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7630071 |
Inspecting apparatus for glass substrate
An inspecting apparatus for a glass substrate detects blurs of a green color filter layer, a blue color filter layer, a column spacer layer, a pixel layer of a thin film transistor, or the like,...
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7589844 |
Shape inspection method and apparatus
Shape inspection is carried out without preparing an inspection apparatus for each model of product. There is provided a shape inspection method comprising a first step of placing an object to be...
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7567344 |
Apparatus and method for characterizing defects in a transparent substrate
An apparatus and method for detecting defects in a transparent substrate by simultaneously using a combination of bright field and dark field light sources for illuminating the substrate. The...
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7551274 |
Defect detection lighting system and methods for large glass sheets
A glass defect detection system comprising an apparatus and methods for the real-time inspection for defects in and on transparent sheets, such as a large sheets of glass is disclosed. The defect...
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7532316 |
Display panel inspection apparatus and method
The present invention relates to a display panel inspection apparatus for inspecting a display panel composed of a plurality of pixels. The display panel inspection apparatus comprises a detecting...
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7528945 |
Method to determine the optical quality of a glazing
A method of determining the optical quality of a glazing which includes at least one area having a reduced light transmission, involves producing a shadowgraph image of the glazing and measuring...
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7522277 |
Lateral surface sensor and imaging optical system therefor
The present invention relates to an imaging optical system for imaging the peripherally extending lateral surfaces ( 9 ) of an object ( 10 ) on to an imaging plane, comprising a reflecting element...
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7502102 |
System and method of imaging the characteristics of an object
A system and method for imaging the characteristics of an object ( 2 ) having at least a first ( 2 a ) and a second ( 2 b ) layer. The object ( 2 ) is illuminated by means of incident light ( 4 ),...
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7495760 |
Device and method for evaluating optical distortion of transparent plate body
To provide estimating apparatus and method of the optical distortion of light transmitted through a transparent plate-shaped body. Upon picking-up a grid pattern via a glass plate by an image...
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7471383 |
Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging
The present application describes and claims an opto-electronic method of quantitatively analyzing reflected optical distortion in sheets or panels of shaped glass.
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7453563 |
Device and method for detecting scratches
The invention relates to a device and a corresponding method for detecting scratches on the surface ( 2 ) of a material, in particular glass. Said device comprises an illumination unit ( 3 ) and a...
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7443499 |
Method for measuring the sagging of a glass panel
A method for measuring the sagging of a glass panel in the process of bending the glass panel on a ring mould. The method includes measuring the sagging at a glass panel's measuring point and the...
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7435941 |
Methods for measuring optical characteristics by differential diffractive scanning
Methods and systems for measuring and/or inspecting a characteristic of an optical article are provided. In one example, a method includes illuminating an optical article with a focused beam of...
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7423738 |
Inspecting system for security documents
An inspecting system for security documents is disclosed, wherein a rotating cylinder provided with transparent sectors is apt to transport the document past an image acquiring device, and in which...
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7420667 |
Equipment for capturing the contour, markings, bores, millings and etchings of an ophthalmic lens or template lens for glasses
Equipment for capturing the contour, markings, bores, millings and etchings of an ophthalmic lens or a template lens for glasses. Equipment for capturing the contour, markings, bores, millings and...
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7420671 |
Defect inspection method and apparatus for transparent plate-like members
A defect inspection method and apparatus for a transparent plate material for detecting a bubble, a scratch, a foreign matter, and another defect existing on or in the transparent plate material...
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7410528 |
Method and system for testing the integrity of green plugged honeycomb structure
A method for testing integrity of a plugged honeycomb structure includes forming a condenser at a first end of the honeycomb structure, passing a vaporous stream into a second end of the honeycomb...
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7408633 |
Apparatus and method for inspecting film defect
There is disclosed a defect inspection apparatus, wherein a light source projects a linear light onto a transparent film to inspect, so that a light receiver receives light beams transmitted...
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7397566 |
Method and apparatus for optical interactance and transmittance measurements
A method, system and apparatus for improving at least one of a) optical interactance measurements, b) optical transmittance measurements and c) optical reflectance measurements. The apparatus has a...
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7394536 |
Method and apparatus for inspecting front surface shape
The present invention provides an inspection method and an inspection apparatus which can remove influence of rear surface reflection image and inspect characteristic of a front surface shape with...
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7385174 |
Apparatus and method for measuring sidewall thickness of non-round transparent containers
An apparatus for inspecting sidewall thickness of non-round transparent containers includes a conveyor for holding a container in stationary position and rotating the container around an axis. A...
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7379177 |
System and method for performing hard glass inspection
A system and method to inspect objects for a characteristic parameter. The system includes at least one electromagnetic source for emitting at least two separate wavelengths of electromagnetic...
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7379174 |
Wafer detecting device
Provided is a detecting device for an FIMS system, for easily and simply detecting a slip-out of a glass wafer from an FOUP or detective storage thereof. The detecting device includes a light...
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7365838 |
System and method for the measurement of optical distortions
An apparatus measures optical deviations caused by an aircraft canopy. In this apparatus, a light source generates a beam of light. A collimator, optically coupled to the light source, then...
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7359046 |
Method and apparatus for wafer-level measurement of volume holographic gratings
The invention describes a system for the measurement of volume holograms on a wafer scale that permits high-resolution and high throughput measurement of grating parameters. The invention uses a...
