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8184496 |
Semiconductor device and method for operating the same
A semiconductor device includes a sensing unit configured to sense whether a value of a programming sensing node is within a predefined range, a fuse connected to the programming sensing node, a...
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8184465 |
Programmable semiconductor device
A programmable device includes a substrate (10); an insulator (13) on the substrate; an elongated semiconductor material (12) on the insulator, the elongated semiconductor material having first and...
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8179732 |
Flash memory devices including ready/busy control circuits and methods of testing the same
A flash memory device includes a chip disable fuse circuit that has a fuse and that outputs a chip disable signal when the fuse is cut out, and a ready/busy control circuit that forcibly activates...
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8179736 |
Antifuses and program circuits having the same
Antifuses and program circuits having the same. The antifuses are embodied as a transistor. When a first power supply voltage is applied to a source, a first program voltage for causing impact...
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8174913 |
Semiconductor memory device and driving method of the same
A memory includes a cell region; a spare region including a spare block; a fuse region storing remedy information necessary for an access to the spare block instead of a remedy target block, the...
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8174922 |
Anti-fuse memory cell and semiconductor memory device
An anti-fuse memory cell includes: a first transistor connected with a word line and configured to output a second voltage based on a first voltage supplied to the word line in a write mode; a...
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8159895 |
Method and system for split threshold voltage programmable bitcells
Methods and systems for split threshold voltage programmable bitcells are disclosed and may include selectively programming bitcells in a memory device by applying a high voltage to a gate terminal...
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8159894 |
One time programmable memory
A one-time programmable memory. The one-time programmable memory has an antifuse and a read circuit configured to read the antifuse. An isolation transistor couples the antifuse to the read...
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8160244 |
Stateless hardware security module
Stateless hardware security modules facilitate securing data transfers between devices in a data communication system. The stateless hardware security module may communicate with other devices via...
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8154941 |
Non-volatile semiconductor memory device and method of writing data therein
A device includes a memory cell array and a control circuit, the memory cell array including word-lines, bit-lines, and memory cells arranged at the intersections of the word-lines and the...
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8154942 |
Integrated circuits with fuse programming and sensing circuitry
Circuitry on an integrated circuit is provided that may be used to program fuses such as polysilicon fuses. Fuse programming may be performed using an elevated power supply voltage. Other circuitry...
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8149639 |
Test apparatus of semiconductor integrated circuit and method using the same
A test apparatus includes a test fuse unit for generating a test fuse signal in response to a test mode signal during a test time and generating a test fuse signals according to a fuse cutting...
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8134879 |
Semiconductor memory device having redundancy circuit for repairing defective unit cell, and method for repairing defective unit cell
A semiconductor memory device includes banks of unit cells, wherein two or more adjacent banks of the banks share a redundancy circuit configured to perform a defect repair operation when an...
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8134882 |
Semiconductor device including an anti-fuse element
A semiconductor device includes a first high potential power supply, a second low potential power supply, a third power supply having a potential higher than the first, a fourth power supply having...
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8134859 |
Method of sensing a programmable non-volatile memory element
A non-volatile memory cell including an antifuse element having a programming node and a control node, a capacitor element, a precharge element, an access element, and a leakage element. The...
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8130565 |
Semiconductor device
A semiconductor device includes internal voltage generating circuits, a switching circuit, load circuits, a control circuit. Each of the plurality of load circuits is supplied with voltage through...
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8120981 |
Semiconductor integrated circuit device with fuse elements and control method therefore
A semiconductor integrated circuit device includes a first block, a second block, and a control section. The first block includes a first fuse, a first switching configured to write data to the...
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8120982 |
Semiconductor device, control method for semiconductor device, and electronic device
A semiconductor device including a first switch coupled to a first power supply line, a second switch coupled to the first switch and to a second power supply line, and a storage part provided in a...
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8122304 |
JTAG controlled self-repair after packaging
An integrated circuit containing memory includes IEEE 1149.1 (JTAG) controlled self-repair system that permits permanent repair of the memory after the integrated circuit has been packaged. The...
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8116130 |
Integrated circuits with nonvolatile memory elements
Nonvolatile memory element circuitry is provided that is based on metal-oxide-semiconductor transistor structures. A nonvolatile memory element may be based on a metal-oxide-semiconductor...
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8116152 |
Nonvolatile semiconductor memory device capable of preventing write-disturb and method of programming
A nonvolatile semiconductor memory device includes a memory cell, a precharge control circuit, a power supply circuit, a bit line driver, a word line driver, a first multiplexer, and a second...
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8116156 |
Semiconductor memory device
There are provided a row predecoder that predocodes an address irrespective of whether the address to which access is requested is a defective address, a row main decoder that controls a sub-word...
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8116163 |
Semiconductor memory device
The present invention provides a semiconductor memory device that includes: a fuse circuit having multiple fuse elements; and a fuse selection circuit connected to an internal address signal line...
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8112681 |
Method and apparatus for handling fuse data for repairing faulty elements within an IC
The application discloses an integrated circuit comprising: circuitry; a fusebox for storing an array of data identifying faulty elements within said circuitry; at least one fusebox controller for...
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8094499 |
Method using a one-time programmable memory cell
A one-time programmable device includes a controller, a protection system, a static storage element and a latch, which can be referred to as a latch-based one-time programmable (OTP) element. In...
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8089821 |
Memory device using antifuses
Herein described is a method of implementing one or more native NMOS antifuses in an integrated circuit. Also described is a method for programming one or more native NMOS antifuses used within a...
