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7602508 |
Method and apparatus for measuring pitch, rake and squareness of a boat propeller
The present invention provides a method of determining certain propeller parameters for a boat propeller that has a hub, a central axis and a plurality of propeller blades attached to the hub. The...
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7595893 |
Shape measurement method and shape measurement apparatus
A shape measurement method for measuring a shape of an object to be measured, which has a substantially rotating symmetric shape, includes: placing an aperture having an opening larger than an...
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7495777 |
Method and apparatus for contact free measurement of periodically moving objects
A method and apparatus is described for contact-free 3 dimensional-measuring of a moving object with periodic motion. The method and apparatus makes use of the projection of a defined intensity...
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7456842 |
Color edge based system and method for determination of 3D surface topology
A method and system for determining surface topology of a three-dimensional (3D) structure, based on a structured pattern that is projected onto the surface structure, and images of the pattern...
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7436498 |
Apparatus for determining the shape of a gemstone
An apparatus for determining the shape of a gemstone, including irregularities on its surface, is provided, The apparatus comprises a platform adapted to support the gemstone, a scanning system...
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7433027 |
Apparatus and method for detecting lens thickness
The present invention relates to a non-contact/non-destructive method and apparatus for measuring the thickness of an ophthalmic lens. The present invention also provides a method for inspecting or...
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7327473 |
Flatness tester for optical components
Disclosed herein is a method comprising capturing an image of a grating formed on a surface of a brightness enhancing display film; measuring a displacement Δd of a fringe from the image of the...
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7253889 |
Shaft cone metrology system and method
Aspects include metrology methods and systems for determining characteristics of conical shaft portions, such as angle of taper. In an example, a metrology system includes a fixture for supporting...
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7245387 |
Three-dimensional measuring instrument
For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional shortening the measurement time. A printed state inspection device 1 includes...
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7019848 |
Three-dimensional measuring instrument, filter striped plate, and illuminating means
For measuring the three-dimensional shape of an object of measurement using a phase shift method, a three-dimensional measuring instrument is provided which is capable of shortening the measurement...
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6985238 |
Non-contact measurement system for large airfoils
A non-contact measurement system employing a non-contact optical sensor and an edge detection sensor with a positioning system for moving the sensors over the surface and edges of a part (A) held...
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6969836 |
Space carving for measurement of high-curvature areas on a mechanical part
A method of determining the leading edge (E) of a turbine blade or airfoil (P). The object is mounted in a desired position and backlit using a light source (S). The object and its leading edge are...
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RE38800 |
NIR clinical opti-scan system
The present invention relates to three-dimensional optical imaging techniques and, more particularly, to the detection and three-dimensional imaging of absorbing and/or scattering structures in...
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6900895 |
Phase noise compensation in an interferometric system
Phase noise is at least partially cancelled for an interferometric system by using a delay/phase cross-correlation approach for two interferometers within the system. The cross-correlation approach...
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6870606 |
Process for measuring the surface of a polished precious stone
Process for the measurement of the surface of a polished precious stone, wherein firstly the position of at least some of the flat facet surfaces of the stone is measured in space, in particular by...
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6845177 |
Method and apparatus for monitoring an analog meter
A method and apparatus for remote monitoring of an analog meter is set out which employs a Hough Transform on the edge points of the meter scale to obtain the center of the scale. The graduation...
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6807302 |
Recognition apparatus and recognition method
A recognition apparatus of this invention for recognizing sorting information as a character string written within a cellophane region of a paper-like material extracts edge components according to...
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6788807 |
Three dimensional information measurement method and apparatus
Method and apparatus for measuring three dimensional information of a target placed in an interior space of a rotator type mirror by using the rotator type mirror in combination with an imaging...
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6757420 |
Inspection device for packages
The invention is concerned with the problem of providing an automatic inspection device, with which it is possible to determine, with little effort and without contact, whether packages,...
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6753971 |
Method for determining geometric structures on or in a substrate as well as material parameters
In order to determine geometric structures and/or material parameters on or in substrates and in a locally resolved manner over the substrate surface, the invention provides the following measures:...
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6728593 |
System for analysis of fabric surface
A system for analyzing fabric surface appearance includes a feed mechanism for running a fabric over a crest including a frame for holding the fabric bent to form a crest, an image capturing device...
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6690841 |
Method and apparatus for image registration
A machine vision system includes an apparatus for registering an input image of an object, such as an aircraft engine blade, to a reference image comprising ideal specifications for the object in...
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6597464 |
Method and device for testing a cutting-edge geometry of a rotatably drivable tool
The testing of a cutting-edge geometry of a tool takes place during time intervals that comprise time instants at which it is to be expected that a region, to be tested, of the tool enters a...
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6567156 |
Apparatus and method for examining the shape of gemstones
A method for examining a gemstone includes the steps of coating the gemstone with a removable diffusing coating and determining the silhouette of the gemstone in three dimensions. The method...
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6543972 |
Device to help determine key cut attributes
The invention relates to a key decode apparatus for helping to automatically extracting and measurement depths and spacings of cuts an object key and decodes when duplicating an original key. A key...
