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7625799 |
Method of forming a shielded gate field effect transistor
A semiconductor region with an epitaxial layer extending over the semiconductor region is provided. A first silicon etch is performed to form an upper trench portion extending into and terminating...
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7622351 |
Method of manufacturing semiconductor device and semiconductor device
A method of manufacturing a semiconductor device, includes: forming a first and a second trench regions adjacent from each other in a first conductivity type semiconductor base; forming a second...
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7622350 |
Method of manufacturing semiconductor device having cell transistor with recess channel structure
A method of manufacturing a semiconductor device is provided. Device separation portions defining first, second and third regions are formed in a substrate. A recess is formed at the first region....
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7615452 |
Method of fabrication of normally-off field-effect semiconductor device
A normally-off HEMT is made by first providing a substrate having its surface partly covered with an antigrowth mask. Gallium nitride is grown by epitaxy on the masked surface of the substrate to...
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7615451 |
Method for forming semiconductor device
A method for forming a semiconductor device is provided. More specifically, a method for forming a bulb-shaped portion of a bulb-shaped recess gate is provided to overcome an etching process margin...
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7615449 |
Semiconductor device having a recess channel transistor
The semiconductor device having a recess channel transistor includes a device isolation structure formed in a semiconductor substrate to define an active region having a recess region at a lower...
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7611947 |
Method of manufacturing semiconductor device
A method of manufacturing a semiconductor device of the present invention consists of forming a trench in a trench-type cell transistor region; forming a gate insulating film and a gate material...
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7608878 |
Semiconductor device manufactured with a double shallow trench isolation process
A method for manufacturing a semiconductor device includes forming a device isolation film by a double Shallow Trench Isolation (STI) process, forming a first active region having a negative slope...
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7608876 |
Merged MOS-bipolar capacitor memory cell
A high density vertical merged MOS-bipolar-capacitor gain cell is realized for DRAM operation. The gain cell includes a vertical MOS transistor having a source region, a drain region, and a...
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7608511 |
Fabrication method of trenched power MOSFET with low gate impedance
A fabrication method of a trenched power MOSFET with low gate impedance is provided. The fabrication method comprising the steps of: forming a plurality of trenches in an epitaxial layer; forming a...
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7608508 |
Method for manufacturing semiconductor device
A method for manufacturing a semiconductor device includes forming a recess with a device separating film and a first hard mask layer so that a pad nitride film for defining a recess gate region...
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7601592 |
Method for forming multi-gate non-volatile memory devices using a damascene process
According to a nonvolatile memory device having a multi gate structure and a method for forming the same of the present invention, a gate electrode is formed using a damascene process. Therefore, a...
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7598586 |
Semiconductor device and production method therefor
A semiconductor device, including: a semiconductor substrate of a first conductivity; and a semiconductor layer provided on the semiconductor substrate and having a super junction structure...
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7598563 |
Memory device and method for manufacturing the same
A split gate (flash) EEPROM cell and a method for manufacturing the same is disclosed, in which a control gate and a floating gate are formed in a vertical structure, to minimize a size of the...
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7598562 |
Semiconductor device and method of manufacturing the same
A semiconductor device including a semiconductor substrate; an element isolation region having a trench filled with an insulating film defined on the semiconductor substrate; a memory cell...
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7595238 |
Trench MOS type silicon carbide semiconductor device and method for manufacturing the same
A trench MOS type SiC semiconductor device includes a first conductivity semiconductor substrate, a first conductivity drift layer on the substrate, a second conductivity base layer on the drift...
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7592233 |
Method for forming a memory device with a recessed gate
A method for forming a memory device with a recessed gate is disclosed. A substrate with a pad layer thereon is provided. The pad layer and the substrate are patterned to form at least two...
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7592224 |
Method of fabricating a storage device including decontinuous storage elements within and between trenches
A semiconductor storage cell includes a first source/drain region underlying a first trench defined in a semiconductor layer. A second source/drain region underlies a second trench in the...
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7592222 |
Method of fabricating flash memory device
The present invention relates to a method of fabricating a flash memory device. According to a method of fabricating a flash memory device in accordance with an aspect of the present invention, a...
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7588984 |
Method to define a transistor gate of a DRAM and the transistor gate using same
A method to determine the predetermined location of a transistor gate of a dynamic random access memory (DRAM). A trench capacitor is respectively provided in a silicon substrate at the two sides...
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7588977 |
Method of fabricating a MOS field effect transistor having plurality of channels
A method of fabricating a MOSFET provides a plurality of nanowire-shaped channels in a self-aligned manner. According to the method, a first material layer and a semiconductor layer are...
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7585755 |
Method of fabricating non-volatile memory device
A method of fabricating a non-volatile memory device according to example embodiments may include forming a semiconductor layer on a substrate. A plurality of lower charge storing layers may be...
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7585727 |
Method for fabricating semiconductor device having bulb-shaped recess gate
A method for fabricating a semiconductor device includes etching a portion of a substrate to form a recess. A polymer layer fills a lower portion of the recess. Sidewall spacers are formed over the...
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7582532 |
Method for fabricating semiconductor device
A method for fabricating a semiconductor device includes etching a predetermined portion of a substrate to form a first recess having a bottom middle portion roundly projected and bottom edge...
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7582530 |
Managing floating gate-to-floating gate spacing to support scalability
Formation techniques are utilized to increase the space or distance between floating gates of a memory array of floating gate transistors. In at least some embodiments, floating gates are first...
