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9031201 X-ray source, X-ray imaging apparatus, and X-ray computed tomography imaging system  
An X-ray imaging apparatus includes: an X-ray source including an electron source and a target, the target having a plurality of projections, each having an emitting surface; a diffraction grating...
9001967 Spectral grating-based differential phase contrast system for medical radiographic imaging  
Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital radiographic imaging system and methods for same that can include an x-ray source for radiographic...
9001969 Radiation imaging system  
An X-ray imaging system is provided with an X-ray source (11), first and second absorption gratings (31, 32), and a flat panel detector (FPD) (30), and obtains a phase contrast image of an object...
8971483 X-ray composite apparatus  
There is provided an X-ray composite apparatus capable of performing, with one unit, X-ray CT and element analysis by fluorescent X-rays. The X-ray composite apparatus 100 includes an X-ray source...
8971492 Analysis method for X-ray diffraction measurement data  
Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks...
8923480 X-ray diffraction instrument  
There is provided an X-ray diffraction instrument including: a two-dimensional plate-like X-ray detector; an X-ray emitter integrated with the X-ray detector so as to penetrate the plate of the...
8913718 Method for identifying nano textile  
A method for identifying a nano textile, including: (1) determining whether a textile belongs to a woven fabric or a non-woven fabric by appearance; and (2) when the textile is a woven fabric,...
8908274 Microstructure manufacturing method and microstructure  
A microstructure manufacturing method includes: preparing a mold having on a front side thereof a plurality of fine structures, with conductivity being imparted to a bottom portion between the...
8903044 X-ray diffraction apparatus  
An X-ray shielding member is provided so as to confront an X-ray incident face of a sample, and a gap through which an X-ray emitted from an X-ray source is passed and irradiated to an X-ray...
8867704 Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source  
A method for performing an X-ray diffractometry analysis of a crystalline and/or amorphous sample, by means of an optical X-ray apparatus having an X-ray source with an X-ray anode constructed...
8744046 Method and apparatus of precisely measuring intensity profile of X-ray nanobeam  
Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform...
8731138 High-resolution X-ray diffraction measurement with enhanced sensitivity  
A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the...
8699665 Wavelength-classifying type X-ray diffraction device  
A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the...
8687766 Enhancing accuracy of fast high-resolution X-ray diffractometry  
A method for analysis includes directing a converging beam of X-rays toward a surface of a sample and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a...
8625740 System and method for correcting X-ray diffraction profiles  
A method for correcting an X-ray diffraction (XRD) profile measured by an X-ray diffraction imaging (XDi) system is provided. The XDi system includes an anode, a detector, and a control system....
8605858 Methods and systems for inspecting structures for crystallographic imperfections  
Embodiments of methods and systems for inspecting a structure for a crystallographic imperfection are provided. In the method, an X-ray wavelength that is particularly susceptible to diffraction...
8600004 Method for obtaining a structure factor of an amorphous material, in particular amorphous glass  
An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity...
8592764 X-ray detector for electron microscope  
Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on...
8553840 Biometric diagnosis  
The invention provides a method of detecting neoplastic or neurological disorders comprising exposing skin or nails to X-ray diffraction and detecting changes in the ultrastructure of the skin or...
8548123 Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer  
An area detector used in a two-dimensional system is used as a point detector in Bragg-Brentano and other geometries by providing the area detector with a mask the limits the area through which...
8537967 Short working distance spectrometer and associated devices, systems, and methods  
A spectrometer includes a rigid body having a first planar face with an orientation and a second planar face with a different orientation than the first planar face. The first and second planar...
8488740 Diffractometer  
A compact powder diffractometer has one or more detectors arranged no more than 300 mm, in an example 55 mm, from a sample stage for mounting a powder sample. High resolution is nevertheless...
8477904 X-ray diffraction and computed tomography  
An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be...
8472587 Collimator with an adjustable focal length  
The invention relates to a collimator with adjustable focal length, especially for use in X-ray testing devices whose operating principle is based on diffraction phenomena in an object. Fixed...
8410439 X-ray detector for electron microscope  
Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on...
