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9022651 X-ray diffraction-based defective pixel correction method using an active pixel array sensor  
A method for correcting erroneous intensity measurements caused by defective pixels of the detector for a single-crystal X-ray diffraction system uses collected diffraction images and a defective...
9020098 Radiation imaging apparatus  
A radiation imaging apparatus according to the present invention includes a radiation source, a reflective structure where at least three reflective substrates are arranged with an interval and...
9001969 Radiation imaging system  
An X-ray imaging system is provided with an X-ray source (11), first and second absorption gratings (31, 32), and a flat panel detector (FPD) (30), and obtains a phase contrast image of an object...
8971492 Analysis method for X-ray diffraction measurement data  
Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks...
8942448 Image processing device, image processing method, and program  
There is provided an image processing device including a body hair detection unit that detects a body hair region corresponding to body hair from a process target image that includes skin, a...
8934607 Measuring apparatus and measuring method  
In accordance with an embodiment, a measuring apparatus includes an electromagnetic wave applying unit, a detecting unit, a data processing unit, a film structure transforming unit, and a film...
8917927 Portable backscatter advanced imaging technology scanner with automated target recognition  
A portable backscatter advanced imaging technology scanner with automated threat or target recognition including: a floor assembly having a cantilever drive assembly for rotating the floor...
8901519 Quick regulation of the range of high-energy ion beams for precision irradiation of moving target volumes  
The invention concerns a device and a process for adjusting the range of an ion beam, in particular for irradiation in tumor therapy. For this purpose, first the reference position of a target...
8903043 Method for correcting timing skew in X-ray data read out of an X-ray detector in a rolling shutter mode  
In an X-ray detector operating in a rolling shutter read out mode, by precisely synchronizing sample rotation with the detector readout, the effects of timing skew on the image intensities and...
8903045 Backscatter system with variable size of detector array  
A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is...
8774359 Gate stack metrology  
An x-ray photoelectron spectroscopy apparatus for measuring film stack characteristics, of the type having an x-ray source and an x-ray photoelectron spectroscopy module coupled to a contiguous...
8767918 X-ray scattering measurement device and X-ray scattering measurement method  
A X-ray scattering measurement device and measurement method can measure, with high resolution, the intensity of X-rays which have undergone small-angle scattering and diffraction with reflection...
8744046 Method and apparatus of precisely measuring intensity profile of X-ray nanobeam  
Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform...
8737565 Compound x-ray lens having multiple aligned zone plates  
A compound zone plate comprising a first zone plate frame including a first zone plate, a second zone plate frame including a second zone plate, and a base frame to which the first zone plate...
8687766 Enhancing accuracy of fast high-resolution X-ray diffractometry  
A method for analysis includes directing a converging beam of X-rays toward a surface of a sample and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a...
8647859 Apparatus and method for analyzing bacteria  
An apparatus for analyzing bacteria is described that includes an analytic sample preparation section for preparing an analytic sample by treating a specimen so as to generate a morphological...
8600004 Method for obtaining a structure factor of an amorphous material, in particular amorphous glass  
An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity...
8592764 X-ray detector for electron microscope  
Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on...
8553840 Biometric diagnosis  
The invention provides a method of detecting neoplastic or neurological disorders comprising exposing skin or nails to X-ray diffraction and detecting changes in the ultrastructure of the skin or...
8537970 X-ray radiator to generate quasi-monochromatic x-ray radiation, and radiography x-ray acquisition system employing same  
For a quasi-monochromatic x-ray radiation with high radiation intensity, an x-ray radiator generates quasi-monochromatic x-ray radiation to expose a subject from a point-shaped radiation source...
8526575 Compound X-ray lens having multiple aligned zone plates  
A compound zone plate comprising a first zone plate frame including a first zone plate, a second zone plate frame including a second zone plate, and a base frame to which the first zone plate...
8512236 System and method for positioning and stabilizing an eye  
A system for securing a patient eye at a known position in an external coordinate system is disclosed. The system includes a head support for supporting the patient's head, an eye-contact device...
8515011 System and method for dose verification radiotherapy  
A system and method for performing dose verification during radiation therapy. The system images photons created by Compton scatter events in the patient receiving treatment using a Compton camera...
8503610 X-ray inspection tool  
A method and apparatus for identifying a response to a plurality of x-rays are provided. In one advantageous embodiment, an apparatus comprising a housing, an x-ray tube, an anode, and an x-ray...
8483471 Method and system for scatter correction in X-ray imaging  
Approaches for deriving scatter information using inverse tracking of scattered X-rays is disclosed. In certain embodiments scattered rays are tracked from respective locations on a detector to a...
