Matches 101 - 150 out of 281 < 1 2 3 4 5 6 >
Match Document Document Title
7050921 Electronic test program with run selection  
A test executive system that allows running of selected tests. A graphical user interface allows the user to run all tests, run marginal and failed tests, or to run only selected tests. When the...
7043387 Testing system for printing press circuit board controllers  
Apparatus for testing functionality of a printed circuit board used to control operation of a printing press, including a plurality of input switches for providing to the circuit board test input...
7043704 Methods and apparatus for verifying circuit board design  
The present invention provides a method for verifying a design of a circuit board that has a wiring layer connecting components to be mounted, a power layer, and an insulating layer formed between...
7043391 User interface for semiconductor evaluation device  
The present invention is a user interface of the semiconductor evaluation device, which evaluates the characteristics of the semiconductor elements on a wafer. This user interface provides means on...
7035753 Method and apparatus for placing an integrated circuit into a default mode of operation  
An integrated circuit having a signal bus carrying address signals includes mode selection means. The mode selection means has a default state and a non-default state. The integrated circuit is...
7031868 Method and apparatus for performing testing of interconnections  
The present invention provides a method and apparatus configured to allow testing of interconnections between components in a system. The present invention utilizes a source of a known pattern, for...
7027947 Integrated circuit testing method, program, storing medium, and apparatus  
An ATPG unit permits allocation of a don't care X as a state for activating a propagating path of a failure and, after a change in network, transfers the state from the don't care X to an uncontrol...
7027948 Testing apparatus, method of controlling the same, and program for implementing the method  
A testing apparatus which, when resuming a test after interruption, makes it possible to determine whether or not an apparatus to be tested is the one for which the test has been interrupted. A...
7020572 Method for receiving and associating conditional dependent test results  
Methods for collecting and displaying conditional dependent test results. At least one measurement condition is received. The received measurement condition specifies the measurement environment. A...
7017138 Dynamically determining a route through one or more switch devices at program execution time  
A system and method for dynamically determining a route through one or more switch devices at program execution time. A program operable to perform a programmatic request to dynamically determine a...
7016811 Network-based system for configuring a programmable hardware element in a measurement system using hardware configuration programs generated based on a user specification  
A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or...
7017083 Method and device for testing the inhibit function of a network component transmission inhibiting device  
A method and a device are described for testing the inhibit function of a network component transmission inhibiting device that allows a transmission line from the network component to the network...
7013230 Input-output circuit and a testing apparatus  
An input-output circuit sending and/or receiving a signal to and/or from an electronic device includes a driver for supplying a signal to the electronic device, a comparator provided parallel to...
7010454 Test services provider  
A test services provider is an object that is arranged to provide a standardized interface for calling test harness provided functionality. The test services provider is not tied to a specific test...
7006940 Set up for a first integrated circuit chip to allow for testing of a co-packaged second integrated circuit chip  
A method and system are provided for testing a first integrated circuit chip which is packaged along with at least a second integrated circuit chip in a semiconductor device, wherein at least some...
7003419 Card for testing functions of card interface  
A card for testing functions of the card interface of an electronic device is provided. The testing card includes a converting circuit, a latch circuit, a data processor, a signal generator, an...
7003422 Method for connecting test bench elements and shell device  
The invention provides a method for connecting test bench elements ( 102 a –102 f ), and a shell device, a test bench element shell ( 201 ) partially or completely surrounding a circuit unit (...
7003423 Programmable logic resource with data transfer synchronization  
A more time-efficient and area-efficient approach is provided to synchronize the transfer of data into programmable logic resources. A programmable logic resource core clock and a reset signal are...
6999887 Memory cell signal window testing apparatus  
A memory cell signal window testing apparatus 101 and method for testing the signal window of a memory are disclosed. First data is written to a memory cell during a write cycle. A low cell...
6993448 System, method and medium for certifying and accrediting requirements compliance  
A computer-implemented system, method and medium for assessing the risk of and/or determining the suitability of a system to comply with at least one predefined standard, regulation and/or...
6993447 System LSI  
A system LSI includes a plurality of circuit blocks; a first power supply terminal, which is connected to a first circuit block; and a second power supply terminal, which is connected to a second...
6980916 Mechanism for graphical test exclusion  
Methods and systems for administratively qualifying and disqualifying test programs of a suite as excludable from performance by a client are disclosed in conjunction with a test framework. Using a...
6980917 Optimization of die yield in a silicon wafer “sweet spot”  
A method of increasing the wafer yield for an integrated circuit includes the steps of receiving as input a shot map, an initial orientation of a center of the shot map relative to a center of a...
6978212 System for portable sensing  
A system for capturing and transmitting analyte data pertaining to an unknown analyte. The system includes a device manager ( 102 ) and a processor manager ( 202 ). The device manager ( 102 ) is...
6978216 Testing of integrated circuits from design documentation  
One or more methods and systems of validating the operation of one or more register designs are presented. In one embodiment, the system utilizes a processor, an integrated circuit design simulator...
6973404 Method and apparatus for administering inversion property in a memory tester  
A method and apparatus permits use of a tester memory ( 31 ) as storage for an inversion mask. The inversion mask indicates to the tester which cells in a DUT memory ( 14 ) are logically inverted...
