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5725975 Gradation mask and process for producing the same  
A gradation mask having spatially stepped transmittance in at least three steps including substantially 0% and substantially 100%, the transmittance being regulated stepwise by varying the...
5725972 Mask with gradual increase in transmittance from opaque to transparent region  
An exposure mask includes a transparent region and an opaque region defined on a transparent substrate, with a transition region formed between he transparent region and the opaque region by a...
5725996 Energy sensitive composition and a process for device fabrication using this composition  
A novel resist composition is disclosed. The resist composition is used in a lithographic process for device fabrication. The resist composition contains a polymer with phosphorus ester moieties....
5721074 Method for fabricating a light exposure mask comprising the use of a process defect inspection system  
A method for fabricating a light exposure mask, including forming a pattern on a wafer by use of a primary light exposure mask formed with a light shield film pattern in accordance with a design...
5716738 Dark rims for attenuated phase shift mask  
A mask for use in semiconductor fabrication which includes a light transparent substrate, preferably glass, having a border and light semitransparent material having light transmissivity preferably...
5712063 Phase shift mask comprising light shielding regions having a multiple box structure  
A phase shift mask for forming contact holes in the fabrication of highly integrated semiconductor devices. The phase shift mask includes a transparent substrate, a plurality of light exposure...
5705246 Master disc for an optical disc and method for manufacturing the master disc  
An exposure master disc includes a photoresist laminate formed on a glass substrate. The photoresist laminate includes an i-line type, first photoresist layer and a g-line type, second photoresist...
5700606 Photomask and a manufacturing method thereof  
A half-tone film, a light-shielding film and resist are formed on a transparent substrate in this order, and the resist is removed by adjusting the dosage of exposure for each area so that...
5700605 Mask for light exposure and process for production of the same  
There is disclosed a mask for light exposure which comprises being provided with a light transparent substrate and a mask pattern formed on the light transparent substrate, the mask pattern...
5698350 Light exposure method for the fabrication of semiconductor devices  
A light exposure method for fabrication of a semiconductor device and a dummy mask used therefor, capable of forming an ultra-fine pattern by diffracting incident light while controlling or cutting...
5698347 Reticle for off-axis illumination  
A reticle for off-axis illumination which has spaces with different sizes wherein subsidiary patterns are formed at space patterns which are larger in size than the space of maximal focus latitude...
5695896 Process for fabricating a phase shifting mask  
A simplified process for forming a phase shifting mask is disclosed. A chrome layer is formed on a transparent substrate and patterned. A resist layer is patterned to define the phase shifting...
5688617 Phase shift layer-containing photomask, and its production and correction  
The present invention relates particularly to a process for producing phase shift layer-containing photomasks, which can produce phase shift photomasks through a reduced or limited number of steps...
5686383 Method of making a color filter array by colorant transfer and lamination  
A method for preparing a color filter array element is disclosed which includes coating an image receiving layer on one surface of a thin support, with the thin support being rigid in the...
5686208 Process for generating a phase level of an alternating aperture phase shifting mask  
A process for generating the phase level pattern of an alternating aperture phase shifting mask is provided. All polygons having both X and Y dimensions greater than a predetermined value are...
5682056 Phase shifting mask and method of manufacturing same  
A phase shifting mask has a light shielding region and a light transmitting region including a light transmitting area and a first phase shifting area which is disposed between the light...
5679484 Exposure mask, exposure mask substrate, method for fabricating the same, and method for forming pattern based on exposure mask  
An exposure mask having an excellent alignment accuracy between patterns, which is prepared by first forming on a light transmissive substrate a light shielding film or a semi-transparent film...
5679483 Embedded phase shifting photomasks and method for manufacturing same  
The present invention phase shifting photomask is fabricated by means of a structured modification to the surface of a mask blank suitable for photolithography. Ion implantation, diffusion or...
5672450 Method of phase shift mask fabrication comprising a tapered edge and phase conflict resolution  
A method for forming a phase shifting photomask is provided. The method includes forming a transparent substrate having a pattern of opaque features and determining areas of phase conflicts between...
5670280 Optically controlled imaging phase mask element  
An optical element includes a phase mask made of a nonlinear material. The element uses the nonlinearity to produce an intensity dependent lens which controls the imaging properties. The invention...
5667919 Attenuated phase shift mask and method of manufacture thereof  
An attenuated Phase Shift Mask (PSM) blank and an attenuated Phase Shift Mask (PSM), and a method by which the attenuated Phase Shift Mask (PSM) blank and the attenuated Phase Shift Mask (PSM) may...
5665496 Method for producing color filter  
A method for producing a color filter involves (a) forming a positive photosensitive coating film on a transparent electrically conductive layer of a transparent substrate; (b) forming a...
5663018 Pattern writing method during X-ray mask fabrication  
A pattern writing method for X-ray mask fabrication including forming a uniform membrane layer on an X-ray absorbing layer and forming an etch mask on the layer of X-ray absorbing material...
5658695 Method for fabricating phase shift mask comprising the use of a second photoshield layer as a sidewall  
A method is provided for fabricating a phase shift mask of the out rigger sub-resolution type capable of accurately fabricating an ultra-fine semiconductor circuit. The method includes the steps of...
5637424 Fine pattern lithography with positive use of interference  
A mask for forming a desired pattern on the image plane is divided into a number of cell areas. Each cell is assigned a uniform characteristic. Each cell area is assigned a particular light...
