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7634054 |
X-ray tube and X-ray analysis apparatus
Provided are an X-ray tube and an X-ray analysis apparatus, which can be further reduced in size as well as in weight and more efficiently detect a fluorescent X-ray and the like to increase...
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7616734 |
Multi-step method of nondestructively measuring a region within an ultra-hard polycrystalline construction
A method for nondestructively obtaining measurement information of a region within one or more ultra-hard polycrystalline constructions comprises conducing a first measurement using x-ray...
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7595489 |
Method and apparatus for material identification
A method of identifying a material using an x-ray emission characteristic is provided. X-ray data representing a monitored x-ray emission characteristic is obtained from a specimen in response to...
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7592591 |
X-ray analyzer using electron beam
An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for...
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7579591 |
Method and apparatus for analyzing sample
Method and apparatus for performing sample analysis using both the WDS and an energy-dispersive X-ray spectrometer (EDS). The analysis starts with irradiating the sample with an electron beam....
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7551714 |
Combined X-ray CT/neutron material identification system
A system and methods for identifying contents of an enclosure such as an air cargo container. A three-dimensional image indicative of at least one of the CT number and the density of contents of...
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7495217 |
Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis
In some embodiments, techniques are described for combining an X-ray detector (e.g., for providing EPMA) and an electron detector (e.g., for providing AES) to provide a tool for determining film...
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7457451 |
Systems, methods and apparatus for specialized filtered back-projection reconstruction for digital tomosynthesis
Systems, methods and apparatus are provided through which in one aspect, a three-dimensional (3D) image of an object is constructed from a plurality of two-dimensional (2D) images of the object...
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7432501 |
Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements
An ionising particle analyser comprises a source of ionising particles, a charged particle detector, and an ionisable gas located between the source and the detector. The analyser further comprises...
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7428293 |
Fluorescent X-ray analysis apparatus
There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit has been improved by reducing an X-ray generating subsidiarily and detected. The fluorescent X-ray analysis...
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7391892 |
Universal digital subtraction phantom and analysis system and method
According to one embodiment, the present technique provides a phantom for testing imaging device. The exemplary phantom includes a first portion having groups of vessels, which are filled with a...
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7375327 |
Method and device for measuring quantity of wear
A method and device to accurately obtain very small quantity of wear of the order of nanometers of a protective film on the surface of a sliding member. A quantity of wear on the surface of a...
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7366374 |
Multilayer optic device and an imaging system and method using same
An optic device, system and method for imaging are described. The optic device includes a first solid phase layer having a first index of refraction with a first photon transmission property and a...
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7358494 |
Material composition analysis system and method
The material composition of a thin film formed on a substrate or covered by a cap layer that shares one or more elements with the thin film can be determined by combining characteristic material...
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7342995 |
Apparatus for estimating specific polymer crystal
A specific macromolecule crystal evaluating device according to the present invention is equipped with a sample detecting stage for detecting a protein crystal in a sample container, an X-ray...
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7331714 |
Optomechanical structure for a multifunctional hard x-ray nanoprobe instrument
A multifunctional hard x-ray nanoprobe instrument for characterization of nanoscale materials and devices includes a scanning probe mode with a full field transmission mode. The scanning probe mode...
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7310436 |
Systems, methods and apparatus for specialized filtered back-projection reconstruction for digital tomosynthesis
Systems, methods and apparatus are provided through which in one aspect, a three-dimensional (3D) image of an object is constructed from a plurality of two-dimensional (2D) images of the object...
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7289598 |
X-ray fluorescent analysis apparatus
The change in the sample size and a change in background intensity due to the coexisting element are measured in real time to thereby automatically change a measurement time, the detection lower...
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7258485 |
X-ray thin film inspection apparatus and thin film inspection apparatus and method for patterned wafer
An X-ray thin film inspection apparatus including a sample table on which an inspection target such as a product wafer or the like is mounted, a positioning mechanism for moving the sample table, a...
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7187751 |
X-ray fluorescence spectrometer and program used therein
A calculating device 10 for calculating the concentration of elements contained in a sample 13 based on the FP method is provided. The calculating device 10 is operable to assume a...
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7184517 |
Analytical method for determination of crystallographic phases of a sample
An analytical method for determining crystallographic phases of a measuring sample comprises the steps of acquiring a diffraction pattern of the measuring sample and qualitative phase analysis of...
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7166838 |
X-ray imaging for patterned film measurement
An x-ray metrology system includes an e-beam generator to cause a test sample to emit x-rays, x-ray optics for focusing the x-rays, and an x-ray imager to generate an image of the test sample from...
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7095822 |
Near-field X-ray fluorescence microprobe
This invention pertains to an x-ray microprobe that can be placed very close the sample surface. A practical implementation is an x-ray target material integrated to an atomic force microscope...
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7049590 |
Capping layer to impede atom ejection
A method of reducing atom ejection from a sample during electron beam bombardment. An electron beam is directed through a low pressure environment toward a surface of the sample. The electron beam...
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6975894 |
Digital topological analysis of trabecular bone MR images and prediction of osteoporosis fractures
The invention provides method, system and device for determining trabecular bone structure and strength by digital topological analysis, and offers, for the first time, a demonstration of superior...
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6885727 |
Apparatus and method for measuring thickness and composition of multi-layered sample
An apparatus determines the thickness and composition of a multi-layered sample comprised of at least a copper layer and a tin-copper alloy plating layer disposed on the copper layer. The sample is...