6971004 System and method of dynamically reconfiguring a programmable integrated circuit  
The present invention system and method enables dynamic reconfiguration of an electronic device in a convenient and efficient manner. In one embodiment, the electronic device includes a...
6970798 Method, apparatus and computer program product for high speed memory testing  
For testing a device under test (“DUT”) a test specification is converted in a computer system by a pin vector generator process, which includes generating test vectors. The DUT has numerous...
6961670 Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis  
A probe testing apparatus reads the surface shape of a contact pad in pressure contact with a contact probe, and differentiates the read surface shape to extract a multiplicity of flat parts. Next,...
6959257 Apparatus and method to test high speed devices with a low speed tester  
An apparatus coupled to a low speed tester and a device is disclosed. The device may have a first speed faster than a second speed of the low speed tester. The apparatus may be configured to allow...
6957162 Low-impact analyzer interface  
Disclosed is a method and apparatus for providing a universal SCSI bus interface in which bus performance is not degraded, and the analyzer is not negatively influenced by post processing while...
6954711 Test substrate reclamation method and apparatus  
Test substrates used to test semiconductor fabrication tools are reclaimed by reading from a database the process steps performed on each test substrate and selecting a reclamation process from a...
6950772 Dynamic component to input signal mapping system  
A dynamic component to input signal mapping system is disclosed that receives different types of input signals applied to a number of components and provides resultant output signals. The system...
6937956 Testing unit and self-evaluating device  
A testing unit is provided with a test data communication port adapted to output test data to a device being tested. The testing unit also has an expected test result data communication port...
6937964 Quality control and support method for analyzer  
The present invention quickly resolves troubles in an analyzer and performs effective external quality control management. An analyzer ( 2 ) and a control device ( 1 ) are connected by a network (...
6928393 Method and system for supporting negative testing in combinatorial test case generators  
Provided is a system and method for black-box testing of software using positive and negative test cases with N-way combinations of parameter values. An original model comprising valid and invalid...
6925408 Mixed-signal core design for concurrent testing of mixed-signal, analog, and digital components  
A mixed-signal core designed for efficient concurrent testing analog, mixed-signal, and digital components. One tester may test all components and, thereby, reduce test time without losing full...
6922650 Semiconductor device tester and its method  
Data on a period longer than the test cycle period concerned in a high-speed pattern test is preset in a period data storage 41 , then a flag 1 is set in a cycle stretch setting part 16 E of a...
6918099 Method and system for entropy driven verification  
A microelectronic device design verification system and method estimates the entropy of stimuli communicated over an interface to verify a microelectronic device design and feeds back the estimated...
6907379 System and method for processing tester information and visualization for parameter with multiple distributions in integrated circuit technology development  
A system and method are provided for processing tester information including means of determining axis information and means of determining break information for the tester information. The axis...
6907550 Stochastic simulation of computer activity based on user categories  
Testing a computer system by simulating the computer system activity that would occur under a number of projected user patterns by navigating through a decision tree. Each of the use patterns may...
6907366 Electronic measurement apparatus having a function to a display a function menu over a plurality of pages in a list and function menu display method  
A storage stores data of plural function menus corresponding to plural function menu items composed of plural pages to be used in instruction of execution of mutually different plural functions to...
6898546 METHOD FOR PROCESSING DATA REPRESENTING PARAMETERS RELATING TO A PLURALITY OF COMPONENTS OF AN ELECTRICAL CIRCUIT, COMPUTER READABLE STORAGE MEDIUM AND DATA PROCESSING SYSTEM CONTAINING COMPUTER-EXECUTABLE INSTRUCTIONS FOR PERFORMING THE METHOD  
A method for processing first data representing parameters relating to several components of an electrical circuit provides an associated first data record for each component. The components of the...
6898703 System and method for creating a boot file utilizing a boot template  
The present invention is a system and method of facilitating automatic generation of the source code in a convenient and efficient manner. In one embodiment of the present invention, a programmable...
6895349 Gate comparator  
A gate comparator control panel, in accordance with the subject invention, allows a user to define up to four different gate regions that may exist on any of the live waveforms, maths waveforms, or...
6889159 Scalable multithreaded system testing tool  
Embodiments of the present invention generally provide a system and method for testing integrity of data transmitted to and from a target device through a data connection. In one embodiment, the...
6889172 Network-based system for configuring a measurement system using software programs generated based on a user specification  
A system and method for online configuration of a measurement system. The user may access a server over a network and specify a desired task, e.g., a measurement task, and receive programs and/or...
6885963 Method for testing a program-controlled unit by an external test device  
A method described is distinguished by the fact that an external test device brings about the execution, in a program-controlled unit, of a program that initiates, performs or supports the testing...
6885953 Oscilloscope panel capture and implementation  
A method and apparatus for saving the operational settings of an instrument. The method comprises the steps of: initiating the saving operation, initializing, by each software object, of any...
6885962 Signal inspection device  
An inspection process and method that is performed not by the operation of a PC but within the inspection device itself according to the inspection program stored in a memory circuit in the...
Matches 101 - 150 out of 281 < 1 2 3 4 5 6 >