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7579649 |
Trench field effect transistor and method of making it
Consistent with an example embodiment, a trench FET has source regions arranged above insulated gates in trenches. A body region of opposite conductivity type is arranged between the trenches and a...
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7579241 |
Semiconductor device and method of manufacture thereof
A semiconductor device comprises a semiconductor substrate, an electrically rewritable semiconductor memory cell provided on the semiconductor substrate, the memory cell comprising an island...
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7579240 |
Method of making vertical transistor with horizontal gate layers
Vertical body transistors with adjacent horizontal gate layers are used to form a memory array in a high density flash electrically erasable and programmable read only memory (EEPROM) or a logic...
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7579237 |
Nonvolatile memory device and method of manufacturing the same
A method of manufacturing a nonvolatile memory device includes forming a plurality of device isolation regions in a semiconductor substrate, forming a tunneling insulation layer on the...
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7575989 |
Method of manufacturing a transistor of a semiconductor device
A method of manufacturing a transistor in which gate resistance is lowered and short channel effects are controlled by forming a trench-type gate. The threshold voltage can also be more tightly...
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7575974 |
Method for fabricating semiconductor device including recess gate
A method for fabricating a semiconductor device includes forming a hard mask pattern over a substrate having a field oxide layer, etching the substrate to form a recess by using the hard mask...
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7575973 |
Method of making three dimensional NAND memory
A method of making a monolithic, three dimensional NAND string including a first memory cell located over a second memory cell, includes growing a semiconductor active region of second memory cell,...
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7572701 |
Recessed gate for a CMOS image sensor
A novel CMOS image sensor cell structure and method of manufacture. The imaging sensor comprises a substrate having an upper surface, a gate comprising a dielectric layer formed on the substrate...
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7572699 |
Process of forming an electronic device including fins and discontinuous storage elements
An electronic device can include a substrate including a fin lying between a first trench and a second trench, wherein the fin is no more than approximately 90 nm wide. The electronic device can...
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7563686 |
Method for forming a memory device with a recessed gate
A method for forming a memory device with a recessed gate is disclosed. A substrate with a pad layer thereon is provided. The pad layer and the substrate are patterned to form at least two...
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7563677 |
Recessed gate electrode and method of forming the same and semiconductor device having the recessed gate electrode and method of manufacturing the same
A recessed gate electrode structure includes a first recess and a second recess in communication with the first recess both formed in a substrate. The second recess is larger than the first recess....
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7560723 |
Enhanced memory density resistance variable memory cells, arrays, devices and systems including the same, and methods of fabrication
A resistance variable memory cell and method of forming the same. The memory cell includes a first electrode and at least one layer of resistance variable material in contact with the first...
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7560340 |
Method of manufacturing flash memory device
A method of manufacturing flash memory devices increases a coupling ratio by increasing the height of a floating gate externally projecting from an isolation layer. A portion of the isolation layer...
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7560335 |
Memory device transistors
Method and device embodiments are described for fabricating MOSFET transistors in a semiconductor also containing non-volatile floating gate transistors. MOSFET transistor gate dielectric smiling,...
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7557002 |
Methods of forming transistor devices
Some embodiments include formation of at least one cavity in a first semiconductor material, followed by epitaxially growing a second semiconductor material over the first semiconductor material...
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7556992 |
Method for forming vertical structures in a semiconductor device
A method is provided for making a semiconductor device, comprising (a) providing a semiconductor stack comprising a first semiconductor layer ( 407 ) having a <110> crystallographic...
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7553717 |
Recess etch for epitaxial SiGe
A PMOS transistor and a method for fabricating a PMOS transistor. The method may include providing a semiconductor wafer having a PMOS transistor gate stack, source/drain extension regions, and...
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7550800 |
Method and apparatus transporting charges in semiconductor device and semiconductor memory device
A conductor-filter system, a conductor-insulator system, and a charge-injection system are provided. The conductor-filter system provides band-pass filtering function, charge-filtering function,...
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7547604 |
Method of forming a recessed gate structure on a substrate having insulating columns and removing said insulating columns after forming a conductive region of the gate structure
Self-aligned recessed gate structures and method of formation are disclosed. Field oxide areas for isolation are first formed in a semiconductor substrate. A plurality of columns are defined in an...
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7547603 |
Non-planar non-volatile memory cell with an erase gate, an array therefor, and a method of making same
A memory cell has a trench formed into a surface of a semiconductor substrate, and spaced apart source and drain regions with a channel region formed therebetween. The source region is formed...
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7547601 |
Low power electrically alterable nonvolatile memory cells and arrays
A method of providing a memory cell includes providing a body of a semiconductor material having a first conductivity type, arranging a filter of a conductor-filter system in contact with a first...
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7547600 |
Five channel fin transistor and method for fabricating the same
A semiconductor device comprises a substrate defining a recessed active region and a fin active region connected to the recessed active region and extending above the recessed active region. The...
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7544991 |
Non-volatile memory device and methods of manufacturing and operating the same
A non-volatile memory device and methods of manufacturing and operating the same are provided. In a method of manufacturing a non-volatile memory device, a substrate having a stepped portion that...
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7544989 |
High density stepped, non-planar flash memory
A first plurality of memory cells is in a first plane in a first column of the array. A second plurality of memory cells is in a second plane in the same column. The second plurality of memory...
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7544568 |
Semiconductor device and method of manufacturing the same
A gate trench 13 is formed in a semiconductor substrate 10 . The gate trench 13 is provided with a gate electrode 16 formed over a gate insulating film 14 . A portion of the gate electrode ...
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