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7615502 |
Laser anneal of vertically oriented semiconductor structures while maintaining a dopant profile
A method to laser anneal a silicon stack (or a silicon-rich alloy) including a heavily doped region buried beneath an undoped or lightly doped region is disclosed. By F selecting laser energy at a...
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7611970 |
Wafer processing method
A water processing method for providing a gettering sink effect to a wafer having a plurality of streets which are formed in a lattice pattern on the front surface of a substrate and devices which...
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7598160 |
Method for manufacturing thin film semiconductor
A method for manufacturing thin film semiconductor device is provided. The semiconductor thin film includes a semiconductor thin film and a gate electrode and has an active region turned into a...
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7592274 |
Method for fabricating semiconductor element
A method for fabricating a semiconductor element includes the steps of: providing a semiconductor wafer; forming an oxide layer on the semiconductor wafer; carrying out a high-temperature thermal...
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7589027 |
Method of manufacturing semiconductor device
Provided is a method of manufacturing a semiconductor device. A first gate oxide layer is formed on a semiconductor substrate in which a core region and an input/output region are defined. The...
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7585793 |
Method for applying a high temperature heat treatment to a semiconductor wafer
The invention provides methods for applying high temperature treatments to semiconductor wafers that limit surface tearing-off defects and surface particle contamination. In preferred embodiments,...
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7585791 |
Laser irradiation method, laser irradiation apparatus and method for manufacturing semiconductor device
In conducting laser annealing using a CW laser or a quasi-CW laser, productivity is not high as compared with an excimer laser and thus, it is necessary to further enhance productivity. According...
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7585790 |
Method for forming semiconductor device
A method of forming a semiconductor device. The method comprises steps of providing a substrate having a first transistor, a second transistor and non-salicide device formed thereon and the...
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7579285 |
Atomic layer deposition method for depositing a layer
The invention is related to an ALD method for depositing a layer including the steps of a) providing a semiconductor substrate in a reactor; b) providing a pulse of a first precursor gas into the...
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7569503 |
Contact doping and annealing systems and processes for nanowire thin films
Embodiments of the present invention are provided for improved contact doping and annealing systems and processes. In embodiments, a plasma ion immersion implantation (PIII) process is used for...
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7557050 |
Method of manufacturing polysilicon thin film and method of manufacturing thin film transistor having the same
In a method of manufacturing a polysilicon thin film and a method of manufacturing a TFT having the thin film, a laser beam is irradiated on a portion of an amorphous silicon thin film to liquefy...
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7521383 |
Manufacturing method of semiconductor device
A first layer (an insulating layer), a second layer (a metal layer), and a third layer (an insulating layer) are formed over a substrate. Then, a fourth layer including a semiconductor element is...
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7521378 |
Low temperature process for polysilazane oxidation/densification
Semiconductor devices, structures and systems that utilize a polysilazane-based silicon oxide layer or fill, and methods of making the oxide layer are disclosed. In one embodiment, a polysilazane...
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7510986 |
Production method for semiconductor device
In a production process for a semiconductor device employing an SiC semiconductor substrate ( 1 ), the SiC semiconductor substrate ( 1 ) is mounted on a susceptor ( 23 ), and a C heating member ( 3...
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7510959 |
Method of manufacturing a semiconductor device having damascene structures with air gaps
A method of manufacturing a semiconductor device having damascene structures with air gaps is provided. In one embodiment, the method comprises the steps of depositing and patterning a disposable...
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7507648 |
Methods of fabricating crystalline silicon film and thin film transistors
A method by which solid phase crystallization (SPC) thermal budget for crystallizing an undoped (or a lightly doped) amorphous Si (a-Si) is significantly reduced. First, a composite layer structure...
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7485575 |
Method of manufacturing semiconductor device
A semiconductor substrate is inserted into a heat treatment apparatus at a low temperature ranging from room temperature to about 50° C., and organic substances included in a metal on the...
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7485551 |
Semiconductor-on-insulator type heterostructure and method of fabrication
The present invention relates to a method of fabricating a semiconductor-on-insulator-type heterostructure that includes at least one insulating layer interposed between a receiver substrate of...
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7479466 |
Method of heating semiconductor wafer to improve wafer flatness
A method of heating-treating a semiconductor wafer is provided. In one embodiment, a first layer is formed over a first side of a substrate. A second layer is formed over the first layer and over a...
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7479465 |
Transfer of stress to a layer
A strained semiconductor layer is achieved by a method for transferring stress from a dielectric layer to a semiconductor layer. The method comprises providing a substrate having a semiconductor...
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7476597 |
Methods and systems for laser assisted wirebonding
The invention provides methods and systems for laser assisted wirebonding. One or more conditioning laser pulses are used to prepare a bonding surface for wirebonding by removing impurities such as...
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7473656 |
Method for fast and local anneal of anti-ferromagnetic (AF) exchange-biased magnetic stacks
A method of thermally treating a magnetic layer of a wafer, includes annealing, for a predetermined short duration, a magnetic layer of a single wafer, applying at least one local magnetic field to...
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7466907 |
Annealing process and device of semiconductor wafer
A device for use in a thermal annealing process for a wafer (T) of material chosen among the semiconductor materials for the purpose of detaching a layer from the wafer at an weakened zone. During...
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7465977 |
Method for producing a packaged integrated circuit
There is described a method for producing a packaged integrated circuit. The method comprises a first step of building an integrated circuit having a micro-structure suspended above a micro-cavity,...
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7465645 |
Method of detaching a layer from a wafer using a localized starting area
A method for detaching a layer from a wafer. A weakened zone is created in the wafer to define the layer to be detached and a remainder portion of the wafer, such that the weakened zone includes a...
