|
Match
|
Document |
Document Title |
|
|
7592825 |
Methods and systems for semiconductor diode junction screening and lifetime estimation
Screening methods and systems that can detect semiconductor junction devices that may exhibit sudden failure.
|
|
|
7579858 |
Semiconductor device and inspection method thereof
A semiconductor device is disclosed. The device has a photodiode isolated by element isolating regions (Ia, 14 a, 14 b ) characterized by the following facts: on the principal surface of first...
|
|
|
7564882 |
Integrated circuit having on-chip laser burn-in circuit
An integrated circuit for providing burn-in current to a laser diode. The integrated circuit includes a laser driver having an output for connection to the laser diode. Burn-in circuitry is formed...
|
|
|
7554100 |
Fabricating method of semiconductor light-emitting device
A fabricating method of a semiconductor light-emitting device includes the step of forming a wafer including a multi-layered semiconductor film epitaxially grown on a base substrate and containing...
|
|
|
7545111 |
Testing inverter driven electric motor shut-off path
A method for testing electric motor shut-off including injecting current into an electric motor, applying at least one of a short or an open to the electric motor for a predetermined length of...
|
|
|
7505496 |
Systems and methods for real-time compensation for non-linearity in optical sources for analog signal transmission
The present invention provides a compact analog directly modulated laser configuration that is suitable for use in the field that uses electrical feedback to compensate for non-linearity in real...
|
|
|
7501848 |
Method and apparatus for measuring leakage current
A method and apparatus for measuring a leakage current of a semiconductor device having a first end and a second end are disclosed. The apparatus for measuring a leakage current includes a...
|
|
|
7474115 |
Organic electronic device display defect detection
Defects are detected in organic electronic device displays such as organic light emitting diode (OLED) displays. An infrared camera may be used to screen displays for defects and to identify the...
|
|
|
7463050 |
System and method for controlling temperature during burn-in
Systems and methods for reducing temperature dissipation during burn-in testing are described. Devices under test are each subject to a body bias voltage. The body bias voltage can be used to...
|
|
|
7449905 |
Automated characterization system for laser chip on a submount
A temperature-controlled system for testing a laser die mounted on a submount is disclosed. The testing system comprises a base having a motor-driven translation platform. The translation platform...
|
|
|
7449897 |
Current fault detection for light emitters
A device includes a light emitter, a current sensing resistance, a current generator, and detection circuitry. The current generator is connected to the light emitter and to the current sensing...
|
|
|
7439753 |
Inverter test device and a method thereof
The present invention discloses an inverter test device and a method thereof, which provides a single-load environment or a multi-load test environment to test electrical performance of an inverter...
|
|
|
7414386 |
Methods for testing optical transmitter components
Methods for testing optical components, such as laser diodes or light emitting diodes, that are manufactured for use in optical transmitters or transceivers. The testing methods are performed using...
|
|
|
7382148 |
System and method for testing an LED and a connector thereof
A system for testing a light emitting diode (LED) ( 20 ) and connectors thereof. The system includes: a chip ( 10 ) having general purpose input output (GPIO) function and a plurality of pins ( 101...
|
|
|
7298167 |
Power supply system
A system for detecting a fault in a power supply having at least one power supply unit and a redundant power supply unit. The system includes a printed circuit board and a common voltage bus...
|
|
|
7145353 |
Double side probing of semiconductor devices
A probe head for testing the properties of a semiconducting device ( 10 ) under test including a dielectric film ( 24 ) supporting at least one semiconducting device ( 10 ) under test with a...
|
|
|
7111218 |
Apparatus with self-test circuit
An apparatus is adapted for self-test. The apparatus includes a microcontroller and a number of relay drivers having outputs electrically connected to form a single input for self-test monitoring....
|
|
|
7049833 |
Method for optimizing the accuracy of an electronic circuit
The present invention provides an apparatus and method for improving the accuracy of circuits. The apparatus includes a replicate circuit and a trim determination circuit. The trim determination...
|
|
|
7030642 |
Quick attachment fixture and power card for diode-based light devices
A quick attachment device for use in the repeated testing of diode light sources ( 30 ) includes a quick attachment module ( 10 ) having a fixed location with respect to a testing position ( 150 )...
|
|
|
7023232 |
Image display device, drive circuit device and defect detection method of light-emitting diode
A defect detection of light-emitting diodes (LEDs) is electrically performed on a large-scale display, comprising a plurality of light-emitting diodes arranged by a predetermined arrangement on an...
|
|
|
6977517 |
Laser production and product qualification via accelerated life testing based on statistical modeling
A method is provided for improving performance testing in semiconductor lasers via an accelerated life model. By using an accelerated life model, operating conditions for performance tests, such as...
|
|
|
6967487 |
Distributed diode fault check
A method and apparatus for testing for latent faults in the isolation devices of a system including redundant power supplies which supply power to one or more system units. A system controller is...
|
|
|
6956226 |
Light image sensor test of opto-electronics for in-circuit test
A method for testing at least one light source on a printed circuit assembly, includes: detecting a light signal from a plurality of light sources on a printed circuit assembly; generating a...
|
|
|
6946858 |
Method and apparatus for measuring photoelectric conversion device, and process and apparatus for producing photoelectric conversion device
A measuring method for measuring current-voltage characteristics of a photoelectric conversion device by irradiating light to said photoelectric conversion device and a reference device...
|
|
|
6943567 |
Method for detecting the operability of a number of identical zener diodes that are connected in parallel to one another and to a solenoid
When using solenoid coils in an explosion-hazard environment, in order that no sparks are produced in the event of a discontinuity in an electrical line leading to the solenoid coil, two or more...
