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6426177 Single component developer for use with ghost exposure  
A method for developing copolymer photosensitive resists wherein a single solvent is used in conjunction with a puddle develop tool. The copolymer resist is ZEP 7000 and the developer is ethyl...
6423456 Method for manufacture of electronic parts  
A composition used as a resist in the manufacture of electronic parts, for example printed circuits, and which is rendered soluble in a developer by patternwise delivery of heat, comprises a...
6420085 Resist compositions and patterning process  
A resist composition contains a base resin, a photoacid generator, and a solvent. The photoacid generator is a sulfonium salt of formula (1). R 1 is hydroxyl, nitro, or straight, branched or...
6420101 Method of reducing post-development defects in and around openings formed in photoresist by use of non-patterned exposure  
In the exposure and development of available deep ultraviolet (DUV) sensitive photoresist it has been observed that following the standard prior art methods of exposure and development results in a...
6420084 Mask-making using resist having SIO bond-containing polymer  
The invention provides improved resist compositions and lithographic methods using the resist compositions of the invention. The resist compositions of the invention are acid-catalyzed resists...
6416925 Positive working photosensitive composition  
A positive working photosensitive composition suitable for exposure using a light source of wavelengths of 250 nm or shorter, particularly 220 nm or shorter; comprising (A) a compound capable of...
6410209 Methods utilizing antireflective coating compositions with exposure under 200 nm  
The invention provides new light absorbing crosslinking compositions suitable for use as an antireflective composition (ARC), particularly suitable for short wavelength imaging applications such as...
6406827 Positive photoresist composition and process for forming resist pattern  
A positive photoresist composition includes (A) an alkali-soluble resin, (B) a quinonediazide ester of, e.g., bis[ 2,5 -dimethyl- 3 -( 2 -hydroxy- 5 -methylbenzyl)- 4 -hydroxyphenyl]methane and/or ...
6407865 Method for fabricating a lenticular plate  
An apparatus for fabricating a lenticular plate by irradiating with laser light a plate to which a photosensitive material is deposited. The apparatus for fabricating a lenticular plate comprises a...
6403288 Resist pattern formation method  
A method of forming a resist pattern from a chemically amplified positive radiation sensitive resin composition. The film thickness of an unexposed portion of a resist film formed from the...
6399258 Method for patterning thin films  
Patterned articles, such as RFID antenna, are made by subablation, a process comprising the steps of: A. providing a substrate having a coating, such as a metal or metal oxide, and an interface...
6399274 Resist composition and patterning process  
A resist composition contains as a base resin a polymer comprising recurring units of the formula (1-1) or (1-2) and having a Mw of 1,000-500,000. R 1 is H, methyl or CO 2 R 2 , R 2 is a...
6399273 Water-processable photoresist compositions  
Water-processable positive-tone photoresists comprising a water-soluble polymer, wherein the polymer contains a heat-labile functional group that renders the polymer insoluble in water or an...
6399267 Radiation sensitive resin composition and use of the same in an interlaminar insulating film  
A radiation sensitive resin composition which can be processed and molded at low temperatures and has resolution, solvent resistance, adhesion to a substrate and storage stability required as an...
6395446 Resist compositions and patterning process  
A chemical amplification type resist composition contains as a photoacid generator a sulfonyldiazomethane compound of the formula (1): wherein R 1 is C 1-10 alkyl or C 6-14 aryl, R 2 is C...
6395450 Positive working photoresist composition  
A positive working photoresist composition includes at least one thermally cross-linkable photoacid generator, a binder polymer, and a solvent in which the binder polymer and photoacid generator...
6395453 Photoresist compositions and patterning method  
There are disclosed a photoresist composition containing at least an α,β-unsaturated ketone compound, and a patterning method comprising a step of application of a photoresist composition...
6395451 Photoresist composition containing photo base generator with photo acid generator  
The present invention relates to a photoresist composition containing Photo Base Generator (PBG), more specifically, to a photoresist composition which comprises (a) photoresist resin, (b) photo...
6391518 Polymers and photoresist compositions using the same  
The present invention provides a photoresist monomer represented by the following formula 2; a photoresist copolymer represented by the following formula 100; and a photoresist composition...
6391514 Mixed solvent system for positive photoresists  
A photosensitive positive working composition suitable for use as a photoresist, which comprises an admixture of at least one film forming resin; at least one photosensitizer; and a photoresist...
6391520 Compounds for photoresist and resin composition for photoresist  
The photoresist resin composition comprises a polymer having an adamantane skeleton represented by the following formula and a photoactive acid precursor: wherein R 1 represents a hydrogen atom...
6391521 Resist compositions containing bulky anhydride additives  
Acid-catalyzed positive resist compositions which are imageable with 193 nm radiation and are developable to form resist structures of high resolution and high etch resistance are enabled by the...
6387598 Pattern forming material and pattern forming method  
A pattern forming material includes a binary copolymer represented by the following general formula or a ternary or higher copolymer obtained by further polymerizing the binary copolymer with...
6387578 Post-exposure heat treatment to reduce surface roughness of PMMA surfaces formed by radiation lithography  
A method to decrease the surface roughness of exposed PMMA surfaces has been discovered. PMMA surface roughness was decreased by a post-exposure heat treatment of less than 70° C. The optimum...
6379861 Polymers and photoresist compositions comprising same  
The present invention provides novel polymers and photoresist compositions that comprise the polymers as a resin binder component. The photoresist compositions of the invention can provide highly...
6376151 Positive resist composition  
A positive resist composition comprising a hydroxypolyamide represented by the following general formula (I) and a photoactive component: (wherein R 1 and R 3 may be the same or different and...
