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7616733 |
High speed materials sorting using x-ray fluorescence
A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray...
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7595489 |
Method and apparatus for material identification
A method of identifying a material using an x-ray emission characteristic is provided. X-ray data representing a monitored x-ray emission characteristic is obtained from a specimen in response to...
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7551714 |
Combined X-ray CT/neutron material identification system
A system and methods for identifying contents of an enclosure such as an air cargo container. A three-dimensional image indicative of at least one of the CT number and the density of contents of...
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7539282 |
XRF analyzer
A method of analyzing a fluid sample by XRF includes the steps of: depositing the fluid sample onto a substrate, exposing the sample and the substrate to an x-ray emission, generating a first...
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7531349 |
Standoff bioagent-detection apparatus and method using multi-wavelength differential laser-induced fluorescence
A standoff bioagent-detection apparatus and method use a direct ultraviolet source to detect bioagents. In some embodiments, a standoff bioagent-detection apparatus and method use laser-induced...
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7529337 |
Energy dispersion type radiation detecting system and method of measuring content of object element
To provide an energy dispersion type radiation detecting system and a method of measuring a content of an object element capable of carrying out a measurement by determining an intensity of an...
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7508907 |
X-ray analysis apparatus
When an X-ray focused by using an X-ray lens is irradiated to a sample, there is generated an X-ray halo component at the peripheral part of the focal point of the focused X-ray in the sample and,...
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7508499 |
Methods for application of a tag onto a media article
A method for imparting tags to a media article, comprising: modifying predetermined locations on the article to change a surface energy of the predetermined locations, applying the tags to a...
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7498573 |
Method for obtaining and processing surface analysis data
A method of managing data obtained by measurements. The method permits EDS (energy dispersive spectroscopy) spectra to be collected in one operation. Energies detected by an EDS detector are...
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7498164 |
Instrument for monitoring nucleic acid sequence amplification reaction
An instrument is provided that can monitor nucleic acid sequence amplifications reactions, for example, PCR amplification of DNA and DNA fragments. The instrument includes a multi-notch filter...
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7495217 |
Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis
In some embodiments, techniques are described for combining an X-ray detector (e.g., for providing EPMA) and an electron detector (e.g., for providing AES) to provide a tool for determining film...
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7477724 |
X-ray instrument
X-ray apparatus 10 includes an X-ray source ( 22 ), an X-ray detector ( 28 ) facing the X-ray source. Inlet ( 6 ) accepts a stream of particles and a guide system ( 18 ) guides the stream of...
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7471763 |
Fluorescent X-ray analysis apparatus
To provide a fluorescent X-ray analysis apparatus using a polarization for effectively measuring a minute portion of a sample surface without a necessary to prepare many kinds of secondary targets....
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7471762 |
Total reflection X-ray fluorescence analysis method
A semiconductor substrate is exposed to an acid vapor, an impurity on the surface of the semiconductor substrate exposed to the acid vapor is scanned and collected with an acid solution, the acid...
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7450685 |
X-ray fluorescence spectrometer and program for use therewith
A scanning X-ray fluorescence spectrometer includes a quantitatively analyzing device ( 18 ) which calculates the concentration of hexavalent chrome based on the fact that the peak spectroscopic...
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7450684 |
Glass recovery method
In a recycling process, the homogeneity of glass cullet decreases and the quality of the recycled glass is diminished. To solve this problem, the present involves using a fluorescent X-ray analyzer...
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7449682 |
System and method for depth profiling and characterization of thin films
Characterization of a sample, e.g., a depth profile, may be attained using one or more of the following parameters in an electron spectroscopy method or system. The one or more parameters may...
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7440542 |
Method and measuring arrangement for nondestructive analysis of an examination object by means of x-radiation
A method and a measuring arrangement are disclosed for nondestructive analysis of an examination object. In at least one embodiment of the method, x-radiation having a specific energy spectrum is...
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7440541 |
Dual source XRF system
A dual source tube XRF system and method wherein a first x-ray source is employed to direct x-rays in a first energy band at a sample and at least a second x-ray source is employed to direct x-rays...
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7436926 |
Fluorescent X-ray analysis apparatus
A sample sealing vessel 8 includes a plurality of wall faces comprising a material for transmitting X-ray, an X-ray source 1 is arranged at a wall face 11 to irradiate primary X-ray, a face ...
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7432501 |
Ionising particle analyser enabling for example the separation of the fluorescent yield (FY) and the total electron yield (TEY) in EXAPS (extended X-ray absorption fine structure) measurements
An ionising particle analyser comprises a source of ionising particles, a charged particle detector, and an ionisable gas located between the source and the detector. The analyser further comprises...
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7430273 |
Instrument having X-ray fluorescence and spark emission spectroscopy analysis capabilities
An analytical instrument is disclosed having both XRF and spark emission spectroscopy capabilities. In a particularly advantageous embodiment, a field portable XRF device is removably coupled to...
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7424092 |
Fluorescent X-ray spectroscopic apparatus
An apparatus and method for accurately analyzing transition metal such as iron and copper contained as impurities in a hafnium-containing film on a semiconductor substrate, which is a sample, is...
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7420163 |
Determining layer thickness using photoelectron spectroscopy
According to one embodiment of the invention, photoelectron spectroscopy is used to determine the thickness of one or more layers in a single or multi-layer structure on a substrate. The thickness...
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7416462 |
Glass substrate processing method and material removal process using x-ray fluorescence
To reuse glass used in a flat panel display, processing suitable for global environment such as processing of separating a lead component must be realized. A disassembly processing method for a...
