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9036781 Amplified backscatter x-ray inspection system  
A method and apparatus for inspecting an object. A radiation generation system is configured to emit radiation. A detector system is configured to detect backscatter formed in response to the...
9031196 Adaptive scanning in an imaging system  
An imaging system exposes an object within a region to a beam of penetrating radiation. The beam of penetrating radiation is sensed on a side opposite the region from a source of the beam. An...
9031188 Internal imaging system  
A system for the inspection of the internal structure of a target includes at least one x-ray source that emits collimated x-rays to irradiate the target. At least one detector is positioned to...
9001970 Method and device for identifying unknown substances in an object  
The present invention relates to a method and a device for identifying unknown substances in an object. According to the state of the art a collimated X-ray beam is directed onto the object and...
9001969 Radiation imaging system  
An X-ray imaging system is provided with an X-ray source (11), first and second absorption gratings (31, 32), and a flat panel detector (FPD) (30), and obtains a phase contrast image of an object...
8983034 X-ray explosive imager  
A technique for use in security screening and detection contexts employs an X-ray explosive imager that acquires images from backscattered RF modulated X-ray signals on which a time series...
8976928 Radiographic apparatus and image acquiring method  
This invention has one object to provide radiographic apparatus with a compensating filter that allows simple and accurate estimation of direct radiation to acquire a radioscopic image or a...
8971492 Analysis method for X-ray diffraction measurement data  
Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks...
8934607 Measuring apparatus and measuring method  
In accordance with an embodiment, a measuring apparatus includes an electromagnetic wave applying unit, a detecting unit, a data processing unit, a film structure transforming unit, and a film...
8923481 Methods to perform backscatter inspection of complex targets in confined spaces  
Embodiments of backscatter inspection systems include features to enable inspection of irregular surfaces, tight spacer, and other hard-to-reach places. Some embodiments include arms that maneuver...
8908831 Covert surveillance using multi-modality sensing  
The present specification discloses a covert mobile inspection vehicle with a backscatter X-ray scanning system that has an X-ray source and detectors for obtaining a radiographic image of an...
8908830 Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement device  
There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a...
8903045 Backscatter system with variable size of detector array  
A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is...
8879688 Reconfigurable detector system  
A method and apparatus for inspecting an object using a backscatter inspection system. In one illustrative embodiment, an apparatus comprises a radiation source, a collimator, and a detector...
8873711 Method and system for visualizing effects of corrosion  
A method and system for visualizing the effects of corrosion are provided. In the context of a method, a workpiece is interrogated with radiation, such as by interrogating the workpiece with x-ray...
8842808 Scatter attenuation tomography using a monochromatic radiation source  
A system and methods for characterizing an inspected object on the basis of attenuation between identified regions of scattering and a plurality of detectors. An incident beam of substantially...
8831176 High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors  
This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a...
8774361 System for identifying radiation zones in X-ray imaging  
A system displays potential radiation zones in an angiography X-ray laboratory during an angiography procedure, for example, and identifies areas of potentially harmful radiation due to X-ray...
8768032 Method for correction of artifacts from edge detectors in compact geometry CT  
A computer-implemented method for correcting artifacts in measured image data due to differential scatter rejection in a computed tomography system is provided. A system for correcting artifacts...
8767918 X-ray scattering measurement device and X-ray scattering measurement method  
A X-ray scattering measurement device and measurement method can measure, with high resolution, the intensity of X-rays which have undergone small-angle scattering and diffraction with reflection...
8761338 Integrated backscatter X-ray system  
The different advantageous embodiments provide a method and apparatus for generating an x-ray beam. The x-ray beam is generated using an x-ray tube. The x-ray tube and a power supply are located...
8759765 Method for processing samples held by a nanomanipulator  
A method for processing a sample in a charged-particle beam microscope. A sample is collected from a substrate and the sample is attached to the tip of a nanomanipulator. The sample is optionally...
8705692 Laser-based accelerator for interrogation of remote containers  
A method and apparatus for generating high-energy beams of electrons or x-rays through laser wakefield acceleration to remotely examine containers is disclosed. By scanning the beam of electrons...
8649587 Methods, systems, and computer-program products for estimating scattered radiation in radiographic projections  
Several related inventions for estimating scattered radiation in radiographic projections are disclosed. Several of the inventions use scatter kernels of various forms, including symmetric and...
8647859 Apparatus and method for analyzing bacteria  
An apparatus for analyzing bacteria is described that includes an analytic sample preparation section for preparing an analytic sample by treating a specimen so as to generate a morphological...
8644453 Scanning systems  
The present application discloses methods and systems for scanning an object. The scanning system provides a first detector region having a thickness of at least 2 mm and a second detector region...
