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7413947 |
Integrated high voltage capacitor having a top-level dielectric layer and a method of manufacture therefor
The present invention provides an integrated high voltage capacitor, a method of manufacture therefore, and an integrated circuit chip including the same. The integrated high voltage capacitor,...
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7410872 |
Sealing method for electronic devices formed on a common semiconductor substrate and corresponding circuit structure
A method for sealing electronic devices formed on a semiconductor substrate includes forming a plurality of first electronic devices adjacent a first portion of the semiconductor substrate, with...
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7410870 |
Methods of forming non-volatile memory devices and devices formed thereby
Methods of forming non-volatile memory devices include steps to define features that enhance shielding of electronic interference between adjacent floating gate electrodes and improve leakage...
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7407856 |
Method of manufacturing a memory device
A method of manufacturing a memory device includes defining a field region and an active region in a substrate, forming a field oxide layer on the field region, forming an insulating layer on the...
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7405123 |
Electrically erasable programmable read-only memory cell and memory device and manufacturing method thereof
A manufacturing method and a device of an EEPROM cell are provided. The method includes the following steps. First, a tunnel layer and an inter-gate dielectric layer are formed over a surface of a...
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7402493 |
Method for forming non-volatile memory devices
According to a nonvolatile memory device having a multi gate structure and a method for forming the same of the present invention, a gate electrode is formed using a damascene process. Therefore, a...
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7402492 |
Method of manufacturing a memory device having improved erasing characteristics
In a method of manufacturing a memory device having improved erasing characteristics, the method includes sequentially forming a tunneling oxide layer, a charge storing layer, and a blocking oxide...
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7396723 |
Method of manufacturing EEPROM device
A method of manufacturing an EEPROM device can reduce the cell area. The method of manufacturing an Electrically Erasable Programmable Read-Only Memory (EEPROM) includes forming a mask pattern over...
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7393748 |
Method of fabricating a semiconductor memory device
A NAND cell unit is formed with an advanced gate forming process on a semiconductor layer of a first conductivity type, which is formed on a semiconductor substrate of the first conductivity type...
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7393747 |
Nonvolatile semiconductor memory and a fabrication method thereof
A nonvolatile semiconductor memory includes a plurality of memory cell transistors, having floating gates, control gates, and inter-gate insulating films each arranged between corresponding...
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7393744 |
Method of manufacturing dielectric film of flash memory device
A method of manufacturing a dielectric film of a flash memory device, including the steps of providing a semiconductor substrate having floating gates formed therein, performing an oxidization...
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7393737 |
Semiconductor device and a method of manufacturing the same
A semiconductor device which, in spite of the existence of a dummy active region, eliminates the need for a larger chip area and improves the surface flatness of the semiconductor substrate. In the...
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7387934 |
Nonvolatile semiconductor memory and manufacturing method for the same
The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of...
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7384846 |
Method of fabricating semiconductor device
A method of fabricating semiconductor devices. Upon formation of a trench for isolation in a cell region, a hard mask film is used as an etch mask. It is thus possible to prevent attacks of a lower...
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7384845 |
Methods of fabricating flash memory devices including word lines with parallel sidewalls
Methods of fabricating integrated circuit devices are provided. The method includes forming a buried diffusion layer in a source active region. A word line pattern is formed crossing over parallel...
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7381616 |
Method of making three dimensional, 2R memory having a 4F2 cell size RRAM
A method of fabricating a multi-level 3D memory array includes: preparing a wafer and peripheral circuits thereon; layers of metal, memory resistor material, and metal are deposited, patterned and...
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7381615 |
Methods for self-aligned trench filling with grown dielectric for high coupling ratio in semiconductor devices
Methods for self-aligned trench filling to isolate active regions in high-density integrated circuits are provided. A deep, narrow trench is etched into a substrate between active regions. The...
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7378315 |
Method for fabricating semiconductor device
A method for fabricating a semiconductor device for a system on chip (SOC) for embodying a transistor for a logic device, an electrical erasable programmable read only memory (EEPROM) cell and a...
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7375018 |
Method of manufacturing semiconductor device
Etching is performed on an insulating layer 23 and a conductive layer 32 with a photoresist 41 as the mask, to form an opening 51 in the conductive layer 32 . After removing the...
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7374980 |
Field effect transistor with thin gate electrode and method of fabricating same
A field effect transistor and a method of fabricating the field effect transistor. The field effect transistor includes: a silicon body, a perimeter of the silicon body abutting a dielectric...
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7371645 |
Method of manufacturing a field effect transistor device with recessed channel and corner gate device
Fabrication of recessed channel array transistors (RCAT) with a corner gate device includes forming pockets between a semiconductor fin that includes a gate groove and neighboring shallow trench...
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7371631 |
Method of manufacturing a nonvolatile semiconductor memory device, and a nonvolatile semiconductor memory device
For enhancing the high performance of a non-volatile semiconductor memory device having an MONOS type transistor, a non-volatile semiconductor memory device is provided with MONOS type transistors...
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7368347 |
Dual bit flash memory devices and methods for fabricating the same
Methods for fabricating dual bit flash memory devices are provided. Method steps include forming a charge trapping layer overlying a substrate and fabricating two insulating members overlying the...
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7364969 |
Semiconductor fabrication process for integrating formation of embedded nonvolatile storage device with formation of multiple transistor device types
A semiconductor fabrication process includes forming polysilicon nanocrystals on a tunnel oxide overlying a first region of a substrate. A second dielectric is deposited overlying the first region...
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7361564 |
Method of manufacturing high-voltage device
A method of manufacturing a high-voltage device DDD (Double Doped Drain) ion implantation process is performed at a tilt angle in order to form a smooth junction profile. Accordingly, the intensity...