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7409037 |
X-ray fluorescence analyzer having means for producing lowered pressure, and an X-ray fluorescence measurement method using lowered pressure
An X-ray fluorescence analyzer has a structure that defines a chamber ( 102 ). There is a window ( 103 ) to the chamber in a surface that is to come next to a sample ( 101 ) outside the chamber....
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7386337 |
Correction of dual energy X-ray absorptiometry measurements based on body lead levels
Methods for correcting a bone density value for an effect of lead are disclosed. One method includes determining an apparent bone density in a patient; applying a correction factor to the apparent...
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7375359 |
Portable X-ray fluorescence instrument with tapered absorption collar
An instrument and method for measuring the elemental composition of a test material. The instrument has a source of penetrating radiation for irradiating an irradiated region of the test material,...
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7375327 |
Method and device for measuring quantity of wear
A method and device to accurately obtain very small quantity of wear of the order of nanometers of a protective film on the surface of a sliding member. A quantity of wear on the surface of a...
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7358494 |
Material composition analysis system and method
The material composition of a thin film formed on a substrate or covered by a cap layer that shares one or more elements with the thin film can be determined by combining characteristic material...
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7356114 |
X-ray fluorescence spectrometer
An X-ray fluorescence spectrometer includes an X-ray source 7 for irradiating a sample 1 at a predetermined incident angle ΓΈ with primary X-rays 6 , and a detecting device 9 for measuring...
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7313220 |
Design for realizing an online element analysis
A device for realizing an online element analysis for a substance (S) that is conveyed past or flows past a measuring station is provided with a device for conveying the substance to be measured, a...
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7286633 |
Fuel analysis system
A fuel analysis system and method wherein an x-ray source emits x-rays at an energy level below but proximate the absorption edge of sulfur. A monochromator is in the optical path between the...
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7254212 |
Particulate matter analyzer, collecting filter and system for analyzing and collecting samples from fluids
A system, including a particulate matter analyzer and collecting filter, provides a method of analyzing and collecting samples from fluids, such as collecting particulate matter from air. A mass...
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7233643 |
Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy
A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector ( 412 ) detects fluorescent X-rays coming from said sample under...
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7200200 |
X-ray fluorescence measuring system and methods for trace elements
An X-ray fluorescence measuring system and related measuring methods are disclosed, the system using X-ray energy at a level of less than 80 KeV may be directed toward a material, such as coal. The...
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7197110 |
Method for determining chemical content of complex structures using X-ray microanalysis
A method for identifying hazardous substances in a printed wiring assembly having a plurality of discrete components, using micro X-ray fluorescence spectroscopy. A micro X-ray fluorescence...
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7187751 |
X-ray fluorescence spectrometer and program used therein
A calculating device 10 for calculating the concentration of elements contained in a sample 13 based on the FP method is provided. The calculating device 10 is operable to assume a...
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7170970 |
Fluorescent X-ray analysis method and fluorescent X-ray analysis apparatus
The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the...
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7130370 |
Method and apparatus for producing an image of the internal structure of an object
Inventions related to the intra-vision means, designed for production of visually sensed images of the internal structure of an object, in particular, of a biological object, are aimed at higher...
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7120226 |
Adaptive scanning of materials using nuclear resonance fluorescence imaging
A method for detecting nuclear species in a sample by adaptive scanning using nuclear resonance fluorescence may comprise illuminating the target sample with photons from a source; detecting a...
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7106826 |
System and method for adapting a software control in an operating environment
A system and method for detecting a substance using x-ray fluorescence is disclosed. The detected substances may be explosives or controlled substances that have a specific chemical fluorescent...
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7065174 |
Measurement arrangement for X-ray fluoresence analysis
A portable measurement apparatus is presented for inducing and measuring fluorescent X-ray radiation. It comprises an X-ray source ( 303, 902, 1005, 1105 ) adapted to controllably irradiate a...
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7049590 |
Capping layer to impede atom ejection
A method of reducing atom ejection from a sample during electron beam bombardment. An electron beam is directed through a low pressure environment toward a surface of the sample. The electron beam...
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7046760 |
Method of measuring and controlling concentration of dopants of a thin film
A method of measuring a concentration of dopants of an objective thin film includes measuring a concentration of dopants of a first wafer, forming the objective thin film on the first wafer to form...
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7039158 |
Multi-technique thin film analysis tool
A thin film analysis system includes multi-technique analysis capability. Grazing incidence x-ray reflectometry (GXR) can be combined with x-ray fluorescence (XRF) using wavelength-dispersive x-ray...
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7023954 |
Optical alignment of X-ray microanalyzers
A method for X-ray analysis of a sample includes aligning an optical radiation source with an X-ray excitation source, so that a spot on the sample that is irradiated by an X-ray beam generated by...
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7020238 |
Adapter and analyzer device for performing X-ray fluorescence analysis on hot surfaces
The measurement head ( 101 ) of an X-ray fluorescence analyzer device is protected against heat from a hot target by using an adapter ( 201 ). It comprises a sheet of material having low thermal...
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7016463 |
Sample retainer for x-ray fluorescence analysis, x-ray fluorescence analyzing method using the same and x-ray fluorescence spectrometer therefor
To provide a sample retainer for X-ray fluorescence analysis, which is used in pretreating a liquid sample and then in X-ray fluorescence analysis of contents of such liquid sample, can...
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7016462 |
Ionic pre-concentration XRF identification and analysis device, system and method
A device, system and method for detecting and measuring concentrations of elements in fluids comprises: flowing a fluid through a central flow interelectrode gap of an ionic preconcentration cell...
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