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7643340 |
Method and apparatus for programming multi level cell flash memory device
A method of programming a selected cell in a multi-level flash memory device comprises determining whether to program an upper bit or a lower bit of a selected memory cell, detecting a current...
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7643358 |
Non volatile semiconductor memory device
A non volatile semiconductor memory device wherein it is possible to transfer Vpp without a drop in voltage of the transfer transistor Vth (threshold voltage) in a transfer circuit or decoder...
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7643346 |
NAND type nonvolatile semiconductor memory device having sideface electrode shared by memory cells
An electrically erasable programmable read-only memory (EEPROM) device of the NAND type having sideface electrodes as auxiliary electrodes on the opposite lateral surfaces of a transistor channel...
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7639540 |
Non-volatile semiconductor memory having multiple external power supplies
A memory device includes core memory such as flash memory for storing data. The memory device includes a first power input to receive a first voltage used to power the flash memory. Additionally,...
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7639555 |
Test circuit device for semiconductor memory apparatus
A test circuit device for a semiconductor memory device includes a main word line driving unit that generates a signal that swings between a driving voltage and one of a first voltage and a second...
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7636254 |
Wordline booster circuit and method of operating a wordline booster circuit
The invention relates to a wordline booster circuit, especially an SRAM-wordline booster circuit, comprising a driving element ( 20 ) for shifting a voltage level of a charge storage element ( 50 )...
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7636259 |
Flash memory array with independently erasable sectors
Systems and methods are disclosed herein to provide a flash memory array with independently erasable sectors. For example, in accordance with an embodiment of the present invention, an integrated...
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7633804 |
Adjusting programming or erase voltage pulses in response to the number of programming or erase failures
Memory devices and methods of operating memory devices are provided. In one such embodiment a programming voltage pulse or an erase voltage pulse is applied to memory cells of a memory device. A...
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7633806 |
Memory device with a nonvolatile memory array
A memory device having a nonvolatile memory array, at least one driver for programming the memory array, which driver is connected to the memory array in order to drive a programming potential, and...
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7630261 |
Nand-structured flash memory
A NAND-structured flash memory including a selection transistor having a first conducting path, one end of the first conducting path being connected to a bit line or a source line, at least one...
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7630226 |
Semiconductor device
A memory cell includes: an irreversible storage element that writes data by breaking down an insulating film, with a write voltage being applied to its one end; and first and second transistors...
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7630242 |
Nonvolatile semiconductor memory device
With this flash memory, because a plurality of memory blocks are formed on a surface of a single P-type well, a layout area can be made small. Further, when erasing data for a memory block to be...
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7630250 |
Controlled ramp rates for metal bitlines during write operations from high voltage driver for memory applications
Systems and methods that control the switching transition times or profile of a ramped voltage write signal used for programming or erasing at least a wordline of an array of multi-bit and/or...
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RE41020 |
Multi-state EEPROM having write-verify control circuit
An EEPROM having a memory cell array in which electrically programmable memory cells are arranged in a matrix and each of the memory cells has three storage states, includes a plurality of data...
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7623389 |
System for low voltage programming of non-volatile memory cells
System for programming a selected non-volatile memory cell in a memory array having a gate node coupled to a wordline WL(n) and a drain node connected to a selected bitline by injecting hot...
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7616512 |
Semiconductor memory device with hierarchical bit line structure
A semiconductor memory device has a hierarchical bit line structure. The semiconductor memory device may include first and second memory cell clusters, which share the same bit line pair and are...
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7616481 |
Memories with alternate sensing techniques
The present invention presents a scheme for sensing memory cells. Selected memory cells are discharged through their channels to ground and then have a voltage level placed on the traditional...
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7616487 |
Decoders and decoding methods for nonvolatile semiconductor memory devices
A decoder for a non-volatile semiconductor memory device includes a level shifter configured to generate a negative first voltage at an output thereof responsive to a first state of a global word...
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7613047 |
Efficient circuit and method to measure resistance thresholds
The embodiments of the invention provide an apparatus, method, etc. for an efficient circuit and method to measure resistance. A sense line driver for an integrated circuit memory is provided,...
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7613030 |
Semiconductor memory device and method for operating the same
A semiconductor memory device is provided, which comprises an analog switch, a first inverter, a second inverter, and a clocked inverter. A first terminal of the analog switch is electrically...
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7609559 |
Word line drivers having a low pass filter circuit in non-volatile memory device
A word line driver system that utilizes a voltage selection circuit to supply one of several voltages to an output node coupled to a plurality of word line control circuits. Each word line control...
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7609554 |
High voltage switching circuit
A high voltage switching circuit that has a depletion mode NMOS transistor, an enhancement mode PMOS transistor and, an enhancement mode NMOS transistor. A control circuit generates first and...
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7609558 |
Non-volatile semiconductor memory device
A non-volatile semiconductor memory device includes a memory cell array having a plurality of multi-level memory cells connected in series. The plurality of multi-level memory cells forms a...
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7606104 |
Semiconductor memory device and electric power supply method
A semiconductor device includes a first and a second memory cell array each including a plurality of electrically reprogrammable memory cells arranged in the form of a matrix, the first memory cell...
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7606070 |
Systems for margined neighbor reading for non-volatile memory read operations including coupling compensation
Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge...