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7361551 |
Method for making an integrated circuit having an embedded non-volatile memory
A method for forming a portion of a semiconductor device includes: patterning gate stack layers overlying a substrate into a gate stack; implanting dopant ions to form shallow source/drain...
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7361545 |
Field effect transistor with buried gate pattern
A field effect transistor includes a buried gate pattern that is electrically isolated by being surrounded by a tunneling insulating film. The field effect transistor also includes a channel region...
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7361543 |
Method of forming a nanocluster charge storage device
An integrated circuit and method of forming an integrated circuit having a memory portion minimizes an amount of oxidation of nanocluster storage elements in the memory portion. A first region of...
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7354824 |
Fabrication method of non-volatile memory
A method for fabricating a non-volatile memory is provided. A dielectric layer, a first conductive layer, and a mask layer are formed sequentially on a substrate and then patterned to form a number...
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7352035 |
Flash memory devices and methods for fabricating flash memory devices
A flash memory device includes a cell string having a plurality of cell transistors connected in series, and a string selection transistor and a ground selection transistor connected to both ends...
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7348282 |
Forming method of gate insulating layer and nitrogen density measuring method thereof
A method of forming a gate insulating layer and nitrogen density measuring method thereof, by which a transistor having enhanced electric characteristics can be fabricated without employing...
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7341914 |
Method for forming a non-volatile memory and a peripheral device on a semiconductor substrate
A method for forming a semiconductor device includes forming a first gate electrode over a semiconductor substrate, wherein the first gate electrode comprises silicon and forming a second gate...
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7339226 |
Dual-level stacked flash memory cell with a MOSFET storage transistor
The present invention is a dual-level flash memory cell design that stores 3 or more bits of information per transistor. The dual-level memory cell stores two lower bits in a first level and stores...
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7338860 |
Methods of forming non-volatile memory device having floating gate
Embodiments of the present invention are directed to methods for forming non-volatile memory devices. A substrate is provided that has a cell region, a first peripheral region, and second...
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7338856 |
Double-doped polysilicon floating gate
The present invention provides a method and apparatus for forming a double-doped polysilicon floating gate in a semiconductor memory element. The method includes forming a first dielectric layer on...
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7335558 |
Method of manufacturing NAND flash memory device
A method of manufacturing a NAND flash memory device, including the steps of providing a semiconductor substrate in which a cell region and a select transistor region are defined; simultaneously...
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7332408 |
Isolation trenches for memory devices
Methods and apparatus are provided. A first dielectric plug is formed in a portion of a trench that extends into a substrate of a memory device so that an upper surface of the first dielectric plug...
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7326616 |
Semiconductor integrated circuit device and a method of manufacturing the same
Manufacturing technique for an IC device which includes forming the first conductor film over a memory cell forming region and over a peripheral circuit forming region of a semiconductor substrate,...
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7326615 |
Method for manufacturing electronic non-volatile memory devices integrated in a semiconductor substrate
A method manufactures a non-volatile memory device on a semiconductor substrate that includes a matrix of memory cells and associated circuitry. The method includes: forming a filling dielectric...
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7319058 |
Fabrication method of a non-volatile memory
A fabrication method for a non-volatile memory is provided. To fabricate the non-volatile memory, a plurality of first trenches and second trenches are formed in a substrate, wherein the second...
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7314797 |
Semiconductor device and its manufacturing method
A semiconductor device is capable of being applied with both a positive and a negative voltage to its control gate, and writing to its memory requires a low voltage. A control gate is formed on a...
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7306990 |
Information storage element, manufacturing method thereof, and memory array
An information memory device capable of reading and writing of information by mechanical operation of a floating gate layer, in which a gate insulation film has a cavity ( 6 ), and a floating gate...
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7303950 |
Semiconductor device, method of manufacturing same and method of designing same
A partial oxide film ( 31 ) with well regions formed therebeneath isolates transistor formation regions in an SOI layer ( 3 ) from each other. A p-type well region ( 11 ) is formed beneath part of...
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7297599 |
Method of fabricating semiconductor device
A method of fabricating a semiconductor device includes forming on a semiconductor substrate a gate electrode with a gate insulating film being interposed between the substrate and the electrode,...
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7297594 |
Non-volatile semiconductor memory device and method of manufacturing the same
A non-volatile semiconductor memory device includes a semiconductor substrate, a memory cell array formed on the semiconductor substrate, and including a first gate insulator having a first...
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7294888 |
CMOS-compatible non-volatile memory cell with lateral inter-poly programming layer
An electrically erasable programmable read-only memory (“CMOS NON-VOLATILE MEMORY”) cell is fabricated using standard CMOS fabrication processes. First and second polysilicon gates are...
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7294548 |
Semiconductor device and fabricating method thereof
A method of fabricating a semiconductor device is described. A substrate having a memory cell region and a high voltage circuit region are provided. First and second source/drain regions are formed...
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7291546 |
Method and apparatus for reducing charge loss in a nonvolatile memory cell
A method of fabricating a non-volatile memory cell on a semiconductor substrate is disclosed. An area of a first region of the semiconductor substrate designated for a layer of floating polysilicon...
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7288456 |
Semiconductor device and method for fabricating the same
A semiconductor device includes: a lower hydrogen-barrier film; a capacitor formed on the lower hydrogen-barrier film and including a lower electrode, a capacitive insulating film, and an upper...
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7285464 |
Nonvolatile memory cell comprising a reduced height vertical diode
A nonvolatile memory cell according to the present invention comprises a bottom conductor, a semiconductor pillar, and a top conductor. The semiconductor pillar comprises a junction diode,...
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