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7560389 |
Method for fabricating semiconductor element
A method for fabricating a semiconductor element on a semiconductor substrate having a support substrate and a semiconductor layer above the support substrate. The method includes preparing the...
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7524729 |
Method of manufacturing a semiconductor integrated circuit device having a trench
A semiconductor integrated circuit device and a method of manufacturing the same. The surface of a substrate of an active region surrounded by an element isolation trench is horizontally flat in...
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7494909 |
Method of manufacturing a chip
Provided are a chip, a chip stack, and a method of manufacturing the same. A plurality of chips which each include: at least one pad formed on a wafer; and a metal layer which protrudes up to a...
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7416947 |
Method of fabricating trench MIS device with thick oxide layer in bottom of trench
A trench MIS device includes a thick dielectric layer at the bottom of the trench. The thick dielectric layer can be formed by the deposition or thermal growth of a dielectric material, such as...
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7393770 |
Backside method for fabricating semiconductor components with conductive interconnects
A backside method for fabricating a semiconductor component with a conductive interconnect includes the step of providing a semiconductor substrate having a circuit side, a backside, and a...
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7354818 |
Process for high voltage superjunction termination
A method of manufacturing a semiconductor device having an active region and a termination region includes providing a semiconductor substrate having first and second main surfaces opposite to each...
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7348254 |
Method of fabricating fin field-effect transistors
A method of fabricating a fin field-effect transistor that may enable a reduction in the number of process steps, by forming the fin structure by etching away a predetermined thickness of an...
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7321141 |
Image sensor device and manufacturing method thereof
A semiconductor substrate is provided on which a plurality of shallow trench isolations (STI) defining a plurality of active areas are formed. The active areas comprise a photo sensing region, and...
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7297599 |
Method of fabricating semiconductor device
A method of fabricating a semiconductor device includes forming on a semiconductor substrate a gate electrode with a gate insulating film being interposed between the substrate and the electrode,...
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7256100 |
Manufacturing method of semiconductor device having trench type element isolation
A semiconductor substrate including a first region, a second region larger than the first region and an isolation region is provided. A mask layer is selectively formed on the first and second...
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7189592 |
Manufacturable single-chip hydrogen sensor
A robust single-chip hydrogen sensor and a method for fabricating such a sensor. By utilizing an interconnect metallization material that is the same or similar to the material used to sense...
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7183173 |
Method for forming isolation film in semiconductor device
A method for forming an isolation film of a semiconductor device is disclosed which includes forming trenches in a semiconductor substrate, forming a first HDP oxide film in the formed trenches,...
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7141483 |
Nitrous oxide anneal of TEOS/ozone CVD for improved gapfill
A method of filling a gap defined by adjacent raised features on a substrate includes providing a flow of a silicon-containing processing gas to a chamber housing the substrate and providing a flow...
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7141485 |
Shallow trench isolation structure with low sidewall capacitance for high speed integrated circuits
A method for reducing sidewall capacitance by 25% or more in an STI structure is described. A conformal barrier layer is deposited on sloped sidewalls in a shallow trench within a substrate. The...
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7078312 |
Method for controlling etch process repeatability
Plasma etch processes incorporating etch chemistries which include hydrogen. In particular, high density plasma chemical vapor deposition-etch-deposition processes incorporating etch chemistries...
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7071076 |
Method of manufacturing semiconductor device
A semiconductor device has an STI oxide film ( 106 ), of which surface is positioned higher than the surface of the silicon substrate ( 100 ) to prevent a pointed portion and a thin film thickness...
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7064045 |
Laser based method and device for forming spacer structures for packaging optical reflection devices
A method for forming a patterned silicon bearing material, e.g., silicon substrate. The method includes providing a silicon substrate, which has a surface region and a backside region. The method...
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7045435 |
Shallow trench isolation method for a semiconductor wafer
The present invention relates to a shallow trench isolation method of a semiconductor wafer which fills dielectric material into shallow trenches between components on the surface of the...
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7013562 |
Method of using micro-contact imprinted features for formation of electrical interconnects for substrates
An imprinting stamp to imprint an opening in a material layer in which the imprint stamp has a coating of a seed material. The seed material is transferred onto the surface within the opening to...
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6997985 |
Semiconductor, semiconductor device, and method for fabricating the same
Method of fabricating semiconductor devices such as thin-film transistors by annealing a substantially amorphous silicon film at a temperature either lower than normal crystallization temperature...
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6933187 |
Method for forming narrow trench structures
A method for forming narrow trench structures. A substrate covered by a layer to be defined is provided. A plurality of oxidable first masking islands is formed on the layer to be defined....
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6897121 |
Method of removing HDP oxide deposition
A method of removing HDP oxide deposition comprises the steps of: (1) etching the HDP oxide deposition by in-side-out model, wherein the etching rate in the center of the substrate is faster than...
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6890832 |
Radiation hardening method for shallow trench isolation in CMOS
A radiation-hardened STI process includes implanting a partially formed wafer with a fairly large dose (10 13 to 10 17 ions/cm 2 ) of a large atom group III element, such as B, Al, Ga or In at an...
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6828209 |
Methods for manufacturing a semiconductor device including a trench isolation region
Embodiments include semiconductor devices and a methods for manufacturing the same that suppress deficiencies in the transistor characteristics. A method for manufacturing a semiconductor device...
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6797588 |
Method for manufacturing a semiconductor device having a trench and a thick insulation film at the trench opening
A surface of a semiconductor substrate is selectively etched to form a first opening, which serves as the opening of a trench. A USG film is deposited on the first opening. A second opening, the...
