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8983790 Method and system for gathering signal states for debugging a circuit  
Systems and methods gather data for debugging a circuit-under-test. The system includes a trigger-and-capture circuit, a data compressor, a direct memory access controller, and a memory...
8959001 Test pattern generation for semiconductor integrated circuit  
A test pattern is sequentially selected from an original test pattern sequence constituted by a plurality of test patterns including a don't care bit. Power consumption in each of regions obtained...
8942300 Integrated digitizer system with streaming interface  
A digitizer system (DS) may include one or more input channels to receive sample data, and an acquisition state machine (ASM) to organize the sample data into one or more acquisition records...
8918295 Distributed reflectometry device and method for diagnosing a transmission network  
A distributed reflectometry device for diagnosing a network is disclosed. According to one aspect, the device includes at least one transmission line and several reflectometers connected to the...
8892387 Driving circuit of a test access port  
A driving circuit of a test access port is disclosed. The driving circuit includes an input terminal for receiving a first test data signal when the driving circuit is operating in an external...
8880926 Counter/gating producing technology specific function outputs from TCK and TMS(C)  
Control events may be signaled to a target system having a plurality of components coupled to a scan path by using the clock and data signals of the scan path. While the clock signal is held a...
8872537 Semiconductor integrated circuit, circuit testing system, circuit testing unit, and circuit test method  
This invention has an object of providing a semiconductor integrated circuit enabling further reduction of the number of test terminals without depending on a compression/expansion technique...
8855962 System for testing electronic circuits  
A system for testing electronic circuits includes first, second, and third standard interfaces. A test port master and a test port slave are connected to an external testing apparatus. The first,...
8843794 Method, system and apparatus for evaluation of input/output buffer circuitry  
Techniques and mechanisms for evaluating I/O buffer circuits. In an embodiment, test rounds are performed for a device including the I/O buffer circuits, each of the test rounds comprising a...
8832513 Characterization and validation of processor links  
A processor link that couples a first processor and a second processor is selected for validation and a plurality of communication parameter settings associated with the first and the second...
8825270 Method and apparatus for indicating an automotive diagnostic urgency  
Provided is a method for determining the urgency for repairing a diagnostic condition in a vehicle. Upon determining the repair urgency, a driver may decide to continue driving (in the case of a...
8823539 Method of displaying multi-fiber test results  
A display method and apparatus provides an easy to interpret presentation of multiple channel data, in the form of columns where the height of the column represents the relative measurement. A...
8826092 Characterization and validation of processor links  
A processor link that couples a first processor and a second processor is selected for validation and a plurality of communication parameter settings associated with the first and the second...
8805637 Test element group and semiconductor device  
A device with a plurality of elements separated into groups, each element including an activation terminal, an input terminal and an output terminal, a plurality of first signal lines, and a...
8791813 Monitoring system for testing apparatus  
A monitoring system includes a testing apparatus and a display control apparatus connected to the testing apparatus. The testing apparatus includes a plurality of testing locations and a...
8751184 Transaction based workload modeling for effective performance test strategies  
A method for creating workload model to test performance of a critical application in a data processing network (112) is disclosed. The method includes receiving (202), at one of the plurality of...
8744797 Test system and test method thereof  
A test system and a test method thereof. The test system includes an electronic device and a test device. The electronic device includes a plurality of output interfaces and provides a...
8718967 Flexible storage interface tester with variable parallelism and firmware upgradeability  
A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmable to provide test patterns for use in automated test...
8717903 Testing method and apparatus applied to IP phone system  
A testing method and an apparatus applied to an IP phone system for testing an electronic device is provided. The electronic device has a true table and signal ports. The electronic device is...
8700350 Card interface direction detection system  
A card interface direction detection system includes a card. A power pin is mounted to the card and connected to a power source. A ground pin is mounted to the card and connected to a ground. A...
8667345 Burn-in method for embedded multi media card, and test board using the same, and embedded multi media card tested by the same  
A burn-in method for an embedded Multi Media Card (eMMC), and a test board using the same, and an eMMC tested by the same. The disclosed burn-in method comprises the steps as below: writing a test...
8666690 Heterogeneous multi-core integrated circuit and method for debugging same  
A heterogeneous multi-core integrated circuit includes first and second sets of processor cores and corresponding first and second test access ports (TAPs). The first and second TAPs are connected...
8667333 Extensible testing system  
A computer implemented system for testing electronic equipment where a plurality of types of systems can be tested using a single test specification.
8655617 Method and system for validating video waveforms and other electrical signals  
Method for validating a single waveform or series of waveforms that are intended for evaluating signals within an automated testing environment. Test signal data is supplied by an external source....
8639466 Computerised storage system comprising one or more replaceable units for managing testing of one or more replacement units  
A method, apparatus and software is disclosed, for use in a computerised storage system comprising one or more replaceable units, for managing testing of one or more replacement units, where the...