8644577 Method for generating image data of an object under examination, projection data processing device, X-ray system and computer program  
A method is disclosed for generating image data of an object under examination from X-ray projection data of the object under examination, wherein, before a reconstruction of the image data, the...
8600004 Method for obtaining a structure factor of an amorphous material, in particular amorphous glass  
An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity...
8548121 X-ray analyzer  
Provided is an X-ray analyzer that is capable of reducing measurement time necessary for mapping analysis by measuring only regions on a sample targeted by a measurer with minimal action. A...
8515011 System and method for dose verification radiotherapy  
A system and method for performing dose verification during radiation therapy. The system images photons created by Compton scatter events in the patient receiving treatment using a Compton camera...
8503610 X-ray inspection tool  
A method and apparatus for identifying a response to a plurality of x-rays are provided. In one advantageous embodiment, an apparatus comprising a housing, an x-ray tube, an anode, and an x-ray...
8442186 Backscatter energy analysis for classification of materials based on positional non-commutativity  
A system and methods for characterizing regions within, or on, an inspected object, wherein a lower-Z scattering material and a higher-Z material may both lie along a common line of sight. The...
8433037 X-ray radar  
A technique for generating three-dimensional information using radio frequency modulated X-rays includes both a method and an apparatus. In a first aspect, the method includes modulating an X-ray...
8411821 3D X-ray reflection microscopy imaging system  
The present disclosure presents, in various aspects and embodiments, a 3D X-ray reflection microscopy imaging technique. Some aspects are directed to various embodiments of an apparatus for use in...
8411820 3D x-ray microscopy imaging system  
The present disclosure presents, in various aspects and embodiments, a 3D X-ray microscopy imaging technique. Some aspects are directed to various embodiments of an apparatus for use in such a...
8401270 Examination of a region using dual-energy radiation  
A first image including a projection of a portion is generated based on data representing attenuation of higher-energy radiation having a peak energy of at least 1 MeV that passes through a...
8366848 Thick doped adhesive tape to enhance backscatter X-ray detectability  
Doped adhesive tape is used during the manufacture of aircraft, including positioning marks, covering orifices from debris, allowing locations to be marked. Any doped adhesive tape inadvertently...
8357894 Microcalorimetry for X-ray spectroscopy  
An improved microcalorimeter-type energy dispersive x-ray spectrometer provides sufficient energy resolution and throughput for practical high spatial resolution x-ray mapping of a sample at low...
8326011 Methods, systems, and computer-program products for estimating scattered radiation in radiographic projections  
Several related inventions for estimating scattered radiation in radiographic projections are disclosed. Several of the inventions use scatter kernels of various forms, including symmetric and...
8306187 Optimal detector position for gamma backscatter  
A method for determining the density of a fluid that includes disposing a gamma-ray source proximate to a vessel containing the fluid is provided. The optimal position of a gamma-ray detector with...
8270566 Adaptive scanning in an imaging system  
An object within a region is exposed to a first beam of penetrating radiation. The first beam of penetrating radiation is sensed on a side opposite the region from a source of the first beam. An...
8243880 Substrate measuring method and apparatus  
According to one embodiment of a substrate measuring method, a shape of a unit structure is measured by making an electromagnetic wave incident on a periodical structure and detecting a scattered...
8238513 Imaging system and method utilizing primary radiation  
An imaging system and method for producing an image based on primary radiation. A separate image based solely on scattered radiation may also be obtained and may be of practical interests. The...
8194822 X-ray inspection based on scatter detection  
Systems and methods for inspecting an object with a scanned beam of penetrating radiation. Scattered radiation from the beam is detected, in either a backward or forward direction. Characteristic...
8153418 Apparatus and method for analyzing bacteria  
An apparatus for analyzing bacteria is described that includes an analytic sample preparation section for preparing an analytic sample by treating a specimen so as to generate a morphological...
8149988 Use of nearly monochromatic and tunable photon sources with nuclear resonance fluorescence in non-intrusive inspection of containers for material detection and imaging  
Methods and systems for detecting potential items of interest in target samples, using nuclear resonance fluorescence, utilize incident photon spectra that are narrower than traditional...
8119991 Method and apparatus for accurate calibration of VUV reflectometer  
A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance...
8121249 Multi-parameter X-ray computed tomography  
The present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide...
8094781 Portable X-ray back scattering imaging systems  
Methods and systems for inspecting objects are disclosed. A portable X-ray backscatter imaging system includes a microfocus X-ray tube to emit X-rays at an object under inspection. A track system...
8094782 X-ray backscatter system for imaging soft tissue regions  
An x-ray source emits a cone beam a rapidly rotating, x-ray-opaque disc with four narrow radial slots. The slots break the cone beam into fan beams that are emitted to an x-ray-opaque plate with a...

Matches 1 - 50 out of 280 1 2 3 4 5 6 >