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6856827 |
Fluoroscopic tracking and visualization system
A system for surgical imaging and display of tissue structures of a patient, including a display and an image processor for displaying such images in coordination with a tool image to facilitate...
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6798863 |
Combined x-ray analysis apparatus
In order to provide a single, small apparatus capable of elemental and structural analysis of inorganic matter by utilizing X-rays having non-obstructive and non-contact characteristics there is...
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6765986 |
X-ray fluorescence analyzer
An x-ray fluorescence analyzer and method. The analyzer and method use a single radio-active source, such as, 241 Am to determine the composition of a metal alloy or precious metal. The method...
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6646263 |
Method of X-ray analysis in a particle-optical apparatus
Samples such as semiconductor wafers may be subjected to an elementary analysis by irradiation by means of electrons and measurement of the X-rays 30 generated in the sample. In order to achieve...
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6522718 |
X-ray fluorescence thickness tester
In order to realize accurate measurement with an X-ray fluorescence thickness tester characterized by being non-destructive and non-contacting, a system comprises an X-ray generating source, a...
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6496562 |
Energy dispersion x-ray fluorescence analysis of chemical subtances
The invention relates to a method for classifying and identifying by means of energy dispersion X-ray fluorescence analysis chemical substances whose X-ray fluorescence lines cannot be detected and...
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6421415 |
On-line system for quantitative analysis of multi-component additives and coatings in sheet material
The present invention is a method and apparatus for calculating the amount and composition of inorganic material in a sheet material. The apparatus of the present invention is capable of...
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6381303 |
X-ray microanalyzer for thin films
Apparatus for X-ray microanalysis of a sample includes an X-ray source, which irradiates a spot having a dimension less than 500 μm on a surface of the sample. A first X-ray detector captures...
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6292532 |
Fluorescent X-ray analyzer useable as wavelength dispersive type and energy dispersive type
A fluorescent X-ray analyzing apparatus capable of being used as either a wavelength dispersive type or an energy dispersive type is provided, with which the analysis can be performed quickly and...
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6285734 |
Method for determining element contents using wave dispersive and energy dispersive x-ray fluorescence analysis
The invention relates to a method for defining element contents contained by solid, liquid or slurry-like materials by means of an X-ray fluorescence method in an online analysis. According to the...
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6240159 |
Fluorescent X-ray analyzer with path switching device
A fluorescent X-ray analyzer has at least three optical detection paths along which the secondary fluorescent X-ray to be analyzed travels selectively and includes a monochromator (6) carried by a...
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6154517 |
Fluorescent X-ray spectroscope
Display is made of the spectrums of the fluorescent X-rays by using the ordinate axis as representing the square root of a fluorescent X-ray intensity and using the abscissa axis as representing...
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6148059 |
Methods and apparatus using fluorescent emissions to determine concentration of material in object
A method and apparatus determine a concentration of dopant in soot that constitutes at least a portion of a soot preform used to form an optical waveguide. The soot is irradiated with photons,...
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5978442 |
Fluorescent x-ray spectroscopes
A fluorescent x-ray spectrometer, which can be used selectably both as a wavelength-dispersion type and an energy-dispersion type, includes an irradiation chamber and a detection chamber provided...
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5943434 |
Method for image reconstruction from projecton data with fast convolution of projections
In a method for image reconstruction in imaging technology for the implementation of a fast convolution with the transformation length M while allowing slight over-convolution errors, each of p or...
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5640437 |
Goniometer
In a goniometer having several axes around which a crystal specimen to be examined can be rotated, a radiation source, a detector for Bragg reflections and a detector for fluorescence radiation,...
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5457725 |
Analyzing method for foreign matter states
A method for identifying foreign matter in or on a sample, using apparatus composed of an X-ray generator, an X-ray detector, and a sample stage having a tilting mechanism capable of fixing a...
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5457726 |
Analyzer for total reflection fluorescent x-ray and its correcting method
A sample is mounted on a sample base. A detector is provided on the sample base, and detects a fluorescent X-ray generated from the sample, and a scattered X-ray of an incident X-ray when the...
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5406608 |
X-ray analysis apparatus
A device for performing both elemental and structural analysis of a crystalline sample, comprising a polychromatic x-ray source (11); a mounting means (15) for mounting the sample so that it is...
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5253283 |
Inspection method and apparatus with single color pixel imaging
An inspection system using penetrating radiation wherein pixels corresponding to transmitted radiation which has been attenuated to at least a predetermined level are displayed in a first color....
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5249216 |
Total reflection X-ray fluorescence apparatus
A total reflection X-ray fluorescence apparatus comprises a base material having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector such as...
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5187727 |
Method and apparatus for measuring the iron content in zinc layer and thickness of zinc layer
A method and apparatus for measuring, for example, the iron content in zinc layers and/or the thickness of a layer of zinc in galvanized steel. In order to measure the percentage of iron content in...
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5128545 |
Method and apparatus for background correction in analysis of a specimen surface
A method and apparatus for background correction of the measured data in analysis of a specimen surface by scanning the surface with an electron beam, wherein a signal occurring from an element to...
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5107527 |
Method and apparatus for analyzing sludgy materials
Analyzing sludgy materials by exposing the flowing material in continuous action to x-ray radiation and by measuring the radiation thus created in the said material, according to the invention, the...
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