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8682466 Automatic virtual metrology for semiconductor wafer result prediction  
A method to enable wafer result prediction includes collecting manufacturing data from various semiconductor manufacturing tools and metrology tools; choosing key parameters using an autokey method...
8679293 System and method for optimizing lignocellulosic granular matter refining  
A system and method for optimizing a process for refining lignocellulosic granular matter such as wood chips use a predictive model including a simulation model based on relations involving a...
8670856 Algorithmic framework for the integrated optimization of hot strip mill and upstream molten metal operations for a large-scale steel manufacturing plant  
A method and system for optimizing modules of a steel manufacturing process includes a plurality of manufacturing modules for a manufacturing process. Each of the modules have a plurality of steps....
8666706 Material property distribution determination for fatigue life calculation using dendrite arm spacing and porosity-based models  
A method to predict a distribution of material properties of a cast component. In one form, the method includes accepting at least one of dendrite arm spacing data and porosity data that have been...
8666530 Silicon etching control method and system  
An etching control system controls exposure of a silicon workpiece to a spontaneous etchant. The system determines an amount of material to be removed from the silicon workpiece, based on metrology...
8649893 Semiconductor manufacturing device, semiconductor device manufacturing method, simulation device, and simulation program  
Disclosed herein is a semiconductor manufacturing device including, a chamber, a sensor, a sticking probability calculating section, an acting section, and a control section.
8620776 Self healing andon system and method  
Disclosed are various embodiments of a self healing andon system. One embodiment of the present disclosure includes a system comprising at least one server. The system further includes logic...
8606386 Multi-agent system for distributed manufacturing scheduling with Genetic Algorithms and Tabu Search  
Computerized scheduling methods and computerized scheduling systems according to exemplary embodiments. A computerized scheduling method may be stored in a memory and executed on one or more...
8560103 Method and computing system for designing a sheet-metal-forming process  
A method for designing a formed sheet-metal part using a computing system is described. The method typically includes performing a numerical simulation of the forming process and computing a local...
8554353 Fabrication system of CIGS thin film solar cell equipped with real-time analysis facilities for profiling the elemental components of CIGS thin film using laser-induced breakdown spectroscopy  
A fabrication processing system is used to produce copper indium gallium selenide (CuIn1-xGaxSe2 or CIGS) thin film solar cells, more particularly to a fabrication processing system CIGS of thin...
8548621 Production system control model updating using closed loop design of experiments  
Methods and production control systems are presented in which design of experiments are performed in situ and produce model parameter estimates that relate actuator set points to any number of...
8532796 Contact processing using multi-input/multi-output (MIMO) models  
The invention provides a systems and methods for creating Double Pattern (DP) structures on a patterned wafer in real-time using Dual Pattern Contact-Etch (DPCE) processing sequences and associated...
8532805 System and method for controlling a manufacturing process  
A method and a system control a manufacturing process of a plant via a MES system. The MES system is provided with a catalogue of a tool model, the catalogue of the tool model contains tool...
8527102 Controlling the cooling of fermenters of a biofuel production plant  
According to various embodiments, a biofuel production system includes a plurality of parallel-operated fermenters, a cooling tower water system configured to supply cooling water to the plurality...
8527081 Method and apparatus for automated validation of semiconductor process recipes  
Methods and apparatus for automated validation of semiconductor process steps are provided herein. In some examples, a method for validating a semiconductor process recipe includes: selecting a...
8494670 Monte-Carlo based accurate corner extraction  
For application to analog, mixed-signal, and custom digital circuits, a system and method to extract circuit-specific process/environmental corners that is yield-aware and/or specification-aware....
8483861 Scheduling modeling system for adaptive, automated data collection and performance analysis of manufacturing system for optimal scheduling  
A scheduler system obtains a basic model of a manufacturing process for the production of one or more products. The basic model is based on a first set of data collected at a point in time from a...
8463417 Method and apparatus to configure control system to link to machinery monitoring system  
A method performed by one or more computer processors imports data from a machinery monitoring system into a control system. The machinery monitoring system is a system that measures machine...
8452439 Device performance parmeter tuning method and system  
A method comprises computing respective regression models for each of a plurality of failure bins based on a plurality of failures identified during wafer electrical tests. Each regression model...
8447423 Method and apparatus for optimizing a performance index of a bulk product blending and packaging plant  
A method of generating capacity, production and inventory plans, over a designated planning horizon, which will optimize, with respect to a designated performance index, the operations of one or...
8437870 System and method for implementing a virtual metrology advanced process control platform  
System and method for implementing a VM APC platform are described. In one embodiment, the VM APC system comprises a process tool for processing a plurality of wafers, a metrology tool for...
8406912 System and method for data mining and feature tracking for fab-wide prediction and control  
System and method for data mining and feature tracking for fab-wide prediction and control are described. One embodiment is a system comprising a database for storing raw wafer manufacturing data;...
8401688 Identification of engineering intent requirements in an electronic environment  
Engineering requirements are defined in an electronic environment. In one embodiment, a method includes providing at least one of a set of master requirements and a set of version requirements to...
8396582 Method and apparatus for self-learning and self-improving a semiconductor manufacturing tool  
System(s) and method(s) for optimizing performance of a manufacturing tool are provided. Optimization relies on recipe drifting and generation of knowledge that capture relationships among product...
