|
Match
|
Document |
Document Title |
|
|
7622937 |
Electrical signal connector
A probe card which can be used for testing narrow-pitched chips or multi-chips, and causes no faulty connections between probes and pads or between probes and a circuit board even in a high...
|
|
|
7618281 |
Interconnect assemblies and methods
Interconnect assemblies and methods for forming and using them. In one example of the invention, an interconnect assembly comprises a substrate, a resilient contact element and a stop structure....
|
|
|
7611377 |
Interface apparatus for electronic device test apparatus
An interface apparatus 5 mounted on a test head 4 comprises: an electrical cable 54 having one end electrically connected to a socket board 66 ; a device side connector 541 attached to the...
|
|
|
7521949 |
Test pin, method of manufacturing same, and system containing same
A test pin includes a compression element ( 110 ), a first tip ( 120 ) physically coupled to a first end ( 111 ) of the compression element, a second tip ( 130 ) physically coupled to a second end...
|
|
|
7521692 |
TDI detecting device, a feed-through equipment, an electron beam apparatus using these device and equipment, and a semiconductor device manufacturing method using the same electron beam apparatus
An electron beam apparatus comprises a TDI sensor 64 and a feed-through device 50 . The feed-through device has a socket contact 54 for interconnecting a pin 52 attached to a flanged 51 ...
|
|
|
7507110 |
Probe connector
A probe connector includes a barrel, a plunger and an elastic element. The barrel disposes a base at one end thereof. The plunger has a basic portion received in the barrel and a contact portion...
|
|
|
7422441 |
Semiconductor component and device and method for connecting such a component, particularly for test purposes
An electrical connection device includes a platform and a moving head. Between these components a semiconductor component is received and retained. The semiconductor component includes an...
|
|
|
7331795 |
Spring probe-compliant pin connector
Provided is an electrical connector for interconnecting electrical components such as a printed wiring assembly to one or more additional printed wiring assemblies. The connector includes a housing...
|
|
|
7094112 |
Spring connector having elastic terminal
An insulative casing has a bottom face to be mounted on a board member. A conductive pin is disposed in the casing so as to be slidable in a first direction parallel to the bottom face. A...
|
|
|
7081005 |
Electric-connection testing device
In an electric-connection testing device of the present invention, a base and a rigid body, to which a substrate provided with a plurality of contacts are secured, are integrated and sandwich a...
|
|
|
7077661 |
Socket for having the same conductor inserts for signal, power and ground
A socket for a microelectronic component is provided. The socket contains power, ground and signal conductors. It further contains a plurality of electrical conductors, each with a respective stop...
|
|
|
7074072 |
Method of making contact with circuit units to be tested in a tester and contact-making apparatus for implementing the method
A contact-making apparatus for making contact with circuit units to be tested in a tester contains a printed circuit board device that has electrical connections to the tester, and a test module...
|
|
|
7071083 |
Method of fabricating polysilicon film by excimer laser crystallization process
A method of fabricating a polysilicon film by an excimer laser crystallization process. First, a substrate comprising a first region and a second region is provided. An amorphous silicon layer and...
|
|
|
7052297 |
Rotary connector having removable and replaceable contacts
A connector that includes a male connector assembly having a nose portion that removably fits within an axial cavity in a female connector assembly and which has removable, replaceable contacts....
|
|
|
7025628 |
Electronic probe extender
An electronic probe extender. In representative embodiments, an electronic probe extender is disclosed which includes a probe connector that is capable of electronic contact to an electronic test...
|
|
|
7014499 |
Probe card for testing semiconductor device
A probe card for testing semiconductor devices includes a main board member, an upper reinforcing plate, a lower reinforcing plate, an interface member, a sub board member, a needle guide member, a...
|
|
|
7010849 |
Methods for manufacturing a resistor-pin assembly of a voltage probe
A pin having a voltage probe pin-head is provided. The pin includes a pin-head having a substantially flat surface at one end and a pin-head tip at an opposing end, the substantially flat surface...
|
|
|
7009377 |
Cartridge system for a probing head for an electrical test probe
A cartridge system includes a main probing head body with electronics positioned therein. Further, the cartridge system includes a probing tip cartridge having a probing tip. A minimally inductive...
|
|
|
6937045 |
Shielded integrated circuit probe
A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for...
|
|
|
6902416 |
High density probe device
A probe block assembly has an electrically insulative housing and an electrically conductive plate. The front side of the housing has a forward face and a recessed face. The electrically conductive...
|
|
|
6869289 |
Multicontact electric connector
Multiple-contact electrical connectors comprising in particular a base 1, two pairs 2, 3 of input/output terminals 4-6 , two electrically conductive needles 11, 12, two electrically...
|
|
|
6844749 |
Integrated circuit test probe
A test probe consists of an elongated screw machine contact biased by a helical spring and mounted in a through hole of a non-conductive substrate. One end of the contact includes a crown for...
|
|
|
6814609 |
Electrical signal read-out method and device therefor
An electric signal taking-out method and a device therefor capable of taking out electric signals for measurement easily from opposite ends of an arbitrary chip part soldered to a circuit board. A...
|
|
|
6799991 |
Medical lead connector
An electrical connector has a compressible portion that expands to accept an inserted lead and then contracts around the lead to provide both an electrical and a spring-like mechanical connection...
|
|
|
6796849 |
Electrical connection device
A fixed electrical connection member of an electronic device for connecting one or more electrical conductors of the electronic device to a mobile electrical connection member external to the...
|
|
|
6756799 |
Multi-meter test lead system
A multi-meter test lead system has a probe having a pointed distal end and a proximal end couplable to supplemental electronic components. An outer sleeve has a distal end with a semi-cylindrical...