8406379 Curvature distribution crystal lens and X-ray reflectometer  
In one embodiment of the present invention, a curvature distribution crystal lens of the present invention is obtained via press-molding. In the case of a Ge single crystal plate, a temperature...
8340248 X-ray diffraction method and X-ray diffraction apparatus  
In an X-ray diffraction method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The...
8311183 Online energy dispersive X-ray diffraction analyser  
An on-line EDXRD analyser including (i) a housing defining an analysis zone and having a passageway through it to allow transport of material in a process stream to pass through the analysis zone,...
8243878 High-resolution X-ray diffraction measurement with enhanced sensitivity  
A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the...
8204174 Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources and by use of facing sides of adjacent monochromator crystals  
Systems and methods for detecting an image of an object by use of X-ray beams generated by multiple small area sources are disclosed. A plurality of monochromator crystals may be positioned to...
8139711 Radiation phase image radiographing apparatus  
A radiation phase image radiographing apparatus, including a radiation emission unit having multiple radiation sources for emitting radiation onto a subject, the radiation sources being...
8119991 Method and apparatus for accurate calibration of VUV reflectometer  
A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance...
8111807 Crystallite size analysis method and apparatus using powder X-ray diffraction  
A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle θ via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the...
8041086 Method of detecting specific polymer crystal  
In a specific macromolecule crystal detecting method according to the present invention, ultraviolet light is irradiated to sample solution, and a fluorescent image emitted from a sample in the...
8036338 Method and device for simultaneous measurement of magnetostriction and magnetization  
Since measurement of magnetostriction is accompanied by measurement of magnetization, magnetostriction and magnetization are measured conventionally by separately prepared devices, with efforts...
8000444 Vertical/horizontal small angle X-ray scattering apparatus and method for measuring small angle X-ray scattering  
A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small...
7991109 X-ray multichannel spectrometer  
An X-ray multichannel spectrometer comprising a polychromatic source (2), a holding means (3) for holding a sample (1), a fluorescence channel (4) that selects X-ray beams of a special wavelength...
7983388 X-ray analysis instrument with adjustable aperture window  
An X-ray analysis instrument, in particular, an X-ray diffractometer (21), has an X-ray source (22; SC) that emits an X-ray beam (23), an X-ray optics (24), in particular a multi-layer X-ray...
7924977 Methods, a processor, and a system for improving an accuracy of identification of a substance  
Methods, a processor, and a system for improving an accuracy of identification of a substance are described. One of the methods includes determining whether a relative molecular interference...
7920676 CD-GISAXS system and method  
CD-GISAXS achieves reduced measurement times by increasing throughput using longer wavelength radiation (˜12×, for example) such as x-rays in reflective geometry to increase both the collimation...
7901136 Methods and system for calibrating and correcting a detection system  
A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a...
7885383 Method for measuring crystallite size with a two-dimensional X-ray diffractometer  
Crystallite size in a sample is determined by performing a quantitative γ-profile analysis on a diffraction ring in a two-dimensional X-ray diffraction pattern. In particular, a two-dimensional...
7864922 Wavelength-dispersive X-ray spectrometer  
An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of...
7860217 X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same  
An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a generator for generating a characteristic X-ray to be irradiated upon a sample to be...
7856083 System and method to account for cross-talk among coherent scatter detectors  
A method to account for cross-talk among a plurality of coherent scatter detectors of a multi-detector inverse fan beam x-ray diffraction imaging (MD-IFB XDI) system. The MD-IFB XDI system...
7852983 X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position  
An X-ray diffractometer has a mechanism without toothed ring and is suited to move the two legs of a goniometer, on which the source and detector are respectively disposed, at the same time and in...
7848489 X-ray diffractometer having co-exiting stages optimized for single crystal and bulk diffraction  
A diffractometer for X-ray diffraction measurements has two co-exiting sample stages which are mounted on the goniometer base simultaneously. A rotation stage is used for single crystal X-ray...
7835495 System and method for X-ray diffraction imaging  
An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive...
7831019 System and methods for characterizing a substance  
A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first...
7817779 Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device  
Non-destructive analysis is carried out by irradiating an object with X-rays, for example, so that the X-rays from the object are incident on an analyzer crystal. The analyzer crystal can be of a...

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