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8089812 |
Semiconductor memory device
A semiconductor memory device can reduce a circuit area necessary for row repair. The semiconductor memory device includes a plurality of memory banks, a plurality of cell arrays arranged in each...
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8081524 |
Combo-type semiconductor integrated circuit supplied with a plurality of external voltages
A combo semiconductor memory apparatus capable of reducing current and power consumption is provided. The semiconductor memory apparatus includes: a signal generator that generates a voltage...
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8081531 |
Temperature sensor capable of reducing test mode time
A temperature sensor includes a temperature sensing unit for producing a sensing level by sensing an internal temperature in a semiconductor memory device, a reference level generating unit for...
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8077531 |
Semiconductor integrated circuit including column redundancy fuse block
A semiconductor integrated circuit includes a semiconductor chip having an edge area and a bank area located an inner portion of the edge area, and a column redundancy fuse block disposed in the...
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8072831 |
Fuse element reading circuit
A fuse element reading circuit including a first fuse element having a resistance which differs in accordance with whether the first fuse element is in a blown state or an unblown state, a...
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8072830 |
Logic embedded memory having registers commonly used by macros
A semiconductor integrated circuit device includes a plurality of memory macros, macro-common register block, and memory macro operation setting circuits. The macro-common register block has...
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8072832 |
Electronic equipment system and semiconductor integrated circuit controller
An electronic equipment system includes a semiconductor integrated circuit having a nonvolatile memory storing information on a characteristic of the semiconductor integrated circuit; and a...
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8068372 |
Semiconductor memory device
A semiconductor memory device includes: a repair node; a fuse one side of which is coupled to the repair node; a pull-down unit configured to selectively transfer a ground voltage to the repair...
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8067288 |
Configuration and method of manufacturing the one-time programmable (OTP) memory cells
This invention discloses a method for manufacturing a one-time programmable (OTP) memory includes a first and second MOS transistors connected in parallel and controlled by a common gate formed...
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8059477 |
Redundancy circuit of semiconductor memory
A redundancy circuit of a semiconductor memory apparatus includes an enable signal generation unit configured to have a plurality of enable fuses corresponding to a first mat grouping information...
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8054667 |
Multilevel one-time programmable memory device
A multilevel one-time programmable memory device includes a plurality of memory cells, wherein each of the plurality of memory cells includes: a first electrode to which a first voltage is applied,...
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8054706 |
Sensor protection using a non-volatile memory cell
A method and apparatus for protecting an electrical device using a non-volatile memory cell, such as an STRAM or RRAM memory cell. In some embodiments, a memory element is connected in parallel...
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8050077 |
Semiconductor device with transistor-based fuses and related programming method
A transistor-based fuse structure is realized in a semiconductor device having a semiconductor substrate, transistor devices formed on the semiconductor substrate, and the transistor-based fuse...
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8050122 |
Fuse apparatus for controlling built-in self stress and control method thereof
A fuse apparatus for controlling a built-in self stress unit includes a built-in self stress configured to repeatedly generate any stress test pattern in a test mode, and generate a one-cycle end...
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8050121 |
Semiconductor memory, system, operating method of semiconductor memory, and manufacturing method of semiconductor memory
A plurality of memory blocks includes real memory cells and redundancy memory cells, are accessed independently during a normal operation mode, and are accessed simultaneously during a test mode in...
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8050129 |
E-fuse apparatus for controlling reference voltage required for programming/reading e-fuse macro in an integrated circuit via switch device in the same integrated circuit
An electrically programmable fuse (e-fuse) apparatus includes an e-fuse macro and a switch device. The e-fuse macro is disposed in an integrated circuit, and has a plurality of e-fuse units. The...
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8045414 |
Non-volatile semiconductor memory device
The row decoder receives writing instruction signal and reading instruction signal to selectively activate one of the word lines according to an input state of row address signals. The data buffer...
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8045415 |
Memory devices having programmable elements with accurate operating parameters stored thereon
Techniques are disclosed for reading operating parameters from programmable elements on memory devices to configure a memory system. More specifically, programmable elements, such as antifuses,...
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8040748 |
Quad SRAM based one time programmable memory
A differential latch-based one time programmable memory cell is provided. The differential latch-based one time programmable memory cell includes a differential latching amplifier having a first...
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8040745 |
Stacked memory and fuse chip
A stacked memory comprises one or more memory core chips and a fuse chip. Each of the memory core chips has a memory cell array including spare memory cells for replacing defective memory cells....
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8035416 |
Bipolar-MOS driver circuit
The present invention relates to electronic driver circuits, and more particularly, to low power electronic driver circuits having low manufacturing costs. The present invention is a circuit design...
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8037444 |
Programmable control of mask-programmable integrated circuit devices
An integrated circuit device such as a structured ASIC includes a mask-programmable portion and a post-fabrication-programmable portion. The mask-programmable portion includes circuitry that is...
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8031544 |
Semiconductor memory device with three-dimensional array and repair method thereof
A nonvolatile memory device includes a three-dimensional (3D) cell array, a column selection circuit and a fuse block. The 3D cell array includes multiple cell arrays located in corresponding...
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8027207 |
Leakage compensated reference voltage generation system
An e-fuse sense circuit employs a single ended sense scheme in which the reference voltage is compensated for leakage. A reference voltage generator includes a pull-up resistor of similar value to...
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