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9043179 Voltage-driven intelligent characterization bench for semiconductor  
A system for testing a plurality of transistors on a wafer having a storage device or personal computer connected via a bus to a plurality of drivers. Each of the voltage drivers having a...
9043336 Methods and systems for global knowledge sharing to provide corrective maintenance  
Described herein are methods and systems for providing corrective maintenance using global knowledge sharing. A method to provide corrective maintenance with a CM system includes performing a...
9037437 High speed data testing without high speed bit clock  
System and method for testing a high speed data path without generating a high speed bit clock, includes selecting a first high speed data path from a plurality of data paths for testing. Coherent...
9031807 Motherboard testing apparatus  
A motherboard testing apparatus for testing a motherboard by subjecting it to sequential power-on and power-off modes includes a control module, a switch module and a display module. The control...
9026393 High voltage interlock strategy  
A High Voltage Interlock Strategy (HVIS) uses feedback current to detect cable connectivity status for a high-voltage cable configured to connect a power conversion circuit with a remote permanent...
9021293 Methods for operating a memory interface circuit including calibration for CAS latency compensation in a plurality of byte lanes  
A method for quickly calibrating a memory interface circuit from time to time in conjunction with operation of a functional circuit is described. The method uses controlling the memory interface...
9002673 Simultaneous testing of semiconductor components on a wafer  
Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a...
9000788 Method for performing an electrical testing of electronic devices  
A method of electrical testing electronic devices DUT, comprising: connecting at least an electronic device DUT to an automatic testing apparatus suitable for performing the testing of digital...
8994516 Control device, control method, and program  
A control device may include a control unit to control transmission of a predetermined control command to a controlled device, when an operation surface is put face down is detected from a...
8990607 Memory interface circuits including calibration for CAS latency compensation in a plurality of byte lanes  
A memory interface circuit for read operations is described. The circuit includes one or more controller circuits, one or more read data delay circuits for providing CAS latency compensation for...
8983790 Method and system for gathering signal states for debugging a circuit  
Systems and methods gather data for debugging a circuit-under-test. The system includes a trigger-and-capture circuit, a data compressor, a direct memory access controller, and a memory...
8977513 Reliability test with monitoring of the results  
An electronic device for executing a reliability test. Such an electronic device includes a circuit for implementing a functionality of the electronic device, and testing circuit for executing a...
8949063 Testing framework for control devices  
The present disclosure generally relates to the automated testing of a system that includes software or hardware components. In some embodiments, a testing framework generates a set of test cases...
8949062 Test module, test apparatus, and test method  
Provided is a test module comprising a specified pattern detecting section that detects a specified pattern output in response to a specified test pattern from a device under test outputting...
8942946 Test apparatus and information processing system  
Provided is a test apparatus that tests a device under test, comprising a test unit that sends and receives signals to and from the device under test; a control apparatus that controls the test...
8938365 Clock fault detector  
A method and apparatus for providing clock fault detection is presented. A first clock of a plurality of clocks on a printed circuit board (PCB) is designated as a reference clock. A reference...
8935117 Circuit and method for measuring voltage  
A testing circuit in an integrated circuit indirectly measures a voltage at a node of other circuitry in the integrated circuit. The testing circuit includes a transistor having a control...
8933715 Configurable vertical integration  
The Configurable Vertical Integration [CVI] invention pertains to methods and apparatus for the enhancement of yields of 3D or stacked integrated circuits and herein referred to as a CVI...
8930159 Semiconductor circuit, semiconductor device, line break detection method, and computer readable medium storing line break detection program  
When line break detection of signal line Ln is carried out, potential smaller than signal line Ln−1 having lower potential than signal line Ln is supplied to signal line Ln, and potentials of...
8930782 Root cause distribution determination based on layout aware scan diagnosis results  
Aspects of the invention relate to yield analysis techniques for generating root cause distribution information. Suspect information for a plurality of failing dies is first generated using a...
8924832 Efficient error handling mechanisms in data storage systems  
A data storage system configured to efficiently search and update system data is disclosed. In one embodiment, the data storage system can attempt to correct errors in retrieved data configured to...
8907697 Electrical characterization for a semiconductor device pin  
Embodiments related to electrically characterizing a semiconductor device are provided. In one example, a method for characterizing a pin of a semiconductor device is provided, the method...
8904255 Integrated circuit having clock gating circuitry responsive to scan shift control signal  
An integrated circuit comprises scan test circuitry and additional circuitry subject to testing utilizing the scan test circuitry. The scan test circuitry comprises a scan chain having a plurality...
8904202 Selective configuration of a node of an electronic circuit component  
A component of an electronic circuit, the component comprising: a node (REG_ENB; DO) selectively configurable as an output node for providing an output signal to an external component or as an...
8892386 Method and apparatus for post-silicon testing  
An apparatus and a computer-implemented method performed by a computerized device, comprising: generating a collection of test data for testing one or more domains, wherein the test data is useful...