5635338 Energy sensitive materials and methods for their use  
A class of silicon-containing materials display excellent sensitively in the ultraviolet and deep ultraviolet for the formation of patterns by radiation induced conversion into glassy compounds....
5635314 Phase shift mask comprising micro spaces in peripheral opaque regions  
The present invention relates to a phase shift mask for modifying blackout patterns at the peripheral sites of the mask, thereby capable of compensating the differences in the light intensity at...
5633101 Mask and projection exposure method  
An exposure mask formed with a predetermined pattern for exposure on a substrate to be subjected to exposure comprises a glass substrate and a heat conductive film having a thermal conductivity...
5629113 Photomask used by photolithography and a process of producing same  
A photomask used by photolithography and a process for producing same which allows a single exposure to make a photomask, thereby simplifying the photomask making process, and facilitating the...
5624791 Pattern forming method using mask  
A mask includes a transparent layer which is transparent with respect to a light which is used for an exposure, and a mask pattern layer which is formed on the transparent layer. At least a portion...
5624790 Papermaking belt and method of making the same using differential light transmission techniques  
A backside textured papermaking belt is disclosed which is comprised of a framework and a reinforcing structure. The framework has a first surface which defines the paper-contacting side of the...
5624773 Resolution-enhancing optical phase structure for a projection illumination system  
In an optical projection system for use in projection printing of masks to wafers, comprising an illumination system including a light source and a mask positioned in the optical path of the...
5620817 Fabrication of self-aligned attenuated rim phase shift mask  
This invention provides a method of forming an attenuating phase shifting rim type photomask and an attenuating phase shifting rim type photomask for use in projection type lithographic apparatus....
5618643 Embedded phase shifting mask with improved relative attenuated film transmission  
A method and apparatus for fabricating a mask for use in patterning a radiation sensitive layer in a lithographic printer. An embedded phase shifting layer is disposed over a substantially...
5609977 Reflection phase shifting mask and method of forming a pattern using the same  
A reflection phase shifting mask used to expose a pattern by forming reflected light having a phase difference upon reflection of light, includes a substrate for reflecting exposure light, a phase...
5604081 Method for producing a surface structure with reliefs  
A method for producing relief surface structures comprises the step of providing a photoresist layer having a relief surface structure on a surface of a substrate, the relief structure of the...
5604060 Halftone phase shift photomask comprising a single layer of halftone light blocking and phase shifting  
The invention provides a halftone phase shift photomask that is of much more simplified structure and so can be fabricated much more easily, which comprises a transparent substrate 10 and a single...
5601954 Attenuated phase shift mask comprising phase shifting layer with parabolically shaped sidewalls  
An attenuated phase shift mask comprises a first layer having a thickness to provide a transmission in the range of about 3 to 10% formed on a transparent substrate and a second layer comprising a...
5597667 Photomask and photomask blank  
A photomask used in photolithography is characterized in that the photomask is provided with a transparent substrate having two opposite main surfaces and a light-shielding pattern formed on one...
5595857 Method of forming a pattern and projection exposure apparatus  
A novel method of pattern formation and a projection exposure apparatus are disclosed, in which the pupil of a projection lens of the projection exposure apparatus used for forming an LSI pattern...
5593801 Attenuating type phase shifting mask, method of manufacturing thereof and semiconductor device manufactured by using the mask  
An attenuating type phase shifting mask and semiconductor device manufactured by using the mask according to the present invention includes an attenuating type phase shifting pattern, and an...
5591550 Phase shift mask and method for forming phase shift mask  
A halftone phase shift mask and a method for forming a halftone phase shift mask. The method includes: forming a halftone pattern material layer on a substrate; defining positions for forming more...
5589304 Photomask comprising a holding frame and reinforcing member with a ceramic oxide bond  
Disclosed is a mask structure which includes a membrane on which a pattern is formed or to be formed, a holding frame for holding the membrane, and a reinforcing member for reinforcing the holding...
5589303 Self-aligned opaque regions for attenuating phase-shifting masks  
An attenuating phase-shifting optical lithographic mask is fabricated, in a specific embodiment of the invention, by first depositing a uniformly thick molybdenum silicide layer on a top planar...
5585210 Mask pattern of a semiconductor device and a method of manufacturing fine patterns using the same  
A mask pattern for manufacturing a resist pattern of a semiconductor device through photolithography is provided with an additional mask pattern whose size is such that resist patterns are not...
5582939 Method for fabricating and using defect-free phase shifting masks  
A method for forming a defect-free phase shift mask includes forming a mask blank having a substrate, an etch stop layer, a phase shift layer and an opaque layer. The etch stop layer and phase...
5582938 Phase shift mask  
A phase shift mask capable of preventing the formation of a ghost image caused by diffraction and interference of light with the phase of 0° and light with the phase of 180° meeting upon forming...
5578360 Thin film reinforcing structure and method for manufacturing the same  
The invention relates to a reinforcing structure for a thin film, particularly for an ultrathin film permeable to X-ray and ultraviolet radiation, and a method for manufacturing a reinforcing...
5576126 Phase shifting mask  
An improved method of fabricating a phase shifting mask suitable for semiconductor manufacture includes the steps of identifying phase conflict areas in a desired mask pattern and forming phase...
5576124 Phase shift mask and method for fabricating the same  
A phase shift mask capable of achieving a variation in phase at the boundary between a light transmitting film and a phase shift film and thereby preventing formation of an undesirable pattern, and...