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6810343 |
Method and system for monitoring service quality in a restaurant
A method and system for monitoring service quality in a restaurant are disclosed. Multiple sensor modules are installed at each table of a restaurant for detecting restaurant customer service...
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6810334 |
Method for inspecting wafer defects of a semiconductor device
Disclosed is a method for inspecting defects of a wafer of a semiconductor device, wherein the wafer is set up with reference coordinates for a respective die so that inspection time is reduced and...
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6801824 |
Substrate selector
Substrate-selecting equipment selects substrates used for objective products from among a group of substrates with photosensitive material layers used for the production of photomask. The...
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6795580 |
Picture quality measurement using blockiness
A picture quality measurement technique using blockiness provides realtime analysis without the use of a reference signal. A field/frame of an image represented by a processed video signal is...
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6789032 |
Method of statistical binning for reliability selection
A statistical method is described for reliability selection of dies on semiconductor wafers using critical wafer yield parameters. This is combined with other data from the wafer or module level...
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6789031 |
Method for determining the equivalency index of products, processes, and services
A method is disclosed wherewith a person skilled in the art of statistical quality control may determine whether a process, a product or a service is statically equivalent to another of known...
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6785617 |
Method and apparatus for wafer analysis
The present invention discloses method and apparatus for wafer analysis. First, a plurality of specific distribution maps, which respectively refer to a defect pattern distribution in a pattern...
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6785623 |
Business to business electronic test monitoring information system
A system/method of establishing a two-way communication system between a testing/manufacturing site and a component vendor is disclosed. The system allows the test results related to a component...
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6782331 |
Graphical user interface for testing integrated circuits
A system that includes a graphical user interface (GUI) connected to an input/output device of a computer system and one or more test instruments producing a set of electrical signals. The system...
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6778934 |
AUTOMATIC MEASURING APPARATUS, AUTOMATIC MEASUREMENT DATA PROCESSING AND CONTROL APPARATUS, NETWORK SYSTEM, AND RECORDING MEDIUM OF AUTOMATIC MEASUREMENT PROCESSING AND CONTROL PROGRAM THAT SELECTS FROM A PLURALITY OF TEST CONDITIONS
When measurement information of a model is entered, a condition file is automatically selected corresponding to a measurement category selected for each measured object displayed on an...
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6775630 |
Web-based interface with defect database to view and update failure events
The present invention is directed to a system and method for providing access to semiconductor manufacturing information. The present invention system and method allows users to interface with...
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6768951 |
Apparatus and method for measuring a parameter in a host device
An apparatus receives an indicating signal representing a parameter at a monitoring locus and includes: (a) A first measuring unit having a first input coupled for selectively receiving the...
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6766267 |
Automated monitoring system, virtual oven and method for stress testing logically grouped modules
A virtual oven efficiently conducts stress testing of large numbers of modules. The virtual oven includes a logical grouping of modules, a controller, test instruments and a database which are all...
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6763309 |
Method and system for the development of materials
A catalyst development engine (CDE) provides a rapid approach to the rational development of scalable heterogeneous catalysts and of high-performance solid materials. The CDE includes three main...
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6760683 |
Method of evaluating performance of a hematology analyzer
A method for evaluating the performance of an instrument, particularly a hematology analyzer, by comparing its operating data with data compiled from a group of like instruments is provided. The...
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6754593 |
Method and apparatus for measuring defects
A method for measuring defects includes receiving a defect characteristic measurement for each measurement site in a first subset of a plurality of measurement sites on a workpiece. A second subset...
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6754600 |
Device for evaluating internal quality of vegetable or fruit, method for warm-up operation of the device, and method for measuring internal quality
An extremely convenient apparatus for evaluating the inner quality of vegetables and fruits which is small and inexpensive, can be introduced easily even by small-scaled enterprisers, in which an...
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6748337 |
Method and apparatus for providing quality control in an instrument for medical analysis
A method and apparatus for providing quality control in a medical analysis instrument is provided. The method includes the steps of: 1) sending one or more quality control specimens to an operator...
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6748342 |
Method and monitoring device for monitoring the quality of data transmission over analog lines
The method and respective device monitors the quality of data transmission over wavelength-division-multiplexed channels on an optical waveguide using an analog check signal. The analog check...
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6741941 |
Method and apparatus for analyzing defect information
To efficiently extract identification of apparatuses causing problems in a thin-film device manufacturing process, candidates for the problem-generating manufacturing apparatus are extracted by...
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6728594 |
Central control system and method for fine tuning individual cigarette manufacturing control systems
The present invention includes a central control system and method for fine tuning a cigarette manufacturing process. A measurement device captures measurements of particular cigarette properties....
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6725168 |
Vehicle/tire performance simulating method
A simulating method for vehicle/tire performances which includes: a tire model preparing step (s 1 ) of preparing a tire model of a tire including a ply made out of a finite number of elements; a...
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6723574 |
Method for quantifying uniformity patterns and including expert knowledge for tool development and control
A system and method of for determining multiple uniformity metrics of a semiconductor wafer manufacturing process includes collecting a quantity across each one of a group of semiconductor wafers....
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6721691 |
Metrology hardware specification using a hardware simulator
A method and system in metrology for integrated circuits, for incorporating the effects of small metrology hardware-based and material-based parameter variations into a library of simulated...
