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9036139 Optical characteristic measurement apparatus  
An optical characteristic measurement apparatus acquires a measurement value pertaining to an image characteristic of an optical system to be tested on a plurality of evaluation planes, and...
9030671 Measuring assembly for measuring a spectacle frame  
A measuring assembly for measuring an inside of a lens frame of a spectacle frame, said lens frame at least partially delimiting an inscribed surface area F that corresponds to a lens shape,...
9030657 Device and method for subaperture stray light detection and diagnosis  
A device and method for subaperture stray light detection and diagnosis. A test light beam is generated. Stray light is detected. Based on the detected stray light, potential paths that light may...
9013687 Testing of optical devices  
The present disclosure describes techniques for testing optical devices in a manner that, in some implementations, simulates the environment in which the devices will be used when they are...
9001315 Lens assembly testing method  
A lens assembly testing method includes: providing a lens assembly having a first lens and a second lens placed on the first lens; determining whether a modulation transfer function value of the...
9001314 Protection factor rating system for protective eyewear  
A method of rating eyewear includes providing eyewear to be rated, measuring a physical property of the eyewear selected from a group that includes ultraviolet radiation absorption, blue light...
8976250 Lens inspection system  
A lens testing system may have a test pattern source that generates a test pattern of light. A lens may have a lens surface that reflects the test pattern of light. A digital camera system may...
8970832 Optical testing method and system for 3D display product  
An optical testing method and system for 3D display products are disclosed, the method comprising: the 3D display product to be tested displaying white light and/or black light, a left eye lens...
8953173 Apparatus for microlithographic projection exposure and apparatus for inspecting a surface of a substrate  
An apparatus (10) for microlithographic projection exposure, which includes: an optical system (18) for imaging mask structures (16) onto a surface (21) of a substrate (20) by projecting the mask...
8947649 Apparatus and method for determining optical center in camera module  
An apparatus and method for determining optical center in camera module are provided, the method for determining optical center in camera module according to an exemplary embodiment comprising...
8945802 Flare-measuring mask, flare-measuring method, and exposure method  
A method for measuring flare information of a projection optical system includes arranging, on an object plane of the projection optical system, a sectoral pattern surrounded by a first side, a...
8928892 Wavefront analysis inspection apparatus and method  
The present invention provides high-resolution wavefront measurement systems and methods for real-time inspection of optical and geometrical properties of specular and transparent objects, the...
8928871 Reflective mask  
According to a flare measuring method in an embodiment, a reflective mask, in which one reflective coordinate in a slit direction in a mask surface is determined when one scanning coordinate is...
8928870 Lens meter  
A lens meter includes a measurement optical system having a light source, measurement target plate, and light receiving sensor. A lens table has an opening where a measurement optical axis of the...
8913236 Method and device for measuring freeform surfaces  
An optical measuring instrument for measuring aspheric surfaces includes an optical measuring arm and a multi-axis drive platform. The optical measuring arm provides for illuminating and imaging...
8879054 High resolution wavelength measurement system using a coarse, stable timing signal  
A source generates an optical test signal sweeping a bandwidth of wavelengths over time. The test signal is applied to a device under test (DUT) to generate a response signal. A timing signal...
8867029 Systems for and methods of facilitating focusing an optical scanner  
Systems and methods for facilitating focusing of an image scanner, such as a confocal microscope, are disclosed. Measurement of optical characteristics in certain areas of a test sample are...
8860936 Multiple radiation inspection of ophthalmic lenses  
Methods for inspecting ophthalmic lenses with different wavelengths of radiation are disclosed herein.
8854611 Method for determining the optic center of a lens blank  
A method comprises providing a lens blank, a precision positioning device, an illumination device, and a vision system, wherein the lens blank includes at least one feature whose position is known...
8836929 Device and method for the optical measurement of an optical system by using an immersion fluid  
A device for the optical measurement of an optical system, in particular an optical imaging system, is provided. The device includes at least one test optics component arranged on an object side...
8830459 Device for demonstrating and testing the cosmetic qualities of an ophthalmic lens  
A device is provided for demonstrating and testing the cosmetic qualities of an ophthalmic lens by viewing, the device comprising both a bearing wall (2) for bearing against a fixed surface and...
8823926 Method and apparatus for visualizing a signature mark on a spectacle lens  
A method and an apparatus serve for visualizing a signature mark on a spectacle lens. In order to identify the signature mark, an illumination light beam is directed onto the spectacle lens, which...
8817246 Lens test device and method  
A lens testing method is disclosed which comprises the following three steps. First, test a lens under test to obtain a testing characteristic value of the lens under test for a first object...
8817088 Sample observation device for generating super resolution image  
A sample observation device includes: an excitation light generation unit; an intermediate image forming unit projecting excitation light to a sample and forming an intermediate image of the...
8810784 Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements  
This invention provides for a method and an ophthalmic lens thickness profile measuring apparatus. More specifically, the apparatus which is capable of measuring the ophthalmic lens in a precursor...
8797520 Wavefront aberration measuring device and method and wavefront aberration adjusting method  
A wavefront aberration measuring apparatus which measures an wavefront aberration of an optical system to be inspected includes a point light source which supplies a measuring light; a...
