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6687151 |
Voltage generation circuit for selectively generating high and negative voltages on one node
An output node NO is, on one hand, connected through a PMOS transistor TP 1 and an NMOS transistor TN 1 to ground, and on the other hand, connected through a PMOS transistor TP 2 and an NMOS...
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6680864 |
Method for reading a vertical gain cell and array for a dynamic random access memory
A vertical gain memory cell including an n-channel metal-oxide semiconductor field-effect transistor (MOSFET) and p-channel junction field-effect transistor (JFET) transistors formed in a vertical...
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6680499 |
Semiconductor device and method of manufacturing the same
Provided are a semiconductor memory device that permits increasing the degree of integration without decreasing the capacitance of the capacitor included in a memory cell, and a method of...
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6677199 |
Structure for preventing salicide bridging and method thereof
A semiconductor device having a memory array that includes a plurality of substantially parallel word lines, a plurality of substantially parallel bit lines, wherein each of the plurality of the...
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6678186 |
Row decoded biasing of sense amplifier for improved one's margin
A structure and method to improve sense amplifier operation in memory circuits is provided. An illustrative method of the present invention includes taking the predecoded the row address signals...
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6671197 |
Contest addressable memory (CAM) with tri-state inverters for data storage
A memory device includes an array of memory cells. When in use, each cell can store a charge representing a binary digit of data. Data lines are connected to the memory cells. The data lines are...
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6671199 |
DATA STORAGE METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT, SEMICONDUCTOR DEVICE EQUIPPED WITH MANY OF THE SEMICONDUCTOR INTEGRATED CIRCUITS, AND ELECTRONIC APPARATUS USING THE SEMICONDUCTOR DEVICE
In a data storage method for memory cells 1, 2 that compose a semiconductor integrated circuit, a power supply potential VDD or a potential VL that is lowered from the power supply potential VDD...
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6667898 |
Method for measuring bias voltage of sense amplifier in memory device
A method for measuring a bias voltage of plural sense amplifiers in a memory device is provided. The method includes the steps of: selecting the plural sense amplifiers as a measurement area,...
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6665206 |
Array architecture for depletion mode ferroelectric memory devices
Depletion-mode ferroelectric transistors are adapted for use as non-volatile memory cells. Various embodiments have an array architecture such that two memory cells sharing the same bit line also...
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6661732 |
Memory system having reduced powder data refresh
The present invention discloses a memory whose power consumption for refresh is reduced to such a level as that of medium and low speed devices, such as SRAM, in its data retention mode. A...
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6661701 |
Three-transistor DRAM cell and associated fabrication method
The three-transistor DRAM cell has a memory transistor formed as a field-effect transistor with a short-channel section and a long-channel section. A second insulating layer and a conductive layer...
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6661699 |
Random access memory cell having double-gate access transistor for reduced leakage current
A dynamic random access memory (DRAM) cell and associated array are disclosed. The DRAM cell ( 300 ) includes a storage capacitor ( 304 ) and a pass transistor ( 302 ). The pass transistor ( 302 )...
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6661702 |
Double gate DRAM memory cell having reduced leakage current
A dynamic random access memory (DRAM) cell and associated array are disclosed. The DRAM cell ( 300 ) includes a storage capacitor ( 304 ) and a pass transistor ( 302 ). The pass transistor ( 302 )...
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6661700 |
Semiconductor memory device
A semiconductor memory device of the present invention has a memory array structure wherein a plurality of word lines and a plurality of bit lines for selecting a predetermined memory cell are...
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6650569 |
Boost device for nonvolatile memories with an integrated stand-by charge pump
The boost device comprises a charge pump circuit having an input and a main output between which an input stage, an intermediate stage and a main output stage are cascade connected. The charge pump...
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6646905 |
Ferroelectric storage device
A ferroelectric storage device having 2Tr-2C cell structure or 1Tr-1C cell structure, which can be assessed by a screening test. In the test, a regulated reference voltage is supplied from an...
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6646944 |
Semiconductor memory device
In a memory sub-block, a refresh activation instruction signal from a main control circuit is taken in by a de-multiplexer in a local control circuit under a predetermined condition and refreshing...
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6646908 |
Integrated memory chip with a dynamic memory
The integrated memory chip has an external control terminal, a dynamic memory, and a control circuit for controlling a memory access to the dynamic memory. The control circuit is connected to the...
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6643205 |
Apparatus and method for refresh and data input device in SRAM having storage capacitor cell
An apparatus for a refresh and a data input device in the SRAM having a storage capacitor cell comprises an internal clock generator for generating and outputting two internal clock signals having...
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6639824 |
Memory architecture
An IC with memory cells arranged in groups is described. The memory cells, for example, are ferroelectric memory cells. The IC includes a variable voltage generator (VVG) for generating an output...
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6639846 |
Method and circuit configuration for a memory for reducing parasitic coupling capacitances
A method and a circuit configuration for a dynamic semiconductor memory are described in which, in order to reduce the parasitic coupling effects between two adjacent bit lines, in particular...
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6639825 |
Data memory
The data memory device has a plurality of memory cells for storing data which are represented by a first physical value of the storing memory elements, especially their conductivity or charge. The...
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6639823 |
Ferroelectric memory device and method of driving the same
A ferroelectric memory device includes a memory cell array in which a plurality of memory cells having at least one ferroelectric capacitor are arranged. Three or more values of data (Pr( 0 ), P 1...
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6635933 |
Structure of a capacitor section of a dynamic random-access memory
Capacitors are formed in the trenches made in an interlayer insulator made of silicon oxide. An insulating film (e.g., a silicon nitride film) is provided on the sides of each trench of the...
