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Document Title |
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5390193 |
Test pattern generation
A method for generating and simulating test patterns to detect faults (57, 63) in an integrated circuit. The method comprises identifying all nets (27) which can potentially be shorted together....
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5345393 |
Logic circuit generator
There is disclosed a logic circuit generator for automatically synthesizing a logic circuit from a given functional description which comprises a logic circuit synthesizing device for synthesizing...
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5341382 |
Method and apparatus for improving fault coverage of system logic of an integrated circuit with embedded memory arrays
A method and apparatus for improving the testability of system logic of an integrated circuit having embedded memory arrays is disclosed. The embedded memory arrays are coupled to a binary constant...
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5327363 |
Pattern memory circuit for integrated circuit testing apparatus
A pattern memory circuit for an integrated circuit testing apparatus. The time consumed for diagnosis in the conventional testing apparatus which uses a CPU is reduced by performing test pattern...
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5260877 |
Method and arrangement for controlling an internal combustion engine with a detecting device utilizing two sensors for generating signals which change in mutually opposite directions
A method and an arrangement for electronically controlling an internal combustion engine of a motor vehicle. The detecting unit is connected to a component determining the power of the engine such...
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5177483 |
Multilevel configurable logic analyzer
A logic analyzer is provided with probes (20) deriving the signals to be tested which are introduced into a digitizer (22) provided with comparators which carry out a digitization according to a...
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5126953 |
Printed circuit board assembly tester
Testing apparatus for assembled printed circuit boards to assure that all the component values are correct and that all the components have been correctly inserted into the board. The testing...
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5124919 |
Test device for automobile engine idle speed control circuit
A portable self-contained instrument for testing the idle speed control system in an automotive engine includes LED indicators for displaying engine computer output pulses to the idle speed stepper...
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5062069 |
ID.ROM emulator for MCA wireless apparatus
Test equipment for a Multi Channel Access (MCA) wireless apparatus includes a Read/Write memory section which operationally replaces an ID.ROM of the apparatus for the purpose of the testing. A...
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5048019 |
Method of testing a read-only memory and device for performing the method
Microcontrollers generally comprise, in addition to the actual processor, a program memory which is constructed as a read-only memory. In order to enable testing of the contents of the program...
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4967387 |
Semiconductor integrated circuit device
A microprocessor having a plurality of memories comprises an address selection means which supplies selectively, to the memories, the address signal generated by the address generation means...
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4926363 |
Modular test structure for single chip digital exchange controller
A modular test structure for performing testing on a single chip having a plurality of different functional blocks is provided which includes test interface logic circuitry (24) formed on each of...
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4896055 |
Semiconductor integrated circuit technology for eliminating circuits or arrays having abnormal operating characteristics
In a semiconductor integrated circuit, power lines or ground lines of a plurality of circuit blocks having equivalent functions are coupled via a switch circuit to a common main power line or main...
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4701701 |
Apparatus for measuring characteristics of circuit elements
An instrument for measuring the characteristics of a circuit element has a plurality of SMUs for applying test signals to the terminals of the circuit element and measuring the resulting output...
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4701870 |
Integrated circuit device testable by an external computer system
An integrated circuit device for an electronic equipment having an internal bus, the integrated circuit device comprising a plurality of input terminals, a switch circuit connected to the plurality...
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4692298 |
Analog process control system testing
The present invention relates to a method and apparatus for testing analog process protection and control systems which are composed of a plurality of channels each serving to monitor a selected...
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4675673 |
Programmable pin driver system
Programmable pin drivers allow PROM pins to be individually programmed and regulated to specified voltages and currents. Each pin is assigned a voltage multiplexer to select a regulated voltage and...
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4656632 |
System for automatic testing of circuits and systems
A Universal Pin Electronics ("UPE") System is disclosed which incorporates a plurality of testing channels, each of which is coupled to a single input pin of a unit under test and is capable of...
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4646299 |
Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
A plurality of test signal applying and monitoring circuits are coupled to pins of an electronic device being tested to force test stimuli signals onto input pins of the device under test. The...
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4642636 |
Method and apparatus for auto-calibration of signal conditioning electronics
Numerous signal conditioning circuits on a plurality of printed circuit boards are calibrated remotely by a signal processing unit which sends coded signals to each board, either sequentially or in...
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4637020 |
Method and apparatus for monitoring automated testing of electronic circuits
A plurality of signal applying and monitoring circuits are coupled to pins of an electronic device being tested to force test stimuli signals representing logic states or other parameters onto...
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4635259 |
Method and apparatus for monitoring response signals during automated testing of electronic circuits
A plurality of test signal applying and response signal monitoring circuits is coupled to pins of an electronic device being tested to force test stimuli signals onto input pins of the device under...
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4493044 |
Apparatus and a method of establishing the correct display order of probe channels for a logic analyzer
A method and apparatus for establishing the correct order of probe channels in a logic analyzer is disclosed. Logic analyzers have probe PODS connected thereto, the PODS having a plurality of probe...
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4389710 |
Braking system test circuit
Test circuitry for exercising and testing the operability of antiskid and automatic braking control circuits in an aircraft braking system. The invention includes a digital processor communicating...
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4354268 |
Intelligent test head for automatic test system
An intelligent test head which can be plugged into an existing computer-controlled automatic test system that is adapted to carry out certain tests on integrated circuits and discrete devices, the...
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4280220 |
Electronic testing system
An electronic system for testing an electronic device responsive to a data clock signal and to a serial input data signal synchronous with the data clock signal comprises an oscillator for...
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4155116 |
Digital control system including built in test equipment
A digital control system features built in test equipment including analog input signal and discrete input signal wrap around implementations for testing the system to achieve maintainability goals...
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4070565 |
Programmable tester method and apparatus
A method and apparatus for automatic, programmed, in-circuit testing of individual logic elements. A plurality of program-operated device connection switches are provided for making connections to...
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4055801 |
Automatic electronic test equipment and method
A method and apparatus for the automatic testing of electronic equipment in which a general purpose digital computer is programmed for the equipment to be tested to generate appropriate stimulus...
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3694632 |
AUTOMATIC TEST EQUIPMENT UTILIZING A MATRIX OF DIGITAL DIFFERENTIAL ANALYZER INTEGRATORS TO GENERATE INTERROGATION SIGNALS
In computer-controlled automatic test or check-out equipment, interrogation signals for application to a unit under test are generated by a matrix of digital differential analyzer integrators, the...
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2950437 |
Circuit testing apparatus
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