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7626189 |
Characterization of fancy yarn
According to the method for characterizing fancy yarn, at least one characteristic of the fancy yarn is scanned along the longitudinal direction of the fancy yarn. Values of the scanning are...
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7528400 |
Optical translation of triangulation position measurement
An optical translation technique for moving the interrogation spot at which a triangulation system measures the displacement of a target is disclosed. In normal operation of the laser triangulation...
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7456842 |
Color edge based system and method for determination of 3D surface topology
A method and system for determining surface topology of a three-dimensional (3D) structure, based on a structured pattern that is projected onto the surface structure, and images of the pattern...
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7369233 |
Optical system for measuring samples using short wavelength radiation
In an optical system measuring sample characteristics, by reducing the amount of ambient absorbing gas or gases and moisture present in at least a portion of the illumination and detection paths...
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7190826 |
Measuring the location of objects arranged on a surface, using multi-camera photogrammetry
A method and apparatus for measuring the location of objects arranged on a convex surface. A plurality of cameras is arranged in a stationary array about the surface, and is used to capture images...
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7126699 |
Systems and methods for multi-dimensional metrology and/or inspection of a specimen
Systems and methods for multi-dimensional metrology and inspection of a specimen such as a bumped wafer are provided. One method includes scanning the specimen with partial oblique illumination to...
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6967726 |
Means for in-place automated calibration of optically-based thickness sensor
The calibration of a laser caliber is described. The laser caliber uses first and second sensors to determine the distance to different sides of a sheet. A third sensor is used to determine the...
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6891629 |
Method and apparatus for detecting a substrate feature
The invention is directed to a method and apparatus for detecting a substrate feature. A sensor is secured opposite the substrate. The sensor emits a signal onto the surface of the substrate. The...
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6745136 |
Pipe inspection systems and methods
A method for inspecting pipe, the method, in at least certain aspects, including detecting an inspection parameter in at least a first part of a pipe, the pipe having a length, a hollow body, an...
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6743645 |
Method of inspecting process for manufacturing semiconductor device and method of manufacturing semiconductor device
A method of inspecting a process for manufacturing a semiconductor device, used to determine the status of a processing operation during the manufacturing process, according to the embodiment of...
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6714301 |
Spectral ellipsometer without chromatic aberrations
A spectral ellipsometer includes a light incident optical system for focusing a incidence spot of polarized light of multi-wavelengths onto a sample surface. A detecting optical system receives the...
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6621578 |
Elliposometer, sample positioning mechanism, and polarization angular adjusting mechanism, used in the elliposometer
An ellipsometer, which detects polarization of light successively reflected from a reference sample and an objective sample to study the objective sample, comprises first and second sample holder...
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6621060 |
Autofocus feedback positioning system for laser processing
The present invention provides a laser processing and autofocusing system that measures the position of the work-piece at the machining spot, to allow the laser processing of work-pieces which are...
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6618689 |
Method for the non-destructive inspection of wall strength
A method for non-destructively inspecting the wall thickness of a component, where the dimensions of the component or of the component surface are measured, substantially without making any...
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6597463 |
System to determine suitability of sion arc surface for DUV resist patterning
A system and method are disclosed for providing in-situ monitoring of an oxidized ARC layer disposed over an ARC layer. By monitoring the thickness of the oxidized portion of the ARC layer during...
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6549293 |
Apparatus for process for measuring the thickness and out-of-roundness of elongate workpieces
The invention relates to an apparatus and process for measuring the diameter and out-of-roundness of elongate workpieces, particularly those of round products advanced in their longitudinal...
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6501555 |
Optical technique to detect etch process termination
The disclosure describes an exemplary method of detecting a process end point during etching in the fabrication of an integrated circuit. This method can include receiving a reference signal...
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6353478 |
Digital range sensor system
A digital range sensor comprises a light source, an optical element to focus the light from the source down to a small spot on a target, a second optical element that is mounted obliquely from the...
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6091500 |
Method and apparatus for measuring overclad tubes
A method and apparatus for measuring and determining certain parameters of an overclad tube measures the OD and the wall thickness of the tube at a plurality of longitudinal points and a plurality...
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6038028 |
High-speed non-contact measuring apparatus for gauging the thickness of moving sheet material
An optical measurement apparatus is provided for measuring the thickness of a moving sheet material (18). The apparatus has a pair of optical measurement systems (21, 31) attached to opposing...
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5671054 |
Method and apparatus for measuring position of pattern formed on a substrate having a thickness
The thickness of a substrate is one of the most important parameters in detecting the flexure of the substrate. The thickness of a reference substrate disposed on a stage and its amount of flexure...
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5606173 |
Arrangement for aligning, focusing and normalizing imaging system
A set of track gauges for use in aligning, focusing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of...
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5594548 |
In-furnace inspection machine utilizing a double-walled structure
A machine for inspecting the surface conditions of structural members within a furnace, particularly within a furnace operating at a high temperature or with a highly radioactive environment, such...
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5581353 |
Laser-based measurement apparatus and method for the on-line measurement of multiple corrugated board characteristics
The apparatus and method of the present invention utilize a pair of fixed-position laser triangulation sensors, with one sensor located above the board and one directly below. Each sensor produces...
