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7620148 X-ray diffraction (Xrd) means for identifying the content in a volume of interest and a method thereof  
The present invention discloses an XRD means for identifying the content of a volume of interest (VOI) and a method thereof. A remote XRD means is comprised inter alia of a plurality of x-ray...
7599463 Remote sensing device to detect materials of varying atomic numbers  
A remote sensing device for detecting materials of varying atomic numbers and systems and methods relating thereto. A system for identifying a material includes a photon beam flux monitor for...
7592591 X-ray analyzer using electron beam  
An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for...
7529340 Systems and methods for identifying a substance  
A method for iteratively identifying a substance is described. The method includes determining whether a function of a difference between an updated diffraction profile and an original diffraction...
7519154 Systems and methods for using a crystallinity of a substance to identify the substance  
A method for naming a substance is described. The method includes using a crystallinity of the substance to name the substance.
7358494 Material composition analysis system and method  
The material composition of a thin film formed on a substrate or covered by a cap layer that shares one or more elements with the thin film can be determined by combining characteristic material...
7321652 Multi-detector EDXRD  
A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors...
7254212 Particulate matter analyzer, collecting filter and system for analyzing and collecting samples from fluids  
A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass...
7248669 Method for analyzing membrane structure and apparatus therefor  
A method and apparatus for analyzing a membrane structure by fitting simulated operation data to measured data obtained by X-ray reflectivity measurement to analyze the membrane structure. The...
7239245 Method and device for monitoring position of radioactive materials in vehicles  
A method and device for monitoring the position of radioactive materials in vehicles relates to a technical field of monitoring of radioactive materials. The method comprises following steps:...
7184517 Analytical method for determination of crystallographic phases of a sample  
An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of...
7130376 X-ray reflectometry of thin film layers with enhanced accuracy  
A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a...
7103142 Material analysis using multiple X-ray reflectometry models  
A method for inspection of a sample includes irradiating the sample with a beam of X-rays, measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby...
7062014 X-ray analyzer for analyzing plastics  
An object is to reduce the influence of chlorine in plastics when the metal concentrations in the plastics are analyzed. In an X-ray analyzer including an X-ray generating part for irradiating...
7046834 Method for measuring bone mineral density by using X-ray image  
A method for measuring a bone mineral density, by use of an x-ray image, in a bone mineral density measuring system, includes the steps of: (a) obtaining an X-ray image of bone; (b) setting a...
7042978 Examination of material samples  
A device ( 1; 1 a ) for the examination of at least one material sample ( 3; 3 a , 3 b , 3 c ) which can be inserted into the device ( 1; 1 a ) and is irradiated by means of electromagnetic waves (...
7039158 Multi-technique thin film analysis tool  
A thin film analysis system includes multi-technique analysis capability. Grazing incidence x-ray reflectometry (GXR) can be combined with x-ray fluorescence (XRF) using wavelength-dispersive x-ray...
6907107 Method and apparatus for the analysis of material composition  
A method is provided of analysing the composition of a semiconductor material ( 3 ) comprising irradiating the material with energy from an energy source ( 1 ) which energy is diffracted from the...
6788760 Methods and apparatus for characterizing thin films  
Methods and apparatus are providing for characterizing thin films in an integrated circuit device. A target including multiple layers is scanned using an x-ray emission inducer. X-ray emissions...
6744850 X-ray reflectance measurement system with adjustable resolution  
An x-ray reflectometry system for measuring thin film samples. The system includes an adjustable x-ray source, such that characteristics of an x-ray probe beam output by the x-ray source can be...
6577705 Combinatorial material analysis using X-ray capillary optics  
Method and system for analyzing local composition and structure of a compound having one or more non-zero gradients in concentration for one or more selected constituents in a selected direction. A...
6574305 Device and method for the inspection of the condition of a sample  
A device and method having a stationary radiation source for directing polychromatic radiation such that the radiation is incident on a sample to be inspected in parallel or diverging rays, and a...
6526119 Method and arrangement for determining the moisture content of wood chips  
A method and arrangement for measuring the moisture content of a flow of wood chips, through which collimated gamma radiation is directed attenuation of which in the flow of wood chips is measured....
6285736 Method for X-ray micro-diffraction measurement and X-ray micro-diffraction apparatus  
An X-ray micro-diffraction measuring method for detecting X-rays diffracted at a minute portion of a specimen upon irradiating the minute portion with X-rays is disclosed. A cylindrical stimulation...
6118850 Analysis methods for energy dispersive X-ray diffraction patterns  
Energy dispersive x-ray diffraction spectra are obtained from numerous volume elements within an object. A feature set such as a set of cepstrum coefficients is extracted from each spectrum and...
6108401 Method of standard-less phase analysis by means of a diffractogram  
A method of determining the concentrations of the constituents in a mixture of substances by way of an X-ray diffractogram of the mixture. The fundamental difficulty that it is not possible to...
6040198 Element concentration measuring method and apparatus, and semiconductor device fabrication method and apparatus  
X-rays are irradiated to a sample to be measured including at least one layer of film formed on a substrate; an interference oscillation curve of the X-rays incident on the sample to be measured is...