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6714884 |
Method and apparatus for providing communication between a defect source identifier and a tool data collection and control system
A method and apparatus for providing communication between a defect source identifier and a tool data collection and control system. The defect source identifier collects wafer data until a defect...
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6711514 |
Method, apparatus and product for evaluating test data
Method, apparatus and product for analyzing a quality control regimen comprising one or more quality control tests, to determine if the tests are in statistical control, and therefore could be...
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6708129 |
Method and apparatus for wafer-to-wafer control with partial measurement data
A method and an apparatus for performing a process control using partial measurement data. A process operation is performed on a semiconductor wafer. Inline metrology data related to the process of...
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6704692 |
Method and system for tracking multiple objects
An improved method and system for solving a combinatorial optimization problem, such as a tracking problem, to define a plurality of associations of measurements taken of a plurality of objects is...
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6694208 |
Method for prioritizing failure modes to improve yield rate in manufacturing semiconductor devices
A method for determining a failure mode with the greatest effect on yield loss in a semiconductor manufacturing process is disclosed. A predetermined number of wafers are processed, and each chip...
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6691052 |
Apparatus and methods for generating an inspection reference pattern
Disclosed are methods and apparatus for generating reference images to reduce the number of false defects found when comparing a reference image to a corresponding target image of a reticle or mask...
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6689324 |
Communication system for automatic synthesis apparatus
A communication system for automatic synthesis apparatus is formed of an automatic synthesis apparatus and a computer connected to the automatic synthesis apparatus. The automatic synthesis...
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6691051 |
Transient distance to fault measurement
A method of determining distance to fault of a transient event in a transmission system uses per frequency triggered I and Q data representing voltage and phase of a return signal in the frequency...
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6684173 |
System and method of testing non-volatile memory cells
The present invention provides a screen for abnormal cells using the cell transconductance. In one embodiment, a method involves reading cells against an elevated reference current while applying...
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6678623 |
Failure analysis device and failure analysis method
A failure analysis device is provided which can realize automatic light emission analysis even when the tested chips have logic LSIs etc. fabricated therein. A comparator ( 11 ) compares individual...
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6675113 |
Monobit-run frequency on-line randomness test
The present invention is a method and apparatus for testing the random numbers generated by a random number generator in real time. A stream of random bits is generated using said random number...
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6675119 |
In-situ measurement method and apparatus in adverse environment
A method and apparatus for making in situ measurements of process parameters in the adverse environment of manufacturing processes such as silicon wafer processing. Rather than using surrogate...
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6665627 |
Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment
Tester derating factor (TDF) arrangements and methodologies providing improvements in semiconductor start-to-finish manufacturing arrangements, especially within DV testing and in the world of...
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6658361 |
Heaviest only fail potential
A method for determining an effective fatal defect count based on defects in a plurality of inspected integrated circuits includes acquiring defect information related to defects in the integrated...
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6650957 |
Method and apparatus for run-to-run control of deposition process
A method and an apparatus for controlling a deposition process in a manufacturing process. A process recipe setting step is performed. A process run of semiconductor devices is performed based upon...
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6647348 |
Latent defect classification system
A method for identifying an integrated circuit having a latent defect. Test data corresponding to a set of integrated circuits is obtained, where the set of integrated circuits was processed on a...
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6631336 |
Nondestructive method of quality control of high-voltage systems and device for use of the method
A method and device applicable to HV generators and X-ray tubes, and a computer program and support for the program. In the method a determination is made of a scale of values representing the...
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6629051 |
Defect inspection data processing system
A defect inspection data processing system includes a client computer having an image pickup section for picking up a two-dimensional image of a to-be-inspected object to be processed in a...
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6629060 |
Support method, quality control method, and device therefor
The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer ( 2 ) and a control device ( 1 ) are connected by a network (...
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6622102 |
Method and system for tracking manufacturing data for integrated circuit parts
An apparatus and method for tracking data for individual integrated circuits through the manufacturing process is described by programming an individual part identifier into a non-volatile portion...
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6618682 |
Method for test optimization using historical and actual fabrication test data
A method and system are provided that minimize wafer or package level test time without adversely impacting yields in downstream manufacturing processes or degrading outgoing quality levels. The...
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6594597 |
Press residual life monitor
A method and apparatus for determining the original warranty and extended warranty for a mechanical device. A value indicative of the severity of the use of a mechanical device is utilized to...
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6591225 |
System for evaluating performance of a combined-cycle power plant
A method and system for evaluating and optimizing the performance of a combined-cycle power plant. The optimization system combines a plant model that predicts performance of a combined-cycle power...
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6577971 |
System and method for evaluating craftsmanship
A system and method for evaluating craftsmanship is disclosed. A system for evaluating the craftsmanship of an article of manufacture may include a list of components to be evaluated, a list of...
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6577969 |
Food safety administration system
A food safety administration system for controlling safety of of food handling locations, wherein a mobile inspection terminal measures the temperature of an object under test or receives data on...
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6577970 |
Method of determining a crystallographic quality of a material located on a substrate
The present invention provides a method of determining a crystallographic quality of a material located on a substrate. The method includes determining a set of crystallographic solutions for an...
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