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7628875 |
MEMS device and assembly method
A method of bonding a MEMS device to a substrate to form a MEMS device assembly. A thickness profile of the MEMS device and/or the flatness of the mating surface of the substrate is determined. An...
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7578301 |
Methods and apparatus for determining the endpoint of a cleaning or conditioning process in a plasma processing system
A method of determining an endpoint of a process by measuring a thickness of a layer, the layer being deposited on the surface by a prior process is disclosed. The method includes providing a...
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7572647 |
Internal balanced coil for inductively coupled high density plasma processing chamber
A coil is provided for use in a semiconductor processing system to generate a plasma with a magnetic field in a chamber. The coil comprises a first coil segment, a second coil segment and an...
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7551766 |
Apparatus and method for inspecting golf balls using threshold analysis
A method for inspecting golf balls is disclosed. An imager such as a camera captures a digital image of the golf ball. The golf ball image is separated into regions, and a brightness level is...
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7547461 |
Process for producing electrophotographic composition layer having controlled thickness by dip coating on thin substrate
A method for controlling the thickness and uniformity of a dip coated layer, using a coating apparatus under conditions of controlled temperature and controlled low humidity, includes the following...
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7544382 |
Dip coating process for producing electrophotographic composition layer having controlled thickness
A method for controlling the thickness and uniformity of a dip coated layer, using a coating apparatus in a normal coating environment, includes the following steps: forming under normal coating...
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7517141 |
Simultaneous control of deposition time and temperature of multi-zone furnaces
The present invention facilitates multi-zone furnace ( 102 ) based deposition processes by iteratively adjusting deposition time and zonal setpoint temperatures to mitigate deviations from desired...
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7459175 |
Method for monolayer deposition
An adaptive real time thermal processing system is presented that includes a multivariable controller. The method includes creating a dynamic model of the MLD processing system and incorporating...
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7445675 |
Sensor for monitoring material deposition
A sensor for detecting an amount of material deposition. The sensor includes a substrate, a heater disposed on the substrate, and a temperature sensor. The heat and the temperature sensor are...
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7436526 |
Real-time system for monitoring and controlling film uniformity and method of applying the same
A real-time system adapted to a PVD apparatus for monitoring and controlling film uniformity is described. The system includes a shielding plate, a monitoring device, and a data processing program....
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7381443 |
Method for forming print with surface textures corresponding to printed image
The hard copy has a transparent coat layer which is formed on an image recording surface of a recording medium on a side of which an image is recorded and covers at least a part of the image...
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7374791 |
Method for making and measuring a coating on the surface of a medical device using an ultraviolet laser
This invention relates to a method for manufacturing an implantable medical device, having a surface covered with a coating that can include a desired amount of a biologically active material,...
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7368082 |
Formulation of spotting solution to achieve uniform spot size and morphology and for nondestructive quality control of assay articles
This invention relates to spotting solutions for the production of assay articles with uniform spot size and morphology for the detection of biopolymers, comprising N-lauroyl sarcosine in a...
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7358199 |
Method of fabricating semiconductor integrated circuits
A method of fabricating semiconductor integrated circuits includes (1) providing a spin-on tool comprising a rotatable platen for holding and spinning a wafer disposed thereon, a fluid supply...
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7334330 |
Thermally insulating layer incorporating a distinguishing agent and method for inspecting the same
Thermally insulating layer incorporating a distinguishing agent and method for inspecting the insulating layer are provided. The distinguishing agent may be used for determining a remaining...
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7332036 |
Thermal projection device
The invention relates to a device and a method for control of the operation of a thermal projection torch ( 12 ), characterized in that the characteristics of the jet ( 16 ) and the temperature of...
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7323061 |
Thermal spraying instrument
The invention relates to a device and method for controlling the operation of a thermal spray torch ( 12 ). The inventive device and method are characterised in that an on-board camera ( 54 ) and...
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7277770 |
Direct write process and apparatus
A direct write process and apparatus for fabricating a desired circuit component onto a substrate surface of a microelectronic device according to a computer-aided design (CAD). The process...
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7275436 |
Method and apparatus for measuring film thickness and film thickness growth
A device for measuring thickness and/or rate of thickness increase of a film comprises at least one piezoelectric element, and first and second electrodes in contact with the piezoelectric element....
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7270712 |
Industrial microdeposition system for polymer light emitting diode displays, printed circuit boards and the like
A microdeposition system ( 20 ) and method deposits precise amounts of fluid material onto a substrate. A microdeposition head ( 50 ) includes a plurality of spaced nozzles. A positioning device...
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7258894 |
Apparatus and method for dispensing liquid crystal material
A liquid crystal material dispensing apparatus includes a spacer height measuring unit for measuring a height of a spacer on a substrate, and a liquid crystal material dispensing system for...
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7247345 |
Optical film thickness controlling method and apparatus, dielectric multilayer film and manufacturing apparatus thereof
A method of controlling film thickness of dielectric multilayer film with high precision, an optical film thickness controlling apparatus and a dielectric multilayer film manufacturing apparatus...
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7244310 |
Over-clocking in a microdeposition control system to improve resolution
A microdeposition system ( 20 ) and method deposits precise amounts of fluid material onto a substrate. A microdeposition head ( 50 ) includes a plurality of spaced nozzles that fire droplets...
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7226638 |
Method and arrangement in connection with production line for optic cable
A method and an arrangement in connection with a production line for optic cable, wherein optical fibers ( 1 ) are guided to a coating point ( 3 ), where filling gel is applied around the fibres,...
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7226634 |
Designing a plated pattern in printed writing board
The plating method comprises the steps of dividing a region, to be plated, into a group of mesh-like zones, measuring a plating area of each of the zones, comparing the measurement values of the...