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6636435 |
Ferroelectric memory cell array and method of storing data using the same
The present invention relates to a ferroelectric memory cell array formed of a single transistor, and method of storing data using the same. The ferroelectric memory cell array includes a plurality...
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6625064 |
Fast, low power, write scheme for memory circuits using pulsed off isolation device
A circuit, for controlling a write operation during which data from data lines is written to a memory cell, is used with a memory cell of the type that is connected to a row line and a first column...
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6618296 |
Charge pump with controlled charge current
A charge pump circuit is configured for suitably controlling the charging current in the charge pump capacitors. The charge pump circuit comprises an input current controlling circuit comprising a...
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6611448 |
Ferroelectric memory and method for reading the same
A ferroelectric memory device and method for reading such a device utilize capacitive coupling between a bit line and sense amplifier. The gain depends on a capacitance ratio rather than the...
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6608772 |
Low-power semiconductor memory device
Sense amplifiers are alternately disposed on both sides of bit line pairs, switch circuits are provided so as to selectively connect two bit lines to a sense amplifier, and connection between a...
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6608340 |
Substrate assembly having a depression suitable for an integrated circuit configuration and method for its fabrication
A depression extends from a main surface of the substrate to the inside of said substrate and has an upper area and an adjacent lower area. A cross-section of the upper area, parallel to the main...
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6600680 |
Circuit configuration and method for determining a time constant of a storage capacitor of a memory cell in a semiconductor memory
A ring oscillator has a multiplicity of inverters. An interconnect is connected between two of the inverters, and a storage capacitor to be measured, with its associated lead resistor, is coupled...
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6600674 |
Ferroelectric memory device including a controller
Bit lines to which memory cells having a capacitor formed of a ferroelectric substance are connected are each divided into a plurality of line segments. These line segments can be electrically...
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6597599 |
Semiconductor memory
In a semiconductor memory in which memory cells where a bit line is connected with the impurity diffused area of MOS transistors are arranged in a close packed layout in order to reduce the gate...
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6594188 |
Integrated memory having a cell array and charge equalization devices, and method for the accelerated writing of a datum to the integrated memory
An integrated memory having a memory cell array with addressable column lines and addressable row lines is described. The memory further has a charge equalization device for charge equalization on...
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6590799 |
On-chip charge distribution measurement circuit
A method and circuit for measuring a charge distribution for readout from FeRAM cells is fast enough for an on-chip defect detection and parameter adjustment. A comparator-type sense amplifier and...
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6590798 |
Apparatus and methods for imprint reduction for ferroelectric memory cell
Memory devices and methods are disclosed for reading a restoring data from and to ferroelectric memory cells, wherein a data bit is sensed from a data memory cell, a toggle bit is sensed from a...
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6587366 |
Ferroelectric memory device and method for operating ferroelectric memory device
A ferroelectric memory device capable of high-speed drive having a word line to which a plurality of memory cells is connected, wherein the plurality of memory cells is divided into at least two...
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6587368 |
Non-volatile memory circuit
A memory circuit has a volatile memory portion and two ferroelectric capacitors. The volatile memory portion has two internal nodes and the ferroelectric capacitors are coupled in series to form a...
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6586787 |
Single electron device
A single electron device. Fabricated from nanoparticle derivatives, particularly from Au and fullerene nanoparticle derivatives, the device reduces thermal fluctuation in the nanoparticle array and...
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6584010 |
Selective device coupling
Memory devices and other integrated circuit devices having a first capacitor and a second capacitor with an interposing selective isolation device, and methods of their operation. A selective...
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6584009 |
Memory integrated circuit with improved reliability
A chained memory IC in which a dual voltage scheme is used for operating the wordlines is described. During standby mode, the wordlines are maintained at a first logic 1 voltage level. To prepare...
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6580634 |
Data memory device
A data memory device is provided that is capable of reading data accurately even if the reading action is repeated. Respective output ends of memory cells D 0 -D 7 and input ends on one side of...
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6577548 |
Self timing interlock circuit for embedded DRAM
A method and circuit for a self timed DRAM. The circuit includes interlock circuits coupled to an extension of the DRAM. The extension does not store “real” data but mimics the operations of...
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6574134 |
Non-volatile ferroelectric capacitor memory circuit having nondestructive read capability
A non-destructive ferroelectric capacitor-based memory circuit has a plurality of word lines located in parallel to each other. A plurality of bit lines is located across the word lines and a...
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6573613 |
Semiconductor memory device having cell plate electrodes allowing independent power supply for each redundant replacement unit
A word line and a cell plate electrode line are formed at a common interconnection layer. A redundant replacement unit for a faulty row is set corresponding to the cell plate electrode line. For...
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6574140 |
Low voltage single supply CMOS electrically erasable read-only memory
P channel EEPROM cells are designed for integration into arrays written with single polarity signals developed from small, low power charge pumps. These cells reduce the additional masking steps...
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6574131 |
Depletion mode ferroelectric memory device and method of writing to and reading from the same
Depletion-mode ferroelectric transistors are adapted for use as non-volatile memory cells. Such memory cells find use in non-volatile memory devices as well as other electronic systems having...
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6573543 |
Reset apparatus, semiconductor IC apparatus, and semiconductor memory apparatus
A reset device detects a rise of a supply voltage to start outputting a reset signal. The reset device includes a voltage detection circuit for detecting the supply voltage. The voltage detection...
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6574132 |
Circuit configuration for equalizing different voltages on line runs in integrated semiconductor circuits
The invention relates to a circuit configuration for equalizing different voltages on line runs in integrated semiconductor circuits, where the bit line and the plate line have a voltage...
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6574136 |
Reduced leakage memory cell
A random access memory cell ( 10 ) includes a first conductor line ( 12 ) and a second conductor line ( 14 ). A native device ( 16 ) is arranged to store charge. A high voltage threshold transistor...
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