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5786131 Process for use of photoresist composition with deep ultraviolet radiation  
The present invention relates to a process for generating a resist image on a substrate utilizing a resist composition comprising (a) a radiation-sensitive acid generator, (b) a substituted...
5783367 Process for production of semiconductor device and resist developing apparatus used therein  
In the production of semiconductor devices, a pattern-wise exposed resist coating is developed with a developer to form a resist pattern corresponding to the pattern of exposure radiation on an...
5783365 Manufacturing method of semiconductor device  
To present a manufacturing method of semiconductor device capable of preventing deactivation phenomenon of acid of chemically amplified resist when the foundation layer is a silicon nitride film,...
5780206 Fine pattern forming process using a resist composition sensitive to deep ultraviolet light  
A resist composition for deep ultraviolet light comprising (a) one of the following resin components (i)-(iii): (i) a resin which becomes alkali-soluble by eliminating protective groups by the...
5773191 Radiation-sensitive composition  
A radiation-sensitive composition is disclosed which includes: (a) a copolymer represented by the general formula: ##STR1## wherein R 1 is a hydrogen atom or a methyl group, R 2 is a...
5770350 Method for forming pattern using multilayer resist  
A method for forming a pattern using a multilayer resist including the steps of: coating a first lower resist layer on a substrate having a lower level region and an upper level region; selectively...
5759751 Method of peeling photo-resist layer without damage to metal wiring  
A semiconductor manufacturer peels a photo-resist mask off by using organic alkaline solvent, and the residual alkaline solvent is neutralized with acid before a rinse in pure water so as to...
5759748 Method for forming photoresist pattern  
A method for forming photoresist patterns, comprising the steps of: coating a chemically enhanced photoresist film on a lower layer; forming a silicon monomer layer on the chemically enhanced...
5756267 Developing solution for negative type photosensitive resin compositions  
A developing solution for negative type photo-sensitive resin compositions which comprises an aqueous solution containing 0.01 to 1.5% by weight of at least one compound selected from quaternary...
5756266 Process for manufacturing devices using maleimide containing resist polymers  
A lithographic process for fabricating a device is disclosed. An area of radiation sensitive material is formed on a substrate. The radiation sensitive material contains a polymeric component The...
5753403 Diazo based imaging element containing hydrolysed polyvinyl alcohol and metal-free phthalocyanine  
The present invention provides an imaging element comprising on a hydrophilic base a light-sensitive layer containing polyvinyl alcohol hydrolyzed to at least an extent of 95% by weight, a cationic...
5753421 Stock developer solutions for photoresists and developer solutions prepared by dilution thereof  
Stock developer solutions for photoresists contain an organic base free from metal ions and at least one compound having a specified weight average molecular weight that is selected from among...
5753404 Photosensitive recording material containing negative working diazonium salt layer and discontinuous top layer  
A photosensitive recording material is described which has a layer base, a negative-working photosensitive layer containing a diazonium salt and a water-insoluble polymeric binder which is soluble...
5753415 Apparatus for piece-by-piece development corresponding to large scale substrates  
A piece-by-piece, passing type development apparatus corresponding to large scale substrates comprises a pipe for ejecting a developing solution and means for applying the developing solution...
5744280 Storage-stable photoimageable deutero leuco dye/photooxidation compositions with improved leuco dye  
Storage-stable photoimageable leuco dye/photooxidant compositions and imaging processes utilizing these compositions are disclosed. These compositions comprise deuterated leuco compounds, e.g.,...
5743998 Process for transferring microminiature patterns using spin-on glass resist media  
A process is provided for altering the susceptibility of a portion of a Spin-On Glass layer to etching. The process includes taking a substrate including a layer of positive or negative resist...
5744285 Composition and process for filling vias  
Electrolytic and electroless processes which use a solid plug of polymer thick film composition to fill throughholes and composition therefor. The composition comprises a trimodal conductive...
5741621 Process for using photoimageable films prepared for aqueous photoimageable liquid emulsions  
A process for preparing an image on a substrate by applying a photoimageable composition on a first substrate, wherein the photoimageable composition, having a solids content from 25 to 60 weight...
5741619 Negative image-recording material comprising an acrylic resin, a diazo compound and carbon black  
A negative-working image-recording material containing both a substance which absorbs light and generates heat and a diazonium compound having two or more diazohio groups in the molecule and a...
5741620 Reactive polymeric dyes  
Reactive polymeric dyes are provided comprising a chromophoric moiety derived from at least one free radically polymerizable dye and an azlactone moiety derived from 2-alkenylazlactone such that...
5741628 Method of forming micropatterns by having a resist film absorb water  
A resist film is formed on a semiconductor substrate by using a chemical amplification resist which generates an acid in response to the radiation of KrF excimer laser light and which reacts with...
5741629 Resist materials and related processes  
Polymers suitable for chemically amplified resists based on styrene chemistry are advantageously formed with a meta substituent on the phenyl ring of the styrene moiety. Additionally, polymers for...
5736301 Method for patterning a photoresist material wherein an anti-reflective coating comprising a copolymer of bisphenol A and benzophenone is used  
A co-polymer of benzophenone and bisphenol A has been shown to have DUV absorption properties. Therefore, the co-polymer has particular utility as an antireflective coating in microlithography...
5736279 Accurate drilling of probe holes in the insulating plate of an electrical test head  
A method for manufacturing insulating plates with accurately located holes in patterns suitable for bed of nails type test heads. An optically aligned drilling machine is used to form holes in the...
5733714 Antireflective coating for photoresist compositions  
The present invention relates to a novel antireflective coating solution and a process for its use in photolithography. The antireflective coating solution comprises a novel polymer and an organic...