8892387 Driving circuit of a test access port  
A driving circuit of a test access port is disclosed. The driving circuit includes an input terminal for receiving a first test data signal when the driving circuit is operating in an external...
8892377 Digital programmable load measurement device  
A digital programmable load measurement device provides a controllable and variable load unit in a system. The variable load unit is connected to a voltage follower and a current follower to...
8886474 System and apparatus for testing cable  
An apparatus for testing one or more transmission lines is disclosed. The apparatus comprises a processor capable of configuring the apparatus in one of a master mode and a slave mode. The...
8886487 Bridge fault removal apparatus, bridge fault removal method, and computer readable medium comprising computer program code for removing bridge fault  
A bridge fault removal apparatus includes a bridge fault extraction unit configured to extract a bridge fault from layout information of a semiconductor integrated circuit, a test pattern...
8880926 Counter/gating producing technology specific function outputs from TCK and TMS(C)  
Control events may be signaled to a target system having a plurality of components coupled to a scan path by using the clock and data signals of the scan path. While the clock signal is held a...
8880375 Test apparatus and test method  
Provided is a test apparatus that tests a device under test having a plurality of output terminals. The test apparatus comprises an executing section that executes a test command sequence for...
8878561 Screening method, screening device and program  
This invention is to detect defective products of semiconductor devices with high accuracy even when the characteristics of the semiconductor devices vary according to their positions on each of...
8862426 Method and test system for fast determination of parameter variation statistics  
A method and test system for fast determination of parameter variation statistics provides a mechanism for determining process variation and parameter statistics using low computing power and...
8860428 Apparatus and method for recognizing an error in a power bridge circuit  
An apparatus and a method for recognizing an error in a power bridge circuit containing a load, a high-side branch and a low-side branch. Accordingly, a first switched current source is connected...
8855962 System for testing electronic circuits  
A system for testing electronic circuits includes first, second, and third standard interfaces. A test port master and a test port slave are connected to an external testing apparatus. The first,...
8843794 Method, system and apparatus for evaluation of input/output buffer circuitry  
Techniques and mechanisms for evaluating I/O buffer circuits. In an embodiment, test rounds are performed for a device including the I/O buffer circuits, each of the test rounds comprising a...
8843778 Dynamically calibrated DDR memory controller  
A method for calibrating a DDR memory controller is described. The method provides an optimum delay for a core clock delay element to produce an optimum capture clock signal. The method issues a...
8838406 Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment  
A re-configurable test circuit for use in an automated test equipment includes a test circuit, a test processor and a programmable logic device. The pin electronics circuit is configured to...
8831900 System for controlling at least one actuator for thrust reverser cowlings on a turbojet engine and method for testing said system  
The invention relates to a system for controlling at least one actuator (6) for thrust reverser cowlings (2) on a turbojet engine, comprising a set of actuator and/or control components with at...
8832513 Characterization and validation of processor links  
A processor link that couples a first processor and a second processor is selected for validation and a plurality of communication parameter settings associated with the first and the second...
8825432 Method for estimating maximum power of a circuit and apparatus thereof  
The present invention provides a method for adjusting a maximum power of a circuit having a first voltage output and a first power. The method includes the following steps: (a) obtaining a voltage...
8826092 Characterization and validation of processor links  
A processor link that couples a first processor and a second processor is selected for validation and a plurality of communication parameter settings associated with the first and the second...
8818749 Circuits and methods for generating a self-test of a magnetic field sensor  
A magnetic field sensor includes built in self-test circuits that allow a self-test of most of, or all of, the circuitry of the magnetic field sensor, including self-test of a magnetic field...
8809073 Apparatus and methods for de-embedding through substrate vias  
A method includes providing on a substrate having at least two through substrate vias (“TSVs”) a plurality of test structures for de-embedding the measurement of the intrinsic characteristics of a...
8813019 Optimized design verification of an electronic circuit  
A method includes reading, through a processor of a computing device communicatively coupled to a memory, a design of an electronic circuit as part of verification thereof. The method also...
8805634 Test apparatus and test method  
A test apparatus that tests a device under test, including a control apparatus that controls testing of the device under test, a test unit that sends and receives signals to and from the device...
8793095 Functional fabric-based test controller for functional and structural test and debug  
A Test Access Mechanism (TAM) architecture for facilitating testing of IP blocks integrated on a System on a Chip (SoC). The TAM architecture includes a Test Controller and one or more Test...
8781783 System and method for checking ground vias of a controller chip of a printed circuit board  
A system and method for checking a ground via of control chips of a printed circuit board (PCB) provides a graphical user interface (GUI) displaying a layout of the PCB. The control chip has a...
8781784 System and method for detecting miswiring of an electrical appliance  
A system for detecting the miswiring of an electrical appliance that includes a microprocessor having first and second input connections to sample signals on two different electrical power lines....
8781792 Yield computation and optimization for selective voltage binning  
Techniques for improving parametric chip yield of manufactured chips are provided. In one aspect, a method for optimizing parametric chip yield is provided. The method includes the following...