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8999819 Dendritic metal structures, methods for making dendritic metal structures, and devices including them  
The present invention relates generally to dendritic metal structures and devices including them. The present invention also relates particularly to methods for making dendritic metal structures...
8900973 Method to enable compressively strained pFET channel in a FinFET structure by implant and thermal diffusion  
A method of making a semiconductor device patterns a first fin in a pFET region, and patterns a second fin in an nFET region. A plurality of conformal microlayers containing a straining material...
8901738 Method of manufacturing an enhanced electromigration performance hetero-junction bipolar transistor  
Semiconductor devices with enhanced electromigration performance and methods of manufacture are disclosed. The method includes forming at least one metal line in electrical contact with a device....
8742531 Electrical devices including dendritic metal electrodes  
The present invention relates generally to electrical devices. The present invention relates more particularly to electrical devices including dendritic metal electrodes. One aspect of the present...
8709858 Tailoring the band gap of solar cells made of liquid silane by adding germanium  
The present invention relates to a method for decreasing or increasing the band gap shift in the production of photovoltaic devices by means of coating a substrate with a formulation containing a...
8704210 Boundary-modulated nanoparticle junctions and a method for manufacture thereof  
A method of providing miniaturized size down to nanoscale electronic materials, which may be easily incorporated into the future ever-scaling down power electronics, microelectronics and...
8704041 Methods and compositions for targeted polynucleotide modification  
A variety of methods and compostions are provided, including methods and compositions for targeted modification of a specific target site in a cell or organism, methods for integrating...
8642376 Methods for depositing a material atop a substrate  
Methods for depositing a material atop a substrate are provided herein. In some embodiments, a method of depositing a material atop a substrate may include exposing a substrate to a silicon...
8633092 Quantum well device  
An apparatus includes a primary planar quantum well and a planar distribution of dopant atoms. The primary planar quantum well is formed by a lower barrier layer, a central well layer on the lower...
8575007 Selective electromigration improvement for high current C4s  
The invention includes embodiments of a method for designing a flip chip and the resulting structure. The starting point is a flip chip with a semiconductor substrate, one or more wiring levels,...
8575727 Gate structures  
A semiconductor device is provided. The device includes a semiconductor substrate, first and second projections extending upwardly from the substrate, the projections having respective first and...
8569116 Integrated circuit with a fin-based fuse, and related fabrication method  
Methods of fabricating an integrated circuit with a fin-based fuse, and the resulting integrated circuit with a fin-based fuse are provided. In the method, a fin is created from a layer of...
8569755 Secure anti-fuse with low voltage programming through localized diffusion heating  
An antifuse has first and second semiconductor regions having one conductivity type and a third semiconductor region therebetween having an opposite conductivity type. A conductive region...
8445362 Apparatus and method for programming an electronically programmable semiconductor fuse  
An apparatus and method for programming an electronically programmable semiconductor fuse applies a programming current to a fuse link as a series of multiple pulses. Application of the...
8436330 Electrically actuated devices  
An electrically actuated device includes a first electrode, a second electrode, and an active region disposed between the first and second electrodes. At least two dopants are present in a...
8410560 Electromigration reduction in micro-hotplates  
A micro-hotplate is provided in the form of a device comprising a sensor and one or more resistive heaters within the micro-hotplate arranged to heat the sensor. Furthermore a controller is...
8350264 Secure anti-fuse with low voltage programming through localized diffusion heating  
An antifuse is provided having a unitary monocrystalline semiconductor body including first and second semiconductor regions each having the same first conductivity type, and a third semiconductor...
8323990 Reliability test structure for multilevel interconnect  
Embodiments in accordance with the present invention relate to structures and methods allowing stress-induced electromigration to be tested in multiple interconnect metallization layers. An...
8278173 Method of fabricating gate structures  
A method includes: forming first and second projections; forming a first structure engaging the first projection, and including: a non-metallic conductive layer, and a first opening over the...
8089060 Non-volatile memory cell and fabrication method thereof  
A non-volatile memory cell and a fabrication method thereof are provided. The non-volatile memory cell includes an anode; a cathode having a surface facing the anode; a specific structure disposed...
8040604 Imaging system and method for providing extended depth of focus, range extraction and super resolved imaging  
An imaging system is presented for imaging objects within a field of view of the system. The imaging system comprises an imaging lens arrangement, a light detector unit at a certain distance from...
7981771 Structures and methods to enhance Cu interconnect electromigration (EM) performance  
The invention generally relates to semiconductor devices, and more particularly to structures and methods for enhancing electromigration (EM) performance in interconnects. A method includes...
7935630 Wiring structure and wiring designing method  
A designing method of a semiconductor device having a first wire and a second wire with a plurality of vias includes determining a first life time change rate of the semiconductor device in...
7915144 Methods for forming thermotunnel generators having closely-spaced electrodes  
The present disclosure relates to methods of forming solid state thermal engines that provides a closely-spaced thermal tunneling gap between a hot and cold electrode. The effective gap may be on...
7855098 Method of forming, modifying, or repairing a semiconductor device using field-controlled diffusion  
A technique for altering or repairing the operating state of a semiconductor device comprises field-controlled diffusion of mobile dopant atoms within the metal oxide crystal lattice. When heated...
7846816 Method for producing a multilayer structure comprising a separating layer  
Process for producing a multilayer structure that includes, within the depth thereof, a separating layer, including: producing an initial multilayer structure comprising a base substrate, a...