5728506 Lithographic processes employing radiation sensitive polymers and photosensitive acid generators  
The use of a terpolymer significantly enhances the properties of resists suitable for deep UV lithography in the manufacture of semiconductor devices. This terpolymer is one represented by the...
5725994 Negative type photosensitive compositions comprising a hydroxyimide compound  
Disclosed are a novel photosensitive composition which can form a sharp negative image, a photosensitive composition recordable independently of the emission wavelength of an exposure light source,...
5725997 Method for preparing a resist pattern of t-shaped cross section  
A resist pattern formed on a substrate has a T-shaped cross section including a stem portion extending from the substrate surface and a cap portion connected to the stem portion and spaced from the...
5721091 Composition for forming an electrically conductive layer to be used in patterning  
A composition for forming an electrically conductive layer which is used in patterning of a resist with electric charge beam, which comprises: (a) 0.1 to 20 parts by weight of sulfonated...
5707784 Method of forming chemically amplified resist pattern and manufacturing for semiconductor device by using the chemically amplified resist pattern  
A chemically amplified resist pattern is formed by applying chemically amplified resist, forming thereafter a layer of an amorphous polyolefines substance thereon, then exposing the chemically...
5705322 Method of providing an image using a negative-working infrared photosensitive element  
An infrared imaging composition contains two essential components, namely an infrared radiation absorbing compound, and a phenolic resin that is either mixed or reacted with an...
5702872 Process for resist pattern formation using positive electrodeposition photoresist compositions  
A positive type electrodeposition photoresist composition includes, as essential components: (A) 100 parts by weight of a polymer having carboxyl group(s) in an amount of 0.5 to 10 equivalents per...
5702820 Photo-imaging resist ink and cured product thereof  
There is disclosed a photo-imaging resist ink containing (A) an unsaturated group-containing polycarboxylic acid resin which is a reaction product of (c) succinic anhydride with an additive...
5700628 Dry microlithography process  
An all-dry microlithography process, where a fluorinated layer 30 is deposited on a processable layer 18 of a semiconductor wafer, and regions of the fluorinated layer 30 are exposed to a masked...
5700629 Developing process  
A resist pattern good in resolution and image precision can be obtained by a developing process characterized by jetting a gas on a developing surface during development or after development.
5698376 Method of producing a resist pattern by contact imaging a photoimageable composition providing a tack-free surface  
In a method of providing a resist pattern on a substrate surface, a layer of photoimageable composition is applied to a substrate, which photoimageable composition provides a tack-free surface. The...
5698377 Method of forming a resist pattern  
To provide a method of forming a resist pattern in a readily controllable manner and at low costs, in a first exposure step, a resist layer is subject to exposure through a mask. In the next, first...
5695903 Process for developing irradiated radiation-sensitive recording materials  
A process for developing irradiated radiation-sensitive recording materials using an aqueous-alkaline developer which contains compounds of the formula (I) ##STR1## wherein A is H, Na, K, NH 4 or...
5686226 Method of forming an applicator for applying tacking media to a circuit substrate  
An applicator (300) provides a tool for depositing processing media (510), such as a tacky flux agent, on predetermined surface areas (715) of a circuit substrate (705). The applicator (300) has a...
5679497 Resist material and method for forming resist pattern  
A resist material and a method for forming a resist pattern can be obtained which can improve throughput of pattern formation using both EB lithography and optical beam lithography and which does...
5677111 Process for production of micropattern utilizing antireflection film  
A process for production of a micropattern, comprised of a step for forming an antireflection film comprised of an inorganic film on an underlying substrate, a step for forming a resist film on...
5677112 Process for forming a pattern on a semiconductor substrate using a deep ultraviolet absorbent composition  
A deep ultraviolet absorbent comprising at least one compound having one or more glycidyl groups in the molecule and at least one anthracene derivative, and a solvent capable of dissolving these...
5674663 Method of applying a photosensitive resin to a substrate for use in papermaking  
The invention comprises a method for applying a curable resin, such as a photosensitive resin, to a substrate such as a papermaker's dewatering felt. The method comprises the steps of providing a...
5667942 Resist pattern forming method  
A resist pattern forming method which includes: an application step of applying a photoresist onto a semiconductor substrate, a prebake step of prebaking the photoresist in an atmosphere...
5665527 Process for generating negative tone resist images utilizing carbon dioxide critical fluid  
The invention relates to a process for generating a negative tone resist image comprising the steps of (1) coating a substrate with a film of a polymeric composition comprising (i) a polymer, (ii)...
5658711 Method of forming micropatterns  
A relatively thick metal oxide film of 100 nm or more is formed in the exposed portion of a resist film by supplying water and a metal alkoxide thereto, and then evaporating the alcohol generated...
5658712 (Meth)acrylates containing urethane groups  
Novel (meth)acrylates which also contain urethane groups and other polymerizable groups in one and the same molecule and can be polymerized either by means of free radicals and/or cationically are...
5656413 Low metal ion containing 4,4'-[1-[4-[1-(4-Hydroxyphenyl)-1-methylethyl]phenyl]ethylidene]bisphe nol and photoresist compositions therefrom  
The present invention provides methods for producing TPPA having low level of metal ions, utilizing treated ion exchange resins. A method is also provided for producing photoresist composition...
5656414 Methods of forming tall, high-aspect ratio vias and trenches in photo-imageable materials, photoresist materials, and the like  
Simple and cost-effective methods for forming tall, high-aspect ratio structures in a material layer comprising a first layer of a image-reversal-type photo-sensitive material and a second layer of...
5652938 Method and apparatus for developing resist  
A resist developing apparatus has a plurality of developing solution containers each provided with a temperature regulator, a mixture tank connected to the plurality of developing solution...