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7622737 Test structures for electrically detecting back end of the line failures and methods of making and using the same  
Test structures for electrically detecting BEOL failures are provided. In an embodiment, the structure comprises: an input/output connection disposed above a primary conductive pad which is...
7622323 Method for increasing mobility of an organic thin film transistor by application of an electric field  
A method for fabricating an organic thin film transistor by application of an electric field. The method includes the steps of fabricating a common organic thin film transistor including a gate...
7622312 Method for evaluating dopant contamination of semiconductor wafer  
The present invention provides a method for evaluating dopant contamination of a semiconductor wafer, wherein a resistivity of a bulk portion of the semiconductor wafer is measured by an eddy...
7622052 Methods for chemical mechanical planarization and for detecting endpoint of a CMP operation  
Methods are provided for chemical mechanical planarization of a layer and for determining the endpoint of a CMP operation. In accordance with one embodiment the method for determining an endpoint...
7618833 Method for pre-treating epitaxial layer, method for evaluating epitaxial layer, and apparatus for evaluating epitaxial layer  
A method for pre-treating an epitaxial layer performed before evaluation of the epitaxial layer by making the epitaxial layer contact with a metal electrode by a capacitance-voltage measurement,...
7618832 Semiconductor substrate having reference semiconductor chip and method of assembling semiconductor chip using the same  
A semiconductor substrate having a reference semiconductor chip and a method of assembling semiconductor chips using the same are provided. According to the method, a semiconductor substrate having...
7615781 Semiconductor wafer and semiconductor device, and method for manufacturing same  
There is a room for improvement in conventional semiconductor devices in terms of reducing the chip area. A semiconductor device 1 comprises an evaluation transistor 10 (first characteristic...
7609070 Manufacturing method and controlling method of electronic device  
A manufacturing method of an electronic device includes applying a direct voltage having a first polarity to a capacitor that has an insulating layer including nitrogen and silicon as a capacitor...
7608469 Method of fabricating a chip  
A method of fabricating a chip may include the step of providing a first electrical part. The method may also include the step of forming a shell with the first electrical part embedded in a first...
7605597 Intra-chip power and test signal generation for use with test structures on wafers  
The fabrication of the wafer may be analyzed starting from when the wafer is in a partially fabricated state. The value of a specified performance parameter may be determined at a plurality of...
7601619 Method and apparatus for plasma processing  
A method and an apparatus for plasma processing which can accurately monitor an ion current applied to the surface of a sample. Predetermined gas is exhausted via an exhaust port by a...
7601559 Apparatus and method for identifying proper orientation and electrical conductivity between a semiconductor device and a socket or contactor  
A semiconductor device with a semiconductor die thereon and a contactor board are electrically coupled when the electrically conductive elements on the semiconductor device and the contactor board...
7598100 Manufacturing method of semiconductor integrated circuit device  
As the thickness of the card holder for preventing warping of a multilayered wiring substrate 1 is increased, there occurs a problem that a thin film sheet 2 is buried in a card holder and...
7598099 Method of controlling a fabrication process using an iso-dense bias  
Embodiments of controlling a fabrication process using an iso-dense bias are generally described herein. Other embodiments may be described and claimed.
7595649 Method to accurately estimate the source and drain resistance of a MOSFET  
Measurements of parameters of MOS transistors, also known as MOSFETs, such as threshold potentials, require accurate estimates of source and drain series resistance. In cases where connections to...
7595557 Semiconductor device and manufacturing method thereof  
A metal wire for inspection and an electrode for inspection are formed on a region of a semiconductor substrate where a metal wire and an electrode for external connection are not formed. The metal...
7592828 Method and device of measuring interface trap density in semiconductor device  
A method is provided for measuring interface trap density in a semiconductor device. In the method, measurement parameters are input to a host computer. A pulse condition is set at a pulse...
7587298 Diagnostic method for root-cause analysis of FET performance variation  
A diagnostic method of and computer system for root-cause analysis of performance variations of FETs in integrated circuits and a method and computer system for monitoring a field effect transistor...
7586322 Test structure and method for measuring mismatch and well proximity effects  
The present invention is directed to a test structure and method to determine the effects of the well proximity effect on the gate threshold voltage of FETs at different distances from the edge of...
7573278 Semiconductor device  
A semiconductor device comprises IC chips, each having semiconductor elements and pad regions, formed on a substrate, and conductor patterns for detecting displacement of a probe needle during a...
7572650 Suppression of localized metal precipitate formation and corresponding metallization depletion in semiconductor processing  
A method and structure for suppressing localized metal precipitate formation (LMPF) in semiconductor processing. For each metal wire that is exposed to the manufacturing environment and is...
7571732 Ignition control of remote plasma unit  
A method of maintaining a remote plasma unit for cleaning a semiconductor-processing apparatus includes: (i) detecting if the semiconductor-processing apparatus is in an idle state; (ii) if the...
7566575 Mounting circuit and method for producing semiconductor-chip-mounting circuit  
A method according to the present invention for producing a semiconductor-chip-mounting circuit 1 includes mainly three steps. In a first step, contacts 2 each in the form of a conical helix...
7556973 Manufacturing method for semiconductor device  
A Manufacturing method for a semiconductor device is provided and includes examining a semiconductor element on a semiconductor wafer, by an on-wafer test, storing on-semiconductor-wafer coordinate...
