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8139715 |
Method and composition for crystallizing G protein-coupled receptors
Certain embodiments provide a method for crystallizing a GPCR. The method may employ a fusion protein comprising: a) a first portion of a G-protein coupled receptor (GPCR), where the first portion...
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8130908 |
X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source...
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8119991 |
Method and apparatus for accurate calibration of VUV reflectometer
A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance...
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8111807 |
Crystallite size analysis method and apparatus using powder X-ray diffraction
A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle θ via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the ...
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7885383 |
Method for measuring crystallite size with a two-dimensional X-ray diffractometer
Crystallite size in a sample is determined by performing a quantitative γ-profile analysis on a diffraction ring in a two-dimensional X-ray diffraction pattern. In particular, a two-dimensional ...
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7844028 |
X-ray diffraction method
An X-ray diffraction method for the analysis of polycrystalline materials, the method comprising: (a) providing a polycrystalline material for analysis; (b) providing a polychromatic X-ray source,...
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7801272 |
X-ray diffraction apparatus and X-ray diffraction method
In an X-ray diffraction method using the parallel beam method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter...
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7792250 |
Method of selecting a wellbore cement having desirable characteristics
A method for determining the ability of a cement composition to withstand subterranean formation conditions comprising obtaining an experimental diffraction pattern of the cement composition,...
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7769135 |
X-ray diffraction wafer mapping method for rhombohedral super-hetero-epitaxy
A new X-ray diffraction (XRD) method is provided to acquire XY mapping of the distribution of single crystals, poly-crystals, and twin defects across an entire wafer of rhombohedral...
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7739075 |
Method for computing crystal shapes from X-ray diffraction data (XRD) of a substance
The present invention relates to a method for computing external crystal shapes from X-Ray Diffraction Data (XRD) of a substance. Each diffraction peak arises from a set of crystal planes and the...
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7712960 |
Device for optimization of experimental parameters on synchrotron beam lines
Enhanced methods and a device enabling a plurality of tools for implementing a plurality of procedures for the accurate alignment and calibration of multiple components of the experimental set up...
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7702071 |
Method for performing power diffraction analysis
A method for successively performing a powder diffraction analysis of at least two powder samples being contained in sample holding means. Use is made of an apparatus comprising:—a source of r...
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7680246 |
Method and device for judging polarity of single crystal sample
Wavelength dependence of diffraction X-ray intensity of a single crystal sample is measured using an X-ray incident optical system of simple structure so that the polarity of the single crystal...
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7583788 |
Measuring device for the shortwavelength x ray diffraction and a method thereof
A measuring device for the short-wavelength X-ray diffraction for test samples or work pieces made of lower-atomic-number crystalline and a method thereof are disclosed in the present invention....
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7558371 |
Method of generating X-ray diffraction data for integral detection of twin defects in super-hetero-epitaxial materials
A method provides X-ray diffraction data suitable for integral detection of a twin defect in a strained or lattice-matched epitaxial material made from components having crystal structures having...
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7542546 |
Sample mounts for microcrystal crystallography
Sample mounts (10) for mounting microcrystals of biological macromolecules for X-ray crystallography are prepared by using patterned thin polyimide films (12) that have curvature imparted thereto,...
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7519154 |
Systems and methods for using a crystallinity of a substance to identify the substance
A method for naming a substance is described. The method includes using a crystallinity of the substance to name the substance.
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7483512 |
Variable centre diffractometer
A diffractometer, having variable center and suitable for performing analysis on hidden or hardly accessible bodies or specimens is described. Said variable center diffractometer is equipped with...
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7471766 |
X-ray diffraction apparatus
Disclosed is an X-ray apparatus having an X-ray source, an X-ray detector, a divergence slit, and a scattering slit. The incident angle θ of X-ray to be irradiated on a sample is changed at a ...
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7438472 |
Automatic cryoloop alignment for protein crystals
Methods and apparatus for implementing robust and efficient cryoloop auto-centering for crystal location and alignment to the x-ray beam are provided. Image processing techniques are used for...
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7421060 |
Method of determining an orientation of a crystal lattice of a first substrate relative to a crystal lattice of a second substrate
According to an illustrative embodiment disclosed herein, a semiconductor structure comprising a first crystalline substrate and a second crystalline substrate is provided. The semiconductor...
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7352845 |
Energy dispersion type X-ray diffraction/spectral device
A white X-ray generating means and an X-ray detecting means are respectively moved to a first position and a second position that are separated, X-ray intensities, for each energy, detected at...
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7337098 |
Diffraction condition simulation device, diffraction measurement system, and crystal analysis system
A diffraction condition simulation device capable of calculating the UB matrix and the rotation matrix R and also their multiplication RUB, thereby obtaining and displaying any Bragg reflection...
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7269245 |
Combinatorial screening system and X-ray diffraction and Raman spectroscopy
A sample analysis system makes use of both X-ray diffraction analysis and Raman spectroscopy of a sample. The sample is part of a sample library that is mounted on an XYZ stage that allows each...
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7258485 |
X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer
An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a...
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7260178 |
Diffractometer and method for diffraction analysis
Diffractometer and method for diffraction analysis making use of two Euler cradles, a primary and a secondary Euler cradle. The primary Euler cradle supports a source of a radiation beam, having a...
