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9001967 Spectral grating-based differential phase contrast system for medical radiographic imaging  
Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital radiographic imaging system and methods for same that can include an x-ray source for radiographic...
9001968 Method for characterization of a spherically bent crystal for Kα X-ray imaging of laser plasmas using a focusing monochromator geometry  
A method is provided for characterizing spectrometric properties (e.g., peak reflectivity, reflection curve width, and Bragg angle offset) of the Kα emission line reflected narrowly off angle of...
8934607 Measuring apparatus and measuring method  
In accordance with an embodiment, a measuring apparatus includes an electromagnetic wave applying unit, a detecting unit, a data processing unit, a film structure transforming unit, and a film...
8908824 Imaging apparatus  
An imaging apparatus includes, a diffraction grating that diffracts an electromagnetic wave emitted from an electromagnetic wave source, a shield grating including a shield portion that prevents...
8781071 Method for extracting a primary diffusion spectrum  
A method and device for spectrometry analysis and for extracting a primary diffuse spectrum from a diffusion spectrum of diffuse radiation, according to a diffusion angle, coming from a material...
8767914 Structure, method of manufacturing the same, and imaging apparatus  
A method of manufacturing a structure includes a step of preparing a substrate including a silicon section, recessed sections and protruding sections formed by etching the silicon section, and a...
8755487 Diffraction grating and alignment method thereof, and radiation imaging system  
An X-ray imaging system includes first to third absorption gratings. Initially, the third absorption grating is disposed in a Z axis orthogonal to a detection surface of a FPD, and the position of...
8737565 Compound x-ray lens having multiple aligned zone plates  
A compound zone plate comprising a first zone plate frame including a first zone plate, a second zone plate frame including a second zone plate, and a base frame to which the first zone plate...
8693631 Craser device, imaging system and method  
A craser device, imaging system utilizing a craser device, and a method of imaging. The craser device includes a gain medium with excited gain medium atoms that emit x-ray and/or gamma-ray...
8675816 X-ray spectrometer  
The invention relates to X-ray spectral analysis and can be used for control of radiation spectra of X-ray generators as well as for analysis of elemental chemical composition and atomic structure...
8600004 Method for obtaining a structure factor of an amorphous material, in particular amorphous glass  
An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity...
8537967 Short working distance spectrometer and associated devices, systems, and methods  
A spectrometer includes a rigid body having a first planar face with an orientation and a second planar face with a different orientation than the first planar face. The first and second planar...
8401270 Examination of a region using dual-energy radiation  
A first image including a projection of a portion is generated based on data representing attenuation of higher-energy radiation having a peak energy of at least 1 MeV that passes through a...
8357894 Microcalorimetry for X-ray spectroscopy  
An improved microcalorimeter-type energy dispersive x-ray spectrometer provides sufficient energy resolution and throughput for practical high spatial resolution x-ray mapping of a sample at low...
8243879 Source grating for X-rays, imaging apparatus for X-ray phase contrast image and X-ray computed tomography system  
A source grating for X-rays and the like which can enhance spatial coherence and is used for X-ray phase contrast imaging is provided. The source grating for X-rays is disposed between an X-ray...
8233682 Methods and systems for improving spatial and temporal resolution of computed images of moving objects  
A method of improving a resolution of an image using image reconstruction is provided. The method includes acquiring scan data of an object and forward projecting a current image estimate of the...
8155270 Synergistic energy-dispersive and wavelength-dispersive X-ray spectrometry  
An X-ray spectroscope collects an energy-dispersive spectrum from a sample under analysis, and generates a list of candidate elements that may be present in the sample. A wavelength dispersive...
8119991 Method and apparatus for accurate calibration of VUV reflectometer  
A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance...
8068582 Methods and systems for the directing and energy filtering of X-rays for non-intrusive inspection  
Systems and methods are disclosed herein for lenses based on crystal X-ray diffraction and reflection to be used to direct and energy filter X-ray beams.
7995706 Electromagnetic wave/particle beam spectroscopic method and electromagnetic wave/particle beam spectroscopic instrument  
The present invention provides an electromagnetic wave/particle beam spectroscopic instrument that is not easily deteriorated in spectroscopic capability, and is resistant to electromagnetic...
7924973 Interferometer device and method  
The present invention discloses an interferometer device and method. In embodiments, the device comprises an electromagnetic radiation source emitting radiation having a first mean wavelength λLE;...
7847274 Localization of a radioactive source within a body of a subject  
A computerized system 40 for locating a device. System 40 includes a sensor module 20 and a CPU 42. A radioactive source 38, associated with the device, produces a signal in the form of...
7796726 Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation  
An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a...
7742565 Method and apparatus for analysis using X-ray spectra  
A method for precisely measuring and displaying the whole profile of an X-ray spectral waveform, which rises from a background level and finally returns to the background level after passing...
7729743 Method and arrangement for tracking a medical instrument  
The invention relates to a method and an arrangement for the intravascular or intracardial navigation of a catheter (5). Using an X-ray fluoroscopy device (1), firstly an image database of 2D...