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7349081 |
Method and device for checking the integrity of a glass protecting tube for the spiral-wound filament of an infrared radiator heat source
In order to be able to check reliably glass protecting tubes for spiral-wound filaments of an infrared radiator heat source with respect to damages due to breaking, a device and method are provided...
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7342654 |
Detection of impurities in cylindrically shaped transparent media
The invention relates to a system and method of detecting impurities in a cylindrically shaped transparent medium, wherein the cylindrically shaped transparent medium is illuminated with...
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7339664 |
System and method for inspecting a light-management film and method of making the light-management film
A method of inspecting a light-management film comprises reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for...
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7332359 |
Semiconductor device inspection method
Techniques for inspecting semiconductor devices. An inspection condition using chip matrix data and chip size data is set. The intricate circuit patterns of at least one semiconductor device is...
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7307714 |
Apparatus and process for detecting inclusions
Disclosed are process and apparatus for inspecting internal inclusions in internally transmissive substrates. The process involves applying a black coating to one major surface of the substrate,...
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7304721 |
Method for dynamically monitoring a reticle
The method of dynamically monitoring a reticle includes preventively macro monitoring and defect inspecting with regard to mechanical loading, including particle deposits or electrostatically...
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7292332 |
Method and apparatus for detecting faults in transparent material
The method for detecting faults in transparent material includes irradiating a definite partial volume in the material with a first radiation source and coupling light into the material from a...
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7289231 |
Apparatus and method for determining physical properties of a mask blank
An apparatus for determining physical properties of a mask blank. The apparatus includes, for example, an illumination device for radiating a predetermined light laterally into the mask blank, a...
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7289201 |
Inspection device for transparent substrate end surface and inspection method therefor
An inspection apparatus for inspecting an end face of a transparent substrate and an inspection method for inspecting an end face of a transparent substrate according to the present invention are...
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7289655 |
Device for inspecting illumination optical device and method for inspecting illumination optical device
The invention provides a device to inspect an illumination optical device and a method to inspect an illumination optical device that make it possible to efficiently inspect illumination optical...
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7283227 |
Oblique transmission illumination inspection system and method for inspecting a glass sheet
An oblique illumination inspection system and method are described herein that are used to identify a defect (e.g., inclusion, onclusion, scratch, stain, blister, cord or other imperfection...
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7274445 |
Confocal scatterometer and method for single-sided detection of particles and defects on a transparent wafer or disk
A problem in the inspection of transparent wafers and disks is the detection of top surface particles. More precisely, it is being able to assign a scattering site as being due to a particle at the...
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7268866 |
Method for inspecting a weld seam in a workpiece made of weldable plastic and device for carrying out this method
The invention relates to an inspection method for inspecting the quality of a weld seam ( 15 ) during which a material, which is transparent to electromagnetic radiation ( 30 ) of a defined...
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7268867 |
Apparatus and method for inspecting a semiconductor component
Examination devices and methods operating with incident light have hitherto been used for the examination of wafers. To allow these devices also to be used with the transmitted-light method, it is...
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7259844 |
High throughput darkfield/brightfield wafer inspection system using advanced optical techniques
The broadband brightfield/darkfield wafer inspection system provided receives broadband brightfield illumination information via a defect detector, which signals for initiation of darkfield...
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7248355 |
Using special visibility materials proximate candidate component locations to enhance recognition
The invention in one implementation encompasses the use of special visibility material to enhance the ability of computer-aided visual inspection machines to detect errors in placement or...
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7239380 |
Tensioning rail applied by injection molding
A device for checking ( 1 ) whether a first object ( 2 ) with an adhesive ( 4 ) affixed thereto is glued onto a second object ( 3 ) by means of the adhesive ( 4 ), including an excitation unit ( 5...
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7215418 |
Inspection of transparent substrates for defects
Methods, apparatus and systems for the detection of defects in transparent substrates such as glass sheets are disclosed. The methods, apparatus and systems are capable of detecting optical path...
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7151603 |
Overhead transparency clarity simulator
A method and apparatus for evaluating the scattering properties of a transparency image comprises projecting radiation through the transparency image to form a transmitted beam of radiation;...
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7148961 |
Container sidewall inspection
Apparatus for inspecting containers having a sidewall with a shoulder and a heel includes a device for positioning a container for inspection, a light source on one side of the container...
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7142307 |
Method and apparatus for optical interactance and transmittance measurements
Apparatus and a method are disclosed for the simultaneous or rapid sequential use of two or more different separations between the source and detector of the measuring apparatus to obtain spectral...
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7142295 |
Inspection of transparent substrates for defects
Methods, apparatus and systems for the detection of defects in transparent substrates such as glass sheets are disclosed. The methods, apparatus and systems are capable of detecting optical path...
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7113272 |
Device and method for automatically inspecting objects traveling in an essentially monolayer flow
A device and a method for automatically inspecting objects traveling in an essentially monolayer flow. The device comprises a detection unit through which the object flow passes, consisting of the...
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7105848 |
Dual level out-of-focus light source for amplification of defects on a surface
A web defect inspection system includes line scan cameras positioned across the width of a web and a dual-level out-of-focus light source for illuminating the web. An illumination surface of the...
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7041962 |
Laser scanning apparatus
The invention relates to a laser scanning apparatus, in particular for distance determination, comprising a transmission unit which has a pulsed laser for the transmission of a light beam into a...
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