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5663903 |
Flat-cell read-only memory
The memory cells of a read-only memory are connected in parallel between adjacent bus-bit lines. The selection of tile sub-bit lines is through a selector logic decoder. The decoder has many rows...
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5663922 |
Method for the anticipated reading of serial access memory, and memory pertaining thereto
A method and apparatus for reading a memory, such that the address decoding is started when the address bits have not yet all been received. All the information elements corresponding to the...
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5652450 |
Nonvolatile semiconductor storage device
According to the present invention, a nonvolatile semiconductor storage device for applying to each word line either one of a selected voltage and a non-selected voltage, corresponding to a...
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5646901 |
CMOS memory cell with tunneling during program and erase through the NMOS and PMOS transistors and a pass gate separating the NMOS and PMOS transistors
An apparatus and method, the apparatus including an NMOS pass gate separating NMOS and PMOS transistors of a CMOS memory cell configured for tunneling during program and erase through the NMOS and...
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5640345 |
Semiconductor memory device and fabrication process
Provided between a control gate electrode and a channel region of the EEPROM memory cell is a capacitor. Formed on the channel region are a first gate dielectric layer of silicon oxide, a first...
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5483483 |
Read-only memory device
A semiconductor memory device includes a current driving transistor composed of a bipolar transistor which is coupled to a corresponding bit line for increasing the bit line current. The collector...
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5469384 |
Decoding scheme for reliable multi bit hot electron programming
A nonvolatile memory circuit having a decoding scheme for reliable multiple bit hot electron programming. The nonvolatile memory circuit has a memory array in which data received at each data input...
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5463587 |
Nonvolatile semiconductor system
It is an object of the present invention to optimize the range of threshold voltage in a flash EEPROM and to simplify the verifying operation. In memory transistors (1)-(4) and a dummy memory...
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5450341 |
Non-volatile semiconductor memory device having memory cells, each for at least three different data writable thereinto selectively and a method of using the same
A method of writing or reading at least three different data in each memory cell, in a non-volatile semiconductor memory device having a plurality of memory cells, each memory cell having floating...
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5450363 |
Gray coding for a multilevel cell memory system
A memory system contains a plurality of memory cells, a sensing circuit, and a translator circuit. The memory cells store one of a plurality of threshold levels, wherein the threshold levels...
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5450354 |
Non-volatile semiconductor memory device detachable deterioration of memory cells
A non-volatile semiconductor memory device capable of electrical programming including a plurality of memory cells, means for selecting at least one memory cell from the plurality of memory cells,...
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5434815 |
Stress reduction for non-volatile memory cell
Non-volatile semiconductor core memory performance is enhanced by reduced stress on core memory cells. Stress is reduced by selectable application of bias voltages to the sense line under control...
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5428572 |
Program element for use in redundancy technique for semiconductor memory device
Improvement of a fuse for use in the redundancy technique particularly for a semiconductor memory device. The fuse is constituted by an MIS type transistor having a gate insulating layer, which...
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5424978 |
Non-volatile semiconductor memory cell capable of storing more than two different data and method of using the same
A non-volatile semiconductor memory device capable of selectively storing one of at least three different data comprises a memory array including a plurality of memory cells, each having a control...
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5424992 |
Method and device for detecting and controlling an array source signal discharge for a memory erase operation
An array source signal discharge controller device (10) includes a pulse converter circuit (12) that receives an erase pulse signal (ERPULSE). The pulse converter circuit (12) converts the erase...
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5418743 |
Method of writing into non-volatile semiconductor memory
A method of using a non-volatile semiconductor memory comprising a plurality of row and column lines, a plurality of memory cells disposed at intersections of the row and column lines and a...
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5412601 |
Non-volatile semiconductor memory device capable of storing multi-value data in each memory cell
An electrically erasable non-volatile semiconductor memory device comprising a plurality of row lines and column lines, a plurality of memory cells connected in a matrix to the plurality of row...
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5394359 |
MOS integrated circuit with adjustable threshold voltage
The MOS cell with adjustable threshold voltage is a cell of the type with a memory that is electrically-erasable and programmable by storage of charges by tunnel effect in a floating gate. To...
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5369608 |
Apparatus for relieving standby current fail of memory device
An apparatus for relieving the standby current fail of a memory device which completely relieves a memory device by suppressing the increasing standby current consumption when the standby current...
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5363329 |
Semiconductor memory device for use in an electrically alterable read-only memory
This disclosure relates to an electrically alterable memory device which can be switched from a high resistance state to a low resistance state. The device increases the concentration of...
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5359554 |
Semiconductor memory device having an energy gap for high speed operation
A semiconductor device is provided comprising a nonvolatile memory cell through which an LSI and a higher operating speed are achieved. A drain region, an insulating layer partly overlaying the...
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5349221 |
Semiconductor memory device and method of reading out information for the same
In a memory cell according to the present invention, when positive high voltages are respectively applied to a gate( 20 ) and a drain region( 14 ) and a source region( 13 ) is grounded, hot...
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5349222 |
Single gate MOS type nonvolatile memory and operating method thereof
The present invention provides nonvolatile semiconductor memory which has advantages permitting the cell of the memory circuit to integrate, the memory circuit to be easy to manufacture, and the...
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5345416 |
High density nonvolatile memory and decoder of the same
A non-volatile memory comprises memory cells M arranged in a matrix (MB), word lines (W1 to Wn) for row selection, sub-bit lines (B: B12, B21, B22, B31), sub-column lines (C: C11, C12, C22), a...
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5343423 |
FET memory device
A plurality of trap-type memory transistors are formed in separate wells of a semiconductor substrate, and arranged to constitute a memory matrix. Each well contains the memory transistors...