8589886 System and method for automatic hardware and software sequencing of computer-aided design (CAD) functionality testing  
The present invention relates to a system and a method for creating hardware and/or software test sequences and in particular, to such a system and method in which modular building blocks are used...
8572583 Method and system for testing software for industrial machine  
There are provided a method and system for testing software for an industrial machine with continuous test values reflecting actual environmental factors, using a simulator before the software for...
8538719 Method for testing device descriptions for field devices of automation technology  
In a method for testing device descriptions for field devices of automation technology, a finite state machine is produced from a device description to serve as a basis for a test script. For...
8527232 Diagnostic test pattern generation for small delay defect  
Methods of diagnostic test pattern generation for small delay defects are based on identification and activation of long paths passing through diagnosis suspects. The long paths are determined...
8521463 System for performing electrical characterization of asynchronous integrated circuit interfaces  
An integrated circuit with a single-channel input/output (I/O) interface and a multi-channel I/O interface includes functional circuits that operate in different clock domains and a test circuit....
8515705 Method and system for testing circuit board of keys  
A circuit board testing system and a circuit board testing system for testing a circuit board of keys. The circuit board testing system includes a computer and a test frame. The circuit board is...
8510072 Detecting an unstable input to an IC  
Additional circuitry is included in an input cell design structure for an integrated circuit to detect and report transitions on an input that was expected to be stable, and to store that event...
8504320 Differential SR flip-flop  
A differential SR flip-flop 100 receives a set signal S and a reset signal R, and generates a differential output pair Q and #Q. A first flip-flop FF1 generates a non-inverted output signal Q1 and...
8473275 Method for integrating event-related information and trace information  
A method for emulating and debugging a microcontroller is described. In one embodiment, an event thread is executed on an emulator that operates in lock-step with the microcontroller. Event...
8463572 Semiconductor device  
A semiconductor device comprises a burn-in test circuit configured to receive a flag signal for a burn-in test, generate a toggled output enable signal, and drive a first input/output line to...
8457921 Electronic device tester and testing method  
An electronic device tester is connected to an electronic device needed to be tested. A test program is stored in a data storage of the tester. The test program includes a number of test...
8452566 Warranty monitoring and enforcement for integrated circuit and related design structure  
An integrated circuit (IC) including a warranty and enforcement system, and a related design structure and HDL design structure are disclosed. In one embodiment, an IC includes a parameter...
8442794 Toolkit for creating appliance diagnostics  
An appliance development toolkit includes an editor configured to create one or more test scripts having steps with each step being separated from its adjacent steps by a transition condition. The...
8423314 Deterministic reconfiguration of measurement modules using double buffered DMA  
Configuring at least one radio frequency (RF) instrument according to a plurality of RF measurement configurations for performing a plurality of tests on a device under test (DUT). A list of RF...
8417478 Network test conflict checking  
There is disclosed a system and method for network test conflict checking. The method may be performed by a network testing system and may be implemented as software. The method may include...
8401812 Tester, method for testing a device under test and computer program  
A tester for testing a device under test has a first channel unit and a second channel unit. The first channel unit has a corresponding first pin connection for a signal from a device under test,...
8396682 Semiconductor device  
A semiconductor device is provided. The semiconductor device applies data applied through a bump pad on which a bump is mounted through a test pad to a test apparatus such that the reliability of...
8392144 Keyboard test program generating method  
A keyboard test program generating method includes the following steps. Firstly, a first key number is received. By pressing a first key, a first key identification code corresponding to the first...
8392767 Data channel test apparatus and method thereof  
A system includes a plurality of devices that are connected in series and a controller that communicates with the devices. Each of the devices has a plurality of input ports and corresponding...
8380477 System of testing engineered safety feature instruments  
The present invention certifies control modules of engineered safety feature instruments for a power plant automatically. The control modules can be tested before storing or operating. The test is...
8362791 Test apparatus additional module and test method  
A test apparatus includes: test modules that communicate with the device under test to test the device under test; additional modules connected between the device under test and the test modules,...
8364859 Storage device, board, liquid container and system  
A storage device, a board, a liquid container, a system and the like are disclosed, which are capable of efficiently detecting a connection to a host device without an increase in the number of...
8346499 Semiconductor device and its testing method  
A semiconductor device 100 including an internal circuit 4 that operates based on an input pattern includes a clock driver 25 that generates an internal clock 7 based on a generated clock 6, a...
8346498 Programmable device testing  
According to some embodiments, characterization data can be loaded onto a programmable device. The characterization data can be configured to cause the programmable device to perform one or more...
8340935 9-term calibration method for network analyzers  
A network analyzer contains a processing device, at least one signal generator and at least four measuring points. The processing device controls the signal generator and processes measured values...

Matches 1 - 50 out of 421 1 2 3 4 5 6 7 8 9 >