|
|
|
6897662 |
Method and apparatus for optimizing the accuracy of an electronic circuit
The present invention provides an apparatus and method for improving the accuracy of circuits. The apparatus includes a replicate circuit and a trim determination circuit. The trim determination...
|
|
|
6888469 |
Method and apparatus for estimating semiconductor junction temperature
An apparatus is disclosed that provides an estimate of the semiconductor junction temperature of a semiconductor device as a function of the electrical current flowing across the corresponding...
|
|
|
6888357 |
Electric circuit arrangement and method for checking the intactness of a photodiode array
An electric circuit arrangement and method for checking intactness of both a photodiode array and an electrical connection between an array output and a microprocessor input. The array output has a...
|
|
|
6873172 |
Automated laser diode test system
An automated laser diode testing and burn-in system is disclosed. Initial device data is obtained by applying current to the device at room temperature and measuring the device parameters. The...
|
|
|
6856129 |
Current probe device having an integrated amplifier
A measurement system is provided that includes a probe device having an integrated amplifier. The integrated amplifier may be a transimpedence amplifier that amplifies input current to an output...
|
|
|
6797936 |
Automated laser diode testing
A testing system includes a device independent handling system utilizing removable collets that are customized for various device configurations and provide unique mechanical, thermal and...
|
|
|
6775000 |
Method and apparatus for wafer-level testing of semiconductor laser
A system and method for manufacturing and wafer-level testing properties of a wafer comprises a chuck receiving a wafer to be tested and a pump light source directing an output beam toward selected...
|
|
|
6771091 |
Method and system for elevated temperature measurement with probes designed for room temperature measurement
Techniques for measuring a contact potential difference of a sample at an elevated temperature using a probe designed for room temperature measurement are disclosed. In such measurements, probe...
|
|
|
6680621 |
Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
A method is described for measuring the capacitance and the equivalent oxide thickness of an ultra thin dielectric layer on a silicon substrate in which the dielectric layer is uniform or...
|
|
|
6670820 |
Method and apparatus for evaluating electroluminescence properties of semiconductor materials and devices
An apparatus for evaluating an associated semiconductor sample having two electrically distinct regions with a junction region disposed therebetween includes a laser for injecting carriers into a...
|
|
|
6639421 |
Measuring apparatus and method for measuring characteristic of solar cell
A predetermined area of a photo-sensing surface of a solar cell is illuminated, and a voltage vs. current characteristic is measured. Note, the rest of the photo-sensing surface which is not...
|
|
|
6621288 |
Timing margin alteration via the insulator of a SOI die
Analysis of a semiconductor die having silicon-on-insulator (SOI) structure is enhanced by operating a die and detecting a response that is used to analyze selected characteristics of the die....
|
|
|
6597195 |
Method of and cassette structure for burn-in and life testing of multiple LEDs and the like
A novel cassette structure technique for enabling simultaneous burn-in of pluralities of LEDs plugged into the cassettes, and then, with the cassettes mounted within a light integrating sphere...
|
|
|
6563326 |
Bus-driveable sensor apparatus with direction-dependent current/voltage characteristic curve and method for testing the apparatus
The current invention provides a bus-drivable sensor apparatus ( 10 ) having a first and a second bus input (a 1 , b 1 ) for connecting to a corresponding first and second bus line (B − , B + ),...
|
|
|
6496013 |
Device for testing circuit boards
An instrument to test electronic components, the instrument including a drive unit electrically connecting the component and electrically driving the component to generate a field in the nearby...
|
|
|
6489798 |
Method and apparatus for testing image sensing circuit arrays
A method and apparatus for testing an image sensor array such as a C-MOS imager which has sensing circuits arranged in rows and columns and wherein the sensing circuits include photosensitive...
|
|
|
6448805 |
Method and apparatus for wafer-level testing of semiconductor lasers
A method and device for wafer level testing of semiconductor lasers allows probing from one side while detecting light output from the opposite side. A chuck with a transparent substrate receives...
|
|
|
6437592 |
Characterization of a semiconductor/dielectric interface by photocurrent measurements
An interface between a semiconductor substrate/dielectric layer is characterized through measurements of a photocurrent. The photocurrent is induced in the semiconductor substrate by scanning a...
|
|
|
6414511 |
Arrangement for transient-current testing of a digital electronic CMOS circuit
For transient-current testing of an electronic circuit, a differentiating current measuring device is arranged for measuring an undershoot voltage for each of a series of current pulses controlled...
|
|
|
6342791 |
Diode defect detecting device
This invention is a diode defect detecting device including a current detector for detecting the primary current of a transformer, a comparator for comparing the detection current detected by the...
|
|
|
6335630 |
Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge
A method of measuring total charge of an insulating layer on a semiconductor substrate includes applying corona charges to the insulating layer and measuring a surface photovoltage of the...
|
|
|
6316955 |
Photoelectric conversion integrated circuit device
A photoelectric conversion integrated circuit device for converting a light signal into a voltage signal has a photodiode that outputs a current in accordance with a light signal it receives, a...
|
|
|
6258437 |
Test structure and methodology for characterizing etching in an integrated circuit fabrication process
A test structure for characterizing etching procedures used in integrated circuit fabrication processes and a method for using the test structure are described. The test structure includes a...
|
|
|
6249140 |
Method of screening semiconductor laser device using temperature cycling and variable driving current
A method of screening semicondutor laser devices which fail due to sudden deterioration and initial failures. Semiconductor laser devices are screened by thermal cycling wherein the devices are...
|
|
|
6239608 |
Method for analyzing schottky junction method for evaluating semiconductor wafer method for evaluating insulating film and schottky junction analyzing apparatus
A method for analyzing a Schottky junction of the present invention includes the step of obtaining electrical field dependence of the Schottky barrier height which shows a degree of dependence of...
|