7688946 Method and device for measuring bond energy  
The adhesion between two layers, in particular two thin layers of a microelectronic device, is a data item of importance. It was found that the closure ratio of the interface could be used, in...
7643604 Stationary inspection system for three-dimensional imaging employing electronic modulation of spectral data from Compton-scattered gammas  
An inspection system according to various embodiments can include a stationary mono-energetic gamma source and a detector-spectrometer. The detector-spectrometer is configured to employ a...
7592591 X-ray analyzer using electron beam  
An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted...
7499520 X-ray imaging apparatus and method with an X-ray interferometer  
A sample which includes a region exhibiting a large density change, such as, bones or lungs and a region exhibiting a small density change, such as, biological soft tissues, and whose measurement...
7469037 Method for detecting a mass density image of an object  
A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an...
7412022 Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas  
A three-dimensional image-generating device is an inspection system incorporating three components: a radiation source, a modulating unit, and a radiation detector. All three components of the...
7394890 Optimized x-ray energy for high resolution imaging of integrated circuits structures  
An x-ray imaging system uses particular emission lines that are optimized for imaging specific metallic structures in a semiconductor integrated circuit structures and optimized for the use with...
7358494 Material composition analysis system and method  
The material composition of a thin film formed on a substrate or covered by a cap layer that shares one or more elements with the thin film can be determined by combining characteristic material...
7352845 Energy dispersion type X-ray diffraction/spectral device  
A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at...
7346145 X-ray imaging system  
To obtain an image that uses both an accurate spatial differential of an object-caused phase shift and the phase shift as contrast at a small observation field of view and under a simplified...
7330530 Diffraction enhanced imaging method using a line x-ray source  
A method for detecting an enhanced image of an object by independently analyzing, detecting, digitizing, and combining images acquired on a high and a low angle side of a rocking curve of a...
7321652 Multi-detector EDXRD  
A method for analysis of a sample includes irradiating an area of the sample with a polychromatic X-ray beam. X-rays scattered from the sample are detected using a plurality of detectors...
7242746 Method for manufacturing a reflector for X-ray radiation  
A method for manufacturing a reflector (5) for X-ray radiation (2, 3, 10, 11) which is curved in a non-circular arc shape, along a first cross-section (13) in a plane (XZ) which contains a...
7130376 X-ray reflectometry of thin film layers with enhanced accuracy  
A method for inspection of a sample that includes a first layer having a known reflectance property and a second layer formed over the first layer. The method includes directing radiation toward a...
7103142 Material analysis using multiple X-ray reflectometry models  
A method for inspection of a sample includes irradiating the sample with a beam of X-rays, measuring a distribution of the X-rays that are emitted from the sample responsively to the beam, thereby...
7076025 Method for detecting a mass density image of an object  
A method for detecting a mass density image of an object. An x-ray beam is transmitted through the object and a transmitted beam is emitted from the object. The transmitted beam is directed at an...
7062015 Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector  
Apparatus for imaging an object (13) irradiated with an X-ray beam (12) by detecting a transmitted X-ray beam transmitted through the object. A crystal analyser (15) receives the transmitted X-ray...
7003075 Optical measuring device  
The present invention provides a measuring device by which, even if a radiation intensity from a light source, a beam size or a beam intensity distribution of the light source changes, an optical...
6947521 Imaging method based on attenuation, refraction and ultra-small-angle-scattering of x-rays  
A method for detecting an image of an object by measuring the intensity at a plurality of positions of a transmitted beam of x-ray radiation emitted from the object as a function of angle within...
6907108 Dual-wavelength x-ray monochromator  
A method for testing a surface includes finding respective first and second critical angles for total external reflection of radiation from an area of the surface at first and second wavelengths....
6898270 X-ray optical system with collimator in the focus of an X-ray mirror  
An X-ray optical system with an X-ray source (Q) and a first graded multi-layer mirror (A), wherein the extension Qx of the X-ray source (Q) in an x direction perpendicular to the connecting line...
6829327 Total-reflection x-ray fluorescence apparatus and method using a doubly-curved optic  
An improved total-reflection x-ray fluorescence (TXRF) apparatus using a doubly-curved optic is presented for use in detecting foreign matter on surfaces, for example, semiconductor wafers. The...
6809864 Multi-layer structure with variable bandpass for monochromatization and spectroscopy  
A grating that includes a multilayer structure that has alternating layers of materials, a plurality of grooves formed between a plurality of lands, wherein at least one structural parameter of...
6754305 Measurement of thin films and barrier layers on patterned wafers with X-ray reflectometry  
The teachings of the subject invention lead to a new application of the XRR and RXRR systems. In particular, it has been recognized for the first time that such systems can be used to measure...
6744850 X-ray reflectance measurement system with adjustable resolution  
An x-ray reflectometry system for measuring thin film samples. The system includes an adjustable x-ray source, such that characteristics of an x-ray probe beam output by the x-ray source can be...
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