7556971 Testing electromigration at multiple points of a single node  
Systems and methods for testing the reliability of a semiconductor component are disclosed herein. One embodiment of a method for testing reliability, among others, comprises providing simulation...
7544522 Fabrication method of semiconductor integrated circuit device  
To prevent breakage of a membrane probe during a probe test using a probe card having the membrane probe, appearance of a main surface of a wafer as a test object is tested by an appearance tester ...
7541203 Conductive adhesive for thinned silicon wafers with through silicon vias  
The present invention relates to a process for preparing a thinned silicon wafer for electrical testing, the thinned silicon wafer comprising at least one circuit design and at least one...
7541202 Connection device and test system  
To achieve high speed exchange of electrical signals between a connection device and a tester, a support member is provided for supporting the connection device, a plurality of pointed contact...
7538873 Method for simulating the movement of particles  
A method for determining the movement of particles, particularly impurities, in a medium, under the influence of a changing interface between two neighboring phases. In a first step, the temporal...
7538443 Offset dependent resistor for measuring misalignment of stitched masks  
A system and method for identifying misalignments in an overlapping region of a stitched circuit in an integrated circuit fabrication process. The method comprises: creating a first circuit using a...
7537943 Method of manufacturing a semiconductor integrated circuit device  
A technique of manufacturing a semiconductor integrated circuit device is provided for reducing the possibility of attachment of foreign matter to a membrane probe when performing probe inspection...
7531136 Chemical sensor  
The application relates to a chemical sensor device comprising a substrate ( 1 ), a sensor medium ( 3 ) formed on the substrate, the sensor medium comprising one-dimensional nanoparticles, wherein...
7529634 Method, apparatus, and computer program of searching for clustering faults in semiconductor device manufacturing  
A method of searching for clustering faults is employed for semiconductor device manufacturing. The method enters data on faults present in a search target, calculates a frequency distribution of...
7526699 Method for creating a built-in self test (BIST) table for monitoring a monolayer deposition (MLD) system  
A method of monitoring a processing system in real-time using low-pressure based modeling techniques that include processing one or more of wafers in a processing chamber, calculating dynamic...
7525325 System and method for floating-substrate passive voltage contrast  
A passive voltage contrast (PVC) system and method are disclosed for analyzing ICs to locate defects and failure mechanisms. During analysis a device side of a semiconductor die containing the IC...
7524682 Method for monitoring temperature in thermal process  
A method for monitoring a temperature in a thermal process is described. A monitor substrate is provided and subject to ion implantation, and a characteristic parameter of the monitor substrate...
7521952 Test structure for electromigration analysis and related method  
A test structure for electromigration and related method are disclosed. The test structure may include an array of a plurality of multilink test sets, each multilink test set including a plurality...
7519885 Monitoring a monolayer deposition (MLD) system using a built-in self test (BIST) table  
A method of monitoring a processing system in real-time using low-pressure based modeling techniques that include processing one or more of wafers in a processing chamber; determining a measured...
7517706 Method for evaluating quality of semiconductor substrate and method for manufacturing semiconductor substrate  
Methods for evaluating a quality of a semiconductor substrate. In one aspect, etching a surface of the semiconductor substrate by dry-etching, detecting bright points on the surface of the etched...
7514278 Test-key for checking interconnect and corresponding checking method  
A test key for checking an interconnect structure is described, including a contiguous metal line and multiple conductive plugs on the contiguous metal line, wherein one end of each plug contacts...
7514276 Aligning stacked chips using resistance assistance  
The present invention relates to a method of aligning stacked chips wherein the apparatus and method utilize bumps in the form of exposed metal lines on a first chip. The present invention further...
7511507 Integrated circuit and circuit board  
An integrated circuit has an analog output circuit for outputting an analog signal and a leadless terminal for connecting an output line of the analog output circuit to a circuit board by...
7511375 Semiconductor device carrier unit and semiconductor socket provided therewith  
In a pressing cap forming part of a semiconductor device carrier unit, a pressing portion of a pressure body has recesses, to each of which a bump is inserted.
7510895 Inferential temperature control system  
A system manages the temperature of thermoplastic material by initiating a default heating cycle in response to a sensor failure. The system may thus continue to heat the thermoplastic material...
7504270 Methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same  
The present invention is directed to methods of quantifying variations resulting from manufacturing-induced corner rounding of various features, and structures for testing same. In one illustrative...
7501847 Increased yield manufacturing for integrated circuits  
A system and method for providing increased manufacturing yield for integrated circuits. Various aspects of the invention may comprise receiving an integrated circuit designed to operate at nominal...
7500208 Non-destructive evaluation of microstructure and interface roughness of electrically conducting lines in semiconductor integrated circuits in deep sub-micron regime  
Novel structures and methods for evaluating lines in semiconductor integrated circuits. A first plurality of lines are formed on a wafer each of which includes multiple line sections. All the line...
7498604 Deposition stop time detection apparatus and methods for fabricating copper using the same  
A method for fabricating copper wiring of a semiconductor device comprises forming a deposition stop time detection pattern having two trench structures positioned with a predetermined distance...
7498180 Method for manufacturing semiconductor device  
A burn-in input signal input to a burn-in circuit is delivered to an internal circuit through a selector. In response to a control signal from the burn-in circuit, the selector selects either the...
7494929 Automatic gain control  
Methods and apparatus for automatic gain control. A film on a substrate is polished by a chemical mechanical polisher that includes a polishing pad and an in-situ monitoring system. The polishing...