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7623982 |
Method of testing an electronic circuit and apparatus thereof
A method of testing an electronic circuit is provided. The method comprises radiating a laser beam onto the electronic circuit, and determining a plurality of samples of a response signal output by...
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7623981 |
Testing of embedded systems
An embedded device testing system for comparing actual device under test input/output vector pairs with modelled device under test input/output vector pairs, wherein actual device under test output...
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7617431 |
Method and apparatus for analyzing delay defect
The apparatus for analyzing a delay defect of the present invention obtains the RC of the maximal incidence among region codes (RCs) to which check circuits detecting errors caused with gradual...
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7617066 |
Virtual crimp validation system
A system for validating a proposed crimp includes a pre-crimp modeler configured to establish a geometry for the proposed crimp, a plurality of virtual testing modules configured to determine at...
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7617065 |
Methodology for estimating statistical distribution characteristics of physical parameters of semiconductor device
A method for estimating statistical distribution characteristics of physical parameters of a semiconductor device includes manufacturing a plurality of semiconductor device chips, each having a...
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7617064 |
Self-test circuit for high-definition multimedia interface integrated circuits
A high-definition multimedia interface circuit uses a high-definition multimedia interface encoder to produce a plurality of channels of data. An output circuit, connected to the high-definition...
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7613968 |
Device and method for JTAG test
In order to realize a JTAG test of a printed board including a semiconductor device having JTAG test unsupported input/output terminals inside thereof, one device is logically divided into two...
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7606677 |
Dynamic measurement control
A metrology recipe includes dynamic instructions that allow a metrology tool to perform a secondary metrology operation on a test wafer when previous measurement data indicates a process issue with...
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7593824 |
System and method for automation of hardware signal characterization and signal integrity verification
A PCB comprising two or more components, such as ICs, comprises drivers and receivers that facilitate communication of signals between the components. Signal terminations, such as series and AC...
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7592828 |
Method and device of measuring interface trap density in semiconductor device
A method is provided for measuring interface trap density in a semiconductor device. In the method, measurement parameters are input to a host computer. A pulse condition is set at a pulse...
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7590912 |
Using a chip as a simulation engine
The chip is placed in self simulation mode. When the trace logic does not have any more data to output it changes the state of the advance signal. The clock generator detects this state change and...
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7590503 |
Method and system for rerouteable cyclic redundancy check sum (CRC) for different sources
Provided is a system and method including a number of routers structured and arranged to route one or more video sources to any of one or more destinations. Each of the number of routers including...
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7587294 |
SATA device having self-test function for OOB-signaling
Disclosed is a SATA device having self-testing function with an OOB-signaling operation and a method of testing the same. The SATA device includes target and test-signaling controllers that...
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7580807 |
Test protocol manager for massive multi-site test
Disclosed herein is a massive multi-site (MMS) testing architecture. The MMS architecture includes a MMS interface on each of a plurality of devices under test. The MMS interface includes a test...
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7580806 |
Apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC)
An apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) includes operating a clock associated with the IC at a frequency (f TARGET ) at...
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7580465 |
Low speed access to DRAM
Embodiments provide access to a memory over a high speed serial link at slower speeds than the high speed serial links regular operation. An embodiment may comprise a memory apparatus with a...
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7577859 |
System and method of controlling power consumption in an electronic system by applying a uniquely determined minimum operating voltage to an integrated circuit rather than a predetermined nominal voltage selected for a family of integrated circuits
A method and apparatus for adaptively adjusting the operating voltage of an integrated circuit in response to tester-to-system variations, worst-case testing techniques, process variations,...
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7577540 |
Re-configurable embedded core test protocol for system-on-chips (SOC) and circuit boards
A test system for a circuit board , wherein the circuit board has a plurality of cores such that at least one of the plurality of cores is adapted to use a test protocol independent of a...
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7574319 |
Instrument architecture with circular processing queue
Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms....
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7574317 |
Method for calibrating a filter, a calibrator and system including the same
An example embodiment provides a method for calibrating an active RC filter and RC time constant calibrator for an active RC filter. The RC time contact calibrator includes a RC timer and a...
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7574314 |
Spurious signal detection
A circuit for a data processing apparatus and a method for detecting spurious signals is disclosed, the circuit comprising a data input operable to receive digital signal values, spurious signal...
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7573937 |
Phase rotator control test scheme
Techniques and apparatus for testing phase rotators for detecting defective tap weights are provided. Phase rotator test logic may include a master phase rotator to cycle the phase of a clock...
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7571070 |
Measurement system fleet optimization
A method, system and program product are disclosed for optimizing a fleet of measurement systems. One embodiment determines a tool matching precision (TMP) and a fleet measurement precision (FMP)...
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7571067 |
Instrument ring architecture for use with a multi-core processor
Apparatuses for a test and measurement instrument provide an instrument capable of handling acquisition, transfer, analysis, and display of large quantities of waveform data and complex waveforms....
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7567891 |
Hot-carrier device degradation modeling and extraction methodologies
The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of...