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5341010 |
Semiconductor device including nonvolatile memories
The present invention can provide the memory circuit which has advantages in integration and the manufacturing expense and is easy to manufacture. The nonvolatile memory 21 comprises a P type well...
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5313419 |
Self-aligned trench isolation scheme for select transistors in an alternate metal virtual ground (AMG) EPROM array
The present invention provides a self-aligned trench isolation scheme for the MOS select transistors in an alternate metal virtual ground (AMG) EPROM array architecture. The new isolation scheme...
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5311049 |
Non-volatile semiconductor memory with outer drain diffusion layer
A non-volatile semiconductor memory wherein in a semiconductor substrate at both sides of a gate structure, a source diffusion layer and drain diffusion layer having an opposite conductivity type...
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5291048 |
Non-volatile storage device with impurities in nitride toward source side
A non-volatile storage device such as an EPROM (erasable programmable read only memory) and a method of manufacturing the same. A silicon oxide film, a silicon nitride film and a silicon oxide film...
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5278440 |
Semiconductor memory device with improved tunneling characteristics
A semiconductor memory is disclosed. The cell has MNOS structure, and comprises a p-type silicon substrate 27 with n type layers 21, 23, a silicon dioxide film 19 thereon, a reduced pressure SiN...
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5270980 |
Sector erasable flash EEPROM
A memory device is provided that includes a plurality of floating gate memory cells arranged in an array, where each memory cell includes a control gate, a drain and a source. A decoder is provided...
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5262987 |
Floating gate semiconductor nonvolatile memory having impurity doped regions for low voltage operation
A semiconductor nonvolatile memory has a base semiconductor region of one conductivity type. A first semiconductor region of the one conductivity type is formed in a surface portion of the base...
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5251172 |
Semiconductor memory apparatus having reduced amount of bit line amplification delay
In a DRAM formed of MOS FETs, respectively different values of substrate bias voltage are applied to transistors of different types of circuit in accordance with the circuit functions, to thereby...
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5241498 |
Non-volatile semiconductor memory device
There is a provided non-volatile semiconductor memory device including a memory cell including a source, a drain, a floating gate, and a control gate. To read out data from the memory cell, a...
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5172338 |
Multi-state EEprom read and write circuits and techniques
Improvements in the circuits and techniques for read, write and erase of EEprom memory enable non-volatile multi-state memory to operate with enhanced performance over an extended period of time....
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5172198 |
MOS type semiconductor device
A MOS type semiconductor device includes two adjacent MOSFETs. The FETs are respectively formed on element forming areas of a P-type substrate. Each of the transistors has N + type layers serving...
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5162880 |
Nonvolatile memory cell having gate insulation film with carrier traps therein
A nonvolatile memory cell comprises a semiconductor substrate of first conduction type, a high-concentration impurity region of second conduction type formed on the semiconductor substrate and...
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5117389 |
Flat-cell read-only-memory integrated circuit
A flat-cell ROM array reduces the number of block select transistors utilized, allows for the layout of straight metal lines, while sharing the metal lines between even and odd banks, and achieves...
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5097444 |
Tunnel EEPROM with overerase protection
The present invention provides protection against the effects of overerasure while essentially maintaining a single transistor per memory cell through the use of an additional transistor for each...
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5068696 |
Programmable interconnect or cell using silicided MOS transistors
A programmable device (10) is formed from a silicided MOS transistor. The transistor (10) is formed at a face of a semiconductor layer (12), and includes a diffused drain region (17, 22) and a...
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5065362 |
Non-volatile RAM with integrated compact static RAM load configuration
A non-volatile random access memory (NVRAM) cell of condensed size employs a pair of programmable threshold voltage devices, e.g. MNOS (metal nitride oxide semiconductor), SNOS (silicon nitride...
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5057885 |
Memory cell system with first and second gates
A memory element manufactured by a thin film forming technique is disclosed. The memory element includes a gate electrode, a gate insulating film, a semiconductor layer, a source electrode, and a...
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5022000 |
Semiconductor memory device
A writing high voltage of one polarity or an erasing high voltage of another polarity is selectively fed, in accordance with a writing or erasing operation mode, via a switch MOSFET to the word...
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5020030 |
Nonvolatile SNOS memory cell with induced capacitor
A silicon substrate with a drain area formed therein is used for the base of the device. A first polysilicon gate is disposed above the substrate with a layer of gate oxide therebetween. Adjacent...
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5017978 |
EPROM having a reduced number of contacts
An integrated circuit includes a memory having cells arranged in rows and columns, each cell having transistor being connected between two bit lines and having a current channel, a control gate and...
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5012448 |
Sense amplifier for a ROM having a multilevel memory cell
A multilevel sense circuit includes a memory MOSFET having one of at least two different current carrying states and a pair of reference MOSFETs one of which has one of the two current carrying...
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4998223 |
Programmable semiconductor memory apparatus
A programmable semiconductor memory apparatus comprises a memory cell array, a data sense circuit for reading data from the memory cell array, and a bus line connected to a common node of a...
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4964079 |
Electrically programmable memory with several information bits per cell
The disclosure concerns electrically programmable memories and, notably, the memories known as EPROMs, EEPROMs, FLASH-EEPROMs. To increase the information storage capacity of a memory, it is...
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4962481 |
EEPROM device with plurality of memory strings made of floating gate transistors connected in series
An electrically erasable programmable semiconductor memory array for high density including a plurality of column lines; a plurality of reference lines perpendicular to the column lines; a...
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4962322 |
Nonvolatible capacitor random access memory
The disclosure relates to a MOSFET-protected nonvolatile capacitor cell which has a storage gate and a nonvolatile stack thereunder, the cell having a heavily doped n+ ring surrounding the storage...
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