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7606086 |
Nonvolatile semiconductor memory device
A nonvolatile semiconductor memory device comprises a memory cell array in which memory cells are arranged in a row and column direction, a circuit for applying a first voltage to a selected bit...
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7602651 |
Semiconductor integrated circuit device
This disclosure concerns a device outputting data to the outside comprising a first transistor with a first conductive type which is connected between an output low voltage corresponding to a first...
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7599243 |
Sense amplifier over driver control circuit and method for controlling sense amplifier of semiconductor device
A semiconductor memory device includes a bit line sense amplifying block that senses and amplifies bit line data. A first driving block drives a pull up power line of the bit line sense amplifying...
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7599226 |
Memory circuit, drive circuit for a memory and method for writing write data into a memory
A first and second non-volatile memory transistor each have a floating gate electrode and a gate terminal. A first switch is connected between a first drain terminal and a bit line for reading out...
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7596033 |
Nonvolatile semiconductor memory device
A sub-decoder element provided corresponding to each word line is constructed by the same conductive type MOS transistors. The sub-decoder elements are arranged in a plurality of columns such that...
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7596036 |
Memory control circuit, microcomputer, and data rewriting method
A memory control circuit according to an embodiment of the present invention includes: a writable/readable memory; a comparison unit comparing write data to write in the memory with read data that...
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7593249 |
Memory device for protecting memory cells during programming
Improved circuitry and methods for programming memory cells of a memory device are disclosed. The improved circuitry and methods operate to protect the memory cells from potentially damaging...
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7586787 |
Reducing bit line leakage current in non-volatile memories
In example embodiments, methods are provided for reducing bit line leakage current. In an example embodiment, an unselected program word line is biased to a bias voltage. The unselected program...
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7583539 |
Non-volatile storage with bias for temperature compensation
A non-volatile storage system in which a body bias is applied to a non-volatile storage system to compensate for temperature-dependent variations in threshold voltage, sub-threshold slope,...
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7580290 |
Non-volatile storage system with intelligent control of program pulse duration
To program a set of non-volatile storage elements, a set of programming pulses are applied to the control gates (or other terminals) of the non-volatile storage elements. The programming pulses...
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7580322 |
High speed programming for nonvolatile memory
A nonvolatile memory device is programmed by selectively scanning input data bits to detect data bits to be programmed, and programming the detected data bits. The detected data bits may be...
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7580288 |
Multi-level voltage adjustment
An adjustable voltage supply ( 310 ) may have a plurality of levels of adjustment, such as a coarse select circuit ( 471 ) and a fine select circuit ( 473 ), to generate an adjustable voltage (e.g....
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7577054 |
Memory with word-line driver circuit having leakage prevention transistor
In a semiconductor memory having a plurality of word lines and bit lines and memory cells arranged at the positions of intersection thereof, a word driver circuit that drives the word line has a...
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7567458 |
Flash memory array having control/decode circuitry for disabling top gates of defective memory cells
A memory system includes memory cells arranged in sectors. A decoder corresponding to a sector disables memory cells having a defective top gate. The decoder may include a low voltage or high...
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7564717 |
Semiconductor memory device
A semiconductor memory device includes a memory cell array, word lines each of which connects the control gates of the memory cells on the same row together in the memory cell array, a row decoder...
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7561475 |
Flash memory controller
An apparatus for controlling a flash memory device which includes a signal generator for generating a clock signal at an operation, a first buffer for outputting the clock signal to the flash...
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7561469 |
Programming method to reduce word line to word line breakdown for NAND flash
A NAND architecture non-volatile memory device and programming process programs the various cells of strings of non-volatile memory cells by the application of differing word line pass voltages...
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7561473 |
System for performing data pattern sensitivity compensation using different voltage
Errors can occur when reading the threshold voltage of a programmed non-volatile storage element due to at least two mechanisms: (1) capacitive coupling between neighboring floating gates and (2)...
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7558116 |
Regulation of boost-strap node ramp rate using capacitance to counter parasitic elements in channel
Systems and/or methods that facilitate accessing data in a memory are presented. The memory can be flash memory that includes a plurality of sectors in an array that can be associated with a...
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7558141 |
Memory system, semiconductor memory device and method of driving same
A semiconductor memory device has a semiconductor substrate, first select transistors formed on the surface of said semiconductor substrate, first dummy transistors formed above said first select...
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7558122 |
Flash memory device and method of erasing flash memory device
A flash memory device and a method of erasing memory cells in a flash memory device are provided. A first post program operation is performed on erased memory cells having a threshold voltage lower...
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7558152 |
Address counter for nonvolatile memory device
An address counter for a nonvolatile memory device includes a cascade of cells. Each cell includes an address counting flip-flop that is updated to a value of every newly counted address bit, or...
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7554847 |
Flash memory device employing disturbance monitoring scheme
A flash memory device comprises a memory cell array including a plurality of NAND strings respectively connected to a plurality of bit lines, and further comprising a disturbed string coupled to a...
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7551489 |
Multi-level memory cell sensing
A multi-level cell memory device performs a read by providing a stepped voltage waveform on a wordline, and comparing cell currents to a substantially constant reference current. Prior to the...
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7551487 |
Nonvolatile memory device and related programming method
In a nonvolatile memory device, a first verification result indicates whether a block of memory cells has been successfully programmed and a second verification result indicates whether a far cell...
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