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6768130 |
Integration of semiconductor on implanted insulator
A method of forming a semiconductor on insulator structure in a monolithic semiconducting substrate with a bulk semiconductor structure. A first portion of a surface of the monolithic...
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6723618 |
Methods of forming field isolation structures
Field isolation structures and methods of forming field isolation structures are described. In one implementation, the method includes etching a trench within a monocrystalline silicon substrate....
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6720233 |
Process for producing trench insulation in a substrate
In a method of producing a trench insulation in a silicon substrate a first silicon-oxide layer is deposited on a front surface of a sequence of layers including the silicon substrate. Then the...
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6699773 |
Shallow trench isolation type semiconductor device and method of forming the same
A method of forming a shallow trench isolation type semiconductor device comprises forming an etch protecting layer pattern to define at least one active region on a substrate, forming at least one...
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6682988 |
Growth of photoresist layer in photolithographic process
A method of fabricating a feature of an integrated circuit in a layer of material includes providing a layer of photoresist having a first thickness over the layer of material; forming apertures in...
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6677223 |
Transistor with highly uniform threshold voltage
Embodiments of the present invention relate to processes utilized in the manufacturing of a semiconductor device having transistors to achieve high uniformity of threshold voltages. The invention...
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6649489 |
Poly etching solution to improve silicon trench for low STI profile
A method of etch polysilicon adjacent to a recessed STI structure feature is described. A substrate is provided with a dielectric layer thereon and a polysilicon layer on the dielectric layer. A...
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6642124 |
Semiconductor device and manufacturing method thereof
The present invention provides a semiconductor device that reduces the junction leak current and achieves an improvement in the reliability of the gate oxide film by minimizing divot formation and...
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6613611 |
ASIC routing architecture with variable number of custom masks
A customizable ASIC routing architecture is provided. The architecture utilizes the uppermost metal layers of an ASIC composed of an array of function blocks for routing among function blocks while...
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6613639 |
Forming a semiconductor on implanted insulator
A method of forming a semiconductor on insulator structure in a monolithic semiconducting substrate with a bulk semiconductor structure. A first portion of a surface of the monolithic...
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6610580 |
Flash memory array and a method and system of fabrication thereof
In a first aspect of the present invention, a flash memory array is disclosed. The flash memory array comprises a substrate comprising active regions, wherein the active regions are defined by a...
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6593165 |
Circuit-incorporating light receiving device and method of fabricating the same
A circuit-incorporating light receiving device includes an integrated circuit and a photodiode. The integrated circuit and the photodiode are provided on a single semiconductor substrate. The...
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6544839 |
Semiconductor integrated circuit device and a method of manufacturing the same
A semiconductor integrated circuit device and a method of manufacturing the same. The surface of a substrate of an active region surrounded by an element isolation trench is horizontally flat in...
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6514834 |
Method of manufacturing a semiconductor device having a low leakage current
A field oxide film is provided in the surface of a semiconductor substrate. An interlayer insulating film is provided on the semiconductor substrate so as to cover an active layer. A contact hole...
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6492229 |
Semiconductor device having reduced field oxide recess and method of fabrication
A semiconductor device having reduced field oxide recess and method of fabrication is disclosed. The method of fabricating the semiconductor device begins by performing an HF dip process on a...
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6482715 |
Method of forming shallow trench isolation layer in semiconductor device
A method of forming a shallow trench isolation layer in a semiconductor device is provided, wherein a first trench and a second trench are formed in an area selected from a semiconductor substrate...
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6479368 |
Method of manufacturing a semiconductor device having a shallow trench isolating region
A method of manufacturing a semiconductor device, in which the depth of a divot in a shallow trench isolation can be decreased. The method comprises forming a trench in a semiconductor substrate,...
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6440818 |
Method of reducing leakage current of a semiconductor wafer
A semiconductor wafer includes a silicon substrate, an active area positioned on the silicon substrate, and a field oxide layer positioned on the surface of the silicon substrate surrounding the...
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6436780 |
Semiconductor device
A number of npn and pnp bipolar transistors are formed in a single chip of silicon, so that some of the transistors have a greater frequency response than others The higher frequency transistors...
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6429077 |
Method of forming a lateral diffused metal-oxide semiconductor transistor
The present invention provides a method of forming a lateral diffused metal-oxide semiconductor (LD MOS) transistor on a semiconductor wafer. An ion implantation process is performed on a...
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6420241 |
Method for forming an isolation region in a semiconductor device and resulting structure using a two step oxidation process
A method for forming an element isolation film of a semiconductor device and the semiconductor device. A pad insulator is constructed on a semiconductor substrate. An over-etching process is...
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6331470 |
Process for manufacturing a semiconductor material wafer having power regions dielectrically insulated from circuitry regions
A manufacturing process is carried out starting from an SOI type wafer including a top silicon layer and a bottom silicon layer separated from each other by a buried silicon dioxide layer. In the...
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6331456 |
Fipos method of forming SOI CMOS structure
The present invention discloses a method to form CMOS transistors for high speed and lower power applications. A high energy and low dose phosphorous is implanted in a silicon substrate to...
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6284626 |
Angled nitrogen ion implantation for minimizing mechanical stress on side walls of an isolation trench
With the present invention, a filled isolation trench is fabricated as part of an integrated circuit on a semiconductor wafer using nitrogen implantation into at least one side wall of the...
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6277675 |
Method of fabricating high voltage MOS device
A method for fabricating a high voltage MOS device. A substrate has a first P-type well region and a N-type well region formed thereon. A field oxide is then formed on the N-well region and...
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