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7439198 |
Method for fabricating a buried metallic layer in a semiconductor body and semiconductor component having a buried metallic layer
A method for fabricating a buried metallic layer at a predetermined vertical position in a semiconductor body having a first and second side includes a step of applying a metal layer to one of the...
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7439196 |
Method for manufacturing pattern formed structure
The main object of the present invention is to provide a method for manufacturing efficiently a pattern formed structure which has a surface having a property-varied pattern and can be used to...
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7410355 |
Method for the heat treatment of substrates
A substrate undergoes a semiconductor fabrication process at different temperatures in a reactor without changing the temperature of the reactor. The substrate is held suspended by flowing gas...
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7402533 |
Masking without photolithography during the formation of a semiconductor device
A method for forming a semiconductor device comprises forming a dielectric layer over a semiconductor wafer substrate assembly having closely spaced regions, such as a memory transistor array, and...
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7402517 |
Method and apparatus for selective deposition of materials to surfaces and substrates
Methods are disclosed for depositing materials selectively and controllably from liquid, near-critical, and/or supercritical fluids to a substrate or surface controlling the location and/or...
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7402445 |
Method of forming micro-structures and nano-structures
Methods of forming a nano-structure for electron extraction are disclosed. One method of forming a nano-structure comprises irradiating an area on a first surface of a thermal conductive film to...
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7381632 |
Semiconductor thin film crystallization device and semiconductor thin film crystallization method
A first laser beam is emitted from a first laser oscillator in a pulsed manner at a high repetition frequency, and converged onto a substrate by a first intermediate optical system 2 so as to...
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7358200 |
Gas-assisted rapid thermal processing
A system, method and apparatus for processing a semiconductor device including a processing chamber and a heating assembly positioned within the processing chamber. The heating assembly including...
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7357963 |
Apparatus and method of crystallizing amorphous silicon
A sequential lateral solidification apparatus includes a laser generator for generating and emitting a laser beam; an X-Y stage movable in two orthogonal axial directions; and a mask arranged...
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7332448 |
Manufacturing method of semiconductor device and semiconductor manufacturing device
A manufacturing method of a semiconductor device, comprises; a process of heat-treating a semiconductor substrate under the ordinary pressure and in an oxidizing atmosphere; and a process of...
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7326658 |
Method for preparing nitrogen-doped annealed wafer and nitrogen-doped and annealed wafer
The present invention provides a method for producing a nitrogen-doped annealed wafer, wherein before a wafer sliced from a silicon single crystal doped with at least nitrogen and polished is...
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7309617 |
MRAM memory cell with a reference layer and method for fabricating
The invention relates to a method for fabricating a reference layer for MRAM memory cells and an MRAM memory cell equipped with a reference layer of this type. A reference layer of this type...
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7300856 |
Process for detaching layers of material
A process for detaching two layers of material according to a weakened zone defined between the layers. This process includes the thermal annealing of a structure that incorporates the layers, with...
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7294586 |
Method of processing a substrate, heating apparatus, and method of forming a pattern
A method of processing a substrate, comprising forming a chemically amplified resist film on a substrate, irradiating energy beams to the chemically amplified resist film to form a latent image...
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7282456 |
Self-repair and enhancement of nanostructures by liquification under guiding conditions
In accordance with the invention, the structure of a patterned nanoscale or near nanoscale device (“nanostructure”) is repaired and/or enhanced by liquifying the patterned device in the...
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7276175 |
Semiconductor device fabrication method
A semiconductor device fabrication method comprises (1) forming a patterned mask layer on an oxide layer of a Mn-containing perovskite type oxide; (2) heat-treating the oxide layer; and (3)...
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7232774 |
Polycrystalline silicon layer with nano-grain structure and method of manufacture
A method of forming polycrystalline silicon with ultra-small grain sizes employs a differential heating of the upper and lower sides of the substrate of a CVD apparatus, in which the lower side of...
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7208696 |
Method of forming a polycrystalline silicon layer
A method of forming a polycrystalline silicon layer. An amorphous silicon layer on a substrate is completely melted using a laser beam passed through a mask so as to form a polycrystalline silicon...
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7202145 |
Strained Si formed by anneal
A semiconductor structure includes a silicon substrate layer, a relaxed silicon-germanium layer on the silicon substrate layer and a strained single crystal silicon layer on the silicon-germanium...
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7138344 |
Method for minimizing slip line faults on a semiconductor wafer surface
A method for minimizing slip line faults on a surface of a semiconductor wafer that has been obtained using a transfer technique. The method includes heating the semiconductor wafer from an ambient...
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7122482 |
Methods for fabricating patterned features utilizing imprint lithography
One embodiment of the present invention is a method for generating patterned features on a substrate that includes: (a) forming a first layer on at least a portion of a surface of the substrate,...
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7122409 |
Semiconductor device and a method of manufacturing the same
To provide a TFT that can operate at a high speed by forming a crystalline semiconductor film while controlling the position and the size of a crystal grain in the film to use the crystalline...
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7115503 |
Method and apparatus for processing thin metal layers
A method and apparatus for processing a thin metal layer on a substrate to control the grain size, grain shape, and grain boundary location and orientation in the metal layer by irradiating the...
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7101817 |
System and method for determining line widths of free-standing structures resulting from a semiconductor manufacturing process
A apparatus and method for determining minimum line widths of free standing structures built by a semiconductor (S/C) manufacturing process. Free standing structures are created in a semiconductor...
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7101814 |
Masking without photolithography during the formation of a semiconductor device
A method for forming a semiconductor device comprises forming a dielectric layer over a semiconductor wafer substrate assembly having closely-spaced regions, such as a memory transistor array, and...
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