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7623984 |
Test apparatus and electronic device
There is provided a test apparatus for testing a device under test. The test apparatus includes first and second period generators that respectively generate test period signals indicating test...
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7577542 |
Method and apparatus for dynamically adjusting the resolution of telemetry signals
One embodiment of the present invention provides a system that dynamically adjusts data resolution during proactive-fault-monitoring in a computer system. During operation, the system temporarily...
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7574633 |
Test apparatus, adjustment method and recording medium
There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable...
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7526535 |
Network-based system for configuring a programmable hardware element in a modeling system using hardware configuration programs determined based on a user specification
A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or...
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7522660 |
Pulse pattern generating apparatus
An object of this invention is to realize a pulse pattern generating apparatus that outputs a test signal of high waveform quality even when the shape of an eye pattern is changed. This invention...
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7505855 |
Multi-channel amplifier having programmable operational characteristics controlled with a serial interface
An amplifier having programmable operational characteristics and a serial communications interface is fabricated on an integrated circuit (IC). The serial communications interface controls the...
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7496480 |
Sweep manager for signal analysis
System and method for specifying a signal analysis function. First user input is received, e.g., to a graphical user interface (GUI), indicating a parameter for a first operation implementing at...
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7472033 |
Apparatus for controlling semiconductor chip characteristics
Apparatus including functional components of circuitry defined on a semiconductor chip, the functional components including a component having modifiable operating characteristics, a performance...
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7433527 |
Time series data dimensional compression apparatus
A time series data dimensional compression apparatus performing dimensional compression for improving the efficiency of searching for time series data without losing the features of data. The...
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7430479 |
System and method for analyzing content data
The system and method provide security and cargo handling personnel a versatile tool to rapidly check cargo for hidden radiological materials, explosives, drugs, and chemical weapons material....
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7424406 |
Filter characteristic measuring method and system
Described are a filter characteristic measuring method and system capable of measuring a gain of an analog filter adapted in a DUT (Device Under Test) and a frequency response at a high speed,...
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7412338 |
Radio frequency device within an energy sensor system
An energy measurement system including a radio frequency (“RF”) device powered by a solar panel. The RF device comprising a wireless communication port operative to transmit and receive...
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7409308 |
Method and device for verifying output signals of an integrated circuit
A system and method for testing an integrated circuit is provided. In one embodiment, a method includes comparing the signal level of the output signal of the integrated circuit to the signal level...
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7397865 |
Systems and methods of using IQ modulation for calibration or measurement
A system analyzer may generate an estimated frequency response of a device, system, communication medium, or combination thereof by utilizing a stimulus signal that is robust against IQ modulator...
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7395170 |
Methods and apparatus for data analysis
A method and apparatus for data analysis according to various aspects of the present invention is configured to automatically select one or more outlier identification algorithms for identifying...
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7359822 |
Testing device
A testing device that tests an electronic device includes a test pattern outputting unit operable to output a test pattern to the electronic device, a deciding unit operable to decide whether an...
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7353137 |
Shoe-based weight measuring system
A shoe-based weight measuring system, comprising: a shoe; one or more weight sensitive detectors constructed and arranged with the shoe to sense weight of a person wearing the shoe and walking or...
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7349827 |
System and method for reporting website activity based on inferred attribution methodology
A method and system for reporting website activity. According to an example embodiment, the system receives event-level data representing visitor activity through navigation entities on a client...
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7342524 |
Waveform generator, waveform shaper, and testing apparatus
There is provided a waveform generator that generates a waveform. The waveform generator includes: a lamp waveform generating section that generates a lamp wave of which a signal value linearly...
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7337066 |
System and method for automated baseline correction for Raman spectra
A system and method for automated baseline correction for Raman spectra is disclosed which may operate as a piecewise-linear baseline correction function. In an embodiment, a first set of data...
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7317294 |
Pulse generator and method thereof
A pulse generator and method thereof. The pulse generator may include a first switching unit receiving a plurality of receiving a plurality of time interval indicators and a first selection signal....
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7313498 |
Device and method for testing an electrical circuit
A method and device for testing an electrical circuit, which do not require a thorough electrical circuit simulation but reliably identifying circuit faults. Preferred embodiments generate a fault...
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7310581 |
Bulk material analyzer system
A real-time bulk material analyzing system is disclosed for analyzing the elemental characteristics of bulk material passing by the system on a moving conveyor belt. An exemplary embodiment...
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7295961 |
Method for generating a circuit model
The present invention includes a method for generating a model of a circuit having an input port and an output port. The method determines an amplitude for current leaving the output port at a...
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7275004 |
Method and apparatus to perform on-die waveform capture
An integrated circuit is provided that includes a first port to receive a first signal from a first channel and a first device coupled to the first port to modify a channel response of the first...
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7272539 |
Representation generation method, representation generation device, and representation generation system
Unique representation, such as music or image full of originality, is generated in relation to a specific data sequence such as a telephone number. A music generation server 10 is provided with...
