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7620470 Method and apparatus for impasse detection and resolution  
A method, apparatus and a system, for provided for performing an automated process flow adjustment. A semiconductor wafer is processed based upon a routing plan and a predetermined schedule. A...
7620478 Control system, method and computer program for synchronizing several robots  
A control system for controlling the movements of a plurality of mechanical units. The control system includes a program that includes a plurality of mechanical unit programs. Each program includes...
7614154 System and method for locating components of a structure  
In non-limiting, illustrative embodiments, methods, systems, and manufacturing facilities are provided for locating components of a structure. Locations of features of components of a structure are...
7574278 Scheduling system and method  
A method and apparatus for scheduling in a wafer fab. The method comprising means for weighting inventories according to at least one of logpoints or reticle, and photolithography units, means for...
7550681 Method and apparatus for measuring weight of CNC workpieces  
This invention discloses a method and apparatus for measuring the weight of a CNC workpiece. As the weight of the workpiece on a loading platform increases, the loading of a driving module which...
7529595 Method of controlling substrate processing apparatus and substrate processing apparatus  
It is an object of the present invention to realize, in a coating and developing apparatus including an inspection section, reduction in the startup time, cost reduction, and an improved operating...
7519448 Method for determining position of semiconductor wafer, and apparatus using the same  
A light source emits light toward a semiconductor wafer, and a light receiving sensor detects light passing a peripheral edge of the semiconductor wafer. Each coordinates of the peripheral edge of...
7512455 Method for self-synchronization of modular production systems  
A system and method for self-synchronization of modular production systems having components with various alternative capabilities for processing and transporting work units along transport...
7512456 Substrate processing apparatus  
When a first substrate transferred outwardly from an indexer cell is the last substrate prior to reticle change in an exposure apparatus, the outward transfer of a second substrate to be processed...
7507296 Methods and apparatus for determining scrubber brush pressure  
In a scrubber adapted to clean a semiconductor wafer, the torque of a brush rotation motor is monitored while a scrubber brush is in contact with the wafer and is being rotated by the motor. The...
7467024 Method and apparatus for an elevator system for a multilevel cleanspace fabricator  
The present invention provides methods and apparatus capable of routine placement and replacement of fabricator tools in a designated tool location. The tool location can be selected from multiple...
7451164 System and method for replicating data  
According to the present invention, techniques for controlling copying of logical volumes within a computer storage system are provided. A representative embodiment includes a plurality of storage...
7447560 System and methods for automatic generation of component data  
A method of manufacturing electronic circuits including generating CAD data, a bill of materials and an approved component vendor list for an electronic circuit and employing the CAD data, the bill...
7439531 Alignment systems and methods for lithographic systems  
An alignment system for a lithographic apparatus has a source of alignment radiation; a detection system that has a first detector channel and a second detector channel; and a position determining...
7406360 Method for detecting transfer shift of transfer mechanism and semiconductor processing equipment  
A dummy substrate ( 17 ) differs from a substrate to be processed in having a first guide (G 1 ) for assisting centering, however, it can be handled as a substitute of the substrate to be...
7390681 Derived metric for monitoring die placement  
A method for monitoring die placement includes receiving measurements of an alignment of a semiconductor die mounted in a package by a die packaging tool. The measurements include center offset...
7353076 Vacuum processing method and vacuum processing apparatus  
The invention provides a semiconductor processing apparatus having a high throughput capable of appropriately coping with the positional displacement that may occur during transfer of the wafer...
7346415 Semiconductor wafer positioning method, and apparatus using the same  
The intensity of light of a predetermined wavelength corresponding to the type of a protective tape joined to the surface of a semiconductor wafer is adjusted by a controller, and a holding stage...
7346847 Power tool control system user interface  
A power tool control system allows a user to operate a power tool through a graphical user interface communicatively coupled with a non-contact measurement and alignment device. The graphical user...
7310566 Quality control method for two-dimensional matrix codes on metallic workpieces, using an image processing device  
A quality control method for two-dimensional matrix codes on metallic workpieces, the codes being in the form of stamped marking dots is disclosed. The stamping process for the marking dots is...
7305277 Methods and systems for position sensing of components in a manufacturing operation  
Methods and systems for position sensing are disclosed. In one embodiment, a method includes measuring at least three discrete point positions associated with a first component by using at least...
7302306 Determining processing times at stations in an assembly system  
An assembly system may assemble articles of manufacture at a plurality of assembly regions and may log a time at which each article of manufacture enters or exits an assembly region. Assembly...
7286890 Transfer apparatus for target object  
A processing system includes a transfer chamber, a plurality of chambers connected to the transfer chamber, a transfer apparatus disposed in the transfer chamber, and a control section configured...
7274971 Methods and apparatus for electronic device manufacturing system monitoring and control  
In a first aspect, a computer program product is provided. The computer program product includes a medium readable by a computer. The computer readable medium has computer program code adapted to...
7248931 Semiconductor wafer position shift measurement and correction  
A method and apparatus is provided for determining substrate drift from its nominal or intended position. The apparatus includes at least two fixed reference points. The reference points can be...
