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7524751 |
Method for forming contact hole in semiconductor device
Methods for forming a contact hole in a semiconductor device are provided. An exposed portion of an isolation layer, which may be generated during a process of forming a borderless contact hole,...
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7524748 |
Method of interconnecting terminals and method of mounting semiconductor devices
A method of interconnecting terminals so as to obtain an excellent electrical connection between terminals such as opposing electrodes and a mounting method for semiconductor devices using this...
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7524752 |
Method of manufacturing semiconductor device
In a method of manufacturing a semiconductor device which method is made up of a process of forming a wiring groove using a hard mask, a metal hard mask 107 is used to form a wiring groove 111 ,...
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7521348 |
Method of fabricating semiconductor device having fine contact holes
A method for fabricating a semiconductor device having fine contact holes is exemplarily disclosed. The method includes forming an isolation layer defining active regions on a semiconductor...
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7521347 |
Method for forming contact hole in semiconductor device
A method for forming a contact hole in a semiconductor device includes forming gate lines on a substrate, forming a bit line pattern by forming a bit line and a bit line hard mask in sequential...
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7517798 |
Methods for forming through-wafer interconnects and structures resulting therefrom
The present invention relates to methods for forming through-wafer interconnects in semiconductor substrates and the resulting structures. In one embodiment, a method for forming a through-wafer...
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7517782 |
Method of forming a metal layer over a patterned dielectric by wet chemical deposition including an electroless and a powered phase
By performing an electroless deposition and an electro deposition process in situ, highly reliable metallizations may be provided, wherein limitations with respect to contaminations and device...
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7514348 |
Sidewall coverage for copper damascene filling
A general process is described for filling a hole or trench at the surface of an integrated circuit without trapping voids within the filler material. A particular application is the filling of a...
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7514288 |
Manufacturing methods for thin film fuse phase change ram
A method for manufacturing a memory device comprises forming an electrode layer on a substrate which comprises circuitry made using front-end-of-line procedures. The electrode layer includes a...
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7514347 |
Interconnect structure and fabricating method thereof
An interconnect structure is described, disposed on a substrate with a conductive part thereon and including a first porous low-k layer on the substrate, a damascene structure in the first porous...
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7510323 |
Multi-layered thermal sensor for integrated circuits and other layered structures
A compact resistive thermal sensor is provided for an integrated circuit (IC), wherein different sensor components are placed on different layers of the IC. This allows the lateral area needed for...
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7510967 |
Method for manufacturing semiconductor device
The present invention relates to a method for manufacturing a semiconductor device, comprising: forming a metal interconnect on a substrate; forming a refractory metal layer containing titanium...
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7508078 |
Electronic device, method for manufacturing electronic device, contact hole of electronic device, method for forming contact hole of electronic device
An electronic device includes a substrate, a first conductive material layer formed on the substrate, a patterning layer formed on the first conductive material layer, the patterning layer...
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7498249 |
Method of forming a connecting conductor and wirings of a semiconductor chip
A resist post is formed on a connection pad of a semiconductor chip, and the semiconductor chip and the resist post are covered by a heat resistant insulating layer. A surface of the insulating...
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7498250 |
Shapes-based migration of aluminum designs to copper damascene
An interconnect structure, method of fabricating the interconnect structure and method of designing the interconnect structure for use in semiconductor devices. The interconnect structure includes...
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7494834 |
Method of manufacturing a transparent element including transparent electrodes
Method of manufacturing a transparent element including transparent electrodes, said method including the steps of:
depositing over at least one part of the surface of a transparent...
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7494907 |
Nanoscale electronic devices and fabrication methods
The invention relates to a method of forming a conducting nanowire between two contacts on a substrate surface wherein a plurality of nanoparticles is deposited on the substrate in the region...
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7494908 |
Apparatus for integration of barrier layer and seed layer
A system for processing a substrate is provided which includes at least one atomic layer deposition (ALD) chamber for depositing a barrier layer containing tantalum and at least one physical vapor...
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7491643 |
Method and structure for reducing contact resistance between silicide contact and overlying metallization
A semiconductor structure in which the contact resistance in the contact opening is reduced as well as a method of forming the same are provided. This is achieved in the present invention by...
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7488684 |
Organic aluminum precursor and method of forming a metal wire using the same
An organic aluminum precursor includes aluminum as a central metal, and borohydride and trimethylamine as ligands. In a method of forming an aluminum layer or wire, the organic aluminum presursor...
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7488682 |
High-density 3-dimensional resistors
Interconnect, i.e., BEOL structures comprising at least one thin film resistor that is located at the same level as that of a neighboring conductive interconnect are provided. The present invention...
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7485581 |
Device with gaps for capacitance reduction
A method for reducing capacitances between semiconductor devices is provided. A plurality of contact structures is formed in a dielectric layer. A mask is formed to cover the contact structures...
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7485559 |
Semiconductor device and method of fabricating the same
A semiconductor device and methods thereof. The semiconductor device includes a first layer formed on a substrate, the first layer having a higher conductivity. The semiconductor device further...
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7482257 |
Method for forming metal contact in semiconductor device
A method for forming a metal contact in a semiconductor device includes forming bit lines over a substrate defined into a cell region and a peripheral region, forming a first inter-layer dielectric...
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7476604 |
Aggressive cleaning process for semiconductor device contact formation
A method of forming a contact through a material includes forming a via through a dielectric material and cleaning the via using a dilute hydrofluoric (DHF) acid solution. The method further...