|
|
|
6743043 |
Socket for electrical parts having separable plunger
A socket for an electrical part comprises a socket body and a contact pin through which an electrical part having a terminal and a printed circuit board are electrically connected. The socket body...
|
|
|
6719582 |
Method of making a flexible electrode bio-probe assembly
A method of producing an electrode brain probe assembly, using a flexible substrate comprising a polymeric layer bearing a conductive material coating. Photolithography and electroplating are used...
|
|
|
6716043 |
Spring connector with slotted conductive pin
An insulating holder has a first face and a second face, with a first hole that has a first diameter at the first face, and a second hole that has a second diameter larger than the first diameter...
|
|
|
6688906 |
Probes and methods for testing electrical circuits
Probes and methods for testing electrical circuits are provided. One such probe includes a conductive socket, a conductive spring, and a housing that guides the conductive spring to the conductive...
|
|
|
6685498 |
Logic analyzer testing method and configuration and interface assembly for use therewith
The logic analyzer interface assembly connects to a unit under test (UUT). The interface assembly includes an interface board having interface contact points matching the pattern of the UUT contact...
|
|
|
6667627 |
Probe for inspecting semiconductor device and method of manufacturing the same
A probe is provided so as to obtain an electrical contact between a semiconductor device having a plurality of first electrodes as external terminals and an inspection substrate having a plurality...
|
|
|
6655983 |
Electrical test probe provided with a signal transmitting wire having an enlarged portion for preventing the wire from coming out of the probe
In order to make a conductive contact that is appropriate for fine pitching, without using a lead wire whose diameter is needlessly thin, a compressed coil spring 5 and the shells 6 a and 7 a ...
|
|
|
6638097 |
Probe structure
A probe structure for testing a to-be-tested object having at least one to-be-tested device. The probe is inserted into a pin hole formed on a pin board and contacts the to-be-tested device. The...
|
|
|
6632099 |
Electrical connector with automatic shunt displacement member
A connector for testing shunted electrical terminal assemblies includes a selectively actuatable shunt displacement member for moving a terminal shunt between a shunted and unshunted position in...
|
|
|
6617864 |
High frequency probe for examining electric characteristics of devices
A probe whose characteristic impedance can be accurately adjusted to a desired value with the production of a small number of prototypes. The probe includes a first line with a signal terminal to...
|
|
|
6595794 |
Electrical contact method and apparatus in semiconductor device inspection equipment
An electrical contact technique for use in the semiconductor device inspection equipment is disclosed. There are used one or more pyramid-shaped contactors projecting toward an objective...
|
|
|
6551126 |
High bandwidth probe assembly
A spring probe block assembly includes an insulative housing. A probe connector having a signal probe, an insulative layer, and a conductive shell is positioned within the housing. At least one...
|
|
|
6541289 |
Semiconductor-package measuring method, measuring socket, and semiconductor package
Electrical connection of a measuring socket to an IC package, to measure electrical characteristics of the IC package, is realized by bringing a measuring pin of a measuring arm of the measuring...
|
|
|
6529021 |
Self-scrub buckling beam probe
A self scrubbing buckling beam contactor for contacting an array of pads positioned on a device under test is described. The contactor consists of three insulating dies: a top, an offset and a...
|
|
|
6515496 |
Microstructure testing head
A testing head for microstructures is presented. The testing head includes a top guide plate and bottom guide plate, separated by an air gap. Each of the plates include respective guide holes for...
|
|
|
6447328 |
Method and apparatus for retaining a spring probe
A spring probe block assembly includes an insulative housing. A probe connector having a signal probe, an insulative layer, and a conductive shell is positioned within the housing. At least one...
|
|
|
6447343 |
Electrical connector having compressive conductive contacts
An electrical connector ( 1 ) includes an insulative housing ( 2 ) and a number of compressive conductive contacts ( 3 ). The insulative housing has a top surface ( 20 ), a bottom surface ( 22 )...
|
|
|
6416352 |
Telecommunication apparatus test module with deflectable circuit switching contact
A telecommunication apparatus comprising an external plastics casing containing a conductive path for a telecommunications signal. The casing includes an aperture providing access to the test...
|
|
|
6407562 |
Probe tip terminating device providing an easily changeable feed-through termination
A probe tip adapter with easily interchangeable termination. It includes an empty circuit substrate with which the user may construct a probe adapter circuit designed specifically for almost any...
|
|
|
6404215 |
Variable spacing probe tip adapter for a measurement probe
A variable spacing probe tip adapter for a differential measurement probe has a measurement probe head with first and second probe tips extending from the probe head. Ribs and grooves formed in the...
|
|
|
6396294 |
Socket pin and socket for electrical testing of semiconductor packages
A socket pin and a socket for electrical testing of a semiconductor package suppress electrical open/short defects due to contact failure and reduce manufacturing costs. The socket pin includes: an...
|
|
|
6352454 |
Wear-resistant spring contacts
A spring contact includes a free portion having a tip. The free portion includes a contact surface and side surfaces. In some embodiments, a wear resistant material is formed on only selected...
|
|
|
6351405 |
Pad for integrated circuit device which allows for multiple probing and reliable bonding and integrated circuit device including the pad
An integrated circuit device having a first type of pads with a probing portion and a bonding portion. The integrated circuit device includes a memory cell array, a logic circuit, and a plurality...
|
|
|
6340306 |
Bridge clip for a connector
A bridge clip for testing electrical connections includes a body and at least one test lead having a first end connected to the body, and a second end having a dimple formed thereon. In a second...
|