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5457537 |
Optical-electrical measuring method for determining cross-sectional dimensions
An optical-electrical measuring method for determining cross-sectional dimensions particularly of elongate articles with reference to at least one straight line, which is applied to the periphery...
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5450204 |
Inspecting device for inspecting printed state of cream solder
An inspecting device inspects the printed state of cream solder by projecting a plurality of light patterns varying in phase onto a printed circuit board printed with cream solder, and processing...
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5442573 |
Laser thickness gauge
An apparatus for determining the position of a surface of a specimen relative to a reference point. The apparatus has a beam source which produces a narrow beam and a beam splitter splits the...
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5420945 |
Methods for aligning focusing and normalizing imaging system
A set of track gauges for use in aligning, focussing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of...
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5420944 |
Techniques for aligning, focusing and normalizing imaging system
A set of track gauges for use in aligning, focussing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of...
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5355083 |
Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate
A non-contact thickness measuring sensor is disclosed which determines the thickness of an overlying material on a substrate. The sensor includes two non-contact separation distance measuring...
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5351126 |
Optical measurement system for determination of an object's profile or thickness
An optical measurement system for determination of a profile or thickness of an object includes first and second optical heads directing first and second light beams, respectively on first and...
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5298977 |
Visual inspection method for part mounted on printed circuit board
Three different color light beams which are converged to a single light spot on the surface of a circuit board at predetermined incident angles, are irradiated onto the top surface of an electronic...
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5222729 |
Method and apparatus for detecting superimposed sheets of paper
A method and apparatus for detecting superimposed sheets of paper in a sheet fed printing press utilizes cooperating upper and lower transmitter and receiver pairs that are positioned above and...
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5212540 |
Method for measuring a thickness of a printed circuit board
The invention relates to a method for measuring a thickness of a printed circuit board having a plating portion provided on a core portion. The method includes directing a laser beam to the core...
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5210593 |
Gauge for measuring the thickness of an unsupported web
A gauge for measuring the thickness of an unsupported web. One triangulation sensor is located above and the other is located below the web. Each triangulation sensor includes a laser whose beam is...
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5075559 |
Method for measuring the thickness of a light-reflective layer on a light-translucent substrate
Measurement of the thickness of a light-reflective layer (20) on a light-translucent substrate (10) is carried out in a non-destructive fashion by placing a light-reflective member of a known...
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5068912 |
Track gauges for aligning and focussing the imaging system in a high speed document handling system
A set of track gauges for use in aligning, focussing and normalizing an imaging system of a high speed document processor have been provided. Each of the gauges fit within a track (14) in front of...
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4924105 |
Optical measuring device with alternately-activated detection
An optical measuring device for measuring a thickness of a workpiece or a height of a step thereof comprises a pair of deviation measuring means disposed in opposing relation to the workpiece, a...
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4905170 |
Method and apparatus of determining optical constants of amorphous semiconductors and dielectrics
Disclosed is a method of and apparatus for determining the optical constants of materials in general and also for determining thicknesses of thin films. A complex index of refraction is derived...
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4803371 |
Optical scanning method and apparatus useful for determining the configuration of an object
An optical scanning system illuminates the object to be scanned with non-coherent light and laser light simultaneously. A photodetector camera views the object and produces a single output signal...
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4773760 |
Procedure and means for measuring the thickness of a film-like or sheet-like web
The invention concerns a procedure for measuring the thickness of a film-like or sheet-like web. In the procedure, measuring heads located on both sides of the web and detectors provided in these...
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4771182 |
Spurious electromagnetic energy discriminator for electro-optical inspection systems
An electro-optical system for inspecting an object includes a source producing a beam of electromagnetic energy, for example, a laser. It also includes a means for discriminating between...
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4745292 |
Arrangement for establishing the thickness of print applied to a print carrier
The present invention refers to an arrangement for determining the thickness of a print applied to a print carrier. The applied print whose thickness is to be determined is orientated in a manner...
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4710808 |
Machine vision differential measurement system
In the present system, the thickness of an object with two surfaces is determined by forming two geometric images on the surfaces in a superimposed relationship. The images are viewed by two video...
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4708482 |
Method and apparatus for measuring wear in the lining of refractory furnaces
A continuous wave laser light beam is directed at the refractory lining within a furnace vessel, and the displacement as measured by a self-scanned linear array of the scattered light beam from a...
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4650333 |
System for measuring and detecting printed circuit wiring defects
A non-contact system for detecting printed circuit wiring defects and for measuring circuit feature height relative to a substrate. The system has an energy source for illuminating the substrate...
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4477185 |
Optical imaging apparatus
An imaging apparatus, for instance a wafer stepper, has an optical system for forming an image of an object such as a reticle and it has a focusing device. The focusing device has detector means...
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4456379 |
Process for the determination of thickness of adhesive layers of inner book block backings
The present invention is directed to a process for determining the thickness of adhesive layers placed on book block backings by initially measuring the position of a backing before adhesive is...
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4375921 |
Dimension measuring apparatus
A device for accurately measuring a dimension associated with a remote object without contacting the object itself is disclosed. A beam of light is directed at a surface of the object and a...
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4373816 |
Scanning beam optical position determining apparatus and method
A method and apparatus for determining the location of a target surface by projecting a periodically scanning pattern of light onto the target surface, and comparing the time of projection of a...
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