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7593506 |
Backscatter inspection portal
A system and method for inspecting an object with multiple sources of substantially coplanar penetrating radiation. Irradiation of the inspected object by the sources is temporally sequenced such...
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7592591 |
X-ray analyzer using electron beam
An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for...
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7555099 |
X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
An X-ray imaging inspection system for bags and packages. Transmission imaging is performed using a fan beam and a segmented detector, while scatter imaging is performed with a scanned pencil beam,...
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7551719 |
Multifunction X-ray analysis system
Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a first, converging beam of X-rays toward a surface of the sample and to direct a second, collimated beam...
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7529341 |
Automatic material discrimination by using computer tomography
Method and apparatus are provided for combining information obtained from CT and Coherent Scatter Computed Tomography to better determine whether there are dangerous materials in the baggage or...
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7486773 |
Megavoltage scatter radiation measurement using beam stop array
A system may include emission of megavoltage radiation from a megavoltage radiation source, acquisition of a first image using an imaging device while first megavoltage radiation is emitted from...
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7474734 |
Method and apparatus for void content measurement and method and apparatus for particle content measurement
A void or particle content is determined using the X-ray small angle scattering measurement for a sample made of a thin film having voids or particles disorderly dispersed in the matrix, the...
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7456399 |
Calibrating multiple photoelectron spectroscopy systems
A method comprising obtaining a first set of spectral data for a first sample film measured by a first system, extracting intensities for one or more elemental species associated with the first...
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7427757 |
Large collection angle x-ray monochromators for electron probe microanalysis
X-ray monochromators and electron probe micro-analysis (EPMA) systems using such monochromators are disclosed. A turretless x-ray monochromator may have a cassette of reflectors instead of a...
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7366374 |
Multilayer optic device and an imaging system and method using same
An optic device, system and method for imaging are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a...
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7295650 |
Method for operating a primary beam stop
A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source ( 1 ) from which corresponding radiation is guided as a primary beam ( 2 ) to a sample...
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7242747 |
Method for determining a gsm substance and/or a chemical composition of a conveyed material sample, and a device for this purpose
A method for determining a weight per unit area and/or a chemical composition of a conveyed material sample. From the analysis of a portion of an incident ionizing radiation, in particular an...
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7184517 |
Analytical method for determination of crystallographic phases of a sample
An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of...
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7166838 |
X-ray imaging for patterned film measurement
An x-ray metrology system includes an e-beam generator to cause a test sample to emit x-rays, x-ray optics for focusing the x-rays, and an x-ray imager to generate an image of the test sample from...
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7120228 |
Combined X-ray reflectometer and diffractometer
Apparatus for analysis of a sample includes a radiation source, which is adapted to direct a converging beam of X-rays toward a surface of the sample. At least one detector array is arranged to...
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7092485 |
X-ray inspection system for detecting explosives and other contraband
A baggage scanning system and method employ combined angular and energy dispersive x-ray scanning to detect the presence of a contraband substance within an interrogation volume of a baggage item....
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7072440 |
Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation
X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for...
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7039161 |
Method for analyzing film structure and apparatus therefor
A method and apparatus for analyzing a film structure analyze particle or pore size distribution with high accuracy and evaluate a shape of a surface or interface even in the case where the...
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6985615 |
Image processing apparatus, method and memory medium
There is disclosed an image processing apparatus for performing a dynamic range compression processing to an arbitrary image to add a high frequency component obtained based on the image, the image...
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6895075 |
X-ray reflectometry with small-angle scattering measurement
Apparatus for inspection of a sample includes a radiation source and an array of detector elements arranged to receive radiation from the surface due to irradiation of an area of the surface by the...
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6879657 |
Computed tomography system with integrated scatter detectors
An imaging system includes an x-ray source coupled to a gantry. The x-ray source generates an x-ray flux, wherein a portion of the x-ray flux becomes scatter radiation. A scatter detector is also...
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6798863 |
Combined x-ray analysis apparatus
In order to provide a single, small apparatus capable of elemental and structural analysis of inorganic matter by utilizing X-rays having non-obstructive and non-contact characteristics there is...
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6785360 |
Personnel inspection system with x-ray line source
A personnel x-ray inspection system includes an electron source that provides a pencil beam of electrons. An electromagnet assembly receives the pencil beam of electrons and directs the beam of...
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6754305 |
Measurement of thin films and barrier layers on patterned wafers with X-ray reflectometry
The teachings of the subject invention lead to a new application of the XRR and RXRR systems. In particular, it has been recognized for the first time that such systems can be used to measure...
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6710341 |
Electron microscope equipped with X-ray spectrometer
An electron microscope is offered which is fitted with an X-ray spectrometer having a compact optical system and high resolution. The spectrometer has a spectrometer chamber whose inside is...
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6693988 |
Arrangement for measuring the pulse transmission spectrum of x-ray quanta elastically scattered in a scanning area for containers
A baggage inspection device based on coherent x-ray scatter has an x-ray source on one side of the scanning area and detectors on the other side of the scanning area. The detectors measure the...
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6678349 |
Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements
This invention provides a measurement device that includes both an X-ray reflectometer and a thermal or plasma wave measurement module for determining the characteristics of a sample. Preferably,...
