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7590278 |
Measurement of corner roundness
A method for analyzing an image includes identifying a curved segment of a contour that is associated with noise. The curved segment is smoothed so as to reduce the noise that is associated with...
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7570798 |
Method of manufacturing ball array devices using an inspection apparatus having one or more cameras and ball array devices produced according to the method
An apparatus for three dimensional inspection of an electronic part which has a camera and illuminator for imaging a first view of the electronic part. An optical element is positioned to reflect a...
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7539339 |
Part recognition data creation method and apparatus, electronic part mounting apparatus, and recorded medium
It is an object of the present invention to provide a parts recognition data preparing method and a preparing device and an electronic parts mounting device and a recording medium, which are...
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7453777 |
Method and device for optical form measurement and/or estimation
A method for optical shape recording and/or evaluation of optically smooth, glossy or optically rough surfaces wherein a photometric stereo method and a deflectometric method are combined using a...
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7324685 |
Inspection systems and methods
In one embodiment, a system comprises logic configured to identify a tip of a pin that has been press fit into a circuit board, logic configured to measure characteristics that pertain to a flat...
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7218771 |
Cam reference for inspection of contour images
This invention discloses an electrical circuit inspection system including an optical subsystem for optically inspecting an electrical circuit and providing an inspection output identifying more...
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7076094 |
Method and apparatus for detecting position of lead of electric component, and electric-component mounting method
A method of detecting a position of a lead of an electric component which additionally includes a body from which the lead extends, the method including the steps of illuminating a lengthwise...
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7062080 |
Method of inspecting curved surface and device for inspecting printed circuit board
A circuit board with lead-free solder is inspected by using light sources with different colors at different angles to obtain an image having a plurality of color components. For each pixel within...
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7058216 |
Apparatus for detecting lead coplanarity, apparatus for detecting condition of electronic component, and system for mounting electronic component
An apparatus for detecting a coplanarity of a plurality of leads of an electronic component that laterally extend from a main body thereof, including a holding device which holds the main body of...
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7027637 |
Adaptive threshold determination for ball grid array component modeling
A method for determining a number of balls in a projection space comprises determining a projection of a portion of a ball grid array, determining at least one local maximum of the projection space...
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6990227 |
Method for printed circuit board inspection
This invention discloses a method for printed circuit board (PCB) inspection, including providing a multiplicity of PCBs placed on an inspection panel, defining each non-identical PCB in terms of...
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6990226 |
Pattern recognition method
A method includes setting lead eye boxes and lead eye points on a gate and a support bar of a lead frame, before clamping the lead frame, and determining whether or not the lead frame is seated in...
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6987875 |
Probe mark inspection method and apparatus
A method and apparatus for inspection of probe marks made on the interconnection lands of semiconductor devices using machine vision is disclosed. An image of an interconnection land is analyzed,...
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6980687 |
Chip inspecting apparatus and method
A method and apparatus for inspecting chips formed as a fine pattern on a surface of an object to be inspected, in which one visual field of an optical observation system is divided into a...
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6950548 |
Creating geometric model descriptions for use in machine vision inspection systems
A method and system create a geometric object model for use in machine vision inspection. A pixel image representation of an object is acquired. Based on this pixel image representation, part...
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6922482 |
Hybrid invariant adaptive automatic defect classification
A method and apparatus is provided for automatically classifying a defect on the surface of a semiconductor wafer into one of a predetermined number of core classes using a core classifier...
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6813377 |
Methods and apparatuses for generating a model of an object from an image of the object
A method and an apparatus are disclosed for generating a model of an object from an image of the object. First, an orientation of the object in the image is determined through the generation of,...
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6810728 |
Kit-based wire evaluation
To provide an evaluation of the remaining life (level of insulation degradation) of wire in an installation, a kit-based approach avoids the need for technical personnel to visit a customer...
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6801652 |
Method for checking the presentation of components to an automatic onserting unit
A method for checking the fitting at automatic onserting units for the onserting of substrates with components, comprising the steps of: taking a picture of the surface of a component to be...
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6795573 |
Inspection method and apparatus
A statistical processing unit compares the gray levels at identical positions in raw and reference images using a raw image having three or more gray levels obtained by sensing an object by an...
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6789240 |
Method of controlling bond process quality by measuring wire bond features
A computerized system and method for inspecting and measuring a ball-shaped wire bond formed by an automated bonder pre-programmed to attach a connecting bond onto a bond pad of an integrated...
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6787378 |
Method for measuring height of sphere or hemisphere
A method is provided that allows a simple and inexpensive apparatus to measure the uniformity of the height-directional positions of spheres or hemispheres such as bump electrodes of a...
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6738504 |
Inspection apparatus for semiconductor device and parts mounter using same
An inspection apparatus for semiconductor devices, comprising: a light irradiation means for irradiating light to a surface of a semiconductor device, the surface having external connection...
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6713311 |
Method for screening semiconductor devices for contact coplanarity
A method for determining contact coplanarity of packaged semiconductor devices having a plurality of contacts. The method includes the steps of measuring the relative positions of the contacts on a...
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6690819 |
Method and apparatus for recognizing components
A method and apparatus for accurately recognizing most of components available in the market with moderate illuminating condition in high speed image processing are disclosed. After imaging a...