7245978 Managing apparatus for managing assisting work to assist substrate-related-work performing system, and managing program for managing assisting work to assist substrate-related-work performing system  
Assisting-work management apparatus and an assisting-work management program for performing the assisting work in a substrate work machine system efficiently by a plurality of workers. A worker...
7194326 Methods and systems for large-scale airframe assembly  
Methods and systems for large-scale airframe assembly are disclosed. In one embodiment, a method includes measuring a plurality of discrete point positions at least one of on and adjacent to at...
7155299 Method and apparatus for precise marking and placement of an object  
The present invention provides a precise marking apparatus for performing precise marking on an object and methods of using the same. The precise marking apparatus comprises an object input handler...
7117055 Process and system for designing molds and dies  
A system and method for designing a tooling assembly automatically validates and maintains relationships between components in view of predefined requirements, preferences, and best design...
7089074 Host feeder setup validation  
The present invention features a method and apparatus for feeder setup validation on a component placement machine. Provided are a host computer in communication with a feeder setup station...
7089073 Component mounting apparatus and component mounting method, and recognition apparatus for a component mount panel, component mounting apparatus for a liquid crystal panel, and component mounting method for a liquid crystal panel  
Transfer of liquid crystal panels to subsequent processes is performed with the panels placed on transfer arms and held by suction pads. A small suction force can be sufficient, and a suction...
7055233 Device and method for assigning a tool to a workpiece  
For assigning a tool to a workpiece conveyed on an assembly line, at least one transmitter is arranged in the area of an assembly line, and a receiver is arranged on the tool. An analyzing unit...
7003368 Manufacturing method for a plurality of manufacturing lots  
As a basic managing pattern, each manufacturing lot containing at least one workpiece is designated as a main objective to be managed. An appropriate number of similar type manufacturing lots...
6983230 Method and apparatus for simulating a radiation dose delivered to an object  
Methods and an apparatus for determining a radiation dosage received by a product being exposed to radiation in an irradiator cell through a computer simulation are provided. One exemplary method...
6958588 Machine equipped with a temperature compensated lathe spindle  
A machine for machining a workpiece with at least one revolving or rotating tool has a work spindle with a shaft ( 5 ), whose temperature is monitored by means of at least one temperature sensor (...
6944517 Substrate apparatus calibration and synchronization procedure  
A method for positioning substrates in a substrate processing apparatus having a substrate alignment device, a first substrate transport apparatus and a second substrate transport apparatus,...
6941189 Programmable adaptable assembly system  
A positioner for use in a tooling apparatus, the positioner including a tool, at least one servo-motor for actuating said tool, a controller for controlling the servo-motor, nonvolatile memory in...
6937916 Automatic recognition of locator die in partial wafermap process  
An off-line partial wafer scanner system is disclosed that resolves partial wafermap related issues that result holt-lot in semiconductor assembly. The system eliminates the need to teach locator...
6934595 Method and system for reducing semiconductor wafer breakage  
In a system and method to reduce wafer breakages in a wafer handling system, the position of a wafer on a platen is monitored and closing of the platen on a vacuum chamber is prevented if a...
6931295 Method and system of calculating lot hold time  
A method of calculating lot hold time. First, identification parameters of a lot are input. The lot may be a split child lot or an unsplit parent lot. The identification parameters include an...
6928332 Process system and process tool for processing a workpiece  
The invention related to a processing tool and a processing device for processing a workpiece ( 5 ) that is located in a predetermined processing area ( 1 ), at a plurality of processing points (...
6892160 Assembly method  
A method of locating an assembly point (P) on a first part ( 40 ), at which assembly point the first part is to be joined to a second part ( 1 ), the method comprising the steps of: determining an...
6879868 Alignment system for lithographic apparatus for measuring a position of an alignment mark  
An alignment system for a lithographic apparatus includes a detection system arranged in a path of at least a portion of an alignment radiation. The alignment system also includes a position...
6876897 Positioning device and method for operation  
A positioning device precisely positions a work piece at a workstation. Precise positioning is accomplished through the use of a tool controller, a programmed mechanism, and a minimal pneumatic...
6876898 Method of identifying workstations that performed work on a workpiece  
A method of identifying workstations that performed work on a workpiece in a work line having a plurality of zones, wherein each zone includes workstations that perform the same type of operation....
6859677 Assembly verification method and inspection system  
A system and method for verifying proper assembly of devices such as a vehicle that are constructed of two or more components assembled to one another. According to the method the device is placed...
6856854 Numerical control device for a machine tool  
A numerical control device for a machine tool switching two reference axes comprising switching timing determining means for determining a timing for switching the moving position definition on the...
6823708 Sheet metal bending system provided with a press brake and a sheet metal support device and a method to prepare its control data and a computer readable storage medium that stores its control data  
A computer readable recording medium which stores control data to control the action of a sheet metal bending system which is provided with a press brake and a sheet metal support device, where the...
6804583 Automatic locating system for a vehicle crash pad and a method thereof  
In order to automatically supply and locate a crash pad assembly in a vehicle by means of a robot in an automobile manufacturing plant, an automatic locating system of a crash pad for a vehicle...
6792330 Drive control system  
A drive control system having constituent devices such as control unit for drive control, servo amplifier for driving motor by receiving a command from the control unit, spindle amplifier, and...
Matches 1 - 50 out of 140 1 2 3 >