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6665373 |
X-ray imaging system with active detector
The present invention provides for an apparatus and method for use in a system with an x-ray source to produce a pencil beam of x-rays to scan an object and a first detector providing a value...
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6661867 |
Tomographic scanning X-ray inspection system using transmitted and compton scattered radiation
X-ray radiation is transmitted through and scattered from an object under inspection to detect weapons, narcotics, explosives or other contraband. Relatively fast scintillators are employed for...
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6621888 |
X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
A system and method for inspecting an enclosure with penetrating radiation. Radiation side-scattered from an object within the enclosure is detected, allowing the object to be located. If the...
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6556653 |
Non-rotating X-ray system for three-dimensional, three-parameter imaging
The system for inspecting an object comprises a structure having a first, second and third orthogonal axes, and a source of x-ray pencil beam mounted thereto along the first axis. An incident...
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6532276 |
Method and apparatus for determining a material of a detected item
A method for determining the material of a detected item in objects, especially explosives in luggage, using X-ray diffraction. In this method, wherein scatter radiation deflected at the...
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6496562 |
Energy dispersion x-ray fluorescence analysis of chemical subtances
The invention relates to a method for classifying and identifying by means of energy dispersion X-ray fluorescence analysis chemical substances whose X-ray fluorescence lines cannot be detected and...
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6483891 |
Reduced-angle mammography device and variants
The invention relates to the mammography devices based on registration of a reduced-angle coherently scattered radiation when an object is rayed by a penetrating radiation. Registration of the...
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6453007 |
X-ray inspection using co-planar pencil and fan beams
An inspection system is for inspecting an object with penetrating radiation. A source of penetrating radiation provides a beam of radiation. The beam alternates between a first beam shape and a...
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6434217 |
System and method for analyzing layers using x-ray transmission
A system and method are presented for determining the thickness and elemental composition of a layer within a measurement sample in an easy and inexpensive manner. An embodiment of the method...
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6381303 |
X-ray microanalyzer for thin films
Apparatus for X-ray microanalysis of a sample includes an X-ray source, which irradiates a spot having a dimension less than 500 μm on a surface of the sample. A first X-ray detector captures...
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6192104 |
Fan and pencil beams from a common source for x-ray inspection
A system and method for inspecting an object, where both a fan beam and a pencil beam of penetrating radiation are used to illuminating the object concurrently. Both beams may be derived from a...
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6151381 |
Gated transmission and scatter detection for x-ray imaging
An inspection system for inspecting an enclosure and its contents using temporally gated sources of penetrating radiation. A first source produces an intermittent first beam having a duration of...
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6121623 |
Parallel radiation detector
A parallel radiation detector includes a plurality of radiation detecting elements, a plurality of preamplifiers for converting signals from the radiation detecting elements into voltage signals, a...
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6078642 |
Apparatus and method for density discrimination of objects in computed tomography data using multiple density ranges
A method and apparatus for detecting and classifying objects in computed tomography (CT) data are disclosed. A connectivity process can be applied to voxels in the data to combine them into...
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5974111 |
Identifying explosives or other contraband by employing transmitted or scattered X-rays
An X-ray inspection device (10) for detecting a specific material of interest in items of various sizes and shapes (24A, 24B, 24C) includes an X-ray source system located at an inspection region...
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5970116 |
Method of determining the density profile of a plate-shaped material
A method of non-destructively, on-line determining the density profile in a plate-shaped material with a density which varies discretely or continuously over the plate thickness, while the density...
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5949847 |
X-ray analyzing apparatus and x-ray irradiation angle setting method
An X-ray analyzing apparatus includes an X-ray tube, a monochromator crystal for making an X-ray monochromic, a slit, a moving table for supporting a product to be tested such as a semiconductor...
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5936255 |
X-ray, neutron or electron diffraction method using an imaging plate and apparatus therefor
An X-ray, neutron or electron diffraction method, which is devoid of the defects of conventional diffraction apparatus using an imaging plate, which can analyzing a sample, in a non-destructive...
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5917880 |
X-ray inspection apparatus
An apparatus particularly suited to the inspection of carp in trucks, shipping containers and the like uses a beam of high energy x-rays, e.g., in the order of 8 Mev. A first detector is aligned...
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5642393 |
Detecting contraband by employing interactive multiprobe tomography
An inspection system for detecting a specific material of interest in items of baggage or packages includes a multi-view X-ray inspection probe and one or more material sensitive probes. The...
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5640437 |
Goniometer
In a goniometer having several axes around which a crystal specimen to be examined can be rotated, a radiation source, a detector for Bragg reflections and a detector for fluorescence radiation,...
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5600700 |
Detecting explosives or other contraband by employing transmitted and scattered X-rays
An X-ray inspection device for detecting a specific material of interest (typically contraband, for example, weapons, drugs, money, explosives) in items of various sizes and shapes includes an...
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5579362 |
Method of and apparatus for the quantitative measurement of paint coating
An apparatus for and a method of measuring at least one painted layer formed on a sample to be analyzed, which sample may be, for example, a galvanized steel including a substrate having the...
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