6002136 Microscope specimen holder and grid arrangement for in-situ and ex-situ repeated analysis  
A specimen holder and specimen grid orientation arrangement facilitating in-situ and ex-situ repeated analysis of a specimen in a microscope. The arrangement includes a specimen grid, to which the...
5923720 Angle dispersive x-ray spectrometer  
An x-ray spectrometer is provided comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved crystal monochromator...
5838757 Hard x-ray polycapillary telescope  
An x-ray telescope has a tubular housing subdivided into M number of radial segments each having a detector for detecting x-rays and an optic module for focussing x-rays onto the detector. The...
5812630 Examination method for the evaluation of location-dependent spectra  
The invention relates to an examination method whereby a respective spectrum with a number of spectral values is measured for a number of locations. Collective evaluation of the old spectra is...
5790628 X-ray spectroscope  
The following arrangement is adopted to achieve an X-ray spectroscope capable of simultaneously spectrally analyzing, with a single spectral scanning, X-rays emitted from a point-like X-ray source...
5745543 Apparatus for simultaneous X-ray diffraction and X-ray fluorescence measurements  
In the case of simultaneous diffraction and fluorescence measurements in an apparatus for X-ray analysis comprising only one X-ray tube, a problem is encountered in that due to the presence of the...
5530732 Method and apparatus for evaluating thin-film multilayer structure  
A method of determining the compositions and thicknesses of metamorphic layers at heterointerfaces of periodic laminated structures, such as multiple quantum well structures. An X-ray diffraction...
5475727 Intelligent automatic gain stabilization for radiation detection instrument  
An intelligent automatic gain stabilization method and apparatus for a radiation detection instrument automatically locate the position of a predetermined characteristic within an energy spectrum,...
5438613 X-ray analysis apparatus and scanning unit suitable for use in such an apparatus  
An X-ray analysis apparatus includes a scanning unit (1) with an X-ray source (3), a crystal holder (9) and an X-ray detection system (5) provided with an X-ray detector (7). The crystal holer (9)...
5414747 Method and apparatus for in-process analysis of polycrystalline films and coatings by x-ray diffraction  
An accurate, real-time method for monitoring and analyzing crystalline specimens having polycrystalline platings. The method is capable of individual or simultaneous analysis of any combination of...
5406609 X-ray analysis apparatus  
An X-ray analysis apparatus including an artificial multi-layered grating for rendering X-ray beams to be monochromatic before they are incident on a specimen to be analyzed. This artificial...
5369572 Radiographic image processing method wherein small variation of density is selectively made clear  
A method for processing a radiographic image, containing: a step for calculating an average S m of original image data of an averaging area around each pixel of the radiographic image; and a step...
5353324 Total reflection X-ray diffraction micrographic method and apparatus  
A method for detecting and evaluating crystal defects existing in the extreme neighborhood of the surface of a crystal specimen through the use of X-ray analyzing micrography. Synchrotron radiation...
5305366 Thin film forming apparatus  
This invention relates to a method and apparatus for analyzing a plurality of elements that are present on the surface of a material of interest or in its neighborhood, as well as a thin-film...
5132997 X-ray spectroscopic analyzing apparatus  
An X-ray spectroscopic analyzing apparatus which comprises a source of X-rays, a first analyzing crystal for diffracting the X-rays from the X-ray source, and a second analyzing crystal for...
5073915 Densitometer for the on-line concentration measurement of rare earth metals and method  
The invention is particularly useful for multi-element solutions wherein successive pairs of X-ray beams are generated and passed through the solution sample corresponding to each of the successive...
5068883 Hand-held contraband detector  
A light-weight hand-held contraband detection system (10) includes two different sources (74) of low energy gamma rays. Each gamma ray source selectively emits gamma rays at a different energy...
5065416 On-line slurry ash monitoring system  
An on-line slurry ash monitoring system for evaluating the composition of coal slurries in coal preparation plants. A coal slurry is introduced into a sample reservoir where it is removed and...
5014287 Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants  
A portable x-ray fluorescence spectrometer has a portable sensor unit containing a battery, a high voltage power supply, an x-ray tube which produces a beam x-ray radiation directed toward a target...
5008910 X-ray analysis apparatus comprising a saggitally curved analysis crystal  
An X-ray analysis apparatus comprises an analysis crystal which is cylindrically curved in the saggital direction. As a result, a beam diffracted by the crystal is collimated in that direction,...
4988872 Electron probe microanalyzer having wavelength-dispersive x-ray spectrometer and energy-dispersive x-ray spectrometer  
An electron probe microanalyzer equipped with a wavelength-dispersive x-ray spectrometer and also with an energy-dispersive x-ray spectrometer. X-rays emanating from the same sample region are...
4975920 RF discharge excitation laser apparatus  
A matching means (2) is arranged in a power source portion (5) including an RF power source (1), an output impedance (Z 0 ) of the RF power source (1) is matched by the matching means with a...
4974244 Sample positioning method and system for X-ray spectroscopic analysis  
A method of positioning a sample for X-Ray spectroanalysis at a spectroscopic machine that includes the steps of determining the point of primary focus of an X-Ray beam upon a master grid and then...
Matches 1 - 50 out of 143 1 2 3 >