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7260515 |
Method and apparatus for simulating transparent latches
A method and apparatus for cycle-based simulation of a transparent latch includes classifying a phase of the transparent latch, classifying a phase of an input to the transparent latch, and...
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7254171 |
Equaliser for digital communications systems and method of equalisation
Equalisation of a communication channel is achieved through use of a Wiener filter frequency response mechanism that operates to transform at least a portion of a data stream generated from a...
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7250772 |
Method and apparatus for characterizing a signal path carrying an operational signal
A method of characterizing a signal path includes (i) generating a reference spread-spectrum signal; (ii) coupling the reference spread-spectrum signal into the signal path while the signal path is...
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7248987 |
Signal processing system for sensor
A signal processing system for a sensor for judging whether an event to be detected has occurred on the basis of a frequency of a sensor output includes a converting device for converting the...
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7236905 |
Test apparatus and power supply circuit
A power circuit which can reduce power consumption. More specifically, a testing apparatus for testing an electronic device which includes: a pattern generation unit for generating a test pattern...
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7236899 |
Micro-magnetization analysis program, method, and apparatus
A micro-magnetization analysis program, method, and apparatus which can analyze transitional change of a micro-magnetization state while one of a plurality of magnetic substances such as a...
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7231311 |
Method for characterizing high-frequency mixers
Novel excitation signals are specifically designed for testing a high-frequency mixer such that all of the desired intermodulation products are measurable after being converted by a sampling...
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7219022 |
Methods and apparatus for detecting failure of an isolation device
Apparatus for detecting failure of an isolation device includes a current sensor to sense current through the isolation device and a circuit responsive to the current sensor output signal and to an...
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7155362 |
Test device for signaling and waveform generation and monitoring
A system for generating a signal for testing a relay is provided. The system includes a plurality of argument vector arrays, each defines a digital signal for testing the relay. Each of the...
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7142974 |
Engine measuring equipment
Engine measuring equipment for obtaining engine torque regarded as necessary for engine performance assessments for a short time period during a period when engine revolution is under a transient...
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7107172 |
Test apparatus and setting method therefor
A test apparatus for testing an electric device includes a plurality of signal input-output units for inputting and/or outputting test signals in response to each of a plurality of terminals...
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7103496 |
Disc interface, disc interface system having the same, and disc interfacing method
A disc interface, a disc interface system having the same, and a disc interfacing method may be provided. The disc interface may receive a reduced quantity of test command information at a lower...
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7102357 |
Determination of worst case voltage in a power supply loop
Various systems, methods, and programs embodied in a computer readable medium are provided for determining a worst-case impedance and worst-case voltage of a power supply loop coupled to a power...
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7089142 |
Method and device for monitoring the function of an output stage having pulse width modulation
A method and a device for monitoring at least one output stage which is actuated by a microcontroller using an input signal having any pulse duty factor. The output signal from the output stage is...
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7089135 |
Event based IC test system
An event based test system for testing an IC device under test (DUT) designed under an automatic electronic design (EDA) environment. The event based test system includes an event memory for...
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7076394 |
Method and device for inspecting an object using a time delay integration sensor
A method for inspecting an object using a time delay integration sensor. A storage time of the time delay integration sensor is changed in response to a signal level of a signal outputted from the...
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7058528 |
Automated optimization of asymmetric waveform generator LC tuning electronics
Disclosed is method of controlling an asymmetric waveform generator including the steps of providing a reference timer signal, and generating an asymmetric waveform as a combination of a first...
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7050924 |
Test signalling
The perceptibility of degradations caused to signals transmitted over a transmission medium is measured by generating one or more predetermined transmission degradation conditions (e t ) and...
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7027940 |
Stepped sine wave frequency response measurement system
A low cost, low power and lightweight swept sine wave analysis system that is affordable to engineers, university laboratories and students, providing accurate magnitude and phase response...
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7024328 |
Systems and methods for non-intrusive testing of signals between circuits
Structures and methods for non-intrusive testing of communication signals exchanged between two circuit boards via an intermediate interconnect board. In one aspect hereof, the functional signal...
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7010452 |
Event pipeline and summing method and apparatus for event based test system
An event pipeline and vernier summing apparatus for high speed event based test system processes the event data to generate drive events and strobe events with various timings at high speed to...
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7007252 |
Method and apparatus for characterizing the propagation of noise through a cell in an integrated circuit
One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the...
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6993438 |
System and method for measuring essential power amplification functions
An apparatus includes a device under test, a network analyzer, an internal amplifier, a first switch, a second switch, a third switch, a first air-line directional coupler, and a first attenuator....
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6990424 |
Method to provide external observability when embedded firmware detects predefined conditions
A method and apparatus for generating a system specific test by providing sophisticated error tracking mechanisms to trigger on a specific system event. The present invention addresses the problem...
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