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7227983 |
Automated macromolecular crystal detection system and method
An automated macromolecular method and system for detecting crystals in two-dimensional images, such as light microscopy images obtained from an array of crystallization screens. Edges are detected...
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7209542 |
Simultaneous measurement of the reflectivity of X-ray with different orders of reflections and apparatus for measurement thereof
Disclosed are an apparatus and a method for simultaneously measuring integrated reflectivity of X-rays with different orders of reflections in crystal. Continuous X-rays are incident into the...
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7208580 |
Atomic structure of the hemalbumin complex and its use in designing therapeutic compounds
A high resolution structure of the hemalbumin binding complex is provided which includes the detailed atomic coordinates which reflect the binding site and the binding characteristics of the...
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7184517 |
Analytical method for determination of crystallographic phases of a sample
An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of...
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7183547 |
Element-specific X-ray fluorescence microscope and method of operation
An element-specific imaging technique utilizes the element-specific fluorescence X-rays that are induced by primary ionizing radiation. The fluorescence X-rays from an element of interest are then...
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7160718 |
Controlled sample environment for analytical devices
Apparatus for examining a sample by microscopy, spectroscopy or crystallography under controlled environmental conditions. The apparatus comprises a sample chamber (1) which is fed by a gas stream...
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7158609 |
X-ray crystal orientation measuring method and X-ray crystal orientation measuring apparatus
An X-ray crystal orientation measuring apparatus and a method thereof, for enabling to measure distribution of crystal orientations upon a crystal having the sub-grain structure, lineage structure,...
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7149280 |
Synthesis and screening of ligands using X-ray crystallography
A method for identifying a ligand of a target macromolecule is disclosed, comprising the steps of: soaking one or more crystals of the target macromolecule in a solution containing a collection of...
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7144457 |
Methods and devices for analyzing crystalline content of precipitates and crystals without isolation
Systems and methods are provided for evaluating a crystallization experiment, where a crystallization experiment of a molecule is to X-rays while housed within a container in which the...
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7116754 |
Diffractometer
A monochromator 4 is used to direct X-rays from X-ray source 2 onto a sample 14 as a convergent beam. The sample 14 is in a growth chamber. The sample is rotated, and diffraction measurements are...
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7116753 |
Method for determination of elastic strains present in single-crystal wafers and device for its realization
Action on the tested wafer 1 is rendered with X-ray beam 3 converging in a point located inside the wafer or under it. Determination of relative position of the interference maxima is performed for...
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7079621 |
Vertical transmission diffraction analysis
The present invention relates to a method for performing a transmission diffraction analysis of an analyte on a support surface, wherein the method comprises: irradiating said analyte with a...
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7072441 |
Alignment diffractometer
The invention is concerned with a method f alignment for aligning crystal planes of a wafer substrate (40) to lithographic features thereon, the method characterized in that it includes the steps...
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7003074 |
Stress measurement method using X-ray diffraction
A stress of a c-axis-oriented specimen of a tetragonal polycrystal is measured using X-ray diffraction under the assumption of a plane stress state. An X-ray optical system is set in the location...
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6937694 |
Pole measuring method
A method for measuring a pole of a sample, using a reflection method, is effective substantially over all measurement regions ranging from the region of high-tilting-angle α of a conventional pole ...
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6907107 |
Method and apparatus for the analysis of material composition
A method is provided of analysing the composition of a semiconductor material (3) comprising irradiating the material with energy from an energy source (1) which energy is diffracted from the...
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6891925 |
Method to determine the three-dimensional atomic structure of molecules
The invention presents an x-ray method for determining the three-dimensional molecular structure of molecules having an unknown structure. The molecules having unknown structure are arranged in a...
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6882739 |
Method and apparatus for rapid grain size analysis of polycrystalline materials
An apparatus and method for performing rapid grain size analysis on a textured polycrystalline material, by generating average grain size and grain size distribution data from x-ray diffraction...
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6859519 |
Method and system for analyzing diffraction data from crystalline systems
A method and system for indexing powder diffraction data are disclosed comprising choosing a maximum impurity peak tolerance level for a crystallography data search, choosing a range of number of...
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6836532 |
Diffraction system for biological crystal screening
A biological crystal formation screening apparatus uses an x-ray diffraction technique to analyze the sample containers of a sample tray for the presence of crystal formation. An x-ray source is...
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6821361 |
Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them
A method and apparatus for quantitatively measuring a metal phase contained in a galvanized layer by X-ray diffractometry, and a method of producing a galvanized steel sheet by using the method and...
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6782075 |
Method of making <200 nm wavelength fluoride crystal lithography/laser optical elements
The invention provides for the making of <200 nm wavelength fluoride crystal optical elements from selected fluoride single crystals of determined quality. The invention relates to a method of...
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6775350 |
Method of examining a wafer of semiconductor material by means of X-rays
A method of examining a wafer of crystalline semiconductor material by means of X-rays, in which method a surface of the wafer is scanned by means of an X-ray beam and secondary radiation generated...
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6751287 |
Method and apparatus for x-ray analysis of particle size (XAPS)
The apparatus comprises an X-ray source (112), a monochromator (118), a goniometer (170), a position sensitive detector (150), a mechanism to rock or rotate the sample or the X-ray source and...
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