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7476605 |
Method of manufacturing semiconductor device
A method for manufacturing a semiconductor device is provided, which comprises forming a first metal wiring layer above a semiconductor substrate, forming an inorganic insulating film above the...
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7476613 |
Method of forming an electrical contact in a semiconductor device using an improved self-aligned contact (SAC) process
A contact for a semiconductor device is made by performing, inter alia, a CMP process on an interlayer insulation layer to expose a first hard mask layer of each conductive line. The interlayer...
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7476607 |
Semiconductor electrode, production process thereof and photovoltaic cell using semiconductor electrode
An object of the present invention is to provide a photovoltaic cell that demonstrates a superior photoelectric conversion function. The present invention relates to a photovoltaic cell comprising...
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7473628 |
Method of manufacturing semiconductor device and semiconductor device
According to an embodiment of the present invention, a method of manufacturing a semiconductor device, comprising forming a conducting layer on a substrate; forming a resist mask having an opening...
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7473609 |
Surface treatment in preparation for contact placement
A contact is formed on indium-phosphide material. Regions of the indium-phosphide material are exposed. An energetic bombardment is performed on exposed regions of the indium-phosphide material....
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7470638 |
Systems and methods for manipulating liquid films on semiconductor substrates
A semiconductor substrate undergoing processing to fabricate integrated circuit devices thereon is spun about a rotational axis while introducing liquid onto a surface of the substrate. An...
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7468287 |
Method of fabricating a heterojunction of organic semiconducting polymers
Provided is a method of forming a heterojunction of contiguous layers of organic semiconducting polymers. The method comprises firstly forming a layer of a first organic semiconducting polymer on a...
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7465651 |
Integrated circuit packages with reduced stress on die and associated methods
Mechanical stresses are reduced between an electronic component having relatively low fracture toughness and a substrate having relatively greater fracture toughness. In an embodiment, the...
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7465654 |
Structure of gold bumps and gold conductors on one IC die and methods of manufacturing the structures
A method for fabricating multiple metal layers includes the following steps. An electronic component is provided with multiple contact points. A first metal layer is deposited over said electronic...
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7465650 |
Methods of forming polysilicon-comprising plugs and methods of forming FLASH memory circuitry
This invention includes methods of forming plugs containing polysilicon, and methods of forming FLASH memory circuitry. In one implementation, a method of forming a plug containing polysilicon...
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7465652 |
Method of forming a catalyst layer on the barrier layer of a conductive interconnect of a semiconductor device
A method is provided for depositing a conductive material in a sub-micron recessed feature formed on a substrate. The method begins by depositing a barrier layer over a dielectric layer disposed on...
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7459340 |
Semiconductor device and manufacturing method thereof
A semiconductor device includes a base plate made of a material including at least a thermosetting resin, and having an opening, a vertical conductor filled and provided in the opening of the base...
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7452795 |
Semiconductor device and method for fabricating the same
When a via-hole 26 and an interconnection trench 32 are formed in an interconnection films 16, 18 by using as a mask a hard mask 20 covering the region except via-hole forming region, and a...
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7449360 |
Phase change memory devices and fabrication methods thereof
In a memory device, at least one conductive contact having a width of less than, or equal to, about 30 nm may be formed on a first electrode. A dielectric layer may be formed on the sides of the at...
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7449409 |
Barrier layer for conductive features
Barrier layers for conductive features and methods of formation thereof are disclosed. A first barrier material is deposited on top surfaces of an insulating material, and a second barrier material...
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7446047 |
Metal structure with sidewall passivation and method
A passivated metal structure and a method of forming the metal structure is disclosed. According to one embodiment, the patterned metal structure, such as conductive lines, are formed on a...
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7442637 |
Method for processing IC designs for different metal BEOL processes
A method for processing IC designs for different metal BEOL processes is provided for enabling fabricating using a metal fabrication process an IC originally having a backend design for a different...
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7442633 |
Decoupling capacitor for high frequency noise immunity
Systems and methods are provided for an on-chip decoupling device and method. One aspect of the present subject matter is a capacitor. One embodiment of the capacitor includes a substrate, a high K...
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7439169 |
Integrated circuit and methods of redistributing bondpad locations
Integrated circuits and methods of redistributing bondpad locations are disclosed. In one implementation, a method of redistributing a bondpad location of an integrated circuit includes providing...
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7432185 |
Method of forming semiconductor device having stacked transistors
There is provided a method of forming a semiconductor device having stacked transistors. When forming a contact hole for connecting the stacked transistors to each other, ohmic layers on the bottom...
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7429536 |
Methods for forming arrays of small, closely spaced features
Methods of forming arrays of small, densely spaced holes or pillars for use in integrated circuits are disclosed. Various pattern transfer and etching steps can be used, in combination with...
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7429527 |
Method of manufacturing self-aligned contact openings
A method of manufacturing self-aligned contact openings is provided. A substrate having a number of device structures is provided and the top of the device structures is higher than the surface of...
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7427544 |
Semiconductor device and method of manufacturing the same
A semiconductor device includes an element isolation insulating film provided in a semiconductor substrate between first and second element regions, a gate electrode running over the element...
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7425499 |
Methods for forming interconnects in vias and microelectronic workpieces including such interconnects
Methods for forming interconnects in blind vias or other types of holes, and microelectronic workpieces having such interconnects. The blind vias can be formed by first removing the bulk of the...
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7419847 |
Method for forming metal interconnection of semiconductor device
A method for forming a metal interconnection of a semiconductor device avoids over-etching and under-etching through the use of the “self-stop” function of a nitridation layer, to prevent the...
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