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6681151 |
System and method for servoing robots based upon workpieces with fiducial marks using machine vision
A system and method for servoing robot marks using fiducial marks and machine vision provides a machine vision system having a machine vision search tool that is adapted to register a pattern,...
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6647132 |
Methods and apparatuses for identifying regions of similar texture in an image
Methods and apparatuses are disclosed for identifying regions of similar texture in an image. The areas of similar texture include areas conventionally thought of as similar texture regions as well...
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6617602 |
Edge detecting apparatus having a control device which selectively operates the light emitting elements
A method of detecting an edge of an object, including the steps of lighting, in each one of a plurality of different directions, at least a portion of the object, taking an image of the portion of...
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6608921 |
Inspection of solder bump lighted with rays of light intersecting at predetermined angle
A bump inspecting apparatus lights a spherical solder bump mounted on the surface of a circuit board and has a reinforcing resin applied to the lower half thereof from all circumferential...
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6587580 |
Stencil printing process optimization for circuit pack assembly using neural network modeling
A system for determining the optimal settings for parameter of a stencil printing machine. The system generates a model mapping parameter inputs to output results. The model is then used to...
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6578175 |
Method and apparatus for evaluating and correcting errors in integrated circuit chip designs
A process for evaluating and correcting virtual integrated circuit designs includes a method and apparatus for determining a ratio of an amount of material, i.e. polysilicon or metal, in any given...
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6571006 |
Methods and apparatuses for measuring an extent of a group of objects within an image
Methods are disclosed that measure the extent of a group of objects within a digital image by comparing signature, representative of the relationship of the objects to one another, against...
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6526165 |
Methods and apparatuses for refining a geometric description of an object having a plurality of extensions
A method and apparatus are disclosed for refining a rough geometric description (GD) and a rough pose of an object having extensions. The invention locates anchor points within an image of the...
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6510240 |
Automatic detection of die absence on the wire bonding machine
An apparatus detects the presence or absence of a semiconductor device. The apparatus includes a wire bonding machine to form a connection with the semiconductor device, and a camera to form an...
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6442291 |
Machine vision methods and articles of manufacture for ball grid array
A method of inspecting an image to locate a ball grid array surface-mounted device includes the steps of inspecting the image to find its surface features and to determine their locations (referred...
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6292261 |
Rotary sensor system with at least two detectors
The present invention includes a system for providing a signal related to a physical condition of an object, such as an electronic component. Various types of electronic components may be used with...
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6278797 |
Apparatus for inspecting land-attached circuit board
An inspection beam such as laser beam is scanned two-dimensionally on an inspection surface of a circuit board with a plurality of lands while allowing its reflected beam from the inspection...
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6275604 |
Method and apparatus for generating semiconductor exposure data
A computer implemented method and an apparatus for generating exposure data of a layout pattern used to fabricate semiconductor integrated circuits. The layout pattern is first analyzed to...
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6249598 |
Solder testing apparatus
A solder testing apparatus comprising image processing means for performing image processing on an image of an appearance of a soldered portion to identify shape characterizing amounts for the...
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6205238 |
Apparatus and method for inspecting leads of an IC
Disclosed are apparatus and method for inspecting leads of an IC placed on a setting table. The apparatus comprises an optical image recognition part for scanning the setting table, a device for...
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6201892 |
System and method for arithmetic operations for electronic package inspection
An inspection system and method uses a first illumination apparatus to illuminate one or more features, such as solder balls on an electronic component or other protruding surfaces or features on...
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6188784 |
Split optics arrangement for vision inspection/sorter module
The present invention provides method and apparatus for determining lead integrity of IC devices characterized by an inspection arrangement which comprises optical elements for back lighting the...
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6133579 |
Method and apparatus for slanted attitude testing and/or for co-planarity testing of a contact for SMD components
An entire contact row of an SMD component is illuminated by a light source direction in the direction of the contact row, and a shadow of the entire contact row is directed by a linear sensor. A...
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6118524 |
Arc illumination apparatus and method
An illumination apparatus and method illuminates one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The illumination apparatus...
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6067376 |
Classifying pixels of an image
Pixels of an image are classified (e.g., into foreground and background pixels). In a set of possible values for the pixels, each value is able to serve as a threshold for classifying the pixels....
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6064756 |
Apparatus for three dimensional inspection of electronic components
A three dimensional inspection apparatus for ball array devices, where the ball array device is positioned in a fixed optical system. An illumination apparatus is positioned for illuminating the...
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6061466 |
Apparatus and method for inspecting an LSI device in an assembling process, capable of detecting connection failure of individual flexible leads
Disclosed is an apparatus and method for inspecting a connection state of a lead electrode to a bump after TAB (tape automated bonding). An LSI chip is immobilized on a stage. A flexible lead is...
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6055054 |
Three dimensional inspection system
A part inspection and calibration method for the inspection of printed circuit boards and integrated circuits includes a camera to image a precision pattern mask deposited on a transparent reticle....
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6028319 |
Calibration standard for lead configurations and method of using
The present invention discloses a calibration standard for use in a CCD or laser lead scanner for the measurement of lead configurations in an IC package by selectively making three leads with one...
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5995220 |
Semiconductor package inspection apparatus
A semiconductor package inspection apparatus comprises single photographic device disposed above the semiconductor package, and comprises light splitter for splitting light in different directions...
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