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7567883 |
Method and apparatus for synchronizing signals in a testing system
The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test...
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7567882 |
Method for evaluating semiconductor device
The present invention provides a method for evaluating an intended element or a parameter. In addition, the invention provides an evaluation method for obtaining a more precise result rapidly....
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7565256 |
Displacement detecting encoder
A displacement detecting encoder including a scale having a positional code that contains positional information, a detection portion which is disposed so as to make a relative movement with...
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7561980 |
Transmission medium testing apparatus and method
The invention provides a method for testing a transmission medium used in a full-duplex communication system comprising an endpoint that comprises a transmitting end (TX) and a receiving end (RX);...
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7558720 |
Dynamic computation of ESD guidelines
An automated method for checking electrostatic discharge (ESD) guidelines ensures that a sufficient number of ESD protection cells have been provided in the neighborhood of each pad in an...
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7555358 |
Process and method for continuous, non lot-based integrated circuit manufacturing
A method for continuous, non lot-based manufacturing of integrated circuit (IC) devices of the type to each have a unique fuse identification (ID) includes: reading the fuse ID of each of the IC...
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7552028 |
Recording medium, test apparatus and diagnostic method
A test apparatus that tests a device under test is provided. The test apparatus includes a test module that provides a test signal to the device under test. The test apparatus includes: a test...
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7552024 |
Circuit board diagnostic operating center
A circuit board diagnostic operating center ( 10 ) including a large flat panel display ( 18 ) used for displaying the test system assets (instruments 12 ) and the circuit card assembly (CCA)...
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7549101 |
Clock transferring apparatus, and testing apparatus
There is provided a clock transferring apparatus for synchronizing a pattern signal synchronized with a reference clock with a variable clock based on an oscillation source different from that of...
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7548841 |
Method for logic checking to check operation of circuit to be connected to bus
To check operation of a circuit to be checked connected to a bus to which at least one master circuit and at least one slave circuit are connected, a model is connected to a bus in place of a...
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7548825 |
Method and apparatus for current and temperature measurement in an electronic power circuit
A current/temperature measurement method using parasitic components in an electronic power circuit is disclosed. The measured values derived from these parasitic components with inadequate...
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7542857 |
Technique for determining performance characteristics of electronic devices and systems
A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first...
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7539598 |
Semiconductor test apparatus and method thereof and multiplexer and method thereof
A semiconductor test apparatus for determining memory failure, including a first at least one multiplexer. The first at least one multiplexer may include a first transistor and a second transistor,...
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7539590 |
System and method for testing a memory
A method and apparatus for testing a memory at speed. A test and repair wrapper integrated with a memory instance is operable to receive test information scanned in from a built-in self-test and...
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7539589 |
Testing radio frequency and analogue circuits
A method and apparatus for testing analogue or RF circuitry, wherein the power supply VDD is ramped up (step 100 ) and quiescent current measurements are taken at selected values of VDD (step 102...
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7539588 |
Data carrier with detection means for detecting a change made of information stored with storing means
A circuit has a first memory for modifiable storage of information, the information being modifiable by an ambient parameter of the circuit, which ambient parameter acts on the first memory. The...
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7536267 |
Built-in self test for memory interconnect testing
In some embodiments, built-in self-test logic is provided for an integrated circuit (IC) device having memory controller logic to generate address and command information for accessing a memory...
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7533299 |
Temporal correlation of messages transmitted by a microprocessor monitoring circuit
The invention concerns a method for transmitting digital messages through output terminals ( 22 ) of a monitoring circuit ( 18 ) integrated to a microprocessor ( 12 ), said messages representing...
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7532994 |
Test apparatus, test method, electronic device manufacturing method, test simulator and test simulation method
A test apparatus for testing an electronic device by providing test signals to the electronic device and comparing multiple output signals with respective anticipated values is disclosed, the test...
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7523010 |
Automated circuit board test actuator system
A method for automatically inserting connectors and coupling test probes to circuit boards, such as computer system boards and the like. The method is implemented via an apparatus that enables...
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7519878 |
Obtaining test data for a device
Obtaining test data for a device under test includes obtaining a first part of the test data by testing the device at first points of a range of parameters using progressive sampling, and obtaining...
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7519496 |
Electronic circuit comprising a secret sub-module
The invention relates to an electronic circuit including a sub-module assembly ( 2 ) connected to the rest of the circuit, the sub-module assembly including a secret sub-module ( 4 ) for performing...
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7519494 |
Integrated circuit with signature computation
The present invention relates to an integrated circuit (DEC V) for processing a plurality of data samples (P) of a data signal (I), wherein said integrated circuit is associated with a counter (CT)...
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7519486 |
Method and apparatus to test the power-on-reset trip point of an integrated circuit
Circuitry for testing a power-on-reset circuit in an integrated circuit includes a high-voltage detector coupled to a first I/O pad of the integrated circuit. A power-on-reset circuit in the...
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7516042 |
Load test load modeling based on rates of user operations
Various technologies and techniques are disclosed for performing load tests based upon user pace. A load test application is provided. Load test settings are received from a user that includes a...
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