method, device and computer program for implementing a safety analysis in systems, in particular in a motor vehicle, the systems or the at least one system having multiple components linked by...
|
|
|
7467054 |
System and method for integrating the internal and external quality control programs of a laboratory
A system and method that enables a laboratory to integrate its internal and external quality control programs to thereby control the quality of its laboratory testing services. The system comprises...
|
|
|
7460968 |
Method and apparatus for selecting wafers for sampling
The present invention provides a method and apparatus for selecting wafers for sampling. The method includes determining a plurality of sampling rules associated with at least one of a plurality of...
|
|
|
7457679 |
Solid model of statistical process control
A computer based proactive process control technique used to predict the capability of a manufacturing process. A solid model of statistical process control is created by a computer program to...
|
|
|
7452733 |
Method of increasing reliability of packaged semiconductor integrated circuit dice
Semiconductor dice are electrically tested prior to final assembly. Dice failing the test are identified and not packaged. However, “good dice” (i.e., those dice that passed testing) in...
|
|
|
7421358 |
Method and system for measurement data evaluation in semiconductor processing by correlation-based data filtering
By performing a contingency-based correlation test of measurement data, such as defect data, with respect to electrical test data after progressively filtering the measurement data, an enhanced...
|
|
|
7409306 |
System and method for estimating reliability of components for testing and quality optimization
A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal...
|
|
|
7401004 |
System for reviewing defects, a computer implemented method for reviewing defects, and a method for fabricating electronic devices
A system for reviewing defects includes an analysis module configured to analyze defect information of a plurality of intermediate products, the defect information including information of an...
|
|
|
7386420 |
Data analysis method for integrated circuit process and semiconductor process
A data analysis method for an integrated circuit process is described, for analyzing the results of at least an in-line quality test, a product test and a yield test done to the products of the IC...
|
|
|
7379847 |
High bandwidth image transfer
The above and other needs are met by an inspection system having a sensor array that is connected to a high speed network connection, and is adapted to provide image data in regard to images of a...
|
|
|
7366620 |
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
Equipment extracts components of spatial frequency that need to be evaluated in manufacturing a device or in analyzing a material or process out of edge roughness on fine line patterns and displays...
|
|
|
7359830 |
Method for automatic on-line calibration of a process model
A method is disclosed for collecting and processing raw process data. The method includes processing the raw data through a process model to obtain a prediction of the process quality; processing...
|
|
|
7359813 |
Outlier screening technique
Multiple parameters of manufactured units are continually measured until some of the units fail, where failure can be accelerated by adjusting operating conditions. Pre-failure data is then...
|
|
|
7348559 |
Defect inspection and charged particle beam apparatus
In a defect inspection apparatus which combines a plurality of probes for measuring electric properties of a specimen including a fine circuit line pattern with a charged particle beam apparatus,...
|
|
|
7346411 |
Automatic control and monitoring system for splice overlapping tolerance in textile ply
The present system enables the monitoring and automatic control of the tolerance in splice overlap of textile play , though the identification of the overlap area, identification and counting of...
|
|
|
7343352 |
Method and system for assessing the quality and cost of inspection
A method, system, and software for assessing the cost tradeoffs associated with performing inspection includes determining measurement variations and product characteristic variations to define an...
|
|
|
7333907 |
System and methods for characterization of chemical arrays for quality control
Systems, methods and computer readable media for characterizing a chemical array. At least one metric indicative of accuracy of location of features on the chemical array by a feature extraction...
|
|
|
7332359 |
Semiconductor device inspection method
Techniques for inspecting semiconductor devices. An inspection condition using chip matrix data and chip size data is set. The intricate circuit patterns of at least one semiconductor device is...
|
|
|
7324905 |
Apparatus, system and method for automating an interactive inspection process
An apparatus, system and method to automate an interactive quality control inspection process. The apparatus may query a user for a response to an audit question integral to a quality control...
|
|
|
7324862 |
Quality control apparatus and control method of the same, and recording medium recorded with quality control program
Various items of data collected at different process steps are associated on production sites where traceability is hard to conduct. A quality control apparatus controls a manufacturing process in...
|
|
|
7318000 |
Biometric quality control process
Systems and methods configured to guide and manage laboratory analytical process control operations. A Biometric quality control (QC) process application is configured to monitor bias and...
|
|
|
7302367 |
Library accuracy enhancement and evaluation
The accuracy of a library of simulated-diffraction signals for use in optical metrology of a structure formed on a wafer is evaluated by utilizing an identity relationship inherent to simulated...
|
|
|
7289862 |
Methods to support process quality and maintenance during control of an industrial process such as welding
A number of methods to support process quality and maintenance during control of an industrial process such as welding are provided. The methods provide, among other things: automatic process limit...
|
|
|
7282942 |
Enhanced sampling methodology for semiconductor processing
The present invention improves wafer sampling methods by partitioning a semiconductor wafer into a set of sampling regions and calculating yield of a sampling region(s) of the semiconductor wafer.
|
|
|
7275016 |
Method and system for providing problem identification and trouble-shooting services
In a complex plant most of the problems or errors will occur only once. Therefore corrective maintenance and trouble-shooting staff can not go back or hark back to ready-made solutions for these...
|
|
|
7272532 |
Method for predicting the quality of a product
A method is provided for predicting a quality characteristic of a product to be manufactured. The method may integrate one or more of feature and tolerance information associated with the product,...
|
|
|
7269526 |
Aggregated run-to-run process control for wafer yield optimization
A method for processing wafers in a batch processing tool that optimizes yield by minimizing within batch wafer variation in a wafer process. In a tool having a plurality of available wafer...
|
|
|
7267799 |
Universal optical imaging and processing system
The present disclosure is directed, in general, to an optical reading system, a universal testing cartridge, and a method of coupling optical reading systems. In a particular illustrative...
|
|
|
7266234 |
Method and device to control the straightness and torsions of long products
Device and method to control the straightness and torsions of a long product ( 11 ), comprising at least two profile-detection devices ( 12 a , 12 b , 12 c ), each presenting a visual field ( 13 )...
|
|
|
7263510 |
Human factors process failure modes and effects analysis (HF PFMEA) software tool
Methods, computer-readable media, and systems for automatically performing Human Factors Process Failure Modes and Effects Analysis for a process are provided. At least one task involved in a...
|
|
|
7260509 |
Method for estimating changes in product life resulting from HALT using quadratic acceleration model
A method provides early estimation of product life using accelerated stress testing data. In an embodiment, data measured from a product operating in a first, high-stress environment is used to...
|
|
|
7260444 |
Real-time management systems and methods for manufacturing management and yield rate analysis integration
A real-time management method for manufacturing management and yield rate analysis integration. A plurality of yield rates relating to wafer products are summed and averaged for a historical yield...
|
|
|
7257502 |
Determining metrology sampling decisions based on fabrication simulation
A method for determining metrology sampling rates for workpieces in a process flow includes determining a current status of the process flow. Future processing of the workpieces in the process flow...
|
|
|
7251578 |
Method and system of measuring data quality
Data quality measurement is provided for use in a data processing stream, which comprises at least one upstream data processing system and at least one downstream data processing system. An input...
|