8466047 Irradiation with high energy ions for surface structuring and treatment of surface proximal sections of optical elements  
A method for processing the surface of a component, or the processing of an optical element through an ion beam, directed onto the surface to be processed, whereby the surface is lowered and/or...
8437451 X-ray shutter arrangement  
A shutter arrangement for an X-ray housing includes a shutter 10 for example of solid tantalum. In embodiments, the shutter has a through hole 22 and slides between a closed and an open position...
8433037 X-ray radar  
A technique for generating three-dimensional information using radio frequency modulated X-rays includes both a method and an apparatus. In a first aspect, the method includes modulating an X-ray...
8410439 X-ray detector for electron microscope  
Multiple detectors arranged in a ring within a specimen chamber provide a large solid angle of collection. The detectors preferably include a shutter and a cold shield that reduce ice formation on...
8357894 Microcalorimetry for X-ray spectroscopy  
An improved microcalorimeter-type energy dispersive x-ray spectrometer provides sufficient energy resolution and throughput for practical high spatial resolution x-ray mapping of a sample at low...
8340248 X-ray diffraction method and X-ray diffraction apparatus  
In an X-ray diffraction method, an X-ray parallel beam is incident on a sample, and diffracted X-rays from the sample are reflected at a mirror and thereafter detected by an X-ray detector. The...
8311183 Online energy dispersive X-ray diffraction analyser  
An on-line EDXRD analyser including (i) a housing defining an analysis zone and having a passageway through it to allow transport of material in a process stream to pass through the analysis zone,...
8300767 Wavelength-classifying type X-ray diffraction device  
A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the...
8289387 Vision system, method for installing a vision system and method for manufacturing a vision system  
A fixed vision system includes a sensor having a sensitive surface for acquiring an image of an object on a detecting plane, and a light-emitting device for generating a luminous reference figure...
8243878 High-resolution X-ray diffraction measurement with enhanced sensitivity  
A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the...
8217937 Isosurfacial three-dimensional imaging system and method  
An isosurfacial three-dimensional imaging system and method uses scanning electron microscopy for surface imaging of an assumed opaque object providing a series of tilt images for generating a...
8163632 Irradiation with high energy ions for surface structuring and treatment of surface proximal sections of optical elements  
A method for processing the surface of a component, or the processing of an optical element through an ion beam, directed onto the surface to be processed, so that the surface is lowered and/or...
8153418 Apparatus and method for analyzing bacteria  
An apparatus for analyzing bacteria is described that includes an analytic sample preparation section for preparing an analytic sample by treating a specimen so as to generate a morphological...
8155267 Device for the X-ray analysis of a specimen, comprising an energy/angle-filtering diffraction analyser system  
A device for X-ray analysis of a sample (1), including: a generation system for the generation of an X-ray beam to irradiate an analysis zone of the sample, said analysis zone defining a analysis...
8119991 Method and apparatus for accurate calibration of VUV reflectometer  
A calibration technique is provided that utilizes a standard sample that allows for calibration in the wavelengths of interest even when the standard sample may exhibit significant reflectance...
8121249 Multi-parameter X-ray computed tomography  
The present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide...
8111807 Crystallite size analysis method and apparatus using powder X-ray diffraction  
A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle θ via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the...
8111808 X-ray explosive imager  
A technique for use in security screening and detection contexts employs an X-ray explosive imager that acquires images from backscattered RF modulated X-ray signals on which a time series...
8041086 Method of detecting specific polymer crystal  
In a specific macromolecule crystal detecting method according to the present invention, ultraviolet light is irradiated to sample solution, and a fluorescent image emitted from a sample in the...
8036338 Method and device for simultaneous measurement of magnetostriction and magnetization  
Since measurement of magnetostriction is accompanied by measurement of magnetization, magnetostriction and magnetization are measured conventionally by separately prepared devices, with efforts...
8030629 Adaptive X-ray optics  
The invention relates to an adaptive optical device for the reflection of impinging radiation, the adaptive optical device comprising at least one actuator and at least one partially reflective...
7983386 X-ray analysis instrument  
An apparatus for carrying out both x-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis of a crystalline sample. A sample holder is located within an evacuable chamber. An x-ray...
7978820 X-ray diffraction and fluorescence  
An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source 10 creating an incident X-ray beam directed to a sample on a sample stage....
7972062 Optical positioner design in X-ray analyzer for coaxial micro-viewing and analysis  
An X-ray analyzer includes a sample stage for holding and positioning a sample and an optical positioner assembly configured above the sample stage. The optical positioner assembly includes a body...
7929667 High brightness X-ray metrology  
An x-ray metrology tool having only one x-ray source. The x-ray source includes a liquid metal source for heating and melting at least one metal and producing a liquid metal jet, a liquid metal...

Matches 1 - 50 out of 301 1 2 3 4 5 6 7 >