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6525828 |
Confocal color
An apparatus for examining an object in three dimensions including an optical system having an illumination side and an observation side; an illumination grid located in an illumination plane on...
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6496271 |
Wire and seal profile analyzer
A wire analyzing device includes a source of radiation that irradiates a plurality of sensing elements. The source of radiation preferably is a laser beam and the sensing elements preferably are...
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6455835 |
System, method, and program product for acquiring accurate object silhouettes for shape recovery
Disclosed are methods and apparatus for obtaining the shape of an object by observing silhouettes of the object. At least one point light source is placed in front of the object, thereby casting a...
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6421451 |
Step difference detection apparatus and processing apparatus using the same
The present invention provides a step difference detection apparatus including an illumination section for emitting illumination light, an incident section for making the illumination light emitted...
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6400459 |
Methods and apparatus for using optical sensors in component replacement heads
Methods and apparatus for improving the efficiency of using optical sensors with component placement machines for the placement of components onto a circuit board. One of the improved methods...
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6195165 |
Enhanced sensor
A single housing sensor includes a detector in the housing receiving light from a light source. A detector in the housing provides an output representative of a profile of a component which is...
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6191857 |
Measuring method and apparatus
A method of measuring selected values of a specimen having at least one edge is performed with an apparatus which positions the specimen in the path of a light beam such that the specimen at least...
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6081337 |
Method and apparatus for measuring liquid crystal cell properties
The present invention relates to methods and apparatus for measuring the optical properties, eg twist angle, cell gap, input director, of a transmissive or reflective liquid crystal cell. For a...
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6072569 |
Apparatus and a method for measurement of wedge in optical components
According to one aspect of the present invention, a method for determining orientation of one surface of an optical component relative to another surface of the optical component comprises: (a)...
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6069701 |
Method and apparatus for measuring the height of an object
A method and an apparatus for measuring the height of an apex of an object with high accuracy without influence of the surface state of the object are disclosed. Correlation coefficients of...
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6065911 |
Method and apparatus for automatically making keys
The invention relates to an improved key making machine that automatically extracts characteristics of an object key without human intervention. The position and alignment of the object key is...
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6064759 |
Computer aided inspection machine
An automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images...
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6064756 |
Apparatus for three dimensional inspection of electronic components
A three dimensional inspection apparatus for ball array devices, where the ball array device is positioned in a fixed optical system. An illumination apparatus is positioned for illuminating the...
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6057909 |
Optical ranging camera
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6049389 |
Method and apparatus for reading relief carried on a transparent or translucent receptacle
The invention provides a method of optically reading relief carried by the outside wall of a transparent or translucent receptacle. The method of the, invention consists: in illuminating the...
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6049384 |
Method and apparatus for three dimensional imaging using multi-phased structured light
An apparatus for three dimensional imaging using multi-phased structured light. Measurement of dimensions as small as two hundred microns within one percent accuracy is possible, and multiple scans...
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6046812 |
Shape-measuring laser apparatus using anisotropic magnification optics
The present invention relates to an apparatus for measuring surface relief profile of an object by projecting a line-shaped laser sheet beam in triangulation method and anisotropic magnification...
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6044288 |
Apparatus and method for determining the perimeter of the surface of an object being scanned
An apparatus for determining the perimeter of an object being scanned comprises a scanning chamber for receiving therein an object being scanned; a source of laser beam disposed within the scanning...
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6043891 |
System for three-dimensional measurement of inaccessible hollow spaces
A system for three-dimensional measurement of inaccessible hollow spaces g. sewage canal pipes) by means of a light source and a camera, which are disposed on an inspection head or carrier. A...
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6040910 |
Optical phase-shift triangulation technique (PST) for non-contact surface profiling
The present invention is an optical system for profiling a surface of an object. The optical system includes a projection system for directing an incident beam of light having a varying intensity...
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6038074 |
Three-dimensional measuring apparatus and method, image pickup apparatus, and apparatus and method for inputting image
Images of an object viewed from a plurality of points of view is input through an image inputting unit. Change of orientation of the image inputting means, occurring when the images of the object...
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6038020 |
Mask pattern verification apparatus employing super-resolution technique, mask pattern verification method employing super-resolution technique, and medium with program thereof
A mask pattern verification apparatus includes a semiconductor circuit layout unit for generating layout data from semiconductor circuit data, a super-resolution corresponding pattern verification...
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6038018 |
Substrate inspecting apparatus, substrate inspecting system having the same apparatus and substrate inspecting method
A substrate inspecting system 60 observes and inspect a semiconductor wafer pattern by irradiating the surface of the semiconductor wafer 11 with electron beams 31, and making a projection unit...
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6033721 |
Image-based three-axis positioner for laser direct write microchemical reaction
Apparatus for determining a best trajectory for laser CVD through a strategy of acquiring a series of two-dimensional plane images of the substrate. These images, taken together, contain...
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6031225 |
System and method for selective scanning of an object or pattern including scan correction
A system and method for correcting a scan pattern of a moving optical scanning system. A gantry moves an optical system at a constant rate in a first direction. Using a light source and a first...
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