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7201936 |
Method of feedback control of sub-atmospheric chemical vapor deposition processes
A method of film deposition in a sub-atmospheric chemical vapor deposition (CVD) process includes (a) providing a model for sub-atmospheric CVD deposition of a film that identifies one or more film...
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7138156 |
Filter design algorithm for multi-variate optical computing
Within a method of making an optical interference filter, sample spectra and measurements of a predetermined characteristic associated with respective spectra are provided. Upon selection of an...
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7105080 |
Vacuum treatment system and method of manufacturing same
Method for manufacturing a workpiece by a vacuum treatment process includes providing a vacuum treatment system with first second parts in a vacuum chamber. Either a sensor or an adjusting element...
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7094444 |
Method for repairing coated components using NiAl bond coats
According to an embodiment of the invention, a method for repairing a coated high pressure turbine blade, which has been exposed to engine operation, to restore coated airfoil contour dimensions of...
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7094440 |
Substrate treatment method and substrate treatment apparatus
The present invention is a substrate treatment method in which a treatment by supplying a treatment solution from a nozzle to a substrate is successively performed for a plurality of substrates,...
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7020537 |
Tuning electrodes used in a reactor for electrochemically processing a microelectronic workpiece
A facility for selecting and refining electrical parameters for processing a microelectronic workpiece in a processing chamber is described. The facility initially configures the electrical...
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7014724 |
Gravity regulated method and apparatus for controlling application of a fluid
An apparatus for dispensing an amount of fluid is disclosed where the amount of fluid and the pressure thereof is controlled by the height of the fluid relative to the spray mechanism that can...
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6974600 |
Method and apparatus for coating a photosensitive material
In a method and an apparatus for coating an object with photosensitive material, a roller stabilizes a supply amount of the photosensitive material and is disposed between the object and a slit...
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6946157 |
Method and apparatus for monitoring the coating on particle during manufacturing of a pharmaceutical product
In a method of monitoring the formation of a coating on a single particle (P), an apparatus is used which comprises means ( 2,5,6,9 ) for arranging said particle (P) at a given spatial location,...
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6933001 |
Optical filter and method of manufacturing the same
The optical thickness of a film formed on a substrate is controlled precisely to manufacture an optical filter having an accurate optical thickness. Time is counted during a film being formed on a...
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6923023 |
Methods and apparatuses for controlling optical fiber primary coating diameter
Methods and apparatuses estimate and control optical fiber primary coating diameter for wet-on-wet optical fiber manufacturing. The primary coating diameter for a particular length of optical fiber...
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6918165 |
Method for manufacturing a multi-layer capacitor
A multi-layer capacitor is highly downsized and increased in capacity. A method for manufacturing the multi-layer capacitor includes, in the same vacuum chamber, forming a dielectric layer,...
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6913938 |
Feedback control of plasma-enhanced chemical vapor deposition processes
A method of film deposition in a chemical vapor deposition (CVD) process includes (a) providing a model for CVD deposition of a film that defines a plurality of regions on a wafer and identifies...
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6913781 |
Substrate processing apparatus and method including a device for applying a coating and a device for measuring the film quality of the coating
A substrate processing apparatus is provided with five inspection devices that perform inspections of different kinds to a substrate. Among the five kinds of inspections, the film quality is...
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6893500 |
Method of constructing optical filters by atomic layer control for next generation dense wavelength division multiplexer
A method of constructing optical filters using alternating layers of materials with “low” and “high” indices of refraction and deposited with atomic layer control. The multilayered thin...
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6884458 |
Sensor for monitoring material deposition and method of monitoring material deposition
A material deposition sensor includes a heater and a temperature sensor separated from one another. In operation, the sensor is disposed within a deposition chamber, and material is deposited onto...
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6816756 |
Paint film thickness predicting method and system for actual car, and recording medium
A paint film thickness predicting method for an actual car, which predicts a paint film thickness of an object car in an actual car state, an electrodeposition coating being applied to the object...
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6814809 |
Coating and developing apparatus and pattern forming method
A coating and developing apparatus has an interface section equipped with a temperature adjuster (a cooling unit). A temperature-raised substrate due to exposure on periphery of the substrate...
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6806949 |
Monitoring material buildup on system components by optical emission
A method and system are provided for monitoring material buildup on system components in a plasma processing system. The system components contain emitters that are capable of producing...
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6790472 |
Method for filming CRT luminescent screen
A method of filming a luminescent screen is disclosed which improves the light output of CRTs that contain printed phosphor lines. The method incorporates both the application and film formulation...
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6781692 |
Method of monitoring the fabrication of thin film layers forming a DWDM filter
A narrow band ellipsometer is used to monitor and control the formation of thin layers in an multilayer, thin film interference filter. Optical interference filters used for DWDM application have a...
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6764710 |
Light emitting markers for use with substrates
A method of determining whether a substrate has been subjected to an energy source. In one embodiment, the method includes the steps of providing a polymeric surface, providing a light emitting...
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6749888 |
Method and apparatus for determining the profile of a coating layer
A method and apparatus for determining the profile of a coating layer of a paper or board web ( 2 ). The method comprises application of a coating slip to at least one surface of the web ( 2 ) at...
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6746577 |
Method and apparatus for thickness control and reproducibility of dielectric film deposition
The invention embodies a method and apparatus for controlling the thickness of a dielectric film formed by physical vapor deposition (PVD). The method compensates for the continuously varying...
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6733821 |
Method for forming an optical component
A method for forming an optical component includes (i) depositing optical layers on a base, and (ii) controlling a thickness of a tuning layer by (a) depositing the tuning layer on the optical...
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