8396583 Method and system for implementing virtual metrology in semiconductor fabrication  
The present disclosure provides a method of fabricating a semiconductor device. The method includes collecting a plurality of manufacturing data sets from a plurality of semiconductor processes,...
8332337 Condition-based monitoring system for machinery and associated methods  
Real-time condition-based analysis is performed on a machine for providing diagnostic and prognostic outputs indicative of machine status includes a signal processor for receiving signals from...
8321046 Substrate processing apparatus  
A substrate processing apparatus including a controller connected to a plurality of sub-controllers for controlling a substrate processing, and an operating section having a display unit for...
8306645 Method for updating manufacturing planning data for a production process  
Manufacturing planning data for a production process that is managed by a manufacturing execution system is updated by way of a plurality of steps, which include: Gathering data from a PLC level...
8271118 Method planning for manufacturing sheet-metal forming parts  
A method for computer-aided generation determining of a method plan for the manufacture of sheet-metal forming parts by way of forming processes, comprises the following steps: determining a set of...
8271117 Fabrication system of semiconductor integrated circuit, fabrication device, fabrication method, integrated circuit and communication system  
A manufacturing system which can restrain the margin of a semiconductor integrated circuit. The integrated circuit including a fixed circuit unit and a reconfigurable circuit unit outputs, to a...
8266552 Pattern generating method, method of manufacturing semiconductor device, and recording medium  
Pattern formation simulations are performed based on design layout data subjected to OPC processing with a plurality of process parameters set in process conditions. A worst condition of the...
8249735 Method and system for automatically identifying an existing workflow to manufacture a given product type  
A method and system for automatically identifying an existing workflow to manufacture a given product type. A workflow description of a workflow can be transformed into a product type description...
8249732 System and method for developing automated templates for knowledge capture  
A system, method, and computer program product for automated development of templates for knowledge capture for use in computer aided design and manufacturing. A method includes receiving a user...
8239055 System for maintaining unified access to SCADA and manufacturing execution system (MES) information  
A system is disclosed that simplifies configuring an MES entity corresponding to a SCADA system object representing plant equipment. The system includes an equipment model builder (EMB) that...
8219231 Quality control system, quality control apparatus, quality control method and computer readable medium  
A quality control method includes: extracting, from a time series distribution of troubles that have occurred in electronic equipments, a first characteristics of states of occurrence of the...
8188866 Circuit board with radio frequency identification for collecting stage-by-stage manufacturing metrics  
A radio frequency identification (RFID) tag is coupled to a circuit board to track the specific operating and environmental conditions of each manufacturing stage as the circuit board passes...
8185232 Learning method of rolling load prediction for hot rolling  
The present invention provides a learning method of rolling load prediction which uses a prediction error of a rolling load at an actual pass of a stock in hot rolling to correct a predicted value...
8091395 System, method, software arrangement and computer-accessible medium for press-forming of materials  
A system, method and software arrangement are provided for generating press-formed parts having a more consistent quality based on improved determination of processing conditions. For example, an...
8086337 Computerized system and method for generating a delivery bill of materials  
A computerized system and method for generating a delivery bill of materials (BOM) for use at a production facility. Input includes parts data identifying the parts used in the production process,...
8069068 Systems and methods for insuring stored food  
A person may store food to prepare for an emergency. An insurance policy may be issue to cover the stored food against loss, theft, spoilage, etc. In issuing the insurance policy and setting the...
8041442 Process for selecting surrogate part  
A process for selecting a surrogate part for metallic plating, the metallic plating of the surrogate part predicting results for the metallic plating of a new or predetermined part is disclosed....
8019349 Telephone conversation resumption system, telephone conversation resumption program, telephone conversation resumption method, portable terminal and relay apparatus  
In a communication network including a relay apparatus and a call control apparatus, a telephone conversation resumption system includes: a reservation unit, when a judgment unit detects...
8014887 Substrate processing apparatus  
A substrate processing apparatus includes an operating section. The operating section includes a display unit having an operation screen, a screen file that stores daily check data monitor screen...
8000819 Manufacturing instruction evaluation support system, manufacturing instruction evaluation support method, and manufacturing instruction evaluation support program  
A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a...
7978544 Methods for providing a unified view of a domain model to a user  
Techniques for providing a unified view of a domain model to a user are described herein. In one embodiment, in response to a first search query received from a client via a first search mechanism...
7966276 Controller for partially observable systems  
A controller is provided, operable to control a system on the basis of measurement data received from a plurality of sensors indicative of a state of the system, with at least partial autonomy, but...
7957822 Component mounter control method and component mounter  
A method controls a component mounter which includes a mobile unit for mounting a component onto a circuit board, and judges on which side of the component mounter as user, who issues an...
7936951 System for document digitization  
A computer-implemented, knowledge-based process for digitizing a set of documents, which includes using a computer to perform the steps of loading a set of definitions stored in an XML document...
7934215 Smart scheduler  
A smart scheduler is provided to prepare a machine for a job, wherein the job has specific requirements, i.e., dimensions. One or more config jobs are identified to configure the machine to meet...
7930049 Control method for a substrate processing apparatus  
A centralized control apparatus includes a data collecting part that gathers data at a predetermined interval from a substrate processing apparatus for each component in the substrate processing...
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