8797388 Mounting accuracy inspection method and inspection apparatus using the inspection method  
A display apparatus to be inspected includes: a display panel in which pixel groups are arranged; and an optical element for providing image display for N viewpoints (N is a natural number more...
8780341 Inspecting system for lens module  
An inspecting system for inspecting a lens module includes an inspection device; and a transmitting and loading device. The transmitting and loading device includes a grasping assembly, a...
8780192 Sample observation device for generating super resolution image  
A sample observation device includes: an excitation light generation unit; an intermediate image forming unit projecting excitation light to a sample and forming an intermediate image of the...
8773651 ***WITHDRAWN PATENT AS PER THE LATEST USPTO WITHDRAWN LIST***
Method and apparatus for visualizing a signature mark on a spectacle lens
 
A method and an apparatus serve for visualizing a signature mark on a spectacle lens. In order to identify the signature mark, an illumination light beam is directed onto the spectacle lens, which...
8773539 Camera module test and focus controlling apparatus  
A camera module test and focus controlling apparatus includes: a base with four actuators therein; a socket frame on one upper side of the base, and rotated by a first actuator; socket boards on...
8773652 Method and device for aligning a lens with an optical system  
The invention comprises a process for pre-aligning a lens with an optical system, the process comprising: providing a lens and an optical system having an optical axis, wherein the lens is apt to...
8760625 Lithographic apparatus, aberration detector and device manufacturing method  
An aberration detector for a lithographic apparatus is used. An imaging device captures an image of at least one pinhole feature of a target projected onto the imaging device by the projection...
8755094 Method of measuring irradiation position shift and focus shift in optical scanning apparatus  
A pupil splitting lens that splits a pupil of a light beam from a deflector into a plurality of light beams in a main scanning direction of the deflector and a pupil splitting lens that splits the...
8749770 Lens module testing device  
A lens module testing device includes a base substrate, a supporting assembly, a bearing assembly, a receiving element, and an operation element. The supporting assembly is positioned on the base...
8749771 Apparatus for measuring thickness of lens and method using the apparatus  
An apparatus for measuring a thickness of a lens is disclosed. The apparatus includes a first support, a second support, a third support, a first positioning element, a second element and a...
8743360 Detection method for birefringence measurement  
A method of controlling a light beam in an optical system includes a light source that directs a collimated light beam along a path, through a sample, and toward the active area of a stationary...
8736828 Method and apparatus for inspecting ophthalmic lens  
An embodiment of a system and a method for inspecting a contact lens is provided. The illumination system illuminates the center zone and the peripheral zone of the contact lens when it is inside...
8724103 Method and apparatus for identifying and correcting spherical aberrations in a microscope imaging beam path  
A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A...
8717551 Adaptive search for atypical regions in incident light field and spectral classification of light in the atypical regions  
A system and method for searching an incident light field for atypical regions (e.g., hot spots or cool spots or spectrally distinctive regions) within the incident light field using a light...
8699015 Schematic eye and adjustment method and evaluation method for optical coherence tomography apparatus  
A schematic eye is used for the evaluation of the optical system of an optical coherence tomography apparatus which captures a tomogram of the fundus. The eye includes a first optical member which...
8699014 Measuring member, sensor, measuring method, exposure apparatus, exposure method, and device producing method  
A measuring member has a first face and a plurality of first marks arranged on the first face. The first marks have respective orientations corresponding to their positions in a first direction.
8699010 Examination kit for polarized lens  
An examination kit allows for discovery of the axis of direction and stress areas of polarized lenses. The kit comprises a lower light box with a transparent work surface, two polarized film...
8699016 Progressive power lens, method of designing progressive power lens and method of evaluating progressive power lens  
Improving the optical state of a progressive addition lens along a principal line of vision through which the line-of-sight of a wearer passes by making the displacement of a position at which an...
8687179 Wavefront aberration measuring apparatus  
A wavefront aberration measuring apparatus comprising: an illumination optical system provided to an incident side of a test lens; and a measuring optical system provided to an exit side of the...
8687180 System, method, and device for determining a focal position of an objective in a microscopy imaging system  
A system and method of determining a focal position for an objective positioned at a measurement location of a sample holder in a microscopy imaging system are provided. The objective is moved to...
8681224 Method for high precision lens distortion calibration and removal  
The present application relates to a high precision method for calibrating and removing distortion from a lens, and more particularly, a method for calibrating and removing distortion by arranging...
8670113 Simplified checking bench for telescopes and auto-checkable telescopes  
In the field of optical checking of optical instruments of telescope type, an instrument comprises an optical objective, a photo-detection housing arranged at the focus of said optical objective...
8665425 Eccentricity measuring method  
In an eccentricity measuring method according to the present invention, a first position of a light source image formed by reflection at one optical surface is measured (S2), a predetermined...
8665430 Exposure condition determining method and surface inspection apparatus  
There is provided an exposure condition determining method for determining an exposure condition for an exposure-objective substrate having a plurality of semiconductor pattern features formed by...