7838330 Method of field-controlled diffusion and devices formed thereby  
A technique for creating high quality Schottky barrier devices in doped (e.g., Li+) crystalline metal oxide (e.g., ZnO) comprises field-controlled diffusion of mobile dopant atoms within the metal...
7818655 Method for quantitative detection of multiple electromigration failure modes  
According to one exemplary embodiment, a computer implemented method for detecting multiple failure modes in a set of electromigration failure data points includes sorting the data points by time...
7781827 Semiconductor device with a vertical MOSFET including a superlattice and related methods  
A semiconductor device may include at least one vertical Metal Oxide Semiconductor Field Effect Transistor (MOSFET) on a substrate. The vertical MOSFET may include at least one superlattice...
7772047 Method of fabricating a semiconductor die having a redistribution layer  
A semiconductor device having a redistribution layer, and methods of forming same, are disclosed. After fabrication of semiconductor die on a wafer, a tape assembly is applied onto a surface of...
7741147 Method of field-controlled diffusion and devices formed thereby  
A technique for creating high quality Schottky barrier devices in doped (e.g., Li+) crystalline metal oxide (e.g., ZnO) comprises field-controlled diffusion of mobile dopant atoms within the metal...
7671444 Empty vias for electromigration during electronic-fuse re-programming  
The disclosure relates generally to integrated circuit (IC) chip fabrication, and more particularly, to an e-fuse device including an opening, a first via and a second via in an interlayer...
7646549 Imaging system and method for providing extended depth of focus, range extraction and super resolved imaging  
An imaging system is presented for imaging objects within a field of view of the system. The imaging system comprises an imaging lens arrangement, a light detector unit at a certain distance from...
7589257 Genes for enhancing nitrogen utilization efficiency in crop plants  
The invention provides isolated NUE (nitrogen utilization efficiency) nucleic acids and their encoded proteins. The present invention provides methods and compositions relating to altering...
7465661 High aspect ratio microelectrode arrays  
A method of electroplating a metal into a plurality of channels within an insulating material includes mounting the material to a cathode; placing the cathode into an electroplating solution...
7301239 Wiring structure to minimize stress induced void formation  
A wiring structure with improved resistance to void formation and a method of making the same are described. The wiring structure has a first conducting layer that includes a large area portion...
7232771 Method and apparatus for depositing charge and/or nanoparticles  
A method and apparatus for use in depositing electrical charge and/or nanoparticles is provided. A stamping process is used in which a stamp having a flexible layer such as a flexible...
7148105 Method for forming polysilicon floating gate  
A floating gate memory cell comprises a substrate with a drain and a source separated by a channel, a floating gate separated from the channel by a first insulation layer, and a control gate...
7026225 Semiconductor component and method for precluding stress-induced void formation in the semiconductor component  
A semiconductor component having a feature suitable for inhibiting stress induced void formation and a method for manufacturing the semiconductor component. A semiconductor substrate is provided...
6881594 Method of using scatterometry for analysis of electromigration, and structures for performing same  
The present invention is generally directed to various methods of using scatterometry for analysis of electromigration. In one illustrative embodiment, the method comprises forming a grating...
6867056 System and method for current-enhanced stress-migration testing of interconnect  
For testing for stress-migration failure of interconnect, an interconnect test structure is formed with a first feeder line coupled to a test line by a first no-flux structure, and with a second...
6844245 Method of preparing a self-passivating Cu laser fuse  
A method of forming a semiconductor device, such as a self-passivating fuse, includes patterning an opening in a dielectric to form a fuse. A seed-layer of a copper-alloy is deposited in the...
6784000 Method for measurement of electromigration in semiconductor integrated circuits  
Electromigration testing is accelerated in the batch fabrication of semiconductor integrated circuits by forming test structures during the metal deposition phase of the batch fabrication process....
6777314 Method of forming electrolytic contact pads including layers of copper, nickel, and gold  
A method of forming an electrical contact on a surface of a substrate. A first layer of a first electrically conductive material is formed on the surface of the substrate, where the first layer is...
6624499 System for programming fuse structure by electromigration of silicide enhanced by creating temperature gradient  
The present invention provides a system, apparatus and method of programming via electromigration. A semiconductor fuse which includes a cathode and an anode coupled by a fuse link having an...
6593213 Synthesis of layers, coatings or films using electrostatic fields  
Systems and methods are described for synthesis of films, coatings or layers using electrostatic fields. A method includes applying an electrostatic field across a first precursor layer that is...
6548377 Method for forming a line of semiconductor device  
A method for forming a line of a semiconductor device is provided, which improves the life span of the line and its reliability by improving resistance to electromigration (EM). The method for...
6513000 Simulation method of wiring temperature rise  
A heat capacity C1 is obtained by conducting two-dimensional thermal analysis simulation to the cross-section of a wiring. Next, based on one-dimensional approximate equation of θ0=(Q0/2)...
6417053 Fabrication method for a silicon nitride read-only memory  
A fabrication method for a silicon nitride read-only memory is described. A silicon nitride read-only memory and a grounding doped region are formed in the substrate. A contact is formed on the...
6362079 Semiconductor device and method of anodization for the semiconductor device  
A first p-type silicon layer (3) is formed as a buried layer in a p-type single crystal silicon substrate (2), and an n-type silicon layer (4) is formed on the upper side of the silicon substrate...

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