6372412 Method of producing an integrated circuit chip using frequency doubling hybrid photoresist and apparatus formed thereby  
A photoresist composition is disclosed having both negative tone and positive tone responses, giving rise to spaces being formed in the areas of diffraction which are exposed to intermediate...
6372413 Method for cleaning the surface of substrate to which residues of resist stick  
A TMAH developer is applied to a to-be-processed substrate that has an organic resist film formed thereon and having an LSI pattern created by exposure, thereby developing the resist pattern,...
6372414 Lift-off process for patterning fine metal lines  
The present invention relates to a process for providing a pattern on a substrate for use in a metal lift-off process, the process comprising: 1) coating a substrate with a liquid positive...
6372406 Deactivated aromatic amines as additives in acid-catalyzed resists  
Deactivated aromatic amines are useful to improve shelf life and performance of acid-catalyzed photoresist compositions without adverse interaction with radiation-sensitive acid generator...
6368775 3-D photo-patterning of refractive index structures in photosensitive thin film materials  
A method of making a three-dimensional refractive index structure in a photosensitive material using photo-patterning. The wavelengths at which a photosensitive material exhibits a change in...
6368770 Photoresist monomers, polymers thereof, and photoresist compositions containing the same  
The present invention provides a novel photoresist monomer, photoresist copolymer derived from the same, and the photoresist composition comprising the same. In particular, the present invention...
6365322 Photoresist composition for deep UV radiation  
The present invention relates to a novel photoresist composition sensitive in the deep ultraviolet region, where the photoresist performance is not adversely impacted by basic contaminants in the...
6361925 Photoinitiator mixtures and compositions with alkylphenylbisacylphosphine oxides  
Compounds of the formula I in which R 1 is C 1 -C 4 alkyl, R 2 is hydrogen, C 1 -C 4 alkyl or C 1 -C 4 alkoxy and R 3 , R 4 , R 5 , R 6 and R 7 independently of one another are hydrogen,...
6358675 Silicon-containing alcohols and polymers having silicon-containing tertiary ester groups made therefrom  
The polymers of the invention are characterized by having at least one pendent ester group having a tertiary carbon atom attached to the ester oxygen atom in which at least one substituent of the...
6352818 Photoresist development method employing multiple photoresist developer rinse  
A method for forming within a deep ultraviolet (DUV) sensitive photosensitive layer formed upon a substrate employed within a microelectronics fabrication a pattern with attenuated defects and...
6352814 Method of forming a desired pattern  
A method for producing a predetermined resist pattern on e.g. a lithographic printing plate, circuit board or mask, comprises the patternwise exposure to heat of a composition which comprises a...
6348299 RIE etch resistant nonchemically amplified resist composition and use thereof  
Photoresist compositions of improved reactive ion etching comprising polymers of 2-hydroxyalkyl methacrylate and/or 2-hydroxyalkylacrylate and a titanate, zirconate and/or hafnate are provided. The...
6340545 Photosensitive resin composition, method of forming patterns, photosensitive liquid for forming colored images, and color filter  
A photosensitive resin composition and a photosensitive liquid for forming colored images are produced from (1) a resin comprising molecules having carboxyl groups and (2) an arene compound, ...
6340556 Tailoring of linewidth through electron beam post exposure  
A process for decreasing the linewidth of photoresist images which are suitable for use in the production of microelectronic devices such as integrated circuits. A photosensitive composition is...
6340546 Positive photosensitive resin composition, method of forming relief pattern, and electronic part  
Positive photosensitive resin compositions, which comprise (A) a polyamidate having repetitive units of general formula (I) wherein R 1 is a tetravalent organic group, R 2 is a divalent...
6340552 Photosensitive composition containing a dissolution inhibitor and an acid releasing compound  
A photosensitive composition comprising: an acid-decomposable compound having at least one substituent which is decomposed by an acid, forming a product which reacts with alkali solution and forms...
6338931 Resist compositions and patterning process  
A chemical amplification type resist composition contains as a photoacid generator a sulfonyldiazomethane compound of the formula (1): wherein R 1 is C 1-10 alkyl or C 6-14 aryl, R 2 is C...
6338930 Positive photoresist layer and a method for using the same  
A method for preparing a positive photoresist layer is provided. In this method, a photoresist composition is drop-wise applied on an insulator layer or a conductive metal layer formed on a...
6335141 Chemically amplified positive resist composition, pattern forming method, and method for preparing polymer having a crosslinking group  
A chemically amplified positive resist composition contains (A) an organic solvent, (B) a base resin in the form of a polymer having at least one acid labile group and crosslinked within a molecule...
6334244 Method for producing ink-jet recording head  
In a method of making an ink jet recording head, oxide films are formed on both surfaces of a silicon substrate, followed by a first metal film, a piezoelectric film, and a second metal film. A...
6333133 Positive planographic printing material  
A positive planographic printing material which is capable of recording a digital data from a computer and the like, using a solid laser or a semiconductor laser emitting infrared rays. The...
6331378 Pattern forming method  
A substrate is coated with a chemically amplified negative resist, thereby forming a resist film on the substrate. The chemically amplified negative resist includes: a polymer containing an acrylic...
6329126 Developer solution for acitinic ray sensitive resist  
Disclosed is a novel aqueous developer solution used in the development treatment of an actinic ray-sensitive resist for the manufacture of, for example, semiconductor devices, which is capable of...
6329125 Chemically amplified resist compositions and process for the formation of resist patterns  
Alkali-developable, chemically amplified resist composition which comprises an alkali-insoluble compound having a structural unit containing a protected alkali-soluble group in which unit a...