Matches 201 - 250 out of 393 < 1 2 3 4 5 6 7 8 >
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6748337 Method and apparatus for providing quality control in an instrument for medical analysis  
A method and apparatus for providing quality control in a medical analysis instrument is provided. The method includes the steps of: 1) sending one or more quality control specimens to an operator...
6741951 Method for performing a hazard review and safety analysis of a product or system  
A method for analyzing a system for safety to personnel or other systems is disclosed comprising: identifying at least one operating parameter of a first subcomponent of said product; identifying...
6741941 Method and apparatus for analyzing defect information  
To efficiently extract identification of apparatuses causing problems in a thin-film device manufacturing process, candidates for the problem-generating manufacturing apparatus are extracted by...
6728594 Central control system and method for fine tuning individual cigarette manufacturing control systems  
The present invention includes a central control system and method for fine tuning a cigarette manufacturing process. A measurement device captures measurements of particular cigarette properties....
6725168 Vehicle/tire performance simulating method  
A simulating method for vehicle/tire performances which includes: a tire model preparing step (s 1 ) of preparing a tire model of a tire including a ply made out of a finite number of elements; a...
6723574 Method for quantifying uniformity patterns and including expert knowledge for tool development and control  
A system and method of for determining multiple uniformity metrics of a semiconductor wafer manufacturing process includes collecting a quantity across each one of a group of semiconductor wafers....
6721691 Metrology hardware specification using a hardware simulator  
A method and system in metrology for integrated circuits, for incorporating the effects of small metrology hardware-based and material-based parameter variations into a library of simulated...
6714884 Method and apparatus for providing communication between a defect source identifier and a tool data collection and control system  
A method and apparatus for providing communication between a defect source identifier and a tool data collection and control system. The defect source identifier collects wafer data until a defect...
6711514 Method, apparatus and product for evaluating test data  
Method, apparatus and product for analyzing a quality control regimen comprising one or more quality control tests, to determine if the tests are in statistical control, and therefore could be...
6708129 Method and apparatus for wafer-to-wafer control with partial measurement data  
A method and an apparatus for performing a process control using partial measurement data. A process operation is performed on a semiconductor wafer. Inline metrology data related to the process of...
6704692 Method and system for tracking multiple objects  
An improved method and system for solving a combinatorial optimization problem, such as a tracking problem, to define a plurality of associations of measurements taken of a plurality of objects is...
6694208 Method for prioritizing failure modes to improve yield rate in manufacturing semiconductor devices  
A method for determining a failure mode with the greatest effect on yield loss in a semiconductor manufacturing process is disclosed. A predetermined number of wafers are processed, and each chip...
6691052 Apparatus and methods for generating an inspection reference pattern  
Disclosed are methods and apparatus for generating reference images to reduce the number of false defects found when comparing a reference image to a corresponding target image of a reticle or mask...
6691051 Transient distance to fault measurement  
A method of determining distance to fault of a transient event in a transmission system uses per frequency triggered I and Q data representing voltage and phase of a return signal in the frequency...
6689324 Communication system for automatic synthesis apparatus  
A communication system for automatic synthesis apparatus is formed of an automatic synthesis apparatus and a computer connected to the automatic synthesis apparatus. The automatic synthesis...
6684173 System and method of testing non-volatile memory cells  
The present invention provides a screen for abnormal cells using the cell transconductance. In one embodiment, a method involves reading cells against an elevated reference current while applying...
6678623 Failure analysis device and failure analysis method  
A failure analysis device is provided which can realize automatic light emission analysis even when the tested chips have logic LSIs etc. fabricated therein. A comparator ( 11 ) compares individual...
6675119 In-situ measurement method and apparatus in adverse environment  
A method and apparatus for making in situ measurements of process parameters in the adverse environment of manufacturing processes such as silicon wafer processing. Rather than using surrogate...
6675113 Monobit-run frequency on-line randomness test  
The present invention is a method and apparatus for testing the random numbers generated by a random number generator in real time. A stream of random bits is generated using said random number...
6665627 Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment  
Tester derating factor (TDF) arrangements and methodologies providing improvements in semiconductor start-to-finish manufacturing arrangements, especially within DV testing and in the world of...
6658361 Heaviest only fail potential  
A method for determining an effective fatal defect count based on defects in a plurality of inspected integrated circuits includes acquiring defect information related to defects in the integrated...
6650957 Method and apparatus for run-to-run control of deposition process  
A method and an apparatus for controlling a deposition process in a manufacturing process. A process recipe setting step is performed. A process run of semiconductor devices is performed based upon...
6647348 Latent defect classification system  
A method for identifying an integrated circuit having a latent defect. Test data corresponding to a set of integrated circuits is obtained, where the set of integrated circuits was processed on a...
6633234 Method for detecting blade breakage using rate and/or impedance information  
Failures associate with bad hand pieces and blade failures in an ultrasonic surgical system are distinguished by monitoring the rate of change of the resonance frequency and the rate of change of...
6631336 Nondestructive method of quality control of high-voltage systems and device for use of the method  
A method and device applicable to HV generators and X-ray tubes, and a computer program and support for the program. In the method a determination is made of a scale of values representing the...
6629060 Support method, quality control method, and device therefor  
The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer ( 2 ) and a control device ( 1 ) are connected by a network (...
6629051 Defect inspection data processing system  
A defect inspection data processing system includes a client computer having an image pickup section for picking up a two-dimensional image of a to-be-inspected object to be processed in a...
6629048 Measurement test instrument and associated voltage management system for accessory device  
A measurement test instrument voltage management system for an accessory device has a accessory device interface that provides a voltage to a memory device in the accessory device. A sensing...
6622102 Method and system for tracking manufacturing data for integrated circuit parts  
An apparatus and method for tracking data for individual integrated circuits through the manufacturing process is described by programming an individual part identifier into a non-volatile portion...
6618682 Method for test optimization using historical and actual fabrication test data  
A method and system are provided that minimize wafer or package level test time without adversely impacting yields in downstream manufacturing processes or degrading outgoing quality levels. The...
6594597 Press residual life monitor  
A method and apparatus for determining the original warranty and extended warranty for a mechanical device. A value indicative of the severity of the use of a mechanical device is utilized to...
6591225 System for evaluating performance of a combined-cycle power plant  
A method and system for evaluating and optimizing the performance of a combined-cycle power plant. The optimization system combines a plant model that predicts performance of a combined-cycle power...
6591207 Semiconductor production system  
A semiconductor production system has a semiconductor manufacturing apparatus having an exposure unit, a control unit for controlling the exposure unit and a storage device; a semiconductor...
6577987 Operational monitoring for a converter  
Monitoring a converter ( 1 ) includes detecting whether a value of an input variable ( 2 ) for the converter ( 1 ) assumes a first prescribed input reference value ( 41 ) and checking whether an...
6577971 System and method for evaluating craftsmanship  
A system and method for evaluating craftsmanship is disclosed. A system for evaluating the craftsmanship of an article of manufacture may include a list of components to be evaluated, a list of...
6577970 Method of determining a crystallographic quality of a material located on a substrate  
The present invention provides a method of determining a crystallographic quality of a material located on a substrate. The method includes determining a set of crystallographic solutions for an...
6577969 Food safety administration system  
A food safety administration system for controlling safety of of food handling locations, wherein a mobile inspection terminal measures the temperature of an object under test or receives data on...
6574580 Pharmacy pill counting vision system  
A semi-automated pill counting system ( 10 ) using digital imaging technology and image recognition software including a modified Hough Transform. The system ( 10 ) comprises a light source ( 12 );...
6574574 Method of and apparatus for ascertaining the genuineness of packaged commodities  
The genuineness of commodities, such as arrays of filter cigarettes in containers of the type having a closure is ascertained by providing the commodities with identifying indicia prior to their...
6556925 Signal processing system and signal processing method for cutting tool with abrasion sensor  
For determination of the expiration of the life of a cutting tool on the basis of a resistance signal from sensor lines, a true signal component indicative of the abrasion of the sensor lines...
6556883 Performance value determination system and method  
A performance value determination system with respect to goods having an index for objectively evaluating performance thereof includes: a performance value determination condition input and storing...
6553324 Method and device for detection of a defect in a sensor system  
A method for implementation in a measuring system containing a sensor system and an arithmetic unit for detection of a defect in the measuring system, wherein at least one state variable of the...
6553273 Fraction defective estimating method, system for carrying out the same and recording medium  
A method and a system for estimating an assembling-related fraction defective coefficient of an article in the stage preceding to manufacturing, e.g. at a stage of design. Assembling operation,...
6549876 Method of evaluating performance of a hematology analyzer  
A procedure for evaluating the performance of an instrument, particularly a hematology analyzer, by comparing its operating data with data compiled from a group of like instruments is provided. The...
6549864 Multivariate statistical process analysis systems and methods for the production of melt polycarbonate  
Computerized process control systems and methods for the production of melt polycarbonate include a plurality of sensors for obtaining a plurality of measurements relating to a plurality of...
6549863 Apparatus and method for generating map data  
Disclosed herein is a map data generating apparatus includes probers for generating map data from execution of each of a plurality of processes constituting wafer tests; and a cell controller for...
6546351 Note-specific currency processing  
A method for processing currency notes from various sources using source-specific processing templates. For each note processed, the system detects at least one unique identifier that may be used...
6542837 Wafer processing system  
A wafer processing system is described located in at least one clean room and having an arrangement of manufacturing units for performing individual manufacturing operations. In a manufacturing...
6542830 Process control system  
A process management system in accordance with the present invention includes inspection apparatuses for inspecting defects on a wafer, the inspection apparatuses being connected through a...
6539342 Sorting objects based on physical characteristics  
In this invention, the detection result indicating physical characteristics obtained from sensor sections and associated with a to-be-detected object for which it is determined that determination...
Matches 201 - 250 